CA2252926A1 - All-metal, giant magnetoresistive, solid-state component - Google Patents
All-metal, giant magnetoresistive, solid-state componentInfo
- Publication number
- CA2252926A1 CA2252926A1 CA002252926A CA2252926A CA2252926A1 CA 2252926 A1 CA2252926 A1 CA 2252926A1 CA 002252926 A CA002252926 A CA 002252926A CA 2252926 A CA2252926 A CA 2252926A CA 2252926 A1 CA2252926 A1 CA 2252926A1
- Authority
- CA
- Canada
- Prior art keywords
- solid
- thin
- state component
- metal
- nodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002184 metal Substances 0.000 title 1
- 239000010409 thin film Substances 0.000 abstract 4
- 239000004020 conductor Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
- H01F10/3281—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn only by use of asymmetry of the magnetic film pair itself, i.e. so-called pseudospin valve [PSV] structure, e.g. NiFe/Cu/Co
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/16—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using saturable magnetic devices
- H03K19/166—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using saturable magnetic devices using transfluxors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10B61/20—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors
Abstract
A solid-state component (200) is de-scribed which includes a network of thin-film elements (202). At least one thin-film element (202) exhibits giant magnetoresistance. The network (202) has a plurality of nodes (208, 210, 212, 214), each of which represents a di-rect electrical connection between two of the thin-film elements (202). First and second ones of the plurality of nodes (208, 210, 212, 214) comprise power terminals (208, 210). Third and fourth ones of the plurality of nodes (208, 210, 212, 214) comprise an output (212, 214).
A first conductor (206) is inductively coupled to the at least one thin-film element (202) for applying a magnetic field thereto.
A first conductor (206) is inductively coupled to the at least one thin-film element (202) for applying a magnetic field thereto.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US1670496P | 1996-05-02 | 1996-05-02 | |
US08/846,410 US5929636A (en) | 1996-05-02 | 1997-04-30 | All-metal giant magnetoresistive solid-state component |
US08/846,410 | 1997-04-30 | ||
US60/016,704 | 1997-04-30 | ||
PCT/US1997/007425 WO1997041601A1 (en) | 1996-05-02 | 1997-05-02 | All-metal, giant magnetoresistive, solid-state component |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2252926A1 true CA2252926A1 (en) | 1997-11-06 |
CA2252926C CA2252926C (en) | 2002-08-06 |
Family
ID=26688967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002252926A Expired - Fee Related CA2252926C (en) | 1996-05-02 | 1997-05-02 | All-metal, giant magnetoresistive, solid-state component |
Country Status (8)
Country | Link |
---|---|
US (2) | US5929636A (en) |
EP (1) | EP0896734B1 (en) |
JP (1) | JP2002502549A (en) |
KR (1) | KR100467117B1 (en) |
AU (1) | AU3117097A (en) |
CA (1) | CA2252926C (en) |
DE (1) | DE69735627T2 (en) |
WO (1) | WO1997041601A1 (en) |
Families Citing this family (56)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6741494B2 (en) * | 1995-04-21 | 2004-05-25 | Mark B. Johnson | Magnetoelectronic memory element with inductively coupled write wires |
JPH11316919A (en) | 1998-04-30 | 1999-11-16 | Hitachi Ltd | Spin tunnel magnetoresistive effect magnetic head |
EP0971424A3 (en) * | 1998-07-10 | 2004-08-25 | Interuniversitair Microelektronica Centrum Vzw | Spin-valve structure and method for making spin-valve structures |
US6194774B1 (en) * | 1999-03-10 | 2001-02-27 | Samsung Electronics Co., Ltd. | Inductor including bonding wires |
US6240622B1 (en) * | 1999-07-09 | 2001-06-05 | Micron Technology, Inc. | Integrated circuit inductors |
US6507187B1 (en) * | 1999-08-24 | 2003-01-14 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Ultra-sensitive magnetoresistive displacement sensing device |
US6609174B1 (en) * | 1999-10-19 | 2003-08-19 | Motorola, Inc. | Embedded MRAMs including dual read ports |
DE10032272C2 (en) * | 2000-07-03 | 2002-08-29 | Infineon Technologies Ag | Current driver arrangement for MRAM |
US6538437B2 (en) * | 2000-07-11 | 2003-03-25 | Integrated Magnetoelectronics Corporation | Low power magnetic anomaly sensor |
US6483740B2 (en) * | 2000-07-11 | 2002-11-19 | Integrated Magnetoelectronics Corporation | All metal giant magnetoresistive memory |
US7248713B2 (en) | 2000-09-11 | 2007-07-24 | Micro Bar Technology, Inc. | Integrated automatic telephone switch |
US6624490B2 (en) | 2000-10-26 | 2003-09-23 | The University Of Iowa Research Foundation | Unipolar spin diode and the applications of the same |
DE10053206C1 (en) * | 2000-10-26 | 2002-01-17 | Siemens Ag | Logic circuit device uses magnetoresistive element with magnetizable soft magnetic layer and selective perpendicular magnetic field for alteration of logic function |
US6738284B2 (en) | 2001-03-23 | 2004-05-18 | Integrated Magnetoelectronics Corporation | Transpinnor-based sample-and-hold circuit and applications |
EP1371100A4 (en) * | 2001-03-23 | 2004-09-01 | Integrated Magnetoelectronics | A transpinnor-based switch and applications |
DE10118650A1 (en) * | 2001-04-14 | 2002-10-17 | Philips Corp Intellectual Pty | Angle sensor and method for increasing the anisotropy field strength of a sensor unit of an angle sensor |
JP3603872B2 (en) * | 2001-05-16 | 2004-12-22 | 松下電器産業株式会社 | Magnetic sensor and banknote recognition device using it |
US6688169B2 (en) | 2001-06-15 | 2004-02-10 | Textron Systems Corporation | Systems and methods for sensing an acoustic signal using microelectromechanical systems technology |
US6711437B2 (en) | 2001-07-30 | 2004-03-23 | Medtronic, Inc. | Pacing channel isolation in multi-site cardiac pacing systems |
US6700371B2 (en) * | 2001-09-05 | 2004-03-02 | Honeywell International Inc. | Three dimensional conductive strap for a magnetorestrictive sensor |
US6771472B1 (en) | 2001-12-07 | 2004-08-03 | Seagate Technology Llc | Structure to achieve thermally stable high sensitivity and linear range in bridge GMR sensor using SAF magnetic alignments |
US7046117B2 (en) * | 2002-01-15 | 2006-05-16 | Honeywell International Inc. | Integrated magnetic field strap for signal isolator |
US6859063B2 (en) * | 2002-04-11 | 2005-02-22 | Integrated Magnetoelectronics Corporation | Transpinnor-based transmission line transceivers and applications |
AU2003225048A1 (en) | 2002-04-19 | 2003-11-03 | Integrated Magnetoelectronics Corporation | Interfaces between semiconductor circuitry and transpinnor-based circuitry |
US8284970B2 (en) * | 2002-09-16 | 2012-10-09 | Starkey Laboratories Inc. | Switching structures for hearing aid |
US7369671B2 (en) | 2002-09-16 | 2008-05-06 | Starkey, Laboratories, Inc. | Switching structures for hearing aid |
US6992919B2 (en) * | 2002-12-20 | 2006-01-31 | Integrated Magnetoelectronics Corporation | All-metal three-dimensional circuits and memories |
US7259545B2 (en) * | 2003-02-11 | 2007-08-21 | Allegro Microsystems, Inc. | Integrated sensor |
US7005852B2 (en) | 2003-04-04 | 2006-02-28 | Integrated Magnetoelectronics Corporation | Displays with all-metal electronics |
US7027319B2 (en) * | 2003-06-19 | 2006-04-11 | Hewlett-Packard Development Company, L.P. | Retrieving data stored in a magnetic integrated memory |
US7244997B2 (en) * | 2003-07-08 | 2007-07-17 | President And Fellows Of Harvard College | Magneto-luminescent transducer |
US20050083743A1 (en) * | 2003-09-09 | 2005-04-21 | Integrated Magnetoelectronics Corporation A California Corporation | Nonvolatile sequential machines |
US7177107B2 (en) * | 2004-02-11 | 2007-02-13 | Hitachi Global Storage Technologies Netherlands B.V. | Preamplifier circuit with signal interference cancellation suitable for use in magnetic storage devices |
EP1574850A1 (en) * | 2004-03-08 | 2005-09-14 | Siemens Aktiengesellschaft | Apparatus for non-destructive detection of deep defects in electric conducting materials |
US20050269612A1 (en) * | 2004-05-11 | 2005-12-08 | Integrated Magnetoelectronics | Solid-state component based on current-induced magnetization reversal |
JP4692805B2 (en) * | 2004-06-30 | 2011-06-01 | Tdk株式会社 | Magnetic sensing element and method for forming the same |
US7777607B2 (en) * | 2004-10-12 | 2010-08-17 | Allegro Microsystems, Inc. | Resistor having a predetermined temperature coefficient |
FR2876800B1 (en) | 2004-10-18 | 2007-03-02 | Commissariat Energie Atomique | METHOD AND DEVICE FOR MEASURING A MAGNETIC FIELD USING A MAGNETORESITIVE SENSOR |
WO2006078720A2 (en) * | 2005-01-19 | 2006-07-27 | Integrated Magnetoelectronics Corporation | Radiation detector |
US7839605B2 (en) * | 2005-11-13 | 2010-11-23 | Hitachi Global Storage Technologies Netherlands B.V. | Electrical signal-processing device integrating a flux sensor with a flux generator in a magnetic circuit |
US7768083B2 (en) * | 2006-01-20 | 2010-08-03 | Allegro Microsystems, Inc. | Arrangements for an integrated sensor |
US7911830B2 (en) | 2007-05-17 | 2011-03-22 | Integrated Magnetoelectronics | Scalable nonvolatile memory |
US7795862B2 (en) | 2007-10-22 | 2010-09-14 | Allegro Microsystems, Inc. | Matching of GMR sensors in a bridge |
US7816905B2 (en) * | 2008-06-02 | 2010-10-19 | Allegro Microsystems, Inc. | Arrangements for a current sensing circuit and integrated current sensor |
FR2942924B1 (en) * | 2009-03-06 | 2011-06-24 | Thales Sa | HYPERFREQUENCY FREQUENCY TRANSPOSER WITH REDUCED DIMENSIONS |
US8619467B2 (en) * | 2010-02-22 | 2013-12-31 | Integrated Magnetoelectronics | High GMR structure with low drive fields |
US9322889B2 (en) * | 2011-12-30 | 2016-04-26 | Nve Corporation | Low hysteresis high sensitivity magnetic field sensor |
US10492009B2 (en) * | 2012-05-07 | 2019-11-26 | Starkey Laboratories, Inc. | Hearing aid with distributed processing in ear piece |
US9784715B2 (en) | 2013-04-19 | 2017-10-10 | Zetec, Inc. | Eddy current inspection probe based on magnetoresistive sensors |
CN103384141B (en) * | 2013-07-24 | 2015-05-06 | 江苏多维科技有限公司 | Magnetic-resistance mixer |
US9632150B2 (en) * | 2015-04-27 | 2017-04-25 | Everspin Technologies, Inc. | Magnetic field sensor with increased field range |
US9741923B2 (en) | 2015-09-25 | 2017-08-22 | Integrated Magnetoelectronics Corporation | SpinRAM |
US10762940B2 (en) | 2016-12-09 | 2020-09-01 | Integrated Magnetoelectronics Corporation | Narrow etched gaps or features in multi-period thin-film structures |
US10935612B2 (en) | 2018-08-20 | 2021-03-02 | Allegro Microsystems, Llc | Current sensor having multiple sensitivity ranges |
US11187764B2 (en) | 2020-03-20 | 2021-11-30 | Allegro Microsystems, Llc | Layout of magnetoresistance element |
US11567108B2 (en) | 2021-03-31 | 2023-01-31 | Allegro Microsystems, Llc | Multi-gain channels for multi-range sensor |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3972786A (en) * | 1974-06-28 | 1976-08-03 | Ampex Corporation | Mechanically enhanced magnetic memory |
US4751677A (en) * | 1986-09-16 | 1988-06-14 | Honeywell Inc. | Differential arrangement magnetic memory cell |
JPH03269383A (en) * | 1990-03-20 | 1991-11-29 | Nec Corp | Magnetic sensor and its signal processing system |
US5173873A (en) * | 1990-06-28 | 1992-12-22 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | High speed magneto-resistive random access memory |
DE4319146C2 (en) * | 1993-06-09 | 1999-02-04 | Inst Mikrostrukturtechnologie | Magnetic field sensor, made up of a magnetic reversal line and one or more magnetoresistive resistors |
US5422621A (en) * | 1993-10-29 | 1995-06-06 | International Business Machines Corporation | Oriented granular giant magnetoresistance sensor |
FR2712420B1 (en) * | 1993-11-08 | 1995-12-15 | Commissariat Energie Atomique | Magnetic read head with multilayer magnetoresistive element and concentrator and method of making the same. |
JPH07153034A (en) * | 1993-11-26 | 1995-06-16 | Matsushita Electric Ind Co Ltd | Magnetoresistance effect device and its manufacture |
US5650889A (en) * | 1994-02-07 | 1997-07-22 | Hitachi, Ltd. | Magnetic recording medium containing heavy rare gas atoms, and a magnetic transducing system using the medium |
US5587943A (en) * | 1995-02-13 | 1996-12-24 | Integrated Microtransducer Electronics Corporation | Nonvolatile magnetoresistive memory with fully closed flux operation |
US5654566A (en) * | 1995-04-21 | 1997-08-05 | Johnson; Mark B. | Magnetic spin injected field effect transistor and method of operation |
US5652445A (en) * | 1995-04-21 | 1997-07-29 | Johnson; Mark B. | Hybrid hall effect device and method of operation |
US5585986A (en) * | 1995-05-15 | 1996-12-17 | International Business Machines Corporation | Digital magnetoresistive sensor based on the giant magnetoresistance effect |
US5650958A (en) * | 1996-03-18 | 1997-07-22 | International Business Machines Corporation | Magnetic tunnel junctions with controlled magnetic response |
-
1997
- 1997-04-30 US US08/846,410 patent/US5929636A/en not_active Expired - Lifetime
- 1997-05-02 CA CA002252926A patent/CA2252926C/en not_active Expired - Fee Related
- 1997-05-02 KR KR10-1998-0708923A patent/KR100467117B1/en not_active IP Right Cessation
- 1997-05-02 JP JP53925797A patent/JP2002502549A/en active Pending
- 1997-05-02 EP EP97926397A patent/EP0896734B1/en not_active Expired - Lifetime
- 1997-05-02 DE DE69735627T patent/DE69735627T2/en not_active Expired - Lifetime
- 1997-05-02 WO PCT/US1997/007425 patent/WO1997041601A1/en active IP Right Grant
- 1997-05-02 AU AU31170/97A patent/AU3117097A/en not_active Abandoned
-
1998
- 1998-12-08 US US09/208,628 patent/US6031273A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69735627D1 (en) | 2006-05-18 |
DE69735627T2 (en) | 2006-08-24 |
AU3117097A (en) | 1997-11-19 |
WO1997041601A1 (en) | 1997-11-06 |
US6031273A (en) | 2000-02-29 |
KR100467117B1 (en) | 2005-06-23 |
EP0896734A1 (en) | 1999-02-17 |
EP0896734A4 (en) | 1999-11-24 |
US5929636A (en) | 1999-07-27 |
EP0896734B1 (en) | 2006-04-05 |
KR20000065205A (en) | 2000-11-06 |
CA2252926C (en) | 2002-08-06 |
JP2002502549A (en) | 2002-01-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKLA | Lapsed | ||
MKLA | Lapsed |
Effective date: 20060502 |
|
MKLA | Lapsed |
Effective date: 20060502 |
|
MKLA | Lapsed |
Effective date: 20060502 |