CA2089079A1 - Machine vision surface characterization system - Google Patents

Machine vision surface characterization system

Info

Publication number
CA2089079A1
CA2089079A1 CA002089079A CA2089079A CA2089079A1 CA 2089079 A1 CA2089079 A1 CA 2089079A1 CA 002089079 A CA002089079 A CA 002089079A CA 2089079 A CA2089079 A CA 2089079A CA 2089079 A1 CA2089079 A1 CA 2089079A1
Authority
CA
Canada
Prior art keywords
light source
surface quality
video camera
image
machine vision
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002089079A
Other languages
French (fr)
Other versions
CA2089079C (en
Inventor
Jeffrey B. Parker
Brian J. Czubko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Autospect Inc
Original Assignee
Jeffrey B. Parker
Brian J. Czubko
Autospect, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeffrey B. Parker, Brian J. Czubko, Autospect, Inc. filed Critical Jeffrey B. Parker
Publication of CA2089079A1 publication Critical patent/CA2089079A1/en
Application granted granted Critical
Publication of CA2089079C publication Critical patent/CA2089079C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Abstract

This invention is a surface inspection system including a light source (111) having a sharp edge between dark and bright and a video camera (121) imaging this edge reflected from the surface. The light intensity of the light source (111) is controlled using a light intensity sensor (115). An optical system (123) focusses an image of the light source (111) at the video camera with sufficient depth of focus to include the surface (10) to be inspected. The exposure duration is set to prevent blurring if the surface is moving. A surface quality computation apparatus computes at least one measure of surface quality, such as gloss, distinctness of reflected image and orange peel of the surface, From the video image signal. This surface quality computation apparatus preferably includes a frame grabber (130) and a general purpose digital computer (140).
CA002089079A 1990-08-14 1991-08-09 Machine vision surface characterization system Expired - Fee Related CA2089079C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US07/567,271 US5078496A (en) 1990-08-14 1990-08-14 Machine vision surface characterization system
US567,271 1990-08-14
PCT/US1991/005697 WO1992003699A1 (en) 1990-08-14 1991-08-09 Machine vision surface characterization system

Publications (2)

Publication Number Publication Date
CA2089079A1 true CA2089079A1 (en) 1992-02-15
CA2089079C CA2089079C (en) 2001-05-08

Family

ID=24266464

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002089079A Expired - Fee Related CA2089079C (en) 1990-08-14 1991-08-09 Machine vision surface characterization system

Country Status (7)

Country Link
US (1) US5078496A (en)
EP (1) EP0543900B1 (en)
AT (1) ATE129070T1 (en)
CA (1) CA2089079C (en)
DE (1) DE69113806T2 (en)
ES (1) ES2077865T3 (en)
WO (1) WO1992003699A1 (en)

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JPH0420845A (en) * 1990-05-15 1992-01-24 Jujo Paper Co Ltd Method for measuring gloss irregularity
US5243405A (en) * 1991-01-07 1993-09-07 Tichenor Clyde L Optical system for surface verification
WO1993012615A1 (en) * 1991-12-19 1993-06-24 The United States Of America, Represented By The Secretary, United States Department Of Commerce Method and apparatus for assessment of surface smoothness using reflected energy
DE4239456A1 (en) * 1992-11-24 1994-06-09 Rheinmetall Sick Optical Inspe Method and device for inspecting surfaces
JP3481631B2 (en) 1995-06-07 2003-12-22 ザ トラスティース オブ コロンビア ユニヴァーシティー イン ザ シティー オブ ニューヨーク Apparatus and method for determining a three-dimensional shape of an object using relative blur in an image due to active illumination and defocus
US6982794B1 (en) 1995-06-07 2006-01-03 The Boeing Company Directional reflectometer
GB2307983B (en) * 1995-12-06 1998-04-29 Laurie Mullaney Associates Lim Test equipment for colour printing
US5892808A (en) * 1996-06-28 1999-04-06 Techne Systems, Inc. Method and apparatus for feature detection in a workpiece
US5986414A (en) * 1997-07-09 1999-11-16 Synergistech, Inc. Configurable light output controller, method for controlling lights and a system for implementing the method and including a configurable light output controller
WO1999045366A1 (en) 1998-03-05 1999-09-10 Universal Healthwatch, Inc. Optical imaging system for diagnostics
US6272437B1 (en) 1998-04-17 2001-08-07 Cae Inc. Method and apparatus for improved inspection and classification of attributes of a workpiece
US6788411B1 (en) * 1999-07-08 2004-09-07 Ppt Vision, Inc. Method and apparatus for adjusting illumination angle
WO2002075295A1 (en) * 2001-03-16 2002-09-26 Honeywell Oy An electronic imaging and quality control method for a fast moving web
BR0208660A (en) * 2001-04-06 2004-03-09 Akzo Nobel Coatings Int Bv Method and device for surface assessment
FR2830079B1 (en) * 2001-09-26 2004-04-30 Holo 3 METHOD AND DEVICE FOR MEASURING AT LEAST ONE GEOMETRIC SIZE OF AN OPTICALLY REFLECTIVE SURFACE
WO2003041902A1 (en) * 2001-11-15 2003-05-22 Elpatronic Ag Method and device for evaluation of jointing regions on workpieces
US7391523B1 (en) * 2003-06-02 2008-06-24 K-Space Associates, Inc. Curvature/tilt metrology tool with closed loop feedback control
FI20126126L (en) 2012-10-30 2014-05-01 Metso Automation Oy Method and apparatus for measuring gloss
DE102013221334A1 (en) * 2013-10-21 2015-04-23 Volkswagen Aktiengesellschaft Method and measuring device for evaluating structural differences of a reflecting surface
JP2017040510A (en) * 2015-08-18 2017-02-23 キヤノン株式会社 Inspection apparatus, inspection method, and object manufacturing method
EP3332685B1 (en) * 2015-11-18 2021-06-16 Samsung Electronics Co., Ltd. Moving object, cleaning robot, floor condition determining device, method of controlling the moving object, and method of controlling the cleaning robot
JP2017198612A (en) * 2016-04-28 2017-11-02 キヤノン株式会社 Inspection device, inspection system, and method for manufacturing article
US10380767B2 (en) * 2016-08-01 2019-08-13 Cognex Corporation System and method for automatic selection of 3D alignment algorithms in a vision system
US10928327B2 (en) * 2016-12-22 2021-02-23 Axalta Coating Systems Ip Co., Llc Apparatuses and methods for measuring spatial properties of surface coating containing flake pigment
US10957072B2 (en) 2018-02-21 2021-03-23 Cognex Corporation System and method for simultaneous consideration of edges and normals in image features by a vision system
EP4200796A1 (en) * 2020-08-19 2023-06-28 3M Innovative Properties Company Robotic repair control systems and methods

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US3509349A (en) * 1968-05-21 1970-04-28 Philco Ford Corp Surface finish inspection device utilizing a plurality of light sources
JPS5271289A (en) * 1975-12-11 1977-06-14 Mitsubishi Electric Corp Surface inspection device
JPS5676004A (en) * 1979-11-26 1981-06-23 Toyota Central Res & Dev Lab Inc Measuring device of flatness
JPS58169012A (en) * 1982-03-31 1983-10-05 Matsushita Electric Works Ltd Surface defect detecting device
JPS59202045A (en) * 1983-05-02 1984-11-15 Suga Shikenki Kk Discrimination of luster effect
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
USH220H (en) * 1986-03-13 1987-02-03 The United States Of America As Represented By The Secretary Of The Army Optical performance comparator
JPH0619262B2 (en) * 1986-07-11 1994-03-16 関東自動車工業株式会社 Method of measuring smoothness of coated surface
JPS63100310A (en) * 1986-10-16 1988-05-02 Tokai Rika Co Ltd Surface property measuring instrument
US4792232A (en) * 1987-05-18 1988-12-20 Shell Oil Company Method and apparatus for detection of undesirable surface deformities
US4847510A (en) * 1987-12-09 1989-07-11 Shell Oil Company Method for comparison of surfaces
US4929846A (en) * 1988-10-05 1990-05-29 Ford Motor Company Surface quality analyzer apparatus and method
IT1224030B (en) * 1988-12-23 1990-09-26 Fiat Ricerche METHOD AND DEVICE FOR THE SURVEY AND CLASSIFICATION OF THE STRUCTURE OF SURFACE TREATMENTS

Also Published As

Publication number Publication date
ATE129070T1 (en) 1995-10-15
DE69113806D1 (en) 1995-11-16
US5078496A (en) 1992-01-07
EP0543900B1 (en) 1995-10-11
ES2077865T3 (en) 1995-12-01
WO1992003699A1 (en) 1992-03-05
CA2089079C (en) 2001-05-08
EP0543900A4 (en) 1993-08-04
EP0543900A1 (en) 1993-06-02
DE69113806T2 (en) 1996-04-11

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Legal Events

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