CA1260063A - Test strip identification - Google Patents
Test strip identificationInfo
- Publication number
- CA1260063A CA1260063A CA000517252A CA517252A CA1260063A CA 1260063 A CA1260063 A CA 1260063A CA 000517252 A CA000517252 A CA 000517252A CA 517252 A CA517252 A CA 517252A CA 1260063 A CA1260063 A CA 1260063A
- Authority
- CA
- Canada
- Prior art keywords
- test device
- conductive
- resistance
- test
- probes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
- G01N33/483—Physical analysis of biological material
- G01N33/487—Physical analysis of biological material of liquid biological material
- G01N33/4875—Details of handling test elements, e.g. dispensing or storage, not specific to a particular test method
- G01N33/48771—Coding of information, e.g. calibration data, lot number
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00742—Type of codes
- G01N2035/00772—Type of codes mechanical or optical code other than bar code
Abstract
ABSTRACT
Test device apparatus is disclosed containing a electrically conductive region which provides infor-mation concerning the nature of the test device and/or its position. In a preferred embodiment a conductive strip is applied to a test device and used to determine the identification of the test device, the position of the test device and/or calibrate an instrument which is used to read the test device.
The conductive strip generates a signal by measuring the resistance ratio of the electrical path through its conductive region using three or more electrodes or probes. The signal obtained by the electrodes is used to determine the characteristics indicated above or to program operational parameters within an instrument used to analyze the test device.
Test device apparatus is disclosed containing a electrically conductive region which provides infor-mation concerning the nature of the test device and/or its position. In a preferred embodiment a conductive strip is applied to a test device and used to determine the identification of the test device, the position of the test device and/or calibrate an instrument which is used to read the test device.
The conductive strip generates a signal by measuring the resistance ratio of the electrical path through its conductive region using three or more electrodes or probes. The signal obtained by the electrodes is used to determine the characteristics indicated above or to program operational parameters within an instrument used to analyze the test device.
Description
~Z~)IJ 63 TEST STRIP IDENTIFICATION
FI EL D O F THE .I N VE~ TI ON
The present invention relates to apparatus and a process for identifying test devices and calibrating instrumentation used in connection with such test devices and, more particularly, the invention relates to the application of a conductive path or region to a test device for use in the identification of the test device and/or calibration of instrumentation employed in conjunction with the test device.
BACKGROU~ID OF THE INVENTION
Increasingly, test devices in the form of reagent strips are being used to provide convenient and rapid analysis of various types of samples, including liquid samples of biological, industrial and other fluid substances. Diagnostic test devices designed for detecting various clinically significant substances or constituents in body fluids, such as urine and blood, have in many cases supplanted prior
FI EL D O F THE .I N VE~ TI ON
The present invention relates to apparatus and a process for identifying test devices and calibrating instrumentation used in connection with such test devices and, more particularly, the invention relates to the application of a conductive path or region to a test device for use in the identification of the test device and/or calibration of instrumentation employed in conjunction with the test device.
BACKGROU~ID OF THE INVENTION
Increasingly, test devices in the form of reagent strips are being used to provide convenient and rapid analysis of various types of samples, including liquid samples of biological, industrial and other fluid substances. Diagnostic test devices designed for detecting various clinically significant substances or constituents in body fluids, such as urine and blood, have in many cases supplanted prior
2~ wet chemistry techniques which were both cumbersome and time consuming. Diagnostic test devices have assisted in the fast, inexpensive and accurate diagnosis and treatment of disease.
Conventional test devices generally comprise an absorbent or porous matrix incorporated with indica-tor reagents which produce a detectable result, ~2,6~ 3 usually of a colorimetric nature. The sample to be teste~ is contacted with the matrix, such as by momen-tary immersion, where the sample i5 liquid, and an indicator response is observed after a period of time. The response can be observed instrumentally or visually, depending on the particular test device.
In the detection of occult blood in urine, for example, a diagnostic test device can be employed which comprises absorhent paper as the matrix impreg-nated with o tolidine and peroxide. When ~his testdevice is wetted with urine containing occult blood, decomposition of the peroxide occurs with the accom-panying oxidation of the o-tolidine to provide a color response. This test is sensitive and extremely useful in diagnosing urinary tract disorders.
For ease in handling, the absorbent or porous matrix, sometimes called a "carrier matrix", is advantageously affixed to one end of an insoluble support member such as an organoplastic strip, e.g., polystyrene, by suitable means such as double faced adhesive tape. Optically transparent substrate material known as Trycite, polystyrene film obtained from Dow Chemical Company, is preferred. The support member normally has a thickness of about 0.19 mm, a width of about 5 mm and a length which can vary depending on the intended use, the number of reagent carrier matrices present, etc. Currently~ test devices are being made by the Ames Division of Miles Laboratories, Inc. having lengths of about 85.5 mm and about 82.5 mm. Obviously, basPd on these dimen-sions and the materials involved, such test devices tend to be small, elongated and flexible in nature.
~6~ 3 Notwi-thstanding the use of "identical" materials and reagents for the manufacture of test devices, variations occur from one batch to the next and such variations can be significant enough to affect the S performance characteristics of a particular test device. Accordingly, test manufacturers have found that it is normally necessar~v to calibrate instrumen-tation used in connection with such test devices in order to compensate for variations from lot to lot in the test devices manufactured. In addition, manufac-turers have found that it is desirable to code ~est devices which are to be read by instrumentation with some kind of identification in order to make certain that the test device used for a particular analysis co~rectly correlates with the instrumentation used to measure or read the test d~vice.
Manufacturers have also sought means for assur-ing users of test devices that a test device inserted into automated equipment is pxoperly aligned and accurately positioned with respect to the automatic readout means. Misalignment, or misregistration, can result in an improper identification or reading of the test device.
Various techniques have been suggested for encoding information into or on a strip, including application of a magnetizable film (EP 132 790 A~, the perforation of a strip (U.S. P,atent No.
Conventional test devices generally comprise an absorbent or porous matrix incorporated with indica-tor reagents which produce a detectable result, ~2,6~ 3 usually of a colorimetric nature. The sample to be teste~ is contacted with the matrix, such as by momen-tary immersion, where the sample i5 liquid, and an indicator response is observed after a period of time. The response can be observed instrumentally or visually, depending on the particular test device.
In the detection of occult blood in urine, for example, a diagnostic test device can be employed which comprises absorhent paper as the matrix impreg-nated with o tolidine and peroxide. When ~his testdevice is wetted with urine containing occult blood, decomposition of the peroxide occurs with the accom-panying oxidation of the o-tolidine to provide a color response. This test is sensitive and extremely useful in diagnosing urinary tract disorders.
For ease in handling, the absorbent or porous matrix, sometimes called a "carrier matrix", is advantageously affixed to one end of an insoluble support member such as an organoplastic strip, e.g., polystyrene, by suitable means such as double faced adhesive tape. Optically transparent substrate material known as Trycite, polystyrene film obtained from Dow Chemical Company, is preferred. The support member normally has a thickness of about 0.19 mm, a width of about 5 mm and a length which can vary depending on the intended use, the number of reagent carrier matrices present, etc. Currently~ test devices are being made by the Ames Division of Miles Laboratories, Inc. having lengths of about 85.5 mm and about 82.5 mm. Obviously, basPd on these dimen-sions and the materials involved, such test devices tend to be small, elongated and flexible in nature.
~6~ 3 Notwi-thstanding the use of "identical" materials and reagents for the manufacture of test devices, variations occur from one batch to the next and such variations can be significant enough to affect the S performance characteristics of a particular test device. Accordingly, test manufacturers have found that it is normally necessar~v to calibrate instrumen-tation used in connection with such test devices in order to compensate for variations from lot to lot in the test devices manufactured. In addition, manufac-turers have found that it is desirable to code ~est devices which are to be read by instrumentation with some kind of identification in order to make certain that the test device used for a particular analysis co~rectly correlates with the instrumentation used to measure or read the test d~vice.
Manufacturers have also sought means for assur-ing users of test devices that a test device inserted into automated equipment is pxoperly aligned and accurately positioned with respect to the automatic readout means. Misalignment, or misregistration, can result in an improper identification or reading of the test device.
Various techniques have been suggested for encoding information into or on a strip, including application of a magnetizable film (EP 132 790 A~, the perforation of a strip (U.S. P,atent No.
3,526,480) with a coded pattern, the applicati,on of different fluorogens which can be scanned by a fluorescent scanning device (U.S. Patent No.
3r551,295) r and the application of an optical type bar coding (U.S. Patent No. 4,510,383) for imparting ~2~)(1C)63 information which can be transmitted to :instrumenta-tion.
Optical readers tend to be expensive. Moreover, light radiating means and light sensitive receivers tend to be sensitive to variations in positioning of a test device. The application of a magnetic strip to test devices, on the other hand, has the disadvan-tage that the magnetic pattern must be scanned to provide useful information, i.e., the coding element must move relative to the reading element; the magnetic pattern is subject to being erased and/or altered due to nearby electrical or magnetic fields such as those from motors, etc.; and the coding of information into a magnetic field and the retrieval of the coded information requires relatively sophis-ticated and expensive equipment.
In U.S~ Patent No. 3,000,498 graphite based ink is applied to the rear surface of a postal stamp in portions where the stamp is strongly colored or heavily printed. The printing is invisible to the naked eye but detectable by sensors moving across the stamp to determine the value of the stamp.
In U.S. Patent No. 4,230,938 electrosensitive material is applied to checks, business forms and the Z5 like in the form of bar codes of horizontal synchro-nization marks Gr vertical synchronization marks or timing tracks which can be sensed by moving a sensor over the forms.
The present invention has been developed for the purpose o providing an improved system for the identification of test devices as well as the cali-bration of instrumentation used with such test devices. In addition, the system which has been MS~1~29 ~260~
developed can be used for the purpose of assuring proper alignment between a test device and instrumen-tation.
S VMMA :F~ Y O F T~E I ~ VE~ TI ON
An object of the present invention is to provide a test device containing improved identification means.
Another object of the present invention is to provide a test device containing improved means for calibration of instrumentation.
Yet another object of the present invention is to provide means for use in confirming proper align-ment between a test device and instrumentation.
Still another object of the present invention is to provide a method of manufacturing test devices with means for identifying and/or aligning the test device and/or calibrating instrumentation.
In accordance with the present invention, at least one conductive path is applied to a test device. Upon contact of the conductive material with probes a ratio measurement is obtained based on resistivity, conductivity or capacitance which is used to identify the nature of the test device and/or determine its ali~nment. Information on the nature of the test device imparted by the ratio measurement can include information as to the type of test device, as well as information which will permit calibration of instrumentation to select optimum system operation parameters for analysis of the test device. Methods for the manufacture of such a test device and the use of the test device are also disclosed.
i3 DE~SCRIPTIO~ OF THE DF~Ah~INGS
Other and further objects, advantages and features of the invention will be apparent to those skilled in the art from the following detailed description thereof, taken in conjunction with the accompanying drawings, in which:
Fig. 1 is a top schematic view of a test device showing two reagent matrices and a conductive strip applied to a substrate;
Fig. 2 is a cross-sectional view taken along lines 2-2 of the test device illustrated in Fig. l;
Fig. 3 is a schematic top view of another test device in accordance with the present invention illustrating reagent matrices and a conductive strip applied to a substrate;
Fig. 4 is yet another embodiment of the present invention illustrating schematically the top view of a test device having reagent matrices and a "T-shaped"
conductive path applied to a substrate, the conduc-tive path capable of being contacted at three or morepoints for determination of the resistance in the electrical path between the points;
Fig. 5 is a schematic side view in cross section of a multilayered test device showing probes pene-trating a coating layer to contact conductive material present beneath the coating layer;
Fig. 6 is a top schematic view of a test device having multiple conductive paths for measuring resistance ratios; and Fig. 7 is a cross-sectional view taken along lines 7-7 in Fig. 6.
MS 1~29 DESC~IPTIO~ OF T~IE PREF~RRED EMBODIM~7~S
~ eferring to Figs. 1 and 2, test device 10 is illustrated comprising mu:Ltiple reagent matrices 12 and 13 attached to substrate 11. A conductive strip 14 is also applied to substrate 11 on the same surface as reagent matrices 12 and 13. By contacting this conductive strip with at least three electrodes or probes (not shown) the signal generated is propor-tional tv the resistance of the electrical path through the conductive region of conductive strip 1 between the probes and the resulting signals can be ratioed to correlate certain operational parameters, e.g., algorithms, wavelengths, etc., of an instrument used to ~Iread~ or measure test device lOo Probes can contact conductive strip 14 at suitable contact points such as contact points 15, 16 and 17 to obtain a ratio of the resistance between contact points 15 and L6 and between points 16 and 17 or another suitable ratio such as the ratio of the resistance between points 15 and 17 and points 15 and 16 or points 16 and 17. Provided contact points 15, 16 and 17 are not equidistant from each other a ratio of resistance values can be obtained. If one or more of the probes fails to contact conductive strip 14 there is an immediate indication of misalignment of test device 10 in the instrumentation. Secondly, conduc-tive strip 14 can be correlated for purposes of identifying the particular test device and automating or indexing instrumentation used to obtain test results. This is of particular importance when the same instrument is being used to make determinations under different operating parameters with respect to different test devices, all of which have an overall ~2~0~63 ~ 8 --configuration o~ approximately the same dimensions.
Thus, cuxrently, it i5 conventional practice to incorporate 1 to 8 or more reagent matrices on the same size substrate. An instrument must be pro-grammed manuallv or automatically to determine thenumber, kind and location of the carrier matrices on each test device in order that appropriate operational parameters are applied in conjunction with the reaction which occurs in each of the carrier matrices o~ the test device. ~he present invention provides the means for instructing instrumentation as to which system operation parameters to apply in the analysis of the tests associated with test device 10.
It will be understood that two carrier matrices on test device 10 have been shown only for purposes of illustration. Obviously, one or more carrier matrices can be present and, as indicated above, the conductive strip 14 can be used to identify the number and type of carrier matrices present on a particular test device.
Conductive strip 14 can be made of any suitable conductive material such as silver, gold, nickel, metal alloys, etc., applied in the form of metal filled polymer, metal powder, etc. The conductive path can be applied to the reagent test device using any convenient technique, including application to a substrate as a tape, as a paint (applied with a brush or a spray), as an ink (applied using type font or spray), or otherwise incorporated into or onto the test devices during or ~ollowing the manufacturing operation. Thus, the conductive material can be applied as a thin layer of film by incorporating metal in a polymeric substance (e.g., epoxy) which MS-1~29 will adhere to substrate 11. Tape can be adhesively bound to substrate 11. Conductive strip 14 can also be applied using sputtering, low pressure heat vapori2ation or electroplating techniques so as to apply conductive material to the surface of substrate 11 .
A preferred type of conductive element is the cermet chip resistor which is available from CA~R
Inc. of Santa Monica, California. Resistance ranges can be formulated ranging from 10 ohms to 40 megaohms in a chip having a thickness ranging from 0.03 to 0.07 cm. Gold epoxy paste, gold filled conductive bondin~ preparations exhibiting high electrical conductivity and bond strength, are available from Transene Company, Inc., of Rowley, Massachusetts under the trademarks Gold Epoxy ~E10, GE20, GE30 and GE40~ These pastes ha~e electrical resistivity of
3r551,295) r and the application of an optical type bar coding (U.S. Patent No. 4,510,383) for imparting ~2~)(1C)63 information which can be transmitted to :instrumenta-tion.
Optical readers tend to be expensive. Moreover, light radiating means and light sensitive receivers tend to be sensitive to variations in positioning of a test device. The application of a magnetic strip to test devices, on the other hand, has the disadvan-tage that the magnetic pattern must be scanned to provide useful information, i.e., the coding element must move relative to the reading element; the magnetic pattern is subject to being erased and/or altered due to nearby electrical or magnetic fields such as those from motors, etc.; and the coding of information into a magnetic field and the retrieval of the coded information requires relatively sophis-ticated and expensive equipment.
In U.S~ Patent No. 3,000,498 graphite based ink is applied to the rear surface of a postal stamp in portions where the stamp is strongly colored or heavily printed. The printing is invisible to the naked eye but detectable by sensors moving across the stamp to determine the value of the stamp.
In U.S. Patent No. 4,230,938 electrosensitive material is applied to checks, business forms and the Z5 like in the form of bar codes of horizontal synchro-nization marks Gr vertical synchronization marks or timing tracks which can be sensed by moving a sensor over the forms.
The present invention has been developed for the purpose o providing an improved system for the identification of test devices as well as the cali-bration of instrumentation used with such test devices. In addition, the system which has been MS~1~29 ~260~
developed can be used for the purpose of assuring proper alignment between a test device and instrumen-tation.
S VMMA :F~ Y O F T~E I ~ VE~ TI ON
An object of the present invention is to provide a test device containing improved identification means.
Another object of the present invention is to provide a test device containing improved means for calibration of instrumentation.
Yet another object of the present invention is to provide means for use in confirming proper align-ment between a test device and instrumentation.
Still another object of the present invention is to provide a method of manufacturing test devices with means for identifying and/or aligning the test device and/or calibrating instrumentation.
In accordance with the present invention, at least one conductive path is applied to a test device. Upon contact of the conductive material with probes a ratio measurement is obtained based on resistivity, conductivity or capacitance which is used to identify the nature of the test device and/or determine its ali~nment. Information on the nature of the test device imparted by the ratio measurement can include information as to the type of test device, as well as information which will permit calibration of instrumentation to select optimum system operation parameters for analysis of the test device. Methods for the manufacture of such a test device and the use of the test device are also disclosed.
i3 DE~SCRIPTIO~ OF THE DF~Ah~INGS
Other and further objects, advantages and features of the invention will be apparent to those skilled in the art from the following detailed description thereof, taken in conjunction with the accompanying drawings, in which:
Fig. 1 is a top schematic view of a test device showing two reagent matrices and a conductive strip applied to a substrate;
Fig. 2 is a cross-sectional view taken along lines 2-2 of the test device illustrated in Fig. l;
Fig. 3 is a schematic top view of another test device in accordance with the present invention illustrating reagent matrices and a conductive strip applied to a substrate;
Fig. 4 is yet another embodiment of the present invention illustrating schematically the top view of a test device having reagent matrices and a "T-shaped"
conductive path applied to a substrate, the conduc-tive path capable of being contacted at three or morepoints for determination of the resistance in the electrical path between the points;
Fig. 5 is a schematic side view in cross section of a multilayered test device showing probes pene-trating a coating layer to contact conductive material present beneath the coating layer;
Fig. 6 is a top schematic view of a test device having multiple conductive paths for measuring resistance ratios; and Fig. 7 is a cross-sectional view taken along lines 7-7 in Fig. 6.
MS 1~29 DESC~IPTIO~ OF T~IE PREF~RRED EMBODIM~7~S
~ eferring to Figs. 1 and 2, test device 10 is illustrated comprising mu:Ltiple reagent matrices 12 and 13 attached to substrate 11. A conductive strip 14 is also applied to substrate 11 on the same surface as reagent matrices 12 and 13. By contacting this conductive strip with at least three electrodes or probes (not shown) the signal generated is propor-tional tv the resistance of the electrical path through the conductive region of conductive strip 1 between the probes and the resulting signals can be ratioed to correlate certain operational parameters, e.g., algorithms, wavelengths, etc., of an instrument used to ~Iread~ or measure test device lOo Probes can contact conductive strip 14 at suitable contact points such as contact points 15, 16 and 17 to obtain a ratio of the resistance between contact points 15 and L6 and between points 16 and 17 or another suitable ratio such as the ratio of the resistance between points 15 and 17 and points 15 and 16 or points 16 and 17. Provided contact points 15, 16 and 17 are not equidistant from each other a ratio of resistance values can be obtained. If one or more of the probes fails to contact conductive strip 14 there is an immediate indication of misalignment of test device 10 in the instrumentation. Secondly, conduc-tive strip 14 can be correlated for purposes of identifying the particular test device and automating or indexing instrumentation used to obtain test results. This is of particular importance when the same instrument is being used to make determinations under different operating parameters with respect to different test devices, all of which have an overall ~2~0~63 ~ 8 --configuration o~ approximately the same dimensions.
Thus, cuxrently, it i5 conventional practice to incorporate 1 to 8 or more reagent matrices on the same size substrate. An instrument must be pro-grammed manuallv or automatically to determine thenumber, kind and location of the carrier matrices on each test device in order that appropriate operational parameters are applied in conjunction with the reaction which occurs in each of the carrier matrices o~ the test device. ~he present invention provides the means for instructing instrumentation as to which system operation parameters to apply in the analysis of the tests associated with test device 10.
It will be understood that two carrier matrices on test device 10 have been shown only for purposes of illustration. Obviously, one or more carrier matrices can be present and, as indicated above, the conductive strip 14 can be used to identify the number and type of carrier matrices present on a particular test device.
Conductive strip 14 can be made of any suitable conductive material such as silver, gold, nickel, metal alloys, etc., applied in the form of metal filled polymer, metal powder, etc. The conductive path can be applied to the reagent test device using any convenient technique, including application to a substrate as a tape, as a paint (applied with a brush or a spray), as an ink (applied using type font or spray), or otherwise incorporated into or onto the test devices during or ~ollowing the manufacturing operation. Thus, the conductive material can be applied as a thin layer of film by incorporating metal in a polymeric substance (e.g., epoxy) which MS-1~29 will adhere to substrate 11. Tape can be adhesively bound to substrate 11. Conductive strip 14 can also be applied using sputtering, low pressure heat vapori2ation or electroplating techniques so as to apply conductive material to the surface of substrate 11 .
A preferred type of conductive element is the cermet chip resistor which is available from CA~R
Inc. of Santa Monica, California. Resistance ranges can be formulated ranging from 10 ohms to 40 megaohms in a chip having a thickness ranging from 0.03 to 0.07 cm. Gold epoxy paste, gold filled conductive bondin~ preparations exhibiting high electrical conductivity and bond strength, are available from Transene Company, Inc., of Rowley, Massachusetts under the trademarks Gold Epoxy ~E10, GE20, GE30 and GE40~ These pastes ha~e electrical resistivity of
4 x lO 4, 7 x 10 4, 7 x 10 4 and 6 x 10 4 ohms cm, respectively. In addition, from the same company, silver bond conductive adhesives are available under the designations Type 40, Type 50 and Type 60 having an electrical resistivity of 1 x 10 4 ohms cm. The silver bond is a two component epoxy based conductive adhesive of silver filled epoxy having a consistency of a soft thixotropic paste. The Transene Company also makes a Nickel-Met pxeparation which is the form of a paint or paste containing nickel powder and an acr~late base. Butyl acetate is used as a solvent in the paint formulation whereas butyl carbitol acetate is used as a solvent in the paste composition. The resistivity of the paint composition is 3.4 x 10 3 ohms cm and the resistivity of the paste is 6.0 x 10 ohms cm. The paint composition can be i0063 applied by spraying or painting following by air cure to a nominal thickness of 1-2 mils. The paste can be screen printed and dried at 100C.
It will be understood that while conductive path 14 has been illustrated as being applied to the same surface of substrate 11 as reagent matrices 12 and 13 theoretically, at least, there is no reason why conductive path 14 could not be applied to the opposite sur~ace of substrate 11 or even applied to the one of the edges of substrate 11.
In Fi~s. 1 and 2 conductive path 14 is shown in an elongated rectangular configurat.ion. It will be understood that this particular configuration is a convenient one but that other configurations can be employed including those illustrated in Figs. 3 and 4 as well as serpentine or other more complex config-urations or shapes. A "V" shape configuration is easy to apply and useful in aligning a test device.
Conductive networks or paths with more than one conductance path of resistance can also be applied.
The size of the conductive path 14 needs to be sufficient to easily facilitate contact with elec-trodes or probes for purpose of determining a ratio of resistance in the conductive path and thus the size o~ conductive path 14 can actually be determined by the type of material used, convenienc~ in making the measurements and the location of the conductive path on a test device.
The test device 20 illustrated in Fig. 3 is similar to that of test device lO illustrated in Figs. 1 and 2. Reagent matrices 22 and 23 correspond to reagent matrices 12 and 13, respectively. Fig. 3, however, illustrates a conductive path 24 which 6~
extends at right angles across the substrate 21 rather than lengthwise, as in Fig. 1~ In Fig. 3 a resistance ratio is obtained from the resistance value between contact points 25 and 26, and the resistance value between con~act points 27 and 28.
In Fig. ~'l test device 30 is illustrated with reagent matrices 32 and 33 attached to substrate 31 and a "T-shaped" conductive path formed by conductive members 34 and 35. Conductive members 34 and 35 can, if desired, be made from the same or di~ferent conductive materials. Fig. 4 illustrates an elec-trical connection being made from probe contact points 36 and 37 through power source 38 and meter 39. This permits a first conductive measurement to be made. A second electrical connection is shown being made from probe contact points 36 and 4n through power source 41 and meter 42. This permits a second conductive measurement to be made which is then ratioed with the first conductive measurement.
The embodiment of Fig. 4 is particularly useful in assuring proper alignment between the test device and instrumentation employed for measurement of a test device since probes must contact points 36, 37 and 40 in order for any ratio signal to be generated.
Still another embodiment of the invention is illustrated in Fig. 5 by test device 50. This test device comprises a multilayered member having a substrate 51 and an intermediate layer 52. Conduc-tive material 56 and reagent matrices 54 and 55 are present in intermediate layer 52. A top or overcoat protective layer 53 is applied to intermediate layer 52. It is necessary for probes 57, 58 and 59 to physically penetrate the overcoat or top layer 53 in MS-1~29 6()~63 the manner shown and contact conductive material 56 thereby permitting resistance ratio measurements to be made.
It will be understood that other configurations of multilayered devices are possible and that Fig. 5 illustrates only one particular embodimentO
~ nother approach is illustrated in Figs. 6 and 7 for measuriny resistance ratios. These figures illustrate a reagent test device 60 comprising reagent matrix 62 attached to substrate 61. Also present on substrate 61 are conductive areas 64 which are separated by resistance materials 65 and 66. By using two probes to contact the metal conductor portions 64 on either side of resistance element 65 and the metal conductor portions 64 on either side of resistance element 66 a ratio of resistances can be obtained which is then used to convey information pertaining to the identification, positioning, nature of the test device or calibration. Alternatively, three probes can be utilized to simultaneously contact metal conductive portions 64 of test device 60 and thereby obtain a ratio of resistance values.
Thus the absolute value of resistance is not impor-tant but only the ratio of resistances. Normally the resistance values of resistance materials 65 and 66 will be quite different such that a distinct ratio of the two resistance values will be obtained. While it is not necessary to limit the ratio to a ratio of two values, normally only two resistance materials are required and additional resistance materials only add to the expense and complicate manufacturing proce-dures.
.~26~)063 Metal conductor areas 64 can be formed from any suitahle conductive materia] and applied to substrate 61 in any suitable fashion. Similarly, resistance elements 65 and 66 can be formed from any suitable resistance materials and applied in any suitable fashion to substrate 6]. The conductive and resis-tive areas must be contiguous (i.e., in electrical contact) so that it is possible to obtain a con-ductance value by contacting metal conductors 64 with probes.
In a preferred embodiment the conductive and resistive materials are applied to substrate 61 using thiclc film techniques for depositing various mixtures of conductive materials and resistive materials to the substrate. Such techniques normally involve applying the materials by a printing or silk screen-ing process. However, a paste mixture can be applied by doctor blade to substrate 61. Among the thick film screen printable resistor pastes are those of Thick Film Systems of Santa Barbara, California, designated by the name Powerohm 850 series, which are resistive formulations of screen printable paste for thick film applications normally applied in microcircuits or for discrete components which require high reliability and close control of prop-erties. The resistance values for such materials can vary over a wide range, varying from a few hundred ohms to several hundred thousand ohms. The actual value of resistance is not important as long as it can be measured. Of course, in the case of the embodiment illustrated in Figs. 6 and 7 there is a difference between the resistance values of elements 65 and 66.
;3 - 1~
The invention solves several problems associated with the use of test devices. First of all, the calibration strip can be used to identify a particu-lar test device and "program'l instrumentation to 'Iread'' that particular test device. Secondly, the calibration strip can be used to indicate the correct placement or positioning of a test device in an instrument. One recurrent problem with reagent strip measurement lies in the improper positioning of the reactive areas of the test device in the optical path o~ an instrument. Despite the presence of mechanical guides and optical signals used to help detect errors in positioning, such errors still occur. The conduc-tive path can be used to replace other erxor detec-tion means or supplement other means used to test forproper positioning. As indicated above, the "T-shaped" configuration illustrated in Fig. 4 is one configuration which requixes a positive signal as an indication that strip positioning along two axes is correct. Obviously, more complicated networks of conductance can be used for checking the position of a test device.
Finally, the conductive strip of the present invention permits system calibration to occur.
Signals from a conductive region can be used to select or program calibration parameters specific ~or an assay on a test device. Based on the ratio of resistance values obtained, the wavelength and/or time period for making a reading and/or mathematical evaluation applied to a reading can be selected automatically by a measuring instrument. Other methods of system calibration such as live cali-bration, and the like, are subject to user errors.
MS~1429 ~6~)~)6~
~hile such methods are fundamental to preparing a system for use, they are peripheral to the primary task of sample application and measurement. Conse-quently, errors that occur during calibration can significantly limit system performance. At a minimum the necessity of such calibration reduces operator convenience. The use of a conductive path on the test device which i5 used to obtain a ratio measurement directly by the instrument and which is used in calibrating the instrument requires very little user involvement and is less prone to user variability or error during the calibration proce-dure. No movement of the sensors or probes relative to the reagent strip is required. System convenience is increased because fewer operating techniques must be learned and the familiar methods of sample applica-tion and reagent strip measurement are not altered.
From the foregoing, it will be seen that this invention is well adapted to attain all of the ends and objects hereinabove set forth, together with other advantages which obvious and which are inherent to the system. The described system requires only static contact between three or more probes and one or more conductive strips. There is no encoding and decoding of data bits from a surface. The conductive strip is not altered by exposure to electrical or magnetic devices and the conductive strip is not a field effect device in which information must be coded entirely within the device. The conductive strip can be easily attached on or incorporated in a test device at low cost. Existing technology con-cerning manufacture of test devices does not have to be altered in order to include conductive paths in MS~1429 ~ ~0063 accordance with the present invention. The ratioing of resistance values (or conductance values) also tends to compensate for correlated errors and avoids many of the problems associated with attempting to obtain an absolute resistance value.
Obviously, many other modifications and varia-tions of the invention as hereinbefore set forth can be made without departing from the spirit and scope of the invention.
It will be understood that while conductive path 14 has been illustrated as being applied to the same surface of substrate 11 as reagent matrices 12 and 13 theoretically, at least, there is no reason why conductive path 14 could not be applied to the opposite sur~ace of substrate 11 or even applied to the one of the edges of substrate 11.
In Fi~s. 1 and 2 conductive path 14 is shown in an elongated rectangular configurat.ion. It will be understood that this particular configuration is a convenient one but that other configurations can be employed including those illustrated in Figs. 3 and 4 as well as serpentine or other more complex config-urations or shapes. A "V" shape configuration is easy to apply and useful in aligning a test device.
Conductive networks or paths with more than one conductance path of resistance can also be applied.
The size of the conductive path 14 needs to be sufficient to easily facilitate contact with elec-trodes or probes for purpose of determining a ratio of resistance in the conductive path and thus the size o~ conductive path 14 can actually be determined by the type of material used, convenienc~ in making the measurements and the location of the conductive path on a test device.
The test device 20 illustrated in Fig. 3 is similar to that of test device lO illustrated in Figs. 1 and 2. Reagent matrices 22 and 23 correspond to reagent matrices 12 and 13, respectively. Fig. 3, however, illustrates a conductive path 24 which 6~
extends at right angles across the substrate 21 rather than lengthwise, as in Fig. 1~ In Fig. 3 a resistance ratio is obtained from the resistance value between contact points 25 and 26, and the resistance value between con~act points 27 and 28.
In Fig. ~'l test device 30 is illustrated with reagent matrices 32 and 33 attached to substrate 31 and a "T-shaped" conductive path formed by conductive members 34 and 35. Conductive members 34 and 35 can, if desired, be made from the same or di~ferent conductive materials. Fig. 4 illustrates an elec-trical connection being made from probe contact points 36 and 37 through power source 38 and meter 39. This permits a first conductive measurement to be made. A second electrical connection is shown being made from probe contact points 36 and 4n through power source 41 and meter 42. This permits a second conductive measurement to be made which is then ratioed with the first conductive measurement.
The embodiment of Fig. 4 is particularly useful in assuring proper alignment between the test device and instrumentation employed for measurement of a test device since probes must contact points 36, 37 and 40 in order for any ratio signal to be generated.
Still another embodiment of the invention is illustrated in Fig. 5 by test device 50. This test device comprises a multilayered member having a substrate 51 and an intermediate layer 52. Conduc-tive material 56 and reagent matrices 54 and 55 are present in intermediate layer 52. A top or overcoat protective layer 53 is applied to intermediate layer 52. It is necessary for probes 57, 58 and 59 to physically penetrate the overcoat or top layer 53 in MS-1~29 6()~63 the manner shown and contact conductive material 56 thereby permitting resistance ratio measurements to be made.
It will be understood that other configurations of multilayered devices are possible and that Fig. 5 illustrates only one particular embodimentO
~ nother approach is illustrated in Figs. 6 and 7 for measuriny resistance ratios. These figures illustrate a reagent test device 60 comprising reagent matrix 62 attached to substrate 61. Also present on substrate 61 are conductive areas 64 which are separated by resistance materials 65 and 66. By using two probes to contact the metal conductor portions 64 on either side of resistance element 65 and the metal conductor portions 64 on either side of resistance element 66 a ratio of resistances can be obtained which is then used to convey information pertaining to the identification, positioning, nature of the test device or calibration. Alternatively, three probes can be utilized to simultaneously contact metal conductive portions 64 of test device 60 and thereby obtain a ratio of resistance values.
Thus the absolute value of resistance is not impor-tant but only the ratio of resistances. Normally the resistance values of resistance materials 65 and 66 will be quite different such that a distinct ratio of the two resistance values will be obtained. While it is not necessary to limit the ratio to a ratio of two values, normally only two resistance materials are required and additional resistance materials only add to the expense and complicate manufacturing proce-dures.
.~26~)063 Metal conductor areas 64 can be formed from any suitahle conductive materia] and applied to substrate 61 in any suitable fashion. Similarly, resistance elements 65 and 66 can be formed from any suitable resistance materials and applied in any suitable fashion to substrate 6]. The conductive and resis-tive areas must be contiguous (i.e., in electrical contact) so that it is possible to obtain a con-ductance value by contacting metal conductors 64 with probes.
In a preferred embodiment the conductive and resistive materials are applied to substrate 61 using thiclc film techniques for depositing various mixtures of conductive materials and resistive materials to the substrate. Such techniques normally involve applying the materials by a printing or silk screen-ing process. However, a paste mixture can be applied by doctor blade to substrate 61. Among the thick film screen printable resistor pastes are those of Thick Film Systems of Santa Barbara, California, designated by the name Powerohm 850 series, which are resistive formulations of screen printable paste for thick film applications normally applied in microcircuits or for discrete components which require high reliability and close control of prop-erties. The resistance values for such materials can vary over a wide range, varying from a few hundred ohms to several hundred thousand ohms. The actual value of resistance is not important as long as it can be measured. Of course, in the case of the embodiment illustrated in Figs. 6 and 7 there is a difference between the resistance values of elements 65 and 66.
;3 - 1~
The invention solves several problems associated with the use of test devices. First of all, the calibration strip can be used to identify a particu-lar test device and "program'l instrumentation to 'Iread'' that particular test device. Secondly, the calibration strip can be used to indicate the correct placement or positioning of a test device in an instrument. One recurrent problem with reagent strip measurement lies in the improper positioning of the reactive areas of the test device in the optical path o~ an instrument. Despite the presence of mechanical guides and optical signals used to help detect errors in positioning, such errors still occur. The conduc-tive path can be used to replace other erxor detec-tion means or supplement other means used to test forproper positioning. As indicated above, the "T-shaped" configuration illustrated in Fig. 4 is one configuration which requixes a positive signal as an indication that strip positioning along two axes is correct. Obviously, more complicated networks of conductance can be used for checking the position of a test device.
Finally, the conductive strip of the present invention permits system calibration to occur.
Signals from a conductive region can be used to select or program calibration parameters specific ~or an assay on a test device. Based on the ratio of resistance values obtained, the wavelength and/or time period for making a reading and/or mathematical evaluation applied to a reading can be selected automatically by a measuring instrument. Other methods of system calibration such as live cali-bration, and the like, are subject to user errors.
MS~1429 ~6~)~)6~
~hile such methods are fundamental to preparing a system for use, they are peripheral to the primary task of sample application and measurement. Conse-quently, errors that occur during calibration can significantly limit system performance. At a minimum the necessity of such calibration reduces operator convenience. The use of a conductive path on the test device which i5 used to obtain a ratio measurement directly by the instrument and which is used in calibrating the instrument requires very little user involvement and is less prone to user variability or error during the calibration proce-dure. No movement of the sensors or probes relative to the reagent strip is required. System convenience is increased because fewer operating techniques must be learned and the familiar methods of sample applica-tion and reagent strip measurement are not altered.
From the foregoing, it will be seen that this invention is well adapted to attain all of the ends and objects hereinabove set forth, together with other advantages which obvious and which are inherent to the system. The described system requires only static contact between three or more probes and one or more conductive strips. There is no encoding and decoding of data bits from a surface. The conductive strip is not altered by exposure to electrical or magnetic devices and the conductive strip is not a field effect device in which information must be coded entirely within the device. The conductive strip can be easily attached on or incorporated in a test device at low cost. Existing technology con-cerning manufacture of test devices does not have to be altered in order to include conductive paths in MS~1429 ~ ~0063 accordance with the present invention. The ratioing of resistance values (or conductance values) also tends to compensate for correlated errors and avoids many of the problems associated with attempting to obtain an absolute resistance value.
Obviously, many other modifications and varia-tions of the invention as hereinbefore set forth can be made without departing from the spirit and scope of the invention.
Claims (2)
1. A method for identifying a reagent test device having an electrically conductive region and calibrating a reagent test device measuring instrument for the identified reagent test device comprising contacting a conductive region of a reagent test device in a first location with electrical probes to make a first resistance or conductance measurement signal, contacting the same or a different conductive region of said reagent test device in a second location with electrical probes to make a second resistance or conductance measurement signal, ratioing the first and second measurement signals, and transmitting the ratioed signals to an instrument, thereby identifying the reagent test device and calibrating said instrument.
2. The method of claim 1 in which one conductive region having uniform conductance is present and the two measurement signals are obtained by contacting the conductive region at nonequidistant contact points with three electrical probes and then applying a current through two probes at a time to obtain said first and second measurement signals.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US797,214 | 1985-11-12 | ||
US06/797,214 US4714874A (en) | 1985-11-12 | 1985-11-12 | Test strip identification and instrument calibration |
Publications (1)
Publication Number | Publication Date |
---|---|
CA1260063A true CA1260063A (en) | 1989-09-26 |
Family
ID=25170232
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA000517252A Expired CA1260063A (en) | 1985-11-12 | 1986-08-29 | Test strip identification |
Country Status (6)
Country | Link |
---|---|
US (1) | US4714874A (en) |
EP (1) | EP0225474B1 (en) |
JP (1) | JPS62113064A (en) |
AU (1) | AU570860B2 (en) |
CA (1) | CA1260063A (en) |
DE (1) | DE3675900D1 (en) |
Families Citing this family (111)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL8602368A (en) * | 1986-09-18 | 1988-04-18 | Tno | RECORD FOR DETERMINING CONTAMINATIONS IN TISSUE. |
US4797622A (en) * | 1987-04-01 | 1989-01-10 | American Telephone And Telegraph Company At&T Bell Laboratories | Technique for determining the values of circuit elements in a three terminal equivalent circuit |
US5053199A (en) * | 1989-02-21 | 1991-10-01 | Boehringer Mannheim Corporation | Electronically readable information carrier |
US4999582A (en) * | 1989-12-15 | 1991-03-12 | Boehringer Mannheim Corp. | Biosensor electrode excitation circuit |
US5124661A (en) * | 1990-07-23 | 1992-06-23 | I-Stat Corporation | Reusable test unit for simulating electrochemical sensor signals for quality assurance of portable blood analyzer instruments |
CA2153883C (en) * | 1993-06-08 | 1999-02-09 | Bradley E. White | Biosensing meter which detects proper electrode engagement and distinguishes sample and check strips |
US6335203B1 (en) | 1994-09-08 | 2002-01-01 | Lifescan, Inc. | Optically readable strip for analyte detection having on-strip orientation index |
US5563031A (en) * | 1994-09-08 | 1996-10-08 | Lifescan, Inc. | Highly stable oxidative coupling dye for spectrophotometric determination of analytes |
US5515170A (en) * | 1994-09-08 | 1996-05-07 | Lifescan, Inc. | Analyte detection device having a serpentine passageway for indicator strips |
US5526120A (en) * | 1994-09-08 | 1996-06-11 | Lifescan, Inc. | Test strip with an asymmetrical end insuring correct insertion for measuring |
WO1996007908A1 (en) * | 1994-09-08 | 1996-03-14 | Lifescan, Inc. | Optically readable strip for analyte detection having on-strip standard |
EP2006669A3 (en) * | 1997-07-22 | 2008-12-31 | Kyoto Daiichi Kagaku Co., Ltd. | Concentration measuring apparatus and test strip for the concentration measuring apparatus |
US6071391A (en) * | 1997-09-12 | 2000-06-06 | Nok Corporation | Enzyme electrode structure |
US7407811B2 (en) | 1997-12-22 | 2008-08-05 | Roche Diagnostics Operations, Inc. | System and method for analyte measurement using AC excitation |
US7494816B2 (en) | 1997-12-22 | 2009-02-24 | Roche Diagnostic Operations, Inc. | System and method for determining a temperature during analyte measurement |
US7390667B2 (en) | 1997-12-22 | 2008-06-24 | Roche Diagnostics Operations, Inc. | System and method for analyte measurement using AC phase angle measurements |
US8071384B2 (en) | 1997-12-22 | 2011-12-06 | Roche Diagnostics Operations, Inc. | Control and calibration solutions and methods for their use |
US6103033A (en) | 1998-03-04 | 2000-08-15 | Therasense, Inc. | Process for producing an electrochemical biosensor |
US8974386B2 (en) | 1998-04-30 | 2015-03-10 | Abbott Diabetes Care Inc. | Analyte monitoring device and methods of use |
US8480580B2 (en) | 1998-04-30 | 2013-07-09 | Abbott Diabetes Care Inc. | Analyte monitoring device and methods of use |
US6175752B1 (en) | 1998-04-30 | 2001-01-16 | Therasense, Inc. | Analyte monitoring device and methods of use |
US8465425B2 (en) * | 1998-04-30 | 2013-06-18 | Abbott Diabetes Care Inc. | Analyte monitoring device and methods of use |
US6949816B2 (en) * | 2003-04-21 | 2005-09-27 | Motorola, Inc. | Semiconductor component having first surface area for electrically coupling to a semiconductor chip and second surface area for electrically coupling to a substrate, and method of manufacturing same |
US8688188B2 (en) | 1998-04-30 | 2014-04-01 | Abbott Diabetes Care Inc. | Analyte monitoring device and methods of use |
US8346337B2 (en) | 1998-04-30 | 2013-01-01 | Abbott Diabetes Care Inc. | Analyte monitoring device and methods of use |
US9066695B2 (en) | 1998-04-30 | 2015-06-30 | Abbott Diabetes Care Inc. | Analyte monitoring device and methods of use |
US6377894B1 (en) | 1998-11-30 | 2002-04-23 | Abbott Laboratories | Analyte test instrument having improved calibration and communication processes |
EP2228653B1 (en) * | 1998-11-30 | 2016-04-13 | Abbott Laboratories | Multichemistry measuring device and test strips |
US20050103624A1 (en) | 1999-10-04 | 2005-05-19 | Bhullar Raghbir S. | Biosensor and method of making |
US20060091006A1 (en) * | 1999-11-04 | 2006-05-04 | Yi Wang | Analyte sensor with insertion monitor, and methods |
US6616819B1 (en) | 1999-11-04 | 2003-09-09 | Therasense, Inc. | Small volume in vitro analyte sensor and methods |
CN1632553A (en) | 1999-11-15 | 2005-06-29 | 松下电器产业株式会社 | Biosensor, method of forming thin-film electrode, and method and apparatus for quantitative determination |
US6720157B2 (en) * | 2000-02-23 | 2004-04-13 | Zyomyx, Inc. | Chips having elevated sample surfaces |
US6462818B1 (en) | 2000-06-22 | 2002-10-08 | Kla-Tencor Corporation | Overlay alignment mark design |
US7541201B2 (en) | 2000-08-30 | 2009-06-02 | Kla-Tencor Technologies Corporation | Apparatus and methods for determining overlay of structures having rotational or mirror symmetry |
US7068833B1 (en) | 2000-08-30 | 2006-06-27 | Kla-Tencor Corporation | Overlay marks, methods of overlay mark design and methods of overlay measurements |
US6486954B1 (en) | 2000-09-01 | 2002-11-26 | Kla-Tencor Technologies Corporation | Overlay alignment measurement mark |
US6560471B1 (en) | 2001-01-02 | 2003-05-06 | Therasense, Inc. | Analyte monitoring device and methods of use |
US6842855B2 (en) * | 2001-01-26 | 2005-01-11 | Dell Products L.P. | System and method for providing information to a computer system |
US6814844B2 (en) | 2001-08-29 | 2004-11-09 | Roche Diagnostics Corporation | Biosensor with code pattern |
US6997343B2 (en) * | 2001-11-14 | 2006-02-14 | Hypoguard Limited | Sensor dispensing device |
US20030111357A1 (en) * | 2001-12-13 | 2003-06-19 | Black Murdo M. | Test meter calibration |
US7804994B2 (en) * | 2002-02-15 | 2010-09-28 | Kla-Tencor Technologies Corporation | Overlay metrology and control method |
US20030169426A1 (en) * | 2002-03-08 | 2003-09-11 | Peterson Timothy A. | Test member orientation |
US6964871B2 (en) * | 2002-04-25 | 2005-11-15 | Home Diagnostics, Inc. | Systems and methods for blood glucose sensing |
US6946299B2 (en) * | 2002-04-25 | 2005-09-20 | Home Diagnostics, Inc. | Systems and methods for blood glucose sensing |
US20080112852A1 (en) * | 2002-04-25 | 2008-05-15 | Neel Gary T | Test Strips and System for Measuring Analyte Levels in a Fluid Sample |
US6743635B2 (en) * | 2002-04-25 | 2004-06-01 | Home Diagnostics, Inc. | System and methods for blood glucose sensing |
US7250095B2 (en) * | 2002-07-11 | 2007-07-31 | Hypoguard Limited | Enzyme electrodes and method of manufacture |
US7264139B2 (en) * | 2003-01-14 | 2007-09-04 | Hypoguard Limited | Sensor dispensing device |
EP1611844A4 (en) * | 2003-04-03 | 2007-08-01 | Pioneer Corp | Living body information detecting device, contact member used therefor, and living body information detecting member-use paint |
US7075639B2 (en) | 2003-04-25 | 2006-07-11 | Kla-Tencor Technologies Corporation | Method and mark for metrology of phase errors on phase shift masks |
US7718439B2 (en) | 2003-06-20 | 2010-05-18 | Roche Diagnostics Operations, Inc. | System and method for coding information on a biosensor test strip |
US8058077B2 (en) | 2003-06-20 | 2011-11-15 | Roche Diagnostics Operations, Inc. | Method for coding information on a biosensor test strip |
US8148164B2 (en) | 2003-06-20 | 2012-04-03 | Roche Diagnostics Operations, Inc. | System and method for determining the concentration of an analyte in a sample fluid |
US7645421B2 (en) | 2003-06-20 | 2010-01-12 | Roche Diagnostics Operations, Inc. | System and method for coding information on a biosensor test strip |
US8071030B2 (en) | 2003-06-20 | 2011-12-06 | Roche Diagnostics Operations, Inc. | Test strip with flared sample receiving chamber |
US8679853B2 (en) | 2003-06-20 | 2014-03-25 | Roche Diagnostics Operations, Inc. | Biosensor with laser-sealed capillary space and method of making |
PT1639352T (en) | 2003-06-20 | 2018-07-09 | Hoffmann La Roche | Method and reagent for producing narrow, homogenous reagent strips |
US7488601B2 (en) | 2003-06-20 | 2009-02-10 | Roche Diagnostic Operations, Inc. | System and method for determining an abused sensor during analyte measurement |
US7645373B2 (en) | 2003-06-20 | 2010-01-12 | Roche Diagnostic Operations, Inc. | System and method for coding information on a biosensor test strip |
US8206565B2 (en) | 2003-06-20 | 2012-06-26 | Roche Diagnostics Operation, Inc. | System and method for coding information on a biosensor test strip |
US7597793B2 (en) | 2003-06-20 | 2009-10-06 | Roche Operations Ltd. | System and method for analyte measurement employing maximum dosing time delay |
US7452457B2 (en) | 2003-06-20 | 2008-11-18 | Roche Diagnostics Operations, Inc. | System and method for analyte measurement using dose sufficiency electrodes |
US7604721B2 (en) | 2003-06-20 | 2009-10-20 | Roche Diagnostics Operations, Inc. | System and method for coding information on a biosensor test strip |
US7346878B1 (en) | 2003-07-02 | 2008-03-18 | Kla-Tencor Technologies Corporation | Apparatus and methods for providing in-chip microtargets for metrology or inspection |
US7608468B1 (en) * | 2003-07-02 | 2009-10-27 | Kla-Tencor Technologies, Corp. | Apparatus and methods for determining overlay and uses of same |
US9012232B2 (en) | 2005-07-15 | 2015-04-21 | Nipro Diagnostics, Inc. | Diagnostic strip coding system and related methods of use |
US20050150762A1 (en) * | 2004-01-09 | 2005-07-14 | Butters Colin W. | Biosensor and method of manufacture |
EP1713926B1 (en) | 2004-02-06 | 2012-08-01 | Bayer HealthCare, LLC | Oxidizable species as an internal reference for biosensors and method of use |
US7569126B2 (en) | 2004-06-18 | 2009-08-04 | Roche Diagnostics Operations, Inc. | System and method for quality assurance of a biosensor test strip |
US7556723B2 (en) | 2004-06-18 | 2009-07-07 | Roche Diagnostics Operations, Inc. | Electrode design for biosensor |
US7601299B2 (en) * | 2004-06-18 | 2009-10-13 | Roche Diagnostics Operations, Inc. | System and method for coding information on a biosensor test strip |
US7557921B1 (en) | 2005-01-14 | 2009-07-07 | Kla-Tencor Technologies Corporation | Apparatus and methods for optically monitoring the fidelity of patterns produced by photolitographic tools |
TWI265677B (en) * | 2005-06-01 | 2006-11-01 | Bionime Corp | Coding module, bio measuring meter and system for operating bio measuring meter |
US8594943B2 (en) * | 2005-05-27 | 2013-11-26 | Bionime Gmbh | Coding module, a bio sensing meter and a system for operating a bio sensing meter |
US8999125B2 (en) | 2005-07-15 | 2015-04-07 | Nipro Diagnostics, Inc. | Embedded strip lot autocalibration |
KR101321296B1 (en) | 2005-07-20 | 2013-10-28 | 바이엘 헬스케어 엘엘씨 | Gated amperometry temperature determination |
JP5671205B2 (en) | 2005-09-30 | 2015-02-18 | バイエル・ヘルスケア・エルエルシー | Gated voltammetry |
ES2825036T3 (en) | 2006-10-24 | 2021-05-14 | Ascensia Diabetes Care Holdings Ag | Transient decay amperometry |
WO2008076212A1 (en) * | 2006-12-13 | 2008-06-26 | Bayer Healthcare Llc | Biosensor with coded information and method for manufacturing the same |
KR20080080841A (en) | 2007-03-02 | 2008-09-05 | 주식회사 아이센스 | Electrochemical biosensor |
US8206564B2 (en) * | 2007-07-23 | 2012-06-26 | Bayer Healthcare Llc | Biosensor calibration system |
KR100896234B1 (en) * | 2007-08-10 | 2009-05-08 | 주식회사 아이센스 | Electrochemical biosensor and measuring instrument thereof |
KR100915383B1 (en) * | 2007-09-04 | 2009-09-03 | 주식회사 휴빛 | Biosensor and readout meter |
KR20100083142A (en) * | 2007-10-10 | 2010-07-21 | 아가매트릭스, 인코포레이티드 | Identification method for electro chemical test strips |
TW200918896A (en) * | 2007-10-19 | 2009-05-01 | Hmd Biomedical Inc | Test stripe with identification function and testing device thereof |
US8241488B2 (en) | 2007-11-06 | 2012-08-14 | Bayer Healthcare Llc | Auto-calibrating test sensors |
US7809512B2 (en) * | 2007-11-11 | 2010-10-05 | Bayer Healthcare Llc | Biosensor coding system |
WO2009076302A1 (en) | 2007-12-10 | 2009-06-18 | Bayer Healthcare Llc | Control markers for auto-detection of control solution and methods of use |
WO2009076263A1 (en) * | 2007-12-10 | 2009-06-18 | Bayer Healthcare Llc | An auto-calibrating test sensor and method of making the same |
DE102008016763B4 (en) * | 2008-04-02 | 2009-12-24 | Dräger Safety AG & Co. KGaA | Apparatus and method for chromatographic detection of a substance |
US20100000862A1 (en) | 2008-07-07 | 2010-01-07 | Agamatrix, Inc. | Integrated Blood Glucose Measurement Device |
US8032321B2 (en) * | 2008-07-15 | 2011-10-04 | Bayer Healthcare Llc | Multi-layered biosensor encoding systems |
KR101013184B1 (en) | 2008-08-22 | 2011-02-10 | 주식회사 아이센스 | Biosensor measuring apparatus and a method thereof |
EP2344863A2 (en) | 2008-10-21 | 2011-07-20 | Bayer HealthCare LLC | Optical auto-calibration method |
US20100249965A1 (en) * | 2009-03-31 | 2010-09-30 | Agamatrix, Inc. | Integrated Blood Glucose Measurement Device |
US9927718B2 (en) | 2010-08-03 | 2018-03-27 | Kla-Tencor Corporation | Multi-layer overlay metrology target and complimentary overlay metrology measurement systems |
KR20130075776A (en) | 2010-09-17 | 2013-07-05 | 아가매트릭스, 인코포레이티드 | Method and apparatus for encoding test strips |
US10890436B2 (en) | 2011-07-19 | 2021-01-12 | Kla Corporation | Overlay targets with orthogonal underlayer dummyfill |
CN102967637B (en) | 2012-03-31 | 2016-07-06 | 艾康生物技术(杭州)有限公司 | Automatic encoding device and biosensor and the manufacture method with this device |
US10168313B2 (en) | 2013-03-15 | 2019-01-01 | Agamatrix, Inc. | Analyte detection meter and associated method of use |
KR102090578B1 (en) * | 2013-05-06 | 2020-03-19 | 삼성디스플레이 주식회사 | Substrate of electronic device, electronic device including the same and measuring method of resistance at contact portion |
US9354194B2 (en) | 2013-06-19 | 2016-05-31 | Cilag Gmbh International | Orientation independent meter |
US10451412B2 (en) | 2016-04-22 | 2019-10-22 | Kla-Tencor Corporation | Apparatus and methods for detecting overlay errors using scatterometry |
CH712764A2 (en) * | 2016-07-22 | 2018-01-31 | Tecan Trading Ag | Pipette tip comprising a volume measuring electrode and method for their preparation and pipetting device. |
CH712735A1 (en) * | 2016-07-22 | 2018-01-31 | Tecan Trading Ag | Pipetting device with a liquid volume sensor and liquid processing system. |
WO2018015419A1 (en) * | 2016-07-22 | 2018-01-25 | Tecan Trading Ag | Pipette tip for an automated pipetting device and production method thereof |
CN109856458B (en) * | 2019-03-20 | 2024-01-30 | 桂林电子科技大学 | Automatic detection device for multiple performances of zebra stripes |
CN110320241A (en) * | 2019-07-28 | 2019-10-11 | 北京怡成生物电子技术股份有限公司 | The recognition methods of target strip and system |
US20220057358A1 (en) * | 2020-08-20 | 2022-02-24 | Polymer Technology Systems, Inc. | Systems and Methods for a Test Strip Calibrator Simulating an Electrochemical Test Strip |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2785057A (en) * | 1953-12-08 | 1957-03-12 | Union Central Life Insurance C | Device for testing liquids |
US3000498A (en) * | 1957-05-20 | 1961-09-19 | Post Office | Sorting methods |
US3808527A (en) * | 1973-06-28 | 1974-04-30 | Ibm | Alignment determining system |
AT336320B (en) * | 1975-06-10 | 1977-04-25 | Gao Ges Automation Org | RECORDING CARRIERS, SUCH AS ID CARD, CHECK CARD AND THE LIKE, WITH MACHINELY VERIFICABLE SECURITY FEATURES OR. INFORMATION AND PROCEDURES FOR MACHINE TESTING AND READING THE SAFETY FEATURES AND INFORMATION |
US4382063A (en) * | 1979-09-10 | 1983-05-03 | Parke-Davis Company | Sterile indicator device |
US4344064A (en) * | 1979-12-06 | 1982-08-10 | Western Electric Co., Inc. | Article carrying a distinctive mark |
DE3133826A1 (en) * | 1981-08-27 | 1983-03-10 | Boehringer Mannheim Gmbh, 6800 Mannheim | ANALYSIS TEST STRIP AND METHOD FOR THE PRODUCTION THEREOF |
US4538105A (en) * | 1981-12-07 | 1985-08-27 | The Perkin-Elmer Corporation | Overlay test wafer |
DE3221500A1 (en) * | 1982-06-07 | 1983-12-08 | Max-E. Dipl.-Ing. 7320 Göppingen Reeb | IDENTIFICATION ARRANGEMENT IN THE FORM OF AN OBJECT TO BE ATTACHED TO AN OBJECT, AND METHOD FOR THE PRODUCTION THEREOF |
DE3326689A1 (en) * | 1983-07-23 | 1985-01-31 | Boehringer Mannheim Gmbh, 6800 Mannheim | METHOD AND DEVICE FOR PRODUCING A TEST STRIP |
JPS60133358A (en) * | 1983-12-21 | 1985-07-16 | Fuji Photo Film Co Ltd | Analytical slide and apparatus thereof |
JPS60133359A (en) * | 1983-12-21 | 1985-07-16 | Fuji Photo Film Co Ltd | Analysis slide and analyzer |
DE8505228U1 (en) * | 1985-02-23 | 1985-05-09 | Frank Oeser Produktion, 1000 Berlin | Codable label |
US4618475A (en) * | 1985-08-30 | 1986-10-21 | Miles Laboratories, Inc. | Reagent test device containing hydrophobic barriers |
-
1985
- 1985-11-12 US US06/797,214 patent/US4714874A/en not_active Expired - Fee Related
-
1986
- 1986-08-29 CA CA000517252A patent/CA1260063A/en not_active Expired
- 1986-10-31 EP EP86115132A patent/EP0225474B1/en not_active Expired
- 1986-10-31 DE DE8686115132T patent/DE3675900D1/en not_active Expired - Fee Related
- 1986-11-04 JP JP61260838A patent/JPS62113064A/en active Granted
- 1986-11-10 AU AU64985/86A patent/AU570860B2/en not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
JPH0463343B2 (en) | 1992-10-09 |
EP0225474B1 (en) | 1990-11-28 |
AU6498586A (en) | 1987-05-14 |
DE3675900D1 (en) | 1991-01-10 |
US4714874A (en) | 1987-12-22 |
EP0225474A1 (en) | 1987-06-16 |
JPS62113064A (en) | 1987-05-23 |
AU570860B2 (en) | 1988-03-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CA1260063A (en) | Test strip identification | |
EP0840122B1 (en) | Method and apparatus for calibrating a sensor element | |
US7316929B2 (en) | Auto-calibration label and apparatus comprising same | |
US7918121B2 (en) | Meter system designed to run singulated test sensors | |
US7955856B2 (en) | Method of making a diagnostic test strip having a coding system | |
AU725457B2 (en) | Densitometer, test piece for the densitometer, biosensor system, and method for forming terminal of the test piece | |
US8029735B2 (en) | System and method for transferring calibration data | |
US9012232B2 (en) | Diagnostic strip coding system and related methods of use | |
US7809512B2 (en) | Biosensor coding system | |
AU2007275548B2 (en) | Diagnostic strip coding system with conductive layers | |
EP1135679B1 (en) | Multichemistry measuring device and test strips | |
CA1210064A (en) | Potassium ion-selective electrode | |
EP0148936B1 (en) | Temperature measurement apparatus | |
JPH02216057A (en) | Test carrier analysis system | |
AU2006270355C1 (en) | Diagnostic strip coding system and related methods of use | |
MXPA00000733A (en) | Densitometer, test piece for the densitometer, biosensor system, and method for forming terminal of the test piece |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MKEX | Expiry | ||
MKEX | Expiry |
Effective date: 20060926 |