CN100539191C

CN100539191C - Semiconductor device and manufacture method thereof

Info

Publication number: CN100539191C
Application number: CNB2005100927206A
Authority: CN
Inventors: 竹村保彦; 寺本聪
Original assignee: Semiconductor Energy Laboratory Co Ltd
Current assignee: Semiconductor Energy Laboratory Co Ltd
Priority date: 1993-10-01
Filing date: 1994-09-30
Publication date: 2009-09-09
Anticipated expiration: 2014-09-30
Also published as: CN1933114A; CN1881620B; CN100578795C; CN1881620A; CN1933164A; CN100530569C; CN1734790A

Abstract

A kind of semiconductor equipment of the present invention comprises: have the silicon island of insulating surface on substrate, described silicon island comprises source electrode, drain electrode and the raceway groove between described source electrode and described drain electrode; The gate electrode that adjoins described channel arrangements has gate insulation layer between described gate electrode and the described raceway groove; Doped region, its doping content than described source electrode and be configured in described raceway groove and described source electrode and described drain electrode at least one between the concentration of described drain electrode low; With the layer that on described gate electrode and described silicon island, has silicon nitride, described layer has the part that contacts with gate insulation layer, wherein said gate insulation layer has at first on the described raceway groove and the second portion on described doped region, and the thickness of described second portion is thinner than the thickness of described first.

Description

Semiconductor device and manufacture method thereof

Technical field

The present invention relates to a kind of semiconductor device and manufacture method thereof.The present invention be more particularly directed to a kind of at insulating surface, for example, in the dielectric substrate of glass and so on or be formed at the isolated-gate field effect transistor (IGFET) (1GFET) that forms on the surface of dielectric film of silica on the silicon chip and so on.Have, the present invention helps isolated-gate field effect transistor (IGFET) again, particularly with the formation of the N ditch type field-effect transistor of higher voltage drives.It is also to be understood that the present invention forms the TFT advantageous particularly to being lower than at transition temperature (being distortion point) on 750 ℃ the glass substrate.

In addition, the invention still further relates to the active matrix of liquid crystal device, the drive circuit of image sensor or the three dimensional integrated circuits (hybrid integrated circuit) of use aforesaid semiconductor device.

Background technology

In prior art, known TFT is used for driving matrix type liquid crystal device or image sensor or similar device.Particularly, using amorphous silicon to do under the occasion of amorphous TFT of active layer, in order to improve actuating speed, the existing crystal TFT that is developing high mobility.In addition, in order further to improve device property, and improve the high drive ability, have been proposed in and form TFT in the active area with high resistance area (high resistant drain region)." high resistance area " among the present invention or " high resistant drain region ＂ comprises the impurity range (drain region) with high resistivity, lightly doped drain (LDD) and gate electrode and the nonoverlapping deviate region of impurity range.

Yet, in N ditch type TFT, be easy to be captured, thereby the conduction type of high resistance area is transformed into the P type by that part of gate insulating film near the drain region by the caused negative electrical charge of hot carrier.Its result has hindered source/leakage current.

Have again, also must use photoetching technique to form high resistance area.This just means, can not improve the rate of finished products of resulting TFT and the uniformity of characteristic.

Summary of the invention

The objective of the invention is to, improve the quality of TFT and improve output by solving foregoing problems.Particularly, the objective of the invention is to prevent produce high resistance area without photoetching process with self-aligned manner by the caused decreased performance of hot carrier.

Another purpose of the present invention is to use TFT of the present invention to make liquid crystal device.

A further object of the present invention is to make the TFT with height water proofing property, and this moisture content particularly is included in the interlevel insulator that forms with TEOS gas.

A further object of the present invention is, utilizes the electric charge that exists in the interlayer dielectric to stablize the characteristic of TFT.

A kind of semiconductor equipment of the present invention comprises: comprise source electrode, drain electrode and the raceway groove between described source electrode and described drain electrode in described silicon island, the silicon island that has insulating surface on the substrate; The gate electrode that adjoins described channel arrangements has gate insulation layer between described gate electrode and the described raceway groove; Doped region, its doping content than described source electrode and be configured in described raceway groove and described source electrode and described drain electrode at least one between the concentration of described drain electrode low; With the layer that on described gate electrode and described silicon island, has silicon nitride, described layer has the part that contacts with gate insulation layer, wherein said gate insulation layer has at first on the described raceway groove and the second portion on described doped region, and the thickness of described second portion is thinner than the thickness of described first.

In Fig. 1, a N ^-The district is between N-type source region 110 and channel region 3.A gate insulating film 104 is positioned at N ^-On the district 111.In addition, the silicon nitride film 114 of cation is formed on source region and the gate insulating film 104 in one deck energy trapping membrane.It will be appreciated that even hot electron is injected into gate insulating film from the active layer near the source region, the positive charge that also can be present in the silicon nitride film neutralizes.So high resistance area can suitably play a role.In addition, TFT shown in Figure 1 also comprises the deviate region between channel region 3 and high resistance area 111.This deviate region is the extension of channel region, its conduction type identical with channel region (intrinsic).

Description of drawings

With the preferred embodiments of the invention and with reference to the accompanying drawings to describe the present invention aforementioned purpose and characteristics.

Fig. 1 represents the fragmentary cross-sectional view according to TFT of the present invention;

Fig. 2 A～2D represents the profile according to the preferred embodiments of the invention;

Fig. 3 A～3H represents the TFT manufacture craft process according to first embodiment of the invention;

Fig. 4 A～4C represents the manufacture craft process according to the TFT of second embodiment of the invention;

Fig. 5 A～5C has represented to adopt the example of the monolithic integrated circuit of TFT of the present invention;

Fig. 6 A～6F represents the manufacture craft process according to the TFT of third embodiment of the invention;

Fig. 7 A～7F represents the manufacture craft process according to the TFT of fourth embodiment of the invention;

Fig. 8 A～8F represents the manufacture craft process according to the TFT of fifth embodiment of the invention;

Fig. 9 A～9G represents the manufacture craft process according to the TFT of sixth embodiment of the invention;

Figure 10 is the schematic diagram of expression according to liquid crystal device of the present invention;

Figure 11 A～11D represents the manufacture craft process according to the TFT of seventh embodiment of the invention.

Embodiment

In a preferred embodiment of the invention, form the film that one deck can be captured positive charge on high resistance area, silicon nitride film for example directly contacts with high resistance area or with therebetween gate insulation silicon oxide film.The thickness of positive charge capture layer for example is 200～2000

The positive charge that tunicle is captured makes the conduction type of the high resistance area of contiguous capture layer become lightly doped N type, or neutralization is injected into negative electrical charge in the gate insulating film, thereby has avoided by the caused decreased performance of hot current-carrying.For example, on high resistance area,, for applying to the drain region+15V, apply-during 20V voltage, can not be captured by oxidized silicon fiml by the caused negative electrical charge of collision ionization to grid if silicon oxide film is not set.When being provided with silicon oxide film on high resistance area, negative electrical charge is that oxidized silicon fiml is captured, and this electric charge will be neutralized by positive charge.Thereby can prevent that high resistance area from becoming the P type.

Fig. 2 A～2D represents the local relation figure between each embodiment positive charge capture layer and the gate insulating film.In Fig. 2 A, TFT has a channel region 3, source region and

drain region

1 and 5, and the anode oxide film 12 that 6, one gate electrodes of one deck gate insulating film 7 reach around gate electrode also has a pair of high resistance area 2 and 4.In addition, on the TFT upper surface, form an interlayer insulator 8, and source,

drain electrode

9 and 10 are set by this insulator.Have again and be provided with electric charge capture film 11 as shown in the figure.

In Fig. 2 A, this gate insulating film 6 has covered the whole active layer that comprises source region and

drain region

1 and 5 especially.And electric charge capture layer 11 is superimposed on this gate insulating film.

In Fig. 2 B, this gate insulating film 6 extends to outside the edge of channel region 3, has covered

high resistance area

2 and 4, but does not cover source region and drain region.Thereby electric charge capture layer 11, but is directly contacted with 5 with source region and drain region 1 with high resistance area 2 with opened in 4 minutes by gate insulating film 6.

In Fig. 2 C, this gate insulating film has only covered channel region, thereby electric charge capture layer 11 directly contacts with source, drain region and high resistance area.Have, the structure shown in Fig. 2 D is the remodeling to structure shown in Fig. 2 B (or Fig. 2 A) again, extends to wherein that part of gate insulation layer has been thinned outside the gate electrode.

With regard to the structure shown in Fig. 2 A or the 2B, when because hot carrier is injected near the part gate insulating film of the high resistance area 4 (indicating ＂ a ＂ among the figure) in drain region 5 during trap either negative, the positive charge neutralization that this negative electrical charge is just captured in the electric charge capture layer 11.For the effect with the positive charge in the capture layer 11 extends to resistive formation, this gate insulating film should be so not thick.For example, preferably make the thickness of this gate insulating film 500

Or below.

With regard to Fig. 2 C,

resistive formation

2 and 4 is not provided with gate insulating film.Thereby, the always weak N type of the conduction type of this resistive formation 2, this is because the existence of captive positive charge is arranged at electric charge capture layer.Hope is without plasma CVD, and forms silicon nitride film with optical cvd or hot CVD, in order to avoid active layer is by plasma damage.

With regard to Fig. 2 D, that part gate insulating film 6 that is positioned on the resistive formation is corroded, becomes thinner than that minute gate insulating film that is positioned on the channel region, so that strengthen the effect of the positive charge of being captured by electric charge capture layer again.This structure is favourable, because can make the thickness of the gate insulating film on the raceway groove thicker, thereby needn't worry that the reliability of gate insulating film is affected.Perhaps, make dielectric film can cover the whole surface in source, drain region.

High resistance area among the present invention is to utilize gate electrode and by the formed anode oxide film of electrode anode oxidation gate electrode, form with self-aligned manner.The thickness of anode oxide film can accurately and very equably be controlled.For example, can make film be thinner than 1000 on request

, or be thicker than 5000

(for example 1 μ m).So the thickness of high resistance area (width) can freely accurately utilize anode oxide film to control.

In addition, used anodic oxide coating divides two kinds among the present invention.A kind of is barrier type anodic oxide coating and another kind is the porous anode layer.When corrosion barrier type anodic oxide coating, must use the corrosive agent that comprises hydrofluoric acid.Yet, the porous anode layer can be corroded with the corrosive agent of phosphoric acid.Thereby can only corrode the porous anode layer, and do not damage silicon or the silica that constitutes TFT.In addition, porous anode layer and barrier type anodic oxide coating all are difficult to use dry etching.Particularly porous anodic oxide is compared with silica, and its selection rate is high especially.So, can obtain the structure shown in Fig. 2 B as follows.

For example at first form the porous anode layer of 1 μ m at least at the side surface of gate electrode.Make mask with anodic oxide coating, remove that part of gate insulating film that extends to beyond the gate electrode, then remove the porous anode layer by corrosion.As a result, gate insulating film extends to and exceeds gate electrode side 1 μ m, shown in Fig. 2 B.In order to obtain high resistance area 2 and source,

drain region

1 and 5, introduce N type foreign ion from the top of gate electrode.To having the foreign ion of certain energy, as the phosphonium ion for 30KeV, the Impurity Distribution on depth direction is observed Gauss and is distributed, and Cmax is approximately apart from surface 100

Deeply.So the impurity that part of active layer of gate insulation layer is not set up can be increased to quite high concentration, however the semiconductor regions below gate insulating film, because a large amount of impurity is stopped that by this dielectric film its impurity does not increase so many.

So, formed source region and

drain region

1 and 5 of mixing, and below the gate insulating film that extends with high concentration impurities, formed the high resistance area 2 that the low concentration impurity with low 1 or 2 figure places mixes simultaneously.When reducing the acceleration energy of foreign ion, the total impurities that is introduced in high resistance area by dielectric film becomes still less, and that its conduction type becomes is identical with channel region.

[embodiment 1]

With reference to Fig. 3 A～3H, explain manufacture craft process according to TFT of the present invention.

At first, give alkali-free glass substrate 101, for example (300mm * 400mm or 100mm * 100mm) apply a bed thickness 1000～3000 to Corning 7059

Silicon oxide film 102.This silicon oxide film can form by sputter in the oxygen atmosphere.Yet, preferably utilize plasma CVD, make raw material with TEOS (tetraethoxysilane) gas, to improve production efficiency.Can use other material to replace silica, for example, individual layer aluminium nitride, double-deck silicon nitride and aluminium nitride.Aluminium nitride can form by reactive sputtering in blanket of nitrogen.

Then, on silicon oxide film 102, form active layer 103, for example a silicon metal.＂ silicon metal ＂ among the present invention can be any type of silicon that comprises crystal at least in part, for example, and monocrystalline, polycrystalline or half amorphous.In the present embodiment, form thick 300～5000 by plasma CVD or LPCVD

, best 500～1000

Amorphous silicon film, then this film is put into 550～600 ℃ reducing atmosphere 24 hours, make its crystallization.This step can use laser annealing to finish.At last, the film of crystallization is carved into figure, obtains active layer 103.

Then, form the dielectric film 104 that for example forms and cover active layer 103, form gate insulating film by silica.The thickness of dielectric film is 300～1500

, for example 500

Or it is thinner.Available sputtering method forms this film.

On dielectric film 104, formation can be used for forming gate electrode by anodised material.Can aluminium for example be arranged anodised material, tantalum, titanium and silicon.These materials can use with form of single sheet respectively.Perhaps, also can utilize two, three kind of material multilayer form, for example, the double-decker of forming by aluminium and stack titanium silicide thereon, or the double-decker of forming by titanium nitride and thereon the aluminium of superposeing.The thickness of each layer changes with desired device property.In the present embodiment, used aluminium film by the Sc of the Si of electron beam evaporation or the formed 1wt% of containing of sputter or 0.1～0.3wt%.

Have again, on the aluminium film, form one deck plays the mask effect in follow-up anodic oxidation step film.To be used as mask with the photoresist material (be OFPR 800/30cp, Tokyo Oka produces) that spin coating forms.For improving photoresist material and adhesiveness, be preferably in and form before the photoresist material formation thick 100～1000 on the surface of aluminium film

The barrier type anode oxide film.In addition, this barrier type anode oxide film prevents that porous anodic oxide is formed at the top at aluminium in one step of back.

Then, aluminium is carved into gate electrode 105 and mask 106 figures with photoresist film, as shown in Figure 3A.

With reference to Fig. 3 B, apply electric current in electrolyte, for gate electrode 105, only the side surface at gate electrode forms porous type anode oxide film 107.Use acidic electrolysis bath, for example the aqueous solution with citric acid, oxalic acid, phosphoric acid, chromic acid or the sulfuric acid of 3-20% can obtain the porous type anode oxide film.Added voltage is lower, and for example in the scope of 10-30V, this moment, holding current was constant.Adopt this low voltage, it is thick that porous anodic oxide can grow into 0.3～25 μ m, for example thick to 1.0 μ m.

In the present embodiment, the thickness of anodic oxide 107 is preferably 0.3～2 μ m, for example 0.5 μ m.The temperature of oxalic acid remains on 30 ℃.Applied voltage is 10V.Anodic oxidation was carried out～40 minutes.Control the thickness of this film with the anodised time.

In addition, after forming porous anodic oxide 107, preferably carry out anodic oxidation in the following manner, on the side surface of gate electrode and upper surface, form barrier type anodic oxide 108.

That is, remove after the mask 106, in electrolyte, apply electric current to gate electrode.In this anodic oxidation, use the ethylene glycol solution contain 3～10% tartaric acid, boric acid or nitric acid.The temperature of solution preferably keeps below room temperature (20 ℃), for example, and about 10 ℃, to improve the quality of film.The increase that is directly proportional with the applied voltage amplitude of the thickness of anodic oxide 108.When applied voltage was 150V, thickness can reach 2000

The thickness of this film should be determined according to skew or the desired size in overlay region.But, must apply the voltage that is higher than 250V, so that increasing, the thickness of film surpasses 3000

So thickness is preferably not to be thicker than 3000

, to avoid using the high like this voltage (Fig. 3 C) harmful to the TFT characteristic.

Even it should be noted that after forming porous anodic oxide to form barrier type anodic oxide 108 again, it also is formed in the inboard of porous anodic oxide 107.Use the phosphoric acid corrosion agent, the corrosion rate of the corrosion rate of porous anodic oxide being compared the barrier type anodic oxide is big 10 times.Therefore, the barrier type anodic oxide is corroded by the phosphoric acid corrosion agent hardly, so in the back during step corrosion porous type anodic oxide 107, it can protect aluminum gate electrode.

After forming the porous type anodic oxide, make mask with porous anodic oxide, with dielectric film 104 be carved into gate insulating film 104 shown in Fig. 3 D ' figure.Corrosion depth can arbitrarily be determined.That is, can remove the surface that dielectric film exposes active layer fully, as shown in drawings, also can only remove the top of dielectric film, active layer is exposed.But, wish to corrode fully dielectric film from productivity ratio, output, uniformity.That part of dielectric film 104 that is positioned at grid electricity level and porous anodic oxide below identical thickness when having kept with original formation.

Adopt plasma dry etching dielectric film 104, get final product isotropic etch, but also anisotropic etch (RIE).The selection that must make silicon and silica is than big fully, so that active layer is not corroded is so much.In the present embodiment, use CF ₄Gas is made corrosive agent.

In addition, when gate electrode is mainly formed by aluminium, tantalum or titanium, and dielectric film 104 is suitable with fluorine-containing etchant gas when mainly being formed by silica, because silica easily is corroded, and minimum to the corrosion rate of aluminium, tantalum oxide and titanium oxide.In addition, also can use hydrofluoric acid containing, as contain the corrosive agent of 1/100 hydrofluoric acid, adopt wet etching.

Gate insulating film 104 ' afterwards, the corrosive agent of use phosphoric acid removes porous anodic oxide 107 forming.For example a kind of mixed acid that comprises phosphoric acid, acetate and phosphoric acid.Corrosion rate is approximately 600

/ minute.Following gate insulation layer 104 ' remain incorruptibly, shown in Fig. 3 E.

Formed like this gate insulation layer 104 ', its width has exceeded outer rim one segment distance " y " of barrier type anodic oxide 108, shown in Fig. 3 D.By explanation in front as can be known, this segment distance " y " is definite by the thickness (width) of the porous anodic oxide film in the self-registered technology 107.

Then, with reference to Fig. 3 F, with gate electrode 105 and the anodic oxide 108 that forms thereon and gate insulation layer 104 ' the extension make mask, by ion doping, with N type foreign ion, for example phosphonium ion is introduced the active layer position.Dosage is 1 * 10 ⁴～5 * 10 ¹⁵At/cm ², for example 2 * 10 ¹⁵At/cm ²Acceleration energy is 10～60keV, for example 40keV.Impurity gas is hydrogen phosphide (PH ₃).With this understanding, make

zone

110 and 113 impurity concentration be increased to enough height, for example 1 * 10 ²⁰～2 * 10 ²¹At/cm ³, form source region and drain region, also increase for example 1 * 10 with the impurity concentration of

time domain

111 and 112 ¹⁷～2 * 10 ¹⁸At/cm ³, because the existence of gate insulating film is arranged thereon.Impurity concentration is measured with secondary ion mass spectroscopy view (SIMS).In addition, these concentration are respectively with 5 * 10 ¹⁴～5 * 10 ¹⁵At/cm ²And 2 * 10 ¹³～5 * 10 ¹⁴At/cm ²Dosage is corresponding.In general, source,

drain region

110 and 113 impurity concentration should be than the impurity concentration of

high resistivity region

111 and 112 high 0.5～3 figure place.

Its result has formed the lower source of resistivity,

drain region

110 and 113 and

high resistivity region

111 and 112.

Subsequently, shown in Fig. 3 G, on whole surface, form thick 200～2000 by plasma CVD

Silicon nitride film 114.The ratio of component that uses silane and ammonium is 250～400 ℃ as the mixture underlayer temperature of 1:5, for example 350 ℃.The component that it increases silane just contains excessive silicon in the silicon nitride, cause forming the positive charge trapping centre of high concentration.If the component of silane increases too much, then be harmful to insulation characterisitic.

Perhaps,, or the nitrogen ion is injected in the silicon fiml, also can forms silicon nitride film by low pressure chemical vapor deposition.

After forming silicon nitride film 114, with xeF excimer laser (wavelength is 355nm, and pulse duration is 40n sec) irradiation, so that the foreign ion that is injected into active layer is activated.Should select Wavelength of Laser, make laser transmissive silicon nitride film.

Replace excimer laser, use other laser also can.But pulse laser is more desirable than the sharp title of continuous wave (CW laser), because the exposure time of CW laser is long, the danger that makes by tapetum expanded by heating and peeling is arranged.

Cause example, iraser is arranged in pulse laser, as Nd:YAG laser (preferred Q-switched pulse vibration), the second harmonic of Nd:YAG (visible light), and ultraviolet laser device, as KrF, XeC1 and ArF excimer laser.When illuminating laser beam above metal film, must select Wavelength of Laser, so that do not reflected by metal film.But when metal film is very thin, then be out of question.In addition, also can be from the side of substrate irradiating laser.In the case, must select the laser of transmissive silicon.

Can also adopt visible light or near-infrared light modulation to anneal to substitute laser annealing.In the case, for surface region being heated to 600～1000 ℃, for example implementing annealing several minutes, or anneal tens of seconds at 1000 ℃ at 600 ℃.Can not make glass lined be heated to so high temperature with near infrared ray (1.2 μ m) annealing, because this near infrared ray is selected to have absorbed by Si semiconductor.Have again, when shortening irradiation, can prevent that glass is heated.

After impurity activation, use ion doping, hydrogen ion is incorporated into active layer.Accelerating voltage is 10～50kV, for example 20kV.Dosage is with 1 * 10 ¹⁴～5 * 10 ¹⁵At/cm ², for example 1 * 10 ¹⁵At/cm ²Do like this is because silicon nitride film does not allow hydrogen to see through it during normal thermal annealing.Thereby hydrogen can be doped to the zone between channel region and source, the drain region automatically.In addition, after increasing the laser active of impurity, preferably implement hydrogen ion doped.

With reference to Fig. 3 H, form thick 2000 by plasma CVD silicon oxide deposition film

～1 μ m, for example 3000

Interlevel insulator 115.Subsequently, form contact hole, form the aluminium electrode or connect up 116 or 117 by contact hole by interlevel insulator.Then, in 200～400 ℃ blanket of nitrogen,,, the hydrogen atom of introducing of preceding step talks about so that swashing with total annealing.Make TFT so finish.

[embodiment 2]

Present embodiment adopts with embodiment 1 described until the same process process that obtains structure shown in Fig. 3 F.Omit unnecessary explanation.But the thickness of dielectric film 104 thick than embodiment 1 in the present embodiment.For example, dielectric film is 1000～1500

, for example 1200

Thick, so that can make grid leakage current reduce to minimum, and in anode oxidation process, can bear high voltage.

With reference to Fig. 4 A, it is corresponding to Fig. 3 E, with gate electrode and dielectric film 104 ' make mask, with 1 * 10 ¹⁴～3 * 10 ¹⁶At/cm ², for example 2 * 10 ¹⁵At/cm ²Dosage, with 50～100kV, for example the accelerating voltage of 80kV carries out the ion doping of nitrogen ion.Make accelerating voltage to the nitrogen ion is almost completely passed do not exist above it dielectric film 104 ' active layer zone 110 and 113.Thereby do not mixed effectively by nitrogen in this zone 110 and 113.When measuring with SIMS, the concentration of nitrogen is lower than 1 * 10 ¹⁹At/cm ³On the other hand, in the zone 121 and 122 below gate insulating film 104 ' expandable part, nitrogen concentration has its maximum, and promptly 5 * 10 ¹⁹～2 * 10 ²¹At/cm ³(according to the degree of depth).Like this, high resistance area will be played in zone 121 and 122.

Then,, press self-aligned manner, with gate insulating film 104 ' further be carved into gate insulating film 104 according to barrier type anodic oxide 108 with reference to Fig. 4 B " figure.Then, form thick 200～2000 by plasma CVD in the mode identical with embodiment 1

, for example thick 1000

Silicon nitride film 114.With ion doping phosphonium ion is incorporated in the active layer again.Its dosage is 5 * 10 ¹⁴～5 * 10 ¹⁵At/cm ²Accelerating voltage is 50～100kV, for example is 80kV.Make dopant gas with hydrogen phosphide.Its result makes zone 110,113 and 121,122 mix the phosphorus of same amount.When measuring with SIMS, the concentration that records phosphorus is 1 * 10 ²⁰～2 * 10 ²¹At/cm ³, this is corresponding to 5 * 10 ¹⁴～5 * 10 ¹⁵At/cm ²Dosage.But because of there being nitrogen to exist, the resistivity in zone 121 and 122 is than

zone

110 and 113 height.In addition, when silicon nitride film mixes at phosphonium ion, prevented that the surface of active area is damaged.

Phosphonium ion and nitrogen ion are for example used excimer laser (wavelength 355nm, pulsewidth 40ns) to activate by subsequent annealing steps.Then, by the mode identical, introduce hydrogen ion by ion doping with embodiment 1.

At last, with reference to Fig. 4 C, form thick 3000 of silicon oxide-containing by CVD

Interlevel insulator 115.Form the aluminium electrode or connect up 116 and 117 by the contact hole that is formed in the interlevel insulator.In 200～400 ℃ nitrogen, anneal again.So just finished the TFT of embodiment 2.

With reference to Fig. 5 A, the monolithic integrated circuit embodiment that uses according to TFT of the present invention is described.Monolithic integrated circuit for example is used as the circuit substrate of active matrix liquid crystal device, and pixel TFT wherein and the peripheral circuit that is formed by TFT all are integrated on the same substrate.Show TFT1～TFT3 in the drawings.TFT1 and TFT2 are used as driving stage TFTS, and its barrier type anodic oxide is 200～2000

, for example 1000

Thick.Because of the diffraction of the foreign ion in ion doping process, gate electrode and high resistance area have slightly overlapping each other.The drain electrode of N ditch type TFT1 interconnects through the drain electrode of wiring 503 with P ditch type TFT2.In addition, the source ground of TFT1, and the source electrode of TFT2 is connected with power supply, to constitute a CMOS inverter.The cmos circuit that it should be noted that other type can be used as peripheral circuit.

On the other hand, TFT3 is used as the pixel TFT that drives pixel.The thickness of its anodic oxide is 1000

, TFT1 and TFT2 are as the same.The width of the high resistivity region of TFT1 and TFT2 " y " (for example) is as thin as 0.2 μ m, and the width of the high resistivity region of TFT3 is made 0.4～2 μ m, and for example 0.5 μ m's is thick, so that reduce the parasitic capacitance between leakage current and grid leak.The width of high resistivity region for a change as mentioned above should be controlled the thickness of porous anodic oxide.Therefore, preferably the gate electrode with each TFT is separated from each other, so that carry out anode oxidation process independently at each TFT gate electrode.

In addition, though TFT1 and TFT3 are N ditch types, and TFT2 is a P ditch type.So the technical process of embodiment 1 and embodiment 2 is not suitable for formation TFT2.Therefore, though with gate insulating film 104 ' be carved into the film 104 ＂ figures shown in Fig. 4 c, this step should not implemented TFT2, so that silicon nitride film 114 does not directly contact with high resistivity region.If silicon nitride film directly contacts with high resistivity region, the positive charge of being captured by silicon nitride film can change the conduction type of high resistivity region into the N type, causes obstruction source, leakage current.Therefore, P ditch TFT has structure as shown in the figure.

[embodiment 3]

With reference to Fig. 6 A, by the method identical with embodiment 1, on Corning 7059 glass substrate 101, form silicon oxide-containing counterdie 102, have 800 of certain degree of crystallinity

Thick island silicon fiml 103, thick 1200

Silicon oxide film 104, thick gate electrode 105 and the porous anodic oxide film on the gate electrode side surface 107 (3000 of 200nm～1 μ m made of aluminum

～1 μ m is as 5000

Thick).

Form thick 1000～2500 by method again with embodiment 1

Barrier type anode oxide film 108 (Fig. 6 B).

Make mask with porous anodic oxide 107, with silicon oxide film 104 corrode into gate insulating film 104 '.Make mask with barrier type anodic oxide 108 then, erode porous anodic oxide 107.Subsequently, with gate electrode and the barrier type anodic oxide and the gate insulating film that form thereon make mask, introduce impurity by ion doping, form low-

resistance impurity range

110 and 113 and high resistant impurity range 111 and 112.Dosage is 1～5 * 10 ¹⁴At/cm ²Accelerating voltage is 30～90kV.Impurity element is phosphorus (Fig. 6 c).

Form layer of metal film 123, for example thick 50～500 on the whole surface with sputtering at again

Titanium film.Also can make other metal such as nickel, molybdenum, tungsten, platinum and palladium.The result forms the direct metal film 123 (Fig. 6 D) that contacts with 113 with low-resistance region 110.

Then, (wavelength 248nm, pulsewidth 20ns) shines this film with the KrF excimer laser, so that activate the impurity of introducing, and makes the pasc reaction of metal film and active layer.So just formed metal silicide region (titanium silicide) 125 and 126.The energy density of laser is 200～400mJ/cm ², preferred 250～300mJ/cm ²In addition, substrate is heated to 200～500 ℃ in the laser irradiation process, in order to avoid the metal film peeling.Then with contain hydrogen peroxide, ammonia and water, component be the mixed liquor corrosive agent of 5:2:2 erode the metal film that remains on the gate electrode and not with the gate insulating film of pasc reaction.This has just formed

metal silicide district

125 and 126.

Then, partly make mask with gate electrode, corrosion gate insulating film 104 ', formation has thin position (200～500 shown in Fig. 6 E

Thick) new gate insulating film 104 ＂.On whole surface, form thick 200～2000 by plasma CVD again

Silicon nitride film 14.Because of

high resistance area

111 and 112 is covered by the thin part of gate insulating film, can avoid the damage that causes by plasma CVD.

Then, by the method identical,, hydrogen ion is introduced active layer by ion doping with embodiment 1.

At last, with reference to Fig. 6 F, form 2000 with CVD

～1 μ m, for example 3000

The interlevel insulator 115 of silicon oxide-containing.Form thick 2000 by the contact hole that is formed at interlevel insulator

～1 μ m is as 5000

The aluminium electrode or connect up 116 or 117.

In the present embodiment, contact with titanium silicide with 117, thereby can improve interface between source, drain region and

electrode

116 and 117, and improve the reliability of contact because of aluminium electrode 116.Be preferably in addition and form titanium nitride layer between aluminium electrode and the titanium silicide as barrier metal.The sheet resistance in metal silicide district is 10～50 Ω/mouths.

High resistance area

111 and 112 sheet resistance are 10～500 Ω/mouths.

In addition, the silicon nitride film 114 that is formed on

high resistance area

111 and 112 relies on gate insulating film to prevent to invade from the outside as sodium one class free ions.

Have, the zone 110 of mixing high concentration phosphorus impurity is roughly consistent with

metal silicide district

125 and 126 with 113 again.In addition, low-

resistance region

110 and 113 and each borders of

high resistance area

111 and 112 be with gate insulating film 104 ' lateral margin expand simultaneously.Also have, gate insulating film 104 ' lateral margin also expand simultaneously with the medial margin of

metal silicide district

125 and 126.

Fig. 5 B represents the embodiment of the monolithic integrated circuit of the TFT of technology shown in a kind of Fig. 6 of use A～6F.The monolithic integrated circuit of Fig. 5 B is used as, and for example the active matrix liquid crystal device wherein is integrated on the same substrate by pixel TFT and the peripheral circuit that TFT forms.In the drawings, express TFT1～TFT3.As driving stage TFT, its barrier type anodic oxide is thick to be 200～2000 with TFT1 and TFT2

, for example 1000

Thick.On the other hand, make pixel transistor with TFT3, its barrier type anodic oxide also is 1000

Thick.The source of TFT3, drain electrode and the pixel capacitors 505 that is formed by ITO are connected.The lead-out terminal of label 506 expression inverters.

The thickness of barrier type anodic oxide is chosen such that the aligning source, edge that makes gate electrode, the edge in drain region, consider the diffusion of implanted dopant.When the width " y " of TFT1 and TFT2 high resistance area is 0.2 μ m (for example), the width that makes the TFT3 high resistance area is 0.4～5 μ m, for example 0.5 μ m.In order to change the width of high resistance area, should be by the thickness of above-mentioned explanation control porous anodic oxide.For this reason, require the gate electrode of each TFT to be separated from each other, so that can carry out anodic oxidation separately to the gate electrode of each TFT.Because the high resistance area width of TFT3 is wideer, when applying voltage, can reduce the parasitic capacitance that exists between gate electrode and the leakage.

In addition, when TFT1 and TFT3 were N ditch type, TFT2 was a P ditch type.Thereby the technology of embodiment 1 and embodiment 2 is unsuitable for making TFT2, explains same precedent.

In addition, before foreign ion injects, can form titanium film.In the case, this help titanium film prevent the surface in ion doping process, charge.In addition, can after the ion doping step, anneal, form titanium film then with laser or similar light.After titanium film forms step, can form titanium silicide with photoirradiation or thermal annealing.

[embodiment 4]

With reference to Fig. 7 A, by the method identical, on Corning 7059 glass substrate 101, form the counterdie 102 that comprises silica with embodiment 1, silicon metal island district 103, silicon oxide film 104, be made from aluminum thick 2000

The gate electrode 105 of～1 μ m, and at the porous anodic oxide film 107 (6000 of gate electrode side surface

Wide).Refer again to embodiment 1 described method, form barrier type anode oxide film 108.

Make mask with porous anodic oxide 107, corrosion oxidation silicon fiml 104, formation gate insulating film 104 '.Then, make mask, erode porous anodic oxide 107 with barrier type anodic oxide 108.Then, on whole surface, form thick 50～500 with sputtering method

The metal film 123 as titanium and so on.

Introduce impurity element with ion doping subsequently.Its dosage is 5 * 10 ¹⁴～5 * 10 ¹⁵At/cm ²Accelerating voltage is 10～30kV.Impurity element is a phosphorus.Because accelerating voltage is very low, when the impurity of q.s was mixed in

zone

110 and 113, the impurity concentration that is incorporated into

zone

111 and 112 was lower, because the existence of gate insulating film is arranged.Low-resistance region (source, drain region) 110 and 113 and

high resistance area

111 and 112 usefulness hydrogen phosphide (PH have been formed like this ₃) make impurity gas (Fig. 7 C).

Then, (wavelength 248nm pulse duration 20ns) shines on this film with the KrF excimer laser, so that the impurity that

active region

111 and 112 has been introduced, and makes the pasc reaction of titanium film and active layer.

Titanium silicide layer

125 and 126 have so just been formed.The energy density of laser is 200～400mJ/cm ², be preferably 250～300mJ/cm ²In addition, during laser irradiation, preferably substrate is heated to 200～500 ℃, in order to avoid the metal film peeling.Can use the annealing of visible light or near-infrared lamp to substitute laser (Fig. 7 D).

Then, with containing hydrogen peroxide, ammonium and water component corrosive agent, erode not with pasc reaction and still stay metal film on gate electrode and the gate insulating film than the mixture of 5:2:2.

Metal silicide district

125 and 126 have been formed like this.

After this, portion makes mask with gate electrode, by dry corrosion gate insulating film 104 is formed figure, forms new 104 ＂ of the gate insulating film shown in Fig. 7 E.On whole surface, form thick 200～2000 with plasma CVD again

Silicon nitride film 114.

After this, hydrogen ion is introduced active layer, then this structure is annealed in blanket of nitrogen by ion doping.Form by CVD again and comprise silica, for example 6000

Interlevel insulator 115.Form the aluminium electrode or connect up 116 and 117 by the contact hole that forms at interlevel insulator.This just finishes the TFT with high resistance area.

Fig. 5 C represents to be used for according to the TFT of the 4th embodiment an example of active matrix liquid crystal device pixel.In the drawings, TFT zone of 507 expressions, zone, the auxiliary capacitor of the electric capacity of zone 508 expression subsidy pixel capacitors, the contact zone of zone 509 expressions, first and second wirings.Silicon nitride film 512 covers active layer, the gate electrode of TFT and the

wiring

510 and 511 that forms (being provided with anode oxide film on it entirely) on the plane identical with gate electrode.On silicon nitride film, form interlevel insulator 513 again.

This TFT is provided with source electrode 516 and drain electrode 517.This electrode 517 is connected with ITO pixel capacitors 514.Remove the interlevel insulator 513 that covers wiring 510 in zone 515.Pixel capacitors 514 and wiring 510 are mutual to forming capacitor by middle anode oxide film and silicon nitride film 512.In the case, because electrode gap is little, and the dielectric constant of silicon nitride and anodic oxide (aluminium oxide) is big, thereby available small size obtains big electric capacity.

[embodiment 5]

With reference to Fig. 8, on Corning 7059 glass substrate 101,, form the counterdie 102 that comprises silica by the method identical with embodiment 1, crystal semiconductor island district 103, for example, silicon semiconductor region oxide-film 104, and made of aluminum thick 2000

The gate electrode 105 of～1 μ m.

Then, use the condition identical,, form porous anodic oxide film 107 (6000 at the upper surface and the side surface of gate electrode with embodiment 1

Thick) (Fig. 8 B).

Between gate electrode and porous anodic oxide, form barrier type anode oxide film 108 (Fig. 8 C) again.

Subsequently, make mask with the barrier type anodic oxide of gate electrode and upward formation thereof, by ion doping, with 5 * 10 ¹⁴～5 * 10 ¹⁵At/cm ²Dosage introduce N type impurity element.Accelerating voltage is 40～100kV.Make impurity gas with phosphorus.Therefore form low-resistivity impurity range 110 and 113.Channel region exceed the gate electrode side apart from ＂ Z ＂, form the deviate region of intrinsic basically.This distance is by the width decision of porous and barrier type anodic oxide 107 and 108.Form high resistance area (Fig. 8 D) like this.

Then, remove porous type anodic oxide 107, expose the surface of barrier type anodic oxide 108 with etch.

Then, (wavelength 355nm, pulsewidth 40ns) shines on the film with the KrF excimer laser, makes the impurity activation of introducing.Laser energy density is 200～400mJ/cm ², preferred 250～300mJ/cm ²In addition, during laser irradiation, substrate can be heated to 200～500 ℃, in order to avoid the metal film peeling.Have, this step process is carried out in available visible light or near infrared lamp annealing again.On whole surface, form thick 200～2000 by plasma CVD again

For example 1000

Silicon nitride film 114.

After this, hydrogen ion is introduced active layer, then this structure is annealed in blanket of nitrogen, with activate hydrogen (Fig. 8 E) by ion doping.

At last, with reference to Fig. 8 F, comprise 6000 of silica with CVD formation

Interlevel insulator 115.Form contact hole on interlevel insulator, the through hole contact forms the electricity of being made by titanium nitride and aluminium multilayered films and will and connect up 116 and 117 again.So just finished the TFT of fourth embodiment of the invention.

[embodiment 6]

Fig. 9 A～9F represents the manufacture method according to sixth embodiment of the invention TFT.On glass substrate 101, form thick 3000 by sputter or plasma CVD

Silicon oxide film 102.On this silicon oxide film 102, form 500 by plasma CVD or LPCVD

Thick amorphous silicon film then makes the silicon fiml crystallization by heating or laser irradiation.Then silicon fiml is carved into the active layer 103 of isolated-gate field effect transistor (IGFET).And nonessential so can not, amorphous silicon film also can directly be made active layer (Fig. 9 A) without crystallization.

Then, form 1000 by plasma CVD or decompression hot CVD

Thick silicon oxide film 104 is made interlevel insulator.Deposited by electron beam evaporation forms the aluminium film that contains 0.18% scandium again.Then, this aluminium film surface of anodic oxidation forms in containing 5% tartaric ethylene glycol solution and is thinned to 100

Oxide layer 127.

The aluminium film is carved into island aluminium film 105 figures with anode oxide film, forms gate electrode (Fig. 9 B).

Then, the citric acid solution with 10% forms wide by 600 by anodic oxidation

Porous anodic oxide film 107 (Fig. 9 C).

Subsequently, remove dense oxidation film 127,, carry out anodic oxidation once more, form blocking anode oxide-film 108 then with containing 5% tartaric ethylene glycol solution.

Make mask with gate electrode 105, barrier type anodic oxide 108 and porous anodic oxide 107, corrode a part of silicon oxide film 104 (Fig. 9 D).

Below with reference to Fig. 9 E, with 5 * 10 ¹⁴～5 * 10 ¹⁵At/cm ²Dosage, N type impurity element phosphorus is introduced, with formation source, drain region 110 and 113.Simultaneously, form

light doping section

111 and 112, because there is silica to exist thereon.In addition, also formed

skew grid region

128 and 129, its conduction type is identical with channel region, i.e. Intrinsical.After this, use heat treatment, laser or high light irradiation activate the impurity that inserts.

Phosphorus in the source, drain

region

110 and 113 concentration is higher than

light doping section

111 and 112 2 to three numerical digits.For example, the concentration in source, drain region is 1 * 10 ²⁰～2 * 10 ²¹At/cm ³, and be 10 at light doping section ¹⁷～2 * 10 ¹⁸At/cm ³

With reference to Fig. 9 F, on whole surface, form silicon nitride film 114 again.As the method that forms silicon nitride film, can use plasma CVD.Yet,, also can use optical cvd or hot CVD for improving surface condition.In addition, available silane and ammonium, silane and N ₂O or the mixture of the two are as raw material.Available dichlorosilane substitutes silane.Silicon nitride thickness 500～2000

, for example 1000

After silicon nitride film forms, laminated construction is carried out 2 hours thermal anneal process at 350 ℃, insert the caused damage of step so that eliminate to gate silicon oxide dielectric film 104, source, drain

region

110 and 113 by impurity.In annealing process, the hydrogen that is contained in the silicon nitride can spread, and can eliminate the defective that is present in silicon oxide film 104 and source, drain

region

110 and 113 surfaces through annealing.

Then,, make original gas, deposit 5000 with TEOS by plasma CVD

Or thicker silica, form interlayer dielectric 115.Should be understood that the silicon oxide film that is formed by TEOS has the trend of trapped electron.Yet silicon nitride film 114 is captured positive charge, and electronics has so just neutralized.Thereby adjoining the silica that is formed by TEOS, to form silicon nitride film be very favourable.

[embodiment 7]

Embodiments of the invention 7 relate to TFT is made in use according to the circuit substrate of the present invention's formation liquid crystal device.Figure 10 represents that the meaning of liquid crystal device shows circuit diagram, in pair of substrate is arranged, between the double-basis sheet, liquid crystal is set, one of them substrate is provided with the semiconductor chip that is assemblied in usually on the computer motherboard.Thereby, be a kind of small-sized gossamery element.

In the drawings, the substrate of label 15 expression liquid crystal cells.On substrate 15, form active matrix circuit 14, it comprises some pixels, each pixel all comprises a TFT11, pixel capacitors 12 and auxiliary capacitor 13.In addition, form the x-decoder/drivers by TFT on substrate, Y-decoder/drivers and XY-driver are in order to drive pixel.Certainly, the TFT that can use aforementioned each embodiment to describe.By wire bond method or COG (be contained on glass) method, on substrate, form semiconductor chip to chip again.In the drawings, constitute patch memory, memory, CPU and input port by these chips.Also can form other chip.

Input port reads from the signal of outside input, and changes shows signal into.Patch memory is proofreaied and correct the input signal or the similar signal of each pixel according to the concrete property of active matrix board.Especially, patch memory comprises the nonvolatile storage of the special information of each pixel of having stored this plate, for example, when in an electro-optical device point defect being arranged, correction signal is provided for defective pixel on every side, does not so just show defective.In addition, when other pixel of brightness ratio of a pixel hangs down, be compensate for brightness, strong information is delivered to this pixel.Because the defect information difference of the pixel in each plate, so the information of each board memory storage in patch memory is also different.

Used identical of the effect of CPU and memory and conventional computer.Particularly, memory comprises that has a RAM who stores with the corresponding demonstration of each pixel.These chips are cmos type entirely.

In addition, a part of aforementioned chip is made of TFT of the present invention.The liquid crystal substrate of present embodiment has a CPU and the memory that is fitted thereon, can with simple electronic device, compare as personal computer.This is very favourable to making the liquid crystal display systems miniaturization and enlarging application.

Form pixel TFT11 as follows.

With reference to Figure 11 A, on glass substrate 101, form bottom silicon oxide film 102 by sputter.Then, form thick 500 by plasma CVD or low pressure hot CVD

Amorphous silicon film.Make the amorphous silicon film crystallization with heating or laser irradiation, then, this film is carved into the figure of active layer 103.

With reference to Figure 11 B,, form thick 1000 by plasma CVD or sputter

Silicon oxide film 104, make gate insulating film.Contain thick 6000 of 018wt% scandium by deposit again

Aluminium film and needle drawing form grid electricity grid 105.This aluminium electrode 105 is carried out anodic oxidation in containing 5% tartaric ethylene glycol solution, form thick 2000

Closely knit anode oxide film 108.

Make mask with gate electrode and anode oxide film 108, by plasma doping, with phosphonium ion, N type impurity is introduced part active layer 103, formation source, drain region 110 and 113.Because there is anode oxide film 108 to exist, forming between channel region 3 and source, the

drain region

110 and 113 after a pair of deviate

region

128 and 129 mixing phosphonium ion, with heat treatment or laser or high light irradiation activation of source, drain region.

With reference to Figure 11 C,, form thick 1000 by plasma CVD with silane and ammonium

Silicon nitride film 114.Subsequently, for example heat total in 400 ℃ the inert atmosphere at 300～500 ℃.Heating and continuous 1 hour.Heating thus, the hydrogen atom that is contained in the silicon nitride film is diffused in the silicon oxide film 104, has eliminated because the defective that the phosphorus doping step brings for the oxidation silicon fiml.

By plasma CVD, do original material with TEOS and oxygen and form thick 5000 again

Silicon oxide film 115.Underlayer temperature is 300～550 ℃ in the plasma CVD process.Form contact hole by silicon oxide film 115, form source,

drain electrode

116 and 117 by contact hole, shown in Figure 11 D.Drain electrode 117 is connected with the pixel capacitors 130 that ITO makes.

High resistance area according to N ditch TFT of the present invention can be a N type conduction region, and the district of mixing C, N or O also is offset the grid region.Having can also be two or more combination in them again.In any case, because contiguous high resistance area, or directly contact with it, or have silicon oxide film mediate, and there is the film that can capture positive charge to exist, then can avoid in high resistance area, occurring parasitic channel.Particularly, the present invention has avoided the reduction of mobility when gate voltage is the three ten-day period of hot season effectively.Therefore, when making the pixel body pipe of liquid crystal device for use N ditch TFT, the may command fine voltage, and reproduction has the soft image of gray scale.

In addition, TFT of the present invention is fit to the TFT of three-dimensional IC, and TFT wherein is formed on the substrate of integrated circuit formation.TFT of the present invention also can be formed on glass or the resin substrates.In any case TFT of the present invention is formed on the dielectric substrate.

The TFT that is used as electro-optical device as TFT of the present invention, for example, be very favourable when being used in the monolithic type active matrix circuit that has peripheral circuit on the same substrate, because the leakage current of TFT of the present invention (I cut-off current) is low, can use high voltage drive, and the reliability height, and these active matrix circuit pixel TFT is desired just.

Can substitute silica and make gate insulating film with other material such as silicon nitride, silicon oxynitride (SiON).In addition, can use the multilayer material of these materials.

Have, being used for silicon nitride film of the present invention can have sandwich construction again.For example, this film comprises the first and the 3rd silicon nitride layer, and Si:N wherein is than approximate 3:4, and second silicon nitride layer between first and the 3rd layer.Si:N in second tunic is than being 10:1～10:5.In addition, the thickness of ground floor is 10～100

Scope in, for example 50

, the second layer is 20～200

For example 100

, and the 3rd layer be 100～5000

As 500

This structure can recently form by the flow of change nitrogenous gas in deposition process to silicon-containing gas.

Though disclose several embodiment about the preferred embodiments of the invention, should be understood that the present invention should not be limited to these special embodiment, do not breaking away under the spirit prerequisite of claim, those of ordinary skill can be made various remodeling.

Claims

1. semiconductor device comprises:

In the silicon island that has on the substrate of insulating surface, described silicon island comprises source electrode, drain electrode and the raceway groove between described source electrode and described drain electrode;

The gate electrode that adjoins described channel arrangements has gate insulation layer between described gate electrode and the described raceway groove;

Doped region, its doping content is lower than the concentration of described source electrode and described drain electrode, and described doped region is configured between in described raceway groove and described source electrode and the described drain electrode at least one; With

The layer that on described gate electrode and described silicon island, comprises silicon nitride, described layer has the part that contacts with the second portion of gate insulation layer,

Wherein said gate insulation layer has at first on the described raceway groove and the described second portion on described doped region, and the thickness of described second portion is thinner than the thickness of described first.

2. semiconductor device comprises:

The layer that on described gate electrode and described silicon island, comprises silicon nitride, described layer has the part that contacts with second portion, source electrode and the drain electrode of gate insulation layer respectively,

3. semiconductor device comprises:

Wherein said gate insulation layer covers described raceway groove, described source electrode and described drain electrode, and

4. semiconductor device comprises:

The side of the described gate electrode of wherein said gate insulation layer extend through is covering described doped region, and the extension of described gate insulation layer has the described second portion thinner than the first of described gate insulation layer on described raceway groove.

5. semiconductor device comprises:

6. semiconductor device comprises:

The layer that comprises silicon nitride on described gate electrode and described silicon island, described layer have the part that contacts with the second portion of gate insulation layer on the described doped region,

The side of the described gate electrode of wherein said gate insulation layer extend through is covering described source electrode and drain electrode, and the extension of described gate insulation layer has the described second portion thinner than the first of described gate insulation layer on described raceway groove.

7. semiconductor device comprises:

Comprise the transistorized pixel parts of the first film; With

The drive circuit that comprises second thin-film transistor,

Wherein each described the first film transistor and described second thin-film transistor comprise:

Wherein said gate insulation layer has at first on the described raceway groove and the described second portion on described doped region, and the thickness of described second portion is thinner than the thickness of described first, and

Wherein said the first film transistor has the pixel capacitors that is electrically connected with one of described source electrode and described drain electrode.

8. semiconductor device comprises:

Comprise the transistorized pixel parts of the first film; With

The drive circuit that comprises second thin-film transistor,

9. semiconductor device comprises:

Comprise the transistorized pixel parts of the first film; With

The drive circuit that comprises second thin-film transistor,

10. semiconductor device comprises:

Comprise the transistorized pixel parts of the first film; With

The drive circuit that comprises second thin-film transistor,

The side of the described gate electrode of wherein said gate insulation layer extend through to be covering described doped region, and the extension of described gate insulation layer has the described second portion thinner than the first of described gate insulation layer on described raceway groove, and

11. a semiconductor device comprises:

Comprise the transistorized pixel parts of the first film; With

The drive circuit that comprises second thin-film transistor,

12. a semiconductor device comprises:

Comprise the transistorized pixel parts of the first film; With

The drive circuit that comprises second thin-film transistor,

The side of the described gate electrode of wherein said gate insulation layer extend through to be covering described source electrode and drain electrode, and the extension of described gate insulation layer has the described second portion thinner than the first of described gate insulation layer on described raceway groove, and

13. a liquid crystal display device comprises:

14. a liquid crystal display device comprises:

The side of the described gate electrode of wherein said gate insulation layer extend through is covering described source electrode and described drain electrode, and the extension of described gate insulation layer has the described second portion thinner than the first of described gate insulation layer on described raceway groove.

15. a liquid crystal display device comprises:

Comprise the transistorized pixel parts of the first film; With

The drive circuit that comprises second thin-film transistor,

16. a liquid crystal display device comprises:

Comprise the transistorized pixel parts of the first film; With

The drive circuit that comprises second thin-film transistor,

The side of the described gate electrode of wherein said gate insulation layer extend through to be covering described source electrode and described drain electrode, and the extension of described gate insulation layer has the described second portion thinner than the first of described gate insulation layer on described raceway groove, and

17. semiconductor device as claimed in claim 1 is characterized in that, described gate insulation layer comprises silica.

18. semiconductor device as claimed in claim 2 is characterized in that, described gate insulation layer comprises silica.

19. semiconductor device as claimed in claim 3 is characterized in that, described gate insulation layer comprises silica.

20. semiconductor device as claimed in claim 4 is characterized in that, described gate insulation layer comprises silica.

21. semiconductor device as claimed in claim 5 is characterized in that, described gate insulation layer comprises silica.

22. semiconductor device as claimed in claim 6 is characterized in that, described gate insulation layer comprises silica.

23. semiconductor device as claimed in claim 7 is characterized in that, described gate insulation layer comprises silica.

24. semiconductor device as claimed in claim 8 is characterized in that, described gate insulation layer comprises silica.

25. semiconductor device as claimed in claim 9 is characterized in that, described gate insulation layer comprises silica.

26. semiconductor device as claimed in claim 10 is characterized in that, described gate insulation layer comprises silica.

27. semiconductor device as claimed in claim 11 is characterized in that, described gate insulation layer comprises silica.

28. semiconductor device as claimed in claim 12 is characterized in that, described gate insulation layer comprises silica.

29. liquid crystal display device as claimed in claim 13 is characterized in that, described gate insulation layer comprises silica.

30. liquid crystal display device as claimed in claim 14 is characterized in that, described gate insulation layer comprises silica.

31. liquid crystal display device as claimed in claim 15 is characterized in that, described gate insulation layer comprises silica.

32. liquid crystal display device as claimed in claim 16 is characterized in that, described gate insulation layer comprises silica.

33. semiconductor device as claimed in claim 1 is characterized in that, the thickness of described gate insulation layer is equal to or less than

34. semiconductor device as claimed in claim 2 is characterized in that, the thickness of described gate insulation layer is equal to or less than

35. semiconductor device as claimed in claim 3 is characterized in that, the thickness of described gate insulation layer is equal to or less than

36. semiconductor device as claimed in claim 4 is characterized in that, the thickness of described gate insulation layer is equal to or less than

37. semiconductor device as claimed in claim 5 is characterized in that, the thickness of described gate insulation layer is equal to or less than

38. semiconductor device as claimed in claim 6 is characterized in that, the thickness of described gate insulation layer is equal to or less than

39. semiconductor device as claimed in claim 7 is characterized in that, the thickness of described gate insulation layer is equal to or less than

40. semiconductor device as claimed in claim 8 is characterized in that, the thickness of described gate insulation layer is equal to or less than

41. semiconductor device as claimed in claim 9 is characterized in that, the thickness of described gate insulation layer is equal to or less than

42. semiconductor device as claimed in claim 10 is characterized in that, the thickness of described gate insulation layer is equal to or less than

43. semiconductor device as claimed in claim 11 is characterized in that, the thickness of described gate insulation layer is equal to or less than

44. semiconductor device as claimed in claim 12 is characterized in that, the thickness of described gate insulation layer is equal to or less than

45. liquid crystal display device as claimed in claim 13 is characterized in that, the thickness of described gate insulation layer is equal to or less than

46. liquid crystal display device as claimed in claim 14 is characterized in that, the thickness of described gate insulation layer is equal to or less than

47. liquid crystal display device as claimed in claim 15 is characterized in that, the thickness of described gate insulation layer is equal to or less than

48. liquid crystal display device as claimed in claim 16 is characterized in that, the thickness of described gate insulation layer is equal to or less than

49. semiconductor device as claimed in claim 7 is characterized in that, described pixel capacitors comprises tin indium oxide.

50. semiconductor device as claimed in claim 8 is characterized in that, described pixel capacitors comprises tin indium oxide.

51. semiconductor device as claimed in claim 9 is characterized in that, described pixel capacitors comprises tin indium oxide.

52. semiconductor device as claimed in claim 10 is characterized in that, described pixel capacitors comprises tin indium oxide.

53. semiconductor device as claimed in claim 11 is characterized in that, described pixel capacitors comprises tin indium oxide.

54. semiconductor device as claimed in claim 12 is characterized in that, described pixel capacitors comprises tin indium oxide.

55. liquid crystal display device as claimed in claim 15 is characterized in that, described pixel capacitors comprises tin indium oxide.

56. liquid crystal display device as claimed in claim 16 is characterized in that, described pixel capacitors comprises tin indium oxide.

57. semiconductor device as claimed in claim 7 is characterized in that, the described gate electrode of described second thin-film transistor and described doped region are slightly overlapping each other.

58. semiconductor device as claimed in claim 8 is characterized in that, the described gate electrode of described second thin-film transistor and described doped region are slightly overlapping each other.

59. semiconductor device as claimed in claim 9 is characterized in that, the described gate electrode of described second thin-film transistor and described doped region are slightly overlapping each other.

60. semiconductor device as claimed in claim 10 is characterized in that, the described gate electrode of described second thin-film transistor and described doped region are slightly overlapping each other.

61. semiconductor device as claimed in claim 11 is characterized in that, the described gate electrode of described second thin-film transistor and described doped region are slightly overlapping each other.

62. semiconductor device as claimed in claim 12 is characterized in that, the described gate electrode of described second thin-film transistor and described doped region are slightly overlapping each other.

63. semiconductor device as claimed in claim 7 is characterized in that, the width of the transistorized doped region of described the first film is wideer than the width of the doped region of described second thin-film transistor.

64. semiconductor device as claimed in claim 8 is characterized in that, the width of the transistorized doped region of described the first film is wideer than the width of the doped region of described second thin-film transistor.

65. semiconductor device as claimed in claim 9 is characterized in that, the width of the transistorized doped region of described the first film is wideer than the width of the doped region of described second thin-film transistor.

66. semiconductor device as claimed in claim 10 is characterized in that, the width of the transistorized doped region of described the first film is wideer than the width of the doped region of described second thin-film transistor.

67. semiconductor device as claimed in claim 11 is characterized in that, the width of the transistorized doped region of described the first film is wideer than the width of the doped region of described second thin-film transistor.

68. semiconductor device as claimed in claim 12 is characterized in that, the width of the transistorized doped region of described the first film is wideer than the width of the doped region of described second thin-film transistor.

69. semiconductor device as claimed in claim 1 is characterized in that, described doping is that the N type mixes.

70. semiconductor device as claimed in claim 2 is characterized in that, described doping is that the N type mixes.

71. semiconductor device as claimed in claim 3 is characterized in that, described doping is that the N type mixes.

72. semiconductor device as claimed in claim 4 is characterized in that, described doping is that the N type mixes.

73. semiconductor device as claimed in claim 5 is characterized in that, described doping is that the N type mixes.

74. semiconductor device as claimed in claim 6 is characterized in that, described doping is that the N type mixes.

75. semiconductor device as claimed in claim 7 is characterized in that, described the first film transistor is a N-channel-type thin-film transistor.

76. semiconductor device as claimed in claim 8 is characterized in that, described the first film transistor is a N-channel-type thin-film transistor.

77. semiconductor device as claimed in claim 9 is characterized in that, described the first film transistor is a N-channel-type thin-film transistor.

78. semiconductor device as claimed in claim 10 is characterized in that, described the first film transistor is a N-channel-type thin-film transistor.

79. semiconductor device as claimed in claim 11 is characterized in that, described the first film transistor is a N-channel-type thin-film transistor.

80. semiconductor device as claimed in claim 12 is characterized in that, described the first film transistor is a N-channel-type thin-film transistor.

81. liquid crystal display device as claimed in claim 13 is characterized in that, described doping is that the N type mixes.

82. liquid crystal display device as claimed in claim 14 is characterized in that, described doping is that the N type mixes.

83. liquid crystal display device as claimed in claim 15 is characterized in that, described the first film transistor is a N-channel-type thin-film transistor.

84. liquid crystal display device as claimed in claim 16 is characterized in that, described the first film transistor is a N-channel-type thin-film transistor.

85. semiconductor device as claimed in claim 1 is characterized in that, described doping is that the P type mixes.

86. semiconductor device as claimed in claim 2 is characterized in that, described doping is that the P type mixes.

87. semiconductor device as claimed in claim 3 is characterized in that, described doping is that the P type mixes.

88. semiconductor device as claimed in claim 4 is characterized in that, described doping is that the P type mixes.

89. semiconductor device as claimed in claim 5 is characterized in that, described doping is that the P type mixes.

90. semiconductor device as claimed in claim 6 is characterized in that, described doping is that the P type mixes.

91. semiconductor device as claimed in claim 7 is characterized in that, described the first film transistor is a P-channel-type thin-film transistor.

92. semiconductor device as claimed in claim 8 is characterized in that, described the first film transistor is a P-channel-type thin-film transistor.

93. semiconductor device as claimed in claim 9 is characterized in that, described the first film transistor is a P-channel-type thin-film transistor.

94. semiconductor device as claimed in claim 10 is characterized in that, described the first film transistor is a P-channel-type thin-film transistor.

95. semiconductor device as claimed in claim 11 is characterized in that, described the first film transistor is a P-channel-type thin-film transistor.

96. semiconductor device as claimed in claim 12 is characterized in that, described the first film transistor is a P-channel-type thin-film transistor.

97. liquid crystal display device as claimed in claim 13 is characterized in that, described doping is that the P type mixes.

98. liquid crystal display device as claimed in claim 14 is characterized in that, described doping is that the P type mixes.

99. liquid crystal display device as claimed in claim 15 is characterized in that, described the first film transistor is a P-channel-type thin-film transistor.

100. liquid crystal display device as claimed in claim 16 is characterized in that, described the first film transistor is a P-channel-type thin-film transistor.

Semiconductor device as claimed in claim 1 also comprises:

Described comprise silicon nitride the layer on pixel capacitors, described pixel capacitors is electrically connected with one of described source electrode and described drain electrode.

Semiconductor device as claimed in claim 2 also comprises:

Semiconductor device as claimed in claim 3 also comprises:

Semiconductor device as claimed in claim 4 also comprises:

Semiconductor device as claimed in claim 5 also comprises:

Semiconductor device as claimed in claim 6 also comprises:

Liquid crystal display device as claimed in claim 13 also comprises:

Liquid crystal display device as claimed in claim 14 also comprises: