CA2054404A1 - Vertical cavity surface emitting lasers with transparent electrodes - Google Patents
Vertical cavity surface emitting lasers with transparent electrodesInfo
- Publication number
- CA2054404A1 CA2054404A1 CA2054404A CA2054404A CA2054404A1 CA 2054404 A1 CA2054404 A1 CA 2054404A1 CA 2054404 A CA2054404 A CA 2054404A CA 2054404 A CA2054404 A CA 2054404A CA 2054404 A1 CA2054404 A1 CA 2054404A1
- Authority
- CA
- Canada
- Prior art keywords
- surface emitting
- cavity surface
- emitting lasers
- vertical cavity
- transparent electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04252—Electrodes, e.g. characterised by the structure characterised by the material
- H01S5/04253—Electrodes, e.g. characterised by the structure characterised by the material having specific optical properties, e.g. transparent electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18308—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/18—Semiconductor lasers with special structural design for influencing the near- or far-field
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04254—Electrodes, e.g. characterised by the structure characterised by the shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/06209—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in single-section lasers
- H01S5/06216—Pulse modulation or generation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2054—Methods of obtaining the confinement
- H01S5/2059—Methods of obtaining the confinement by means of particular conductivity zones, e.g. obtained by particle bombardment or diffusion
- H01S5/2063—Methods of obtaining the confinement by means of particular conductivity zones, e.g. obtained by particle bombardment or diffusion obtained by particle bombardment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34313—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs
- H01S5/3432—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs the whole junction comprising only (AI)GaAs
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Lasers (AREA)
Abstract
VERTICAL CAVITY SURFACE EMITTING LASERS
WITH TRANSPARENT ELECTRODES
Abstract Optically transparent and electrically conductive cadmium tin oxide or indium tin oxide is employed in vertical cavity surface emitting lasers for vertical current injection. Continuous wave lasing at room temperature is achieved in GaAs/AlGaAsquantum well lasers. Devices with a 10µm optical window which also serves as a vertical current injection inlet give lasing threshold currents as low as 3.8mA. The differential series resistance is (350-450).OMEGA. with a diode voltage of (5.1-5.6)V at the lasing threshold. Far field pattern of the laser emission is Gaussian-like with a full width at half maximum of 7°.
WITH TRANSPARENT ELECTRODES
Abstract Optically transparent and electrically conductive cadmium tin oxide or indium tin oxide is employed in vertical cavity surface emitting lasers for vertical current injection. Continuous wave lasing at room temperature is achieved in GaAs/AlGaAsquantum well lasers. Devices with a 10µm optical window which also serves as a vertical current injection inlet give lasing threshold currents as low as 3.8mA. The differential series resistance is (350-450).OMEGA. with a diode voltage of (5.1-5.6)V at the lasing threshold. Far field pattern of the laser emission is Gaussian-like with a full width at half maximum of 7°.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/637,245 US5115441A (en) | 1991-01-03 | 1991-01-03 | Vertical cavity surface emmitting lasers with transparent electrodes |
US637,245 | 1991-01-03 |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2054404A1 true CA2054404A1 (en) | 1992-07-04 |
CA2054404C CA2054404C (en) | 1994-03-08 |
Family
ID=24555144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002054404A Expired - Fee Related CA2054404C (en) | 1991-01-03 | 1991-10-29 | Vertical cavity surface emitting lasers with transparent electrodes |
Country Status (9)
Country | Link |
---|---|
US (1) | US5115441A (en) |
EP (1) | EP0497052B1 (en) |
JP (1) | JP2975201B2 (en) |
KR (1) | KR0127911B1 (en) |
CA (1) | CA2054404C (en) |
DE (1) | DE69104342T2 (en) |
HK (1) | HK188895A (en) |
SG (1) | SG28332G (en) |
TW (1) | TW212255B (en) |
Families Citing this family (85)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100274283B1 (en) * | 1991-03-28 | 2001-01-15 | 야스카와 히데아키 | Surface-emitting semiconductor laser and its manufacturing method |
US5258990A (en) * | 1991-11-07 | 1993-11-02 | The United States Of America As Represented By The Secretary Of The United States Department Of Energy | Visible light surface emitting semiconductor laser |
US5226053A (en) * | 1991-12-27 | 1993-07-06 | At&T Bell Laboratories | Light emitting diode |
US5212703A (en) * | 1992-02-18 | 1993-05-18 | Eastman Kodak Company | Surface emitting lasers with low resistance bragg reflectors |
US5258316A (en) * | 1992-03-26 | 1993-11-02 | Motorola, Inc. | Patterened mirror vertical cavity surface emitting laser |
US5256596A (en) * | 1992-03-26 | 1993-10-26 | Motorola, Inc. | Top emitting VCSEL with implant |
US5245622A (en) * | 1992-05-07 | 1993-09-14 | Bandgap Technology Corporation | Vertical-cavity surface-emitting lasers with intra-cavity structures |
US5293392A (en) * | 1992-07-31 | 1994-03-08 | Motorola, Inc. | Top emitting VCSEL with etch stop layer |
US5317587A (en) * | 1992-08-06 | 1994-05-31 | Motorola, Inc. | VCSEL with separate control of current distribution and optical mode |
US5343487A (en) * | 1992-10-01 | 1994-08-30 | Optical Concepts, Inc. | Electrical pumping scheme for vertical-cavity surface-emitting lasers |
JP2797883B2 (en) * | 1993-03-18 | 1998-09-17 | 株式会社日立製作所 | Multicolor light emitting device and its substrate |
US5345462A (en) * | 1993-03-29 | 1994-09-06 | At&T Bell Laboratories | Semiconductor surface emitting laser having enhanced polarization control and transverse mode selectivity |
US5643369A (en) * | 1993-06-24 | 1997-07-01 | Fuji Xerox Co., Ltd. | Photoelectric conversion element having an infrared transmissive indium-tin oxide film |
US5323416A (en) * | 1993-08-20 | 1994-06-21 | Bell Communications Research, Inc. | Planarized interference mirror |
US5388120A (en) * | 1993-09-21 | 1995-02-07 | Motorola, Inc. | VCSEL with unstable resonator |
US5546209A (en) * | 1994-03-11 | 1996-08-13 | University Of Southern California | One-to-many simultaneous and reconfigurable optical two-dimensional plane interconnections using multiple wavelength, vertical cavity, surface-emitting lasers and wavelength-dependent detector planes |
GB2295269A (en) * | 1994-11-14 | 1996-05-22 | Sharp Kk | Resonant cavity laser having oxide spacer region |
US5530715A (en) * | 1994-11-29 | 1996-06-25 | Motorola, Inc. | Vertical cavity surface emitting laser having continuous grading |
US5493577A (en) * | 1994-12-21 | 1996-02-20 | Sandia Corporation | Efficient semiconductor light-emitting device and method |
US5627854A (en) * | 1995-03-15 | 1997-05-06 | Lucent Technologies Inc. | Saturable bragg reflector |
US5513204A (en) * | 1995-04-12 | 1996-04-30 | Optical Concepts, Inc. | Long wavelength, vertical cavity surface emitting laser with vertically integrated optical pump |
US5625617A (en) * | 1995-09-06 | 1997-04-29 | Lucent Technologies Inc. | Near-field optical apparatus with a laser having a non-uniform emission face |
US5724376A (en) * | 1995-11-30 | 1998-03-03 | Hewlett-Packard Company | Transparent substrate vertical cavity surface emitting lasers fabricated by semiconductor wafer bonding |
US5719891A (en) * | 1995-12-18 | 1998-02-17 | Picolight Incorporated | Conductive element with lateral oxidation barrier |
US6304588B1 (en) * | 1997-02-07 | 2001-10-16 | Xerox Corporation | Method and structure for eliminating polarization instability in laterally-oxidized VCSELs |
US5978408A (en) * | 1997-02-07 | 1999-11-02 | Xerox Corporation | Highly compact vertical cavity surface emitting lasers |
AU9472298A (en) | 1997-09-05 | 1999-03-22 | Micron Optics, Inc. | Tunable fiber fabry-perot surface-emitting lasers |
US6026111A (en) * | 1997-10-28 | 2000-02-15 | Motorola, Inc. | Vertical cavity surface emitting laser device having an extended cavity |
US5960024A (en) | 1998-03-30 | 1999-09-28 | Bandwidth Unlimited, Inc. | Vertical optical cavities produced with selective area epitaxy |
US6493372B1 (en) | 1998-04-14 | 2002-12-10 | Bandwidth 9, Inc. | Vertical cavity apparatus with tunnel junction |
US6487231B1 (en) | 1998-04-14 | 2002-11-26 | Bandwidth 9, Inc. | Vertical cavity apparatus with tunnel junction |
US6535541B1 (en) | 1998-04-14 | 2003-03-18 | Bandwidth 9, Inc | Vertical cavity apparatus with tunnel junction |
US6487230B1 (en) | 1998-04-14 | 2002-11-26 | Bandwidth 9, Inc | Vertical cavity apparatus with tunnel junction |
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US6275513B1 (en) | 1999-06-04 | 2001-08-14 | Bandwidth 9 | Hermetically sealed semiconductor laser device |
US6233263B1 (en) | 1999-06-04 | 2001-05-15 | Bandwidth9 | Monitoring and control assembly for wavelength stabilized optical system |
US20020048301A1 (en) * | 1999-07-30 | 2002-04-25 | Peidong Wang | Single mode operation of microelectromechanically tunable, half-symmetric, vertical cavity surface emitting lasers |
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US6570905B1 (en) | 2000-11-02 | 2003-05-27 | U-L-M Photonics Gmbh | Vertical cavity surface emitting laser with reduced parasitic capacitance |
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US6975661B2 (en) | 2001-06-14 | 2005-12-13 | Finisar Corporation | Method and apparatus for producing VCSELS with dielectric mirrors and self-aligned gain guide |
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US6795478B2 (en) * | 2002-03-28 | 2004-09-21 | Applied Optoelectronics, Inc. | VCSEL with antiguide current confinement layer |
US6890781B2 (en) * | 2002-06-25 | 2005-05-10 | Uni Light Technology Inc. | Transparent layer of a LED device and the method for growing the same |
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US7075962B2 (en) * | 2003-06-27 | 2006-07-11 | Finisar Corporation | VCSEL having thermal management |
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US20050243881A1 (en) * | 2004-04-30 | 2005-11-03 | Hoki Kwon | InAlAs having enhanced oxidation rate grown under very low V/III ratio |
JP4747516B2 (en) * | 2004-06-08 | 2011-08-17 | 富士ゼロックス株式会社 | Vertical cavity surface emitting semiconductor laser device |
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US7483212B2 (en) * | 2006-10-11 | 2009-01-27 | Rensselaer Polytechnic Institute | Optical thin film, semiconductor light emitting device having the same and methods of fabricating the same |
TW200834969A (en) * | 2007-02-13 | 2008-08-16 | Epistar Corp | Light-emitting diode and method for manufacturing the same |
US9070851B2 (en) | 2010-09-24 | 2015-06-30 | Seoul Semiconductor Co., Ltd. | Wafer-level light emitting diode package and method of fabricating the same |
CN205944139U (en) | 2016-03-30 | 2017-02-08 | 首尔伟傲世有限公司 | Ultraviolet ray light -emitting diode spare and contain this emitting diode module |
US10714893B2 (en) * | 2017-07-17 | 2020-07-14 | Thorlabs, Inc. | Mid-infrared vertical cavity laser |
WO2019204390A1 (en) | 2018-04-17 | 2019-10-24 | Smartflow Technologies, Inc. | Filter cassette article, and filter comprising same |
US11025033B2 (en) | 2019-05-21 | 2021-06-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Bump bonding structure to mitigate space contamination for III-V dies and CMOS dies |
CN111817129A (en) * | 2020-08-31 | 2020-10-23 | 江西铭德半导体科技有限公司 | VCSEL chip and manufacturing method thereof |
CN113206446A (en) * | 2021-04-30 | 2021-08-03 | 厦门大学 | Method for manufacturing nitride vertical cavity surface emitting laser based on conductive oxide DBR |
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JPH01264285A (en) * | 1988-04-15 | 1989-10-20 | Omron Tateisi Electron Co | Surface light-emitting type semiconductor laser |
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US4873696A (en) * | 1988-10-31 | 1989-10-10 | The Regents Of The University Of California | Surface-emitting lasers with periodic gain and a parallel driven nipi structure |
US5018157A (en) * | 1990-01-30 | 1991-05-21 | At&T Bell Laboratories | Vertical cavity semiconductor lasers |
US5012486A (en) * | 1990-04-06 | 1991-04-30 | At&T Bell Laboratories | Vertical cavity semiconductor laser with lattice-mismatched mirror stack |
-
1991
- 1991-01-03 US US07/637,245 patent/US5115441A/en not_active Expired - Lifetime
- 1991-10-29 CA CA002054404A patent/CA2054404C/en not_active Expired - Fee Related
- 1991-11-14 TW TW080108948A patent/TW212255B/zh active
- 1991-12-10 DE DE69104342T patent/DE69104342T2/en not_active Expired - Fee Related
- 1991-12-10 SG SG1995903290A patent/SG28332G/en unknown
- 1991-12-10 EP EP91311481A patent/EP0497052B1/en not_active Expired - Lifetime
- 1991-12-27 JP JP3345666A patent/JP2975201B2/en not_active Expired - Lifetime
- 1991-12-30 KR KR1019910025274A patent/KR0127911B1/en not_active IP Right Cessation
-
1995
- 1995-12-14 HK HK188895A patent/HK188895A/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CA2054404C (en) | 1994-03-08 |
DE69104342D1 (en) | 1994-11-03 |
JPH04276681A (en) | 1992-10-01 |
HK188895A (en) | 1995-12-22 |
US5115441A (en) | 1992-05-19 |
TW212255B (en) | 1993-09-01 |
SG28332G (en) | 1995-09-01 |
EP0497052B1 (en) | 1994-09-28 |
KR920015668A (en) | 1992-08-27 |
JP2975201B2 (en) | 1999-11-10 |
KR0127911B1 (en) | 1998-04-07 |
DE69104342T2 (en) | 1995-02-16 |
EP0497052A1 (en) | 1992-08-05 |
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