CA2389367A1 - Concentric spectrometer with mitigation of internal specular reflections - Google Patents
Concentric spectrometer with mitigation of internal specular reflections Download PDFInfo
- Publication number
- CA2389367A1 CA2389367A1 CA002389367A CA2389367A CA2389367A1 CA 2389367 A1 CA2389367 A1 CA 2389367A1 CA 002389367 A CA002389367 A CA 002389367A CA 2389367 A CA2389367 A CA 2389367A CA 2389367 A1 CA2389367 A1 CA 2389367A1
- Authority
- CA
- Canada
- Prior art keywords
- spectrometer
- aperture
- optical
- optical axis
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000000116 mitigating effect Effects 0.000 title 1
- 230000003287 optical effect Effects 0.000 claims abstract 26
- 230000015572 biosynthetic process Effects 0.000 claims abstract 4
- 238000001228 spectrum Methods 0.000 claims 2
- 239000006185 dispersion Substances 0.000 claims 1
- 230000001902 propagating effect Effects 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 2
- 238000001514 detection method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0262—Constructional arrangements for removing stray light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
Abstract
Concentric spectrometers are plagued with internal reflections due to the inherent nature of more than one optical surface possessing a common center of curvature. Reflections from optical surfaces arise when there is a difference or change in the refractive index of the media in which an optical beam or ray of a given wavelength is propagating. Internal reflections in concentric optical systems can produce a myriad of undesirable optical phenomenon at the image plane such as multiple images of an object, interference fringes, and stray light. As a result a loss in contrast or detection limit arise from such phenomenon in which light or detectable radiation that impinges on the image plane does not add to the formation of the intended image, (stray light). The present invention produces high quality images without the optical phenomenon(s) that arise from internal reflections by removing the reflected radiation from propagating through the optical system.
Claims (20)
1. A concentric spectrometer which mitigates internal specular reflections, said spectrometer comprising:
(a) an optical axis; and (b) a radial distance perpendicular to said optical axis;
(c) an object aperture located substantially at said radial distance from optical axis;
(d) an image aperture located substantially at said radial distance from optical axis;
(e) a plurality of non-planar optical surfaces having centers of curvature which are substantially common on said optical axis; wherein said plurality of non-planar optical surfaces includes at least one grating surface which is aplanatic for zero order of diffraction; wherein said plurality of non-planar optical surfaces includes at least one convex refracting surface; and (f) a plurality of planar optical surfaces substantially coincident with the centers of curvatures of said plurality of optical surfaces and are substantially perpendicular to said optical axis.
(a) an optical axis; and (b) a radial distance perpendicular to said optical axis;
(c) an object aperture located substantially at said radial distance from optical axis;
(d) an image aperture located substantially at said radial distance from optical axis;
(e) a plurality of non-planar optical surfaces having centers of curvature which are substantially common on said optical axis; wherein said plurality of non-planar optical surfaces includes at least one grating surface which is aplanatic for zero order of diffraction; wherein said plurality of non-planar optical surfaces includes at least one convex refracting surface; and (f) a plurality of planar optical surfaces substantially coincident with the centers of curvatures of said plurality of optical surfaces and are substantially perpendicular to said optical axis.
2. The spectrometer of claim 1 further comprising an aperture mask positioned at said grating surface.
3. The spectrometer of claim 1 further comprising a plurality of light absorbing baffles between said refracting surface and said grating surface.
4. The spectrometer of claim 1 further comprising at least one planar reflecting optical surface positioned in the ray path at an oblique angle relative to said optical axis.
5. The spectrometer of claim 1 wherein at least one of said surfaces is substantially coincident with said object aperture.
6. The spectrometer of claim 1 wherein at least one of said planar optical surfaces is substantially coincident with said image aperture.
7. The spectrometer of claim 1 wherein said object aperture includes one or more apertures through which polychromatic light enters said spectrometer.
8. The spectrometer of claim 1 wherein images of said object aperture are formed within said image aperture spatially dispersed by wavelength along the axis of dispersion substantially perpendicular to the grooves of said grating surface.
9. The spectrometer of claim 1 wherein one said planar optical surface and one said non-planar optical surface form a piano-convex lens of index of refraction higher than of that media that separates the convex surface of the lens and said grating surface.
10. The spectrometer of claim 9 wherein the convex lens surface of said piano-convex lens and said grating surface are spatially separated along said optical axis to advantage of best image formation of diffracted object within said image aperture at said radial distance from said optical axis.
11. The spectrometer of claim 9 wherein said planar surface of said piano-convex lens may include either object aperture or image aperture or both.
12. The spectrometer of claim 1 wherein the radii of said radial distance is sufficient to cause light diffracted from said grating surface to reflect from specular surface of said refracting surface to exclude impingement on said grating surface.
13. The spectrometer of claim 12 wherein said radial distance substantially includes said object aperture and said image aperture and zero order of diffraction.
14. The spectrometer of claim 2 wherein said aperture mask prevents the propagation of light beyond the clear aperture of said grating surface.
15. The spectrometer of claim 7 further comprising an aperture mask for preventing the propagation of diffracted light reflected from the specular surface of said convex surface of said piano-convex lens.
16. The spectrometer of claim 14 wherein said aperture mask does not impede the propagation light that would contribute to the formation of spectra at said image aperture.
17. The spectrometer of claim 1 wherein the non-planar optical surfaces are substantially spherical.
18. The spectrometer of claim 3 wherein said light absorbing baffles absorb light which does not contribute to the formation of spectra by impingement on said baffles no less than two times.
19. The spectrometer of claim 10 further comprising light absorbing baffles which absorb diffracted light reflected from the specular surface of said convex surface of plano-convex lens.
20. The spectrometer of claim 19 wherein said light absorbing baffles absorb light beyond the clear aperture of said grating surface.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16749199P | 1999-12-01 | 1999-12-01 | |
US60/167,491 | 1999-12-01 | ||
PCT/US2000/031165 WO2001040746A1 (en) | 1999-12-01 | 2000-11-13 | Concentric spectrometer with mitigation of internal specular reflections |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2389367A1 true CA2389367A1 (en) | 2001-06-07 |
CA2389367C CA2389367C (en) | 2010-08-24 |
Family
ID=22607572
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA2389367A Expired - Fee Related CA2389367C (en) | 1999-12-01 | 2000-11-13 | Concentric spectrometer with mitigation of internal specular reflections |
Country Status (6)
Country | Link |
---|---|
US (1) | US6538736B1 (en) |
EP (1) | EP1236025B1 (en) |
JP (1) | JP4611591B2 (en) |
CA (1) | CA2389367C (en) |
DE (1) | DE60010322T2 (en) |
WO (1) | WO2001040746A1 (en) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6538736B1 (en) * | 1999-12-01 | 2003-03-25 | Hach Company | Concentric spectrometer with mitigation of internal specular reflections |
WO2006023712A2 (en) * | 2004-08-19 | 2006-03-02 | Headwall Photonics, Inc. | Multi-channel, multi-spectrum imaging spectrometer |
US8045155B2 (en) * | 2007-06-08 | 2011-10-25 | Hamamatsu Photonics K.K. | Spectroscopic module |
WO2008149930A1 (en) | 2007-06-08 | 2008-12-11 | Hamamatsu Photonics K.K. | Spectroscopic module |
US7609381B2 (en) * | 2008-03-20 | 2009-10-27 | The Aerospace Corporation | Compact, high-throughput spectrometer apparatus for hyperspectral remote sensing |
JP5205239B2 (en) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | Spectrometer |
JP2009300417A (en) * | 2008-05-15 | 2009-12-24 | Hamamatsu Photonics Kk | Spectroscopic module and its manufacturing method |
JP5205238B2 (en) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | Spectroscopic module |
JP2009300418A (en) * | 2008-05-15 | 2009-12-24 | Hamamatsu Photonics Kk | Spectroscopic module |
JP5205242B2 (en) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | Spectrometer manufacturing method |
JP5205241B2 (en) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | Spectroscopic module |
JP5512961B2 (en) * | 2008-05-15 | 2014-06-04 | 浜松ホトニクス株式会社 | Spectroscopic module and manufacturing method thereof |
JP5205240B2 (en) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | Spectroscopic module manufacturing method and spectroscopic module |
JP5415060B2 (en) | 2008-05-15 | 2014-02-12 | 浜松ホトニクス株式会社 | Spectroscopic module |
JP2009300422A (en) * | 2008-05-15 | 2009-12-24 | Hamamatsu Photonics Kk | Spectroscopic module |
JP5207938B2 (en) | 2008-05-15 | 2013-06-12 | 浜松ホトニクス株式会社 | Spectroscopic module and method for manufacturing spectral module |
JP5205243B2 (en) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | Spectrometer |
US8379203B2 (en) * | 2008-10-20 | 2013-02-19 | Lian-Qin Xiang | Spectrometers with aberration-corrected concave diffraction gratings and transmissive aberration correctors |
FR2938059B1 (en) * | 2008-11-03 | 2011-03-11 | Horiba Jobin Yvon Sas | DYSON-TYPE IMAGER SPECTROMETER OF ENHANCED IMAGE QUALITY AND LOW DISTORTION. |
JP2010261767A (en) * | 2009-05-01 | 2010-11-18 | Canon Inc | Spectroscopic device and image forming apparatus with the same |
FI20106141A0 (en) * | 2010-11-01 | 2010-11-01 | Specim Spectral Imaging Oy Ltd | Spectrometer for transmission in image form |
DE102011078756A1 (en) * | 2011-07-06 | 2013-01-10 | Siemens Aktiengesellschaft | Apparatus and method for reducing stray radiation in spectrometers by means of inner walls |
DE102011078755B4 (en) * | 2011-07-06 | 2014-03-13 | Siemens Aktiengesellschaft | Device and method for reducing stray radiation in spectrometers by means of cover |
CN102538962B (en) * | 2012-01-19 | 2015-11-18 | 杭州远方光电信息股份有限公司 | A kind of low stray light polychromator |
US9823544B2 (en) * | 2013-03-14 | 2017-11-21 | Drs Network & Imaging Systems, Llc | Method and system for controlling stray light reflections in an optical system |
EP3879325A1 (en) * | 2020-03-13 | 2021-09-15 | Optos PLC | Optical component mount |
WO2023228450A1 (en) * | 2022-05-27 | 2023-11-30 | 浜松ホトニクス株式会社 | Spectrometry device |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1201299A (en) * | 1982-11-29 | 1986-03-04 | Albert Brunsting | Optical readhead |
US4798446A (en) * | 1987-09-14 | 1989-01-17 | The United States Of America As Represented By The United States Department Of Energy | Aplanatic and quasi-aplanatic diffraction gratings |
GB8821029D0 (en) * | 1988-09-07 | 1988-10-05 | Sira Ltd | Imaging spectrometer |
US5123740A (en) * | 1991-01-15 | 1992-06-23 | Beckman Instruments, Inc. | Stray light trap in a monochrometer |
US5995221A (en) * | 1997-02-28 | 1999-11-30 | Instruments S.A., Inc. | Modified concentric spectrograph |
US6538736B1 (en) * | 1999-12-01 | 2003-03-25 | Hach Company | Concentric spectrometer with mitigation of internal specular reflections |
-
2000
- 2000-11-03 US US09/705,990 patent/US6538736B1/en not_active Expired - Fee Related
- 2000-11-13 WO PCT/US2000/031165 patent/WO2001040746A1/en active IP Right Grant
- 2000-11-13 CA CA2389367A patent/CA2389367C/en not_active Expired - Fee Related
- 2000-11-13 JP JP2001542163A patent/JP4611591B2/en not_active Expired - Fee Related
- 2000-11-13 EP EP00978594A patent/EP1236025B1/en not_active Expired - Lifetime
- 2000-11-13 DE DE60010322T patent/DE60010322T2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1236025A1 (en) | 2002-09-04 |
EP1236025B1 (en) | 2004-04-28 |
JP4611591B2 (en) | 2011-01-12 |
DE60010322T2 (en) | 2005-05-04 |
JP2003515733A (en) | 2003-05-07 |
US6538736B1 (en) | 2003-03-25 |
WO2001040746A1 (en) | 2001-06-07 |
CA2389367C (en) | 2010-08-24 |
DE60010322D1 (en) | 2004-06-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKLA | Lapsed |
Effective date: 20181113 |