JPH03269681A
(en)
*
|
1990-03-19 |
1991-12-02 |
Sharp Corp |
Picture recognizing device
|
IL99823A0
(en)
*
|
1990-11-16 |
1992-08-18 |
Orbot Instr Ltd |
Optical inspection method and apparatus
|
US5365084A
(en)
*
|
1991-02-20 |
1994-11-15 |
Pressco Technology, Inc. |
Video inspection system employing multiple spectrum LED illumination
|
US5172005A
(en)
*
|
1991-02-20 |
1992-12-15 |
Pressco Technology, Inc. |
Engineered lighting system for tdi inspection comprising means for controlling lighting elements in accordance with specimen displacement
|
DE4222804A1
(en)
*
|
1991-07-10 |
1993-04-01 |
Raytheon Co |
Automatic visual tester for electrical and electronic components - performs video scans of different surfaces with unequal intensities of illumination by annular and halogen lamps
|
US5260779A
(en)
*
|
1992-02-21 |
1993-11-09 |
Control Automation, Inc. |
Method and apparatus for inspecting a printed circuit board
|
US5461417A
(en)
*
|
1993-02-16 |
1995-10-24 |
Northeast Robotics, Inc. |
Continuous diffuse illumination method and apparatus
|
US5517235A
(en)
*
|
1993-11-03 |
1996-05-14 |
Control Automation, Inc. |
Method and apparatus for inspecting printed circuit boards at different magnifications
|
US5418879A
(en)
*
|
1994-04-04 |
1995-05-23 |
Chrysler Corporation |
Distributed light delivery system
|
US5842060A
(en)
*
|
1994-10-31 |
1998-11-24 |
Northeast Robotics Llc |
Illumination device with curved beam splitter for illumination an object with continuous diffuse light
|
US5761540A
(en)
*
|
1994-10-31 |
1998-06-02 |
Northeast Robotics, Inc. |
Illumination device with microlouver for illuminating an object with continuous diffuse light
|
US5539485A
(en)
*
|
1994-10-31 |
1996-07-23 |
White; Timothy P. |
Illumination device for providing continuous diffuse light on and off an observing axis
|
US5764874A
(en)
*
|
1994-10-31 |
1998-06-09 |
Northeast Robotics, Inc. |
Imaging system utilizing both diffuse and specular reflection characteristics
|
US5604550A
(en)
*
|
1994-10-31 |
1997-02-18 |
Northeast Robotics, Inc. |
Illumination device for indirectly illuminating an object with continuous diffuse light
|
US6017133A
(en)
*
|
1994-12-30 |
2000-01-25 |
Siemens Aktiengesellschaft |
Device for recognizing the position of the terminals of components
|
JP2775411B2
(en)
*
|
1995-07-25 |
1998-07-16 |
名古屋電機工業株式会社 |
Lighting equipment for printed wiring board inspection equipment
|
US5713661A
(en)
*
|
1995-10-23 |
1998-02-03 |
Northeast Robotics, Inc. |
Hockey puck shaped continuous diffuse illumination apparatus and method
|
US5859924A
(en)
*
|
1996-07-12 |
1999-01-12 |
Robotic Vision Systems, Inc. |
Method and system for measuring object features
|
US6219442B1
(en)
|
1996-10-08 |
2001-04-17 |
International Business Machines Corporation |
Apparatus and method for measuring distortion of a visible pattern on a substrate by viewing predetermined portions thereof
|
DE19643017C1
(en)
*
|
1996-10-18 |
1998-04-23 |
Innomess Ges Fuer Messtechnik |
Procedure for the determination of optical defects in large panes
|
US6075883A
(en)
|
1996-11-12 |
2000-06-13 |
Robotic Vision Systems, Inc. |
Method and system for imaging an object or pattern
|
US5760893A
(en)
*
|
1996-12-24 |
1998-06-02 |
Teradyne, Inc. |
Method and apparatus for inspecting component placement and solder connection in printed circuit board manufacture
|
US5862973A
(en)
*
|
1997-01-30 |
1999-01-26 |
Teradyne, Inc. |
Method for inspecting solder paste in printed circuit board manufacture
|
US6624597B2
(en)
|
1997-08-26 |
2003-09-23 |
Color Kinetics, Inc. |
Systems and methods for providing illumination in machine vision systems
|
US20030133292A1
(en)
|
1999-11-18 |
2003-07-17 |
Mueller George G. |
Methods and apparatus for generating and modulating white light illumination conditions
|
US6095661A
(en)
|
1998-03-19 |
2000-08-01 |
Ppt Vision, Inc. |
Method and apparatus for an L.E.D. flashlight
|
US7740371B1
(en)
|
1998-03-19 |
2010-06-22 |
Charles A. Lemaire |
Method and apparatus for pulsed L.E.D. illumination for a camera
|
US20040114035A1
(en)
*
|
1998-03-24 |
2004-06-17 |
Timothy White |
Focusing panel illumination method and apparatus
|
WO2000003198A1
(en)
|
1998-07-08 |
2000-01-20 |
Ppt Vision, Inc. |
Machine vision and semiconductor handling
|
US6956963B2
(en)
*
|
1998-07-08 |
2005-10-18 |
Ismeca Europe Semiconductor Sa |
Imaging for a machine-vision system
|
US7353954B1
(en)
|
1998-07-08 |
2008-04-08 |
Charles A. Lemaire |
Tray flipper and method for parts inspection
|
JP3299193B2
(en)
*
|
1998-08-21 |
2002-07-08 |
日本電気株式会社 |
Bump inspection method / apparatus, information storage medium
|
US6207946B1
(en)
*
|
1998-09-03 |
2001-03-27 |
Semiconductor Technologies & Instruments, Inc. |
Adaptive lighting system and method for machine vision apparatus
|
US6273338B1
(en)
|
1998-09-22 |
2001-08-14 |
Timothy White |
Low cost color-programmable focusing ring light
|
US6788411B1
(en)
|
1999-07-08 |
2004-09-07 |
Ppt Vision, Inc. |
Method and apparatus for adjusting illumination angle
|
IE20000838A1
(en)
|
1999-10-18 |
2001-05-16 |
Mv Res Ltd |
Machine vision
|
US7075565B1
(en)
*
|
2000-06-14 |
2006-07-11 |
Landrex Technologies Co., Ltd. |
Optical inspection system
|
US6486963B1
(en)
|
2000-06-20 |
2002-11-26 |
Ppt Vision, Inc. |
Precision 3D scanner base and method for measuring manufactured parts
|
US6509559B1
(en)
|
2000-06-20 |
2003-01-21 |
Ppt Vision, Inc. |
Binary optical grating and method for generating a moire pattern for 3D imaging
|
US6501554B1
(en)
|
2000-06-20 |
2002-12-31 |
Ppt Vision, Inc. |
3D scanner and method for measuring heights and angles of manufactured parts
|
US6760471B1
(en)
*
|
2000-06-23 |
2004-07-06 |
Teradyne, Inc. |
Compensation system and related techniques for use in a printed circuit board inspection system
|
US6850637B1
(en)
*
|
2000-06-28 |
2005-02-01 |
Teradyne, Inc. |
Lighting arrangement for automated optical inspection system
|
WO2002018913A2
(en)
*
|
2000-09-01 |
2002-03-07 |
Color Kinetics Incorporated |
Systems and methods for providing illumination in machine vision systems
|
US7042172B2
(en)
|
2000-09-01 |
2006-05-09 |
Color Kinetics Incorporated |
Systems and methods for providing illumination in machine vision systems
|
JP3496644B2
(en)
*
|
2001-01-12 |
2004-02-16 |
シーシーエス株式会社 |
Lighting equipment for inspection
|
JP3433739B2
(en)
*
|
2001-05-18 |
2003-08-04 |
オムロン株式会社 |
Irradiation device and substrate inspection device using the same
|
US7113313B2
(en)
*
|
2001-06-04 |
2006-09-26 |
Agilent Technologies, Inc. |
Dome-shaped apparatus for inspecting a component or a printed circuit board device
|
FR2829344B1
(en)
*
|
2001-08-29 |
2004-10-01 |
Oreal |
DEVICE FOR ACQUIRING AT LEAST ONE IMAGE OF AT LEAST PART OF A PERSON'S FACE OR HAIR
|
JP4155496B2
(en)
*
|
2002-04-25 |
2008-09-24 |
大日本スクリーン製造株式会社 |
Classification support device, classification device, and program
|
US8171567B1
(en)
|
2002-09-04 |
2012-05-01 |
Tracer Detection Technology Corp. |
Authentication method and system
|
TWI258583B
(en)
*
|
2003-01-30 |
2006-07-21 |
Test Research Inc |
Device and method for optical detection of printed circuit board
|
EP1455179A1
(en)
*
|
2003-03-07 |
2004-09-08 |
MV Research Limited |
A machine vision inspection system and method
|
US7171037B2
(en)
*
|
2003-03-20 |
2007-01-30 |
Agilent Technologies, Inc. |
Optical inspection system and method for displaying imaged objects in greater than two dimensions
|
US20040184653A1
(en)
*
|
2003-03-20 |
2004-09-23 |
Baer Richard L. |
Optical inspection system, illumination apparatus and method for use in imaging specular objects based on illumination gradients
|
JP2004093571A
(en)
*
|
2003-09-26 |
2004-03-25 |
Ccs Inc |
Lighting system for inspection
|
WO2005088517A1
(en)
|
2004-03-12 |
2005-09-22 |
Ingenia Technology Limited |
Methods and apparatuses for creating authenticatable printed articles and subsequently verifying them
|
BRPI0508631A
(en)
|
2004-03-12 |
2007-08-07 |
Ingenia Technology Ltd |
apparatus for determining a signature of an article arranged in a reading volume, use of the apparatus, methods for identifying an article made of paper or cardboard, an article made of plastic, a product by its packaging, a document, a garment or footwear, and a disc, method for tagging an article, and, tagged article
|
JP2006047290A
(en)
*
|
2004-06-30 |
2006-02-16 |
Omron Corp |
Image generation method for board inspection, board inspecting device and illumination device for board inspection
|
EP1612569A3
(en)
|
2004-06-30 |
2006-02-08 |
Omron Corporation |
Method and apparatus for substrate surface inspection using multi-color light emission system
|
GB2438424B
(en)
*
|
2004-08-13 |
2008-02-13 |
Ingenia Technology Ltd |
Article manufacturing screen
|
DE102004056698B3
(en)
*
|
2004-11-24 |
2006-08-17 |
Stratus Vision Gmbh |
Inspection device for a substrate having at least one printed layer
|
TWM276556U
(en)
*
|
2005-03-04 |
2005-10-01 |
Biotek Technology Corp |
Improvement of optical system structure for treatment and cosmetology
|
US7344273B2
(en)
|
2005-03-22 |
2008-03-18 |
Binary Works, Inc. |
Ring light with user manipulable control
|
EP1969525A1
(en)
|
2005-12-23 |
2008-09-17 |
Ingenia Holdings (UK)Limited |
Optical authentication
|
KR100833717B1
(en)
*
|
2005-12-26 |
2008-05-29 |
(주) 인텍플러스 |
Vision inspection system
|
SG138491A1
(en)
*
|
2006-06-21 |
2008-01-28 |
Generic Power Pte Ltd |
Method and apparatus for 3-dimensional vision and inspection of ball and like protrusions of electronic components
|
FR2919396B1
(en)
*
|
2007-07-27 |
2010-08-20 |
Clara Vision |
HOUSING AND SHOOTING SYSTEM, IN PARTICULAR FOR THE QUALITY CONTROL OF WELD CORD.
|
US20110175997A1
(en)
*
|
2008-01-23 |
2011-07-21 |
Cyberoptics Corporation |
High speed optical inspection system with multiple illumination imagery
|
KR100956932B1
(en)
*
|
2008-02-16 |
2010-05-10 |
주식회사 에스디티 |
Lighting unit for automatic visual inspection machine
|
WO2009107981A2
(en)
|
2008-02-26 |
2009-09-03 |
주식회사 고영테크놀러지 |
Apparatus and method for measuring a three-dimensional shape
|
WO2009120951A2
(en)
*
|
2008-03-28 |
2009-10-01 |
Nordson Corporation |
Automated conformal coating inspection system and methods of use
|
AT507018B1
(en)
*
|
2008-07-09 |
2012-11-15 |
Profactor Res And Solutions Gmbh |
DEVICE FOR TESTING OBJECTS
|
US7869645B2
(en)
*
|
2008-07-22 |
2011-01-11 |
Seiko Epson Corporation |
Image capture and calibratiion
|
US8269836B2
(en)
*
|
2008-07-24 |
2012-09-18 |
Seiko Epson Corporation |
Image capture, alignment, and registration
|
WO2010068331A1
(en)
|
2008-12-10 |
2010-06-17 |
Applied Materials, Inc. |
Enhanced vision system for screen printing pattern alignment
|
GB2466311B
(en)
|
2008-12-19 |
2010-11-03 |
Ingenia Holdings |
Self-calibration of a matching algorithm for determining authenticity
|
GB2466465B
(en)
*
|
2008-12-19 |
2011-02-16 |
Ingenia Holdings |
Authentication
|
DE102008064562A1
(en)
*
|
2008-12-29 |
2010-07-08 |
Carl Zeiss Oim Gmbh |
Device for optically inspecting an at least partially shiny surface on an object
|
US8388204B2
(en)
*
|
2009-09-22 |
2013-03-05 |
Cyberoptics Corporation |
High speed, high resolution, three dimensional solar cell inspection system
|
US8681211B2
(en)
*
|
2009-09-22 |
2014-03-25 |
Cyberoptics Corporation |
High speed optical inspection system with adaptive focusing
|
US8670031B2
(en)
*
|
2009-09-22 |
2014-03-11 |
Cyberoptics Corporation |
High speed optical inspection system with camera array and compact, integrated illuminator
|
US8872912B2
(en)
*
|
2009-09-22 |
2014-10-28 |
Cyberoptics Corporation |
High speed distributed optical sensor inspection system
|
US8894259B2
(en)
*
|
2009-09-22 |
2014-11-25 |
Cyberoptics Corporation |
Dark field illuminator with large working area
|
GB2476226B
(en)
|
2009-11-10 |
2012-03-28 |
Ingenia Holdings Ltd |
Optimisation
|
WO2012122177A1
(en)
*
|
2011-03-08 |
2012-09-13 |
Spectral Instruments Imaging, LLC |
Imaging system having primary and auxiliary camera systems
|
FI125320B
(en)
*
|
2012-01-05 |
2015-08-31 |
Helmee Imaging Oy |
EVENTS AND SIMILAR OPTICAL MEASUREMENT PROCEDURES
|
US9467609B2
(en)
|
2013-05-10 |
2016-10-11 |
Mettler-Toledo, LLC |
Machine vision inspection systems and methods and aperture covers for use therewith
|
EP2887055B1
(en)
|
2013-12-17 |
2016-05-11 |
CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement |
Method and apparatus for detection of visible defects
|
MX364011B
(en)
*
|
2014-05-05 |
2019-04-11 |
Arconic Inc |
Apparatus and methods for weld measurement.
|
US10091891B2
(en)
*
|
2014-07-11 |
2018-10-02 |
Voltera Inc. |
Apparatus and method for printing circuitry
|
JP2017067633A
(en)
*
|
2015-09-30 |
2017-04-06 |
キヤノン株式会社 |
Checkup apparatus, and manufacturing method
|
FR3054914B1
(en)
*
|
2016-08-03 |
2021-05-21 |
Vit |
OPTICAL INSPECTION METHOD OF AN OBJECT
|
DE102017207071A1
(en)
*
|
2017-04-27 |
2018-10-31 |
Robert Bosch Gmbh |
Test device for optical inspection of an object and object inspection arrangement
|
JP7010057B2
(en)
*
|
2018-02-26 |
2022-01-26 |
オムロン株式会社 |
Image processing system and setting method
|
JP7187782B2
(en)
*
|
2018-03-08 |
2022-12-13 |
オムロン株式会社 |
Image inspection equipment
|