CA2361759A1 - Method of information collection and processing of sample's surface - Google Patents
Method of information collection and processing of sample's surface Download PDFInfo
- Publication number
- CA2361759A1 CA2361759A1 CA002361759A CA2361759A CA2361759A1 CA 2361759 A1 CA2361759 A1 CA 2361759A1 CA 002361759 A CA002361759 A CA 002361759A CA 2361759 A CA2361759 A CA 2361759A CA 2361759 A1 CA2361759 A1 CA 2361759A1
- Authority
- CA
- Canada
- Prior art keywords
- force
- cantilever
- coordinate
- layers
- fixed end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/04—Display or data processing devices
Abstract
The applied method is implemented in AFM-microscopy to get space distributions of surface properties and layers, placed on it.
This method includes successive reading in predetermined points of the surface under control of force curve and subsequent constructions of images of appropriate distributions of parameters extracted from these force curves. The peculiarity of the method is that reading of force curve is carried out by noting of values of cantilever's deviation force and/or coordinate of its fixed end and/or derivatives from cantilever's deviation force of coordinate of its fixed end at least in points of control of force curve.
Upon that, characteristics and parameters of sample's surface and/or surface layers, for instance, presence, quantity and thickness of surface layers, coordinates of sample's surface and limits of surface layers, as well as adhesion, elastic and friction properties of surtace and layers, are diagnosed by a number of points of control and/or noted values of cantilever's deviation force and/or coordinate of its fixed end and/or derivatives from cantilever's deviation force of coordinate of its fixed end in appropriate points.
This method includes successive reading in predetermined points of the surface under control of force curve and subsequent constructions of images of appropriate distributions of parameters extracted from these force curves. The peculiarity of the method is that reading of force curve is carried out by noting of values of cantilever's deviation force and/or coordinate of its fixed end and/or derivatives from cantilever's deviation force of coordinate of its fixed end at least in points of control of force curve.
Upon that, characteristics and parameters of sample's surface and/or surface layers, for instance, presence, quantity and thickness of surface layers, coordinates of sample's surface and limits of surface layers, as well as adhesion, elastic and friction properties of surtace and layers, are diagnosed by a number of points of control and/or noted values of cantilever's deviation force and/or coordinate of its fixed end and/or derivatives from cantilever's deviation force of coordinate of its fixed end in appropriate points.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| RU99102369/28A RU2145055C1 (en) | 1999-02-08 | 1999-02-08 | Process of collection and processing of information about surfaces of sample |
| RU99102369 | 1999-02-08 | ||
| PCT/RU2000/000040 WO2000046568A2 (en) | 1999-02-08 | 2000-02-07 | Method of information collection and processing of sample's surface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2361759A1 true CA2361759A1 (en) | 2000-08-10 |
| CA2361759C CA2361759C (en) | 2005-09-27 |
Family
ID=20215582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002361759A Expired - Fee Related CA2361759C (en) | 1999-02-08 | 2000-02-07 | Method of information collection and processing of sample's surface |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6776030B1 (en) |
| EP (1) | EP1153262A1 (en) |
| AU (1) | AU2835000A (en) |
| CA (1) | CA2361759C (en) |
| RU (1) | RU2145055C1 (en) |
| WO (1) | WO2000046568A2 (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2193769C2 (en) * | 2000-12-14 | 2002-11-27 | Закрытое акционерное общество "НТ-МДТ" | Method measuring characteristics of surface magnetic field with use of scanning sounding microscope |
| US6677697B2 (en) * | 2001-12-06 | 2004-01-13 | Veeco Instruments Inc. | Force scanning probe microscope |
| DE10213910B4 (en) * | 2002-03-28 | 2004-05-06 | Wieland-Werke Ag | Objectification of (surface) test methods through image processing |
| US7107158B2 (en) * | 2003-02-03 | 2006-09-12 | Qcept Technologies, Inc. | Inspection system and apparatus |
| US7420106B2 (en) * | 2005-03-18 | 2008-09-02 | The University Of Utah Research Foundation | Scanning probe characterization of surfaces |
| US7555940B2 (en) * | 2006-07-25 | 2009-07-07 | Veeco Instruments, Inc. | Cantilever free-decay measurement system with coherent averaging |
| GB0621560D0 (en) * | 2006-10-31 | 2006-12-06 | Infinitesima Ltd | Probe assembly for a scanning probe microscope |
| US7578176B2 (en) * | 2006-12-22 | 2009-08-25 | Veeco Metrology, Inc. | Systems and methods for utilizing scanning probe shape characterization |
| US8363985B2 (en) | 2007-10-15 | 2013-01-29 | Nippon Telegraph And Telephone Corporation | Image generation method and apparatus, program therefor, and storage medium which stores the program |
| JPWO2010067570A1 (en) * | 2008-12-10 | 2012-05-17 | 国立大学法人京都大学 | Output processing method of scanning probe microscope and scanning probe microscope |
| RU2462726C2 (en) * | 2010-10-11 | 2012-09-27 | Государственное Научное Учреждение "Институт Тепло- И Массообмена Имени А.В. Лыкова Национальной Академии Наук Беларуси" | Method of scanning on scanning probe microscope and forming image of surface |
| RU2516022C2 (en) * | 2012-03-07 | 2014-05-20 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования Самарский государственный технический университет | Method to collect and process information on sample surface |
| WO2014197412A1 (en) * | 2013-06-05 | 2014-12-11 | Nanomechanics, Inc. | Electrostatic force tester |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5266801A (en) * | 1989-06-05 | 1993-11-30 | Digital Instruments, Inc. | Jumping probe microscope |
| US5289004A (en) * | 1990-03-27 | 1994-02-22 | Olympus Optical Co., Ltd. | Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light |
| US5262643A (en) | 1992-06-12 | 1993-11-16 | International Business Machines Corp. | Automatic tip approach method and apparatus for scanning probe microscope |
| JPH0642953A (en) | 1992-07-24 | 1994-02-18 | Matsushita Electric Ind Co Ltd | Interatomic force microscope |
| US5400647A (en) * | 1992-11-12 | 1995-03-28 | Digital Instruments, Inc. | Methods of operating atomic force microscopes to measure friction |
| US5308974B1 (en) | 1992-11-30 | 1998-01-06 | Digital Instr Inc | Scanning probe microscope using stored data for vertical probe positioning |
| US5406832A (en) | 1993-07-02 | 1995-04-18 | Topometrix Corporation | Synchronous sampling scanning force microscope |
| JPH07113741A (en) * | 1993-10-18 | 1995-05-02 | Ryoden Semiconductor Syst Eng Kk | Adhesion measuring instrument, adhesion measuring method and manufacture of semiconductor |
| US5983712A (en) * | 1994-05-19 | 1999-11-16 | Molecular Imaging Corporation | Microscope for compliance measurement |
| JPH0862229A (en) * | 1994-08-22 | 1996-03-08 | Ryoden Semiconductor Syst Eng Kk | Thin-film quality measuring instrument and method, and manufacture of semiconductor device |
-
1999
- 1999-02-08 RU RU99102369/28A patent/RU2145055C1/en not_active IP Right Cessation
-
2000
- 2000-02-07 AU AU28350/00A patent/AU2835000A/en not_active Abandoned
- 2000-02-07 WO PCT/RU2000/000040 patent/WO2000046568A2/en active Application Filing
- 2000-02-07 EP EP00906791A patent/EP1153262A1/en not_active Withdrawn
- 2000-02-07 CA CA002361759A patent/CA2361759C/en not_active Expired - Fee Related
- 2000-02-07 US US09/890,265 patent/US6776030B1/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP1153262A1 (en) | 2001-11-14 |
| US6776030B1 (en) | 2004-08-17 |
| WO2000046568A3 (en) | 2000-12-21 |
| RU2145055C1 (en) | 2000-01-27 |
| CA2361759C (en) | 2005-09-27 |
| WO2000046568A2 (en) | 2000-08-10 |
| AU2835000A (en) | 2000-08-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |
Effective date: 20180207 |