CA1027639A - Digital circuit module test system - Google Patents

Digital circuit module test system

Info

Publication number
CA1027639A
CA1027639A CA229,807A CA229807A CA1027639A CA 1027639 A CA1027639 A CA 1027639A CA 229807 A CA229807 A CA 229807A CA 1027639 A CA1027639 A CA 1027639A
Authority
CA
Canada
Prior art keywords
test system
circuit module
digital circuit
module test
digital
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA229,807A
Other languages
French (fr)
Inventor
Virendra K. Kadakia
Ralph C. Moore (Jr.)
Charles P. Holt (Jr.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xerox Corp
Original Assignee
Xerox Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xerox Corp filed Critical Xerox Corp
Application granted granted Critical
Publication of CA1027639A publication Critical patent/CA1027639A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
CA229,807A 1974-07-01 1975-06-20 Digital circuit module test system Expired CA1027639A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/484,473 US4000460A (en) 1974-07-01 1974-07-01 Digital circuit module test system

Publications (1)

Publication Number Publication Date
CA1027639A true CA1027639A (en) 1978-03-07

Family

ID=23924293

Family Applications (1)

Application Number Title Priority Date Filing Date
CA229,807A Expired CA1027639A (en) 1974-07-01 1975-06-20 Digital circuit module test system

Country Status (4)

Country Link
US (1) US4000460A (en)
CA (1) CA1027639A (en)
GB (1) GB1498125A (en)
NL (1) NL7507837A (en)

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* Cited by examiner, † Cited by third party
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US4066882A (en) * 1976-08-16 1978-01-03 Grumman Aerospace Corporation Digital stimulus generating and response measuring means
US4070565A (en) * 1976-08-18 1978-01-24 Zehntel, Inc. Programmable tester method and apparatus
US4108358A (en) * 1977-03-22 1978-08-22 The Bendix Corporation Portable circuit tester
SU802970A1 (en) * 1977-04-08 1981-02-07 Предприятие П/Я В-8495 Device for function testing of large-scale integrated circuits
US4168796A (en) * 1978-04-13 1979-09-25 Ncr Corporation Tester with driver/sensor circuit having programmable termination devices
US4174805A (en) * 1978-04-13 1979-11-20 Ncr Corporation Method and apparatus for transmitting data to a predefined destination bus
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
USRE31828E (en) * 1978-05-05 1985-02-05 Zehntel, Inc. In-circuit digital tester
US4459695A (en) * 1979-11-07 1984-07-10 Davy Mcgee (Sheffield) Limited Fault finding in an industrial installation by means of a computer
US4379259A (en) * 1980-03-12 1983-04-05 National Semiconductor Corporation Process of performing burn-in and parallel functional testing of integrated circuit memories in an environmental chamber
US4316259A (en) * 1980-03-18 1982-02-16 Grumman Aerospace Corporation Programmable function generator
SE8305262L (en) * 1982-12-14 1984-06-15 Gen Electric UNIVERSAL LOGIC CARD
US4553049A (en) * 1983-10-07 1985-11-12 International Business Machines Corporation Oscillation prevention during testing of integrated circuit logic chips
US4656632A (en) * 1983-11-25 1987-04-07 Giordano Associates, Inc. System for automatic testing of circuits and systems
US4937827A (en) * 1985-03-01 1990-06-26 Mentor Graphics Corporation Circuit verification accessory
DE3543699A1 (en) * 1985-12-11 1987-06-19 Rohde & Schwarz METHOD FOR TESTING THE INDIVIDUAL COMPONENTS OF A CIRCUIT BOARD (IN-CIRCUIT TEST)
US4744084A (en) * 1986-02-27 1988-05-10 Mentor Graphics Corporation Hardware modeling system and method for simulating portions of electrical circuits
US6539497B2 (en) * 1987-06-02 2003-03-25 Texas Instruments Incorporated IC with selectively applied functional and test clocks
US5291495A (en) * 1991-07-12 1994-03-01 Ncr Corporation Method for designing a scan path for a logic circuit and testing of the same
US5369604A (en) * 1993-02-05 1994-11-29 Texas Instruments Incorporated Test plan generation for analog integrated circuits
US5554827A (en) * 1993-02-22 1996-09-10 Wacom Co., Ltd. Method of and apparatus for determining whether a digitizer coordinate detecting tablet is properly operating and/or writing adjustment data into a memory associated with the tablet
US6393385B1 (en) * 1995-02-07 2002-05-21 Texas Instruments Incorporated Knowledge driven simulation time and data reduction technique
US6185709B1 (en) * 1998-06-30 2001-02-06 International Business Machines Corporation Device for indicating the fixability of a logic circuit
US6385739B1 (en) 1999-07-19 2002-05-07 Tivo Inc. Self-test electronic assembly and test system
US6526841B1 (en) * 1999-08-02 2003-03-04 Pemstar, Inc. Environmental test chamber and a carrier for use therein
DE10110050A1 (en) * 2001-03-02 2002-09-05 Bosch Gmbh Robert Method for protecting safety-critical program parts or routines from inadvertent execution, especially for automotive use, in which a safety critical routine will only run if a bit pattern has been set by a calling program section
US7672452B2 (en) * 2002-05-03 2010-03-02 General Instrument Corporation Secure scan
JP2003332443A (en) * 2002-05-08 2003-11-21 Toshiba Corp Semiconductor integrated circuit and design supporting device as well as test method therefor
US7231573B2 (en) * 2002-12-20 2007-06-12 Verigy Pte. Ltd. Delay management system
JP3828502B2 (en) * 2003-03-26 2006-10-04 株式会社東芝 Integrated circuit
US7145977B2 (en) * 2003-07-30 2006-12-05 International Business Machines Corporation Diagnostic method and apparatus for non-destructively observing latch data
US7232101B2 (en) * 2003-11-26 2007-06-19 Pemstar, Inc. Hard drive test fixture
US20050225338A1 (en) * 2004-03-31 2005-10-13 Sands Richard L Hard drive test fixture
US20050240845A1 (en) * 2004-04-23 2005-10-27 Texas Instruments Incorporated Reducing Number of Pins Required to Test Integrated Circuits
KR101851945B1 (en) * 2011-06-29 2018-04-26 삼성전자주식회사 Semiconductor module and test system including the same
US11221378B2 (en) * 2020-02-05 2022-01-11 General Electric Company Systems, methods, and program products for testing electrical loops included in control circuits of electrical power systems

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3219927A (en) * 1958-09-15 1965-11-23 North American Aviation Inc Automatic functional test equipment utilizing digital programmed storage means
US3581074A (en) * 1968-02-19 1971-05-25 Burroughs Corp Automatic checkout apparatus
US3621387A (en) * 1969-08-21 1971-11-16 Gen Instrument Corp Computer-controlled tester for integrated circuit devices
US3651315A (en) * 1970-05-14 1972-03-21 Collins Radio Co Digital products inspection system
US3673397A (en) * 1970-10-02 1972-06-27 Singer Co Circuit tester
DE2121330C3 (en) * 1971-04-30 1974-10-17 Ludwig 6369 Dortelweil Illian Method and circuit arrangement for testing digitally operating electronic devices and their components

Also Published As

Publication number Publication date
NL7507837A (en) 1976-01-05
US4000460A (en) 1976-12-28
GB1498125A (en) 1978-01-18

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