CN100573187C - Range image sensor - Google Patents
Range image sensor Download PDFInfo
- Publication number
- CN100573187C CN100573187C CNB2005800010337A CN200580001033A CN100573187C CN 100573187 C CN100573187 C CN 100573187C CN B2005800010337 A CNB2005800010337 A CN B2005800010337A CN 200580001033 A CN200580001033 A CN 200580001033A CN 100573187 C CN100573187 C CN 100573187C
- Authority
- CN
- China
- Prior art keywords
- cycle
- electric charge
- value
- group
- detect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
A kind of range image sensor comprises light source, optical detection device, sensor controlled stage and image construction stage.Described image construction stage is each pictorial element compute distance values in the described range image based on the every place electric charge that is picked up by described sensor controlled stage after the cycle in the particular probe of described different detect cycles, makes up range image then.Specific detect cycle is one of optical detection device one or more detect cycles that can not reach capacity betwixt, and is such one-period, during the value relevant with the amount of the light that receives from object space become maximal value one or more detect cycles.
Description
Technical field
The present invention relates to a kind of range image sensor (range image sensor), be used to absorb the image of object space to produce range image, in range image, when having a physical objects in the object space at least, each pictorial element (image element) comprises the respective distances value apart from physical objects.
Background technology
The described displacement measuring device scanning of Japan publication bulletin No.H09-257418 shines the light beam of object under test and measures with respect to the reference surface of the object distance apart from the ohject displacement surface based on triangulation method (triangulation) subsequently.
But, this device is unsuitable for such purposes, for example, follows the tracks of the track of physical objects motion in the object space.Because for pursuit path need be used the whole object space of beam flying, and device is finished with the whole object space of beam flying and will be spent the long time.
This problem can be passed through to solve according to the range image sensor of our another invention (referring to Japanese patent laid-open publication gazette No.2004-272001).This sensor comprises light source and optical detection device, and light source is to the light of object space emissive porwer modulation, and optical detection device has the photosensitive array that is provided with in the face of object space.When intensity-modulated light is launched to object space, just set up range image based on the output of optical detection device.When at least one physical objects was arranged in the object space, each pictorial element in the range image all had the respective distances value apart from physical objects.Each distance value is to obtain from the difference between the phase place of the received light of the respective pixel of the phase place of the light of light emitted and optical detection device.Each pixel response is set to the shorter time of one-period of specific strength light modulated in the time cycle (hereinafter to be referred as " gathering the cycle ", " integration period ") that light mainly gathers electric charge.
If it is longer to gather cycle length, the shot noise that just can be reduced in the generation of photosensitive array place is to improve the S/N ratio.But, comprise under a large amount of ambient light noise environment at (for example sunshine) optical detection device become be easy to saturated.On the other hand, if it is shorter to gather cycle length, optical detection device become be difficult to saturated.But, S/N is than descending and being difficult to obtain correct distance.
Summary of the invention
Therefore the objective of the invention is to, by improving S/N than preventing the saturated degree of accuracy that improves range observation of optical detection device simultaneously.
Range image sensor of the present invention comprises light source, optical detection device, sensor controlled stage and image construction stage.Light source according to the modulation signal of characteristic frequency to object space emissive porwer light modulated.Optical detection device has the photosensitive unit that is provided with towards object space.Each photosensitive unit receives light and produces electric charge in response to the light quantity from the space from object space gathering in the cycle of the one-period that is shorter than characteristic frequency.The sensor controlled stage is controlled, so that each of photosensitive unit gathered the particular phases of cycle and modulation signal is synchronous.After the detect cycle corresponding to one or more cycles of characteristic frequency, the sensor controlled stage is also controlled, to pick up the every electric charge that produces and be stored in the optical detection device from optical detection device.Image construction stage is each pictorial element compute distance values in the range image based on the every place electric charge that is picked up by the sensor controlled stage, makes up range image then.When at least one physical objects was arranged in the object space, distance value represented to arrive the distance of physical objects.Detect cycle comprises different detect cycles.Described image construction stage is each pictorial element compute distance values in the described range image based on the every place electric charge that is picked up by described sensor controlled stage after the cycle in the particular probe of described different detect cycles.Specific detect cycle is one of optical detection device one or more detect cycles that can not reach capacity betwixt, and be such detect cycle, during the value relevant with the amount of the light that receives from object space become maximal value one or more detect cycles.
In this configuration, because based on the distance value of each pictorial element in the every place electric charge computed range image that picks up with the particular probe cycle synchronisation and make up range image then, therefore might improve S/N than to prevent optical detection device simultaneously saturated and improve the degree of accuracy of range observation.
In a preferred embodiment, the sensor controlled stage is controlled so that each of photosensitive unit gather in the one group of phase place that differs from one another in cycle and the modulation signal each is synchronous.The sensor controlled stage is also controlled, to pick up one group of electric charge corresponding to one group of phase place in each pictorial element part of range image after the cycle of particular probe at least of different detect cycles.Image construction stage is based on the distance value of each pictorial element in particular probe one group of electric charge computed range image that pick up at each the pictorial element place in range image after the cycle.In this configuration, can be based on one group of electric charge compute distance values corresponding to one group of phase place.
In strengthening embodiment (enhanced embodiment), the sensor controlled stage is also controlled, to pick up one group of electric charge corresponding to one group of phase place in each pictorial element part of range image after each different detect cycle.Image construction stage is selected specific detect cycle from different detect cycles.Image construction stage is also based on the distance value of each pictorial element in particular probe one group of electric charge computed range image that pick up at each the pictorial element place in range image after the cycle.The described particular probe cycle is one of one or more detect cycles, during this time, the value that the one group of electric charge that picks up from each pictorial element in described range image after each described different detect cycle obtains is no more than based on the predetermined value of the saturation level of described optical detection device, and the described particular probe cycle becomes a peaked detect cycle one or more detect cycles for the value that obtains from one group of electric charge.According to the present invention, might improve the S/N ratio and prevent that simultaneously optical detection device is saturated and improve the degree of accuracy of range observation.
In alternative, the described particular probe cycle is one of one or more detect cycles, during this time, the value of one group of electric charge that pick up at each the pictorial element place after each described different detect cycle in described range image is no more than the predetermined value corresponding to described saturation level, and the value that is one group of electric charge of described particular probe cycle becomes the peaked detect cycle in one or more detect cycles.According to the present invention, might improve the S/N ratio and prevent that simultaneously optical detection device is saturated and improve the degree of accuracy of range observation.
In another alternative, the described particular probe cycle is one of one or more detect cycles, during this time, the maximum charge value of every group of electric charge that pick up at each the pictorial element place after each described different detect cycle in described range image is no more than based on the predetermined max-thresholds of described saturation level, and the described particular probe cycle is that described maximum charge value becomes the peaked detect cycle in one or more detect cycles.According to the present invention, might improve the S/N ratio and prevent that simultaneously optical detection device is saturated and improve the degree of accuracy of range observation.
In other alternatives, the described particular probe cycle is one of one or more detect cycles, during this time, the mean value of one group of electric charge that pick up at each the pictorial element place after each described different detect cycle in described range image is no more than based on the predetermined average reference value of described saturation level, and the described particular probe cycle is that described mean value becomes the peaked detect cycle in one or more detect cycles.In this configuration, might consider from the intensity-modulated light of object space and surround lighting composition whether saturated to distinguish optical detection device.
Strengthen among the embodiment at another, when not selecting the particular probe cycle or being shorter than predetermined length as first particular probe cycle in particular probe cycle, in the non-selected particular probe cycle or selected to be shorter than each or a plurality of phase places place of one group of phase place of particular image element in the first particular probe cycle of predetermined length, image construction stage selected for the second particular probe cycle from different detect cycles.Image construction stage is revised the one or more values that obtain from the one group of electric charge that picks up at particular image element after the cycle in second particular probe based on the length ratio in the corresponding second particular probe cycle then.Image construction stage is calculated a class value then and is calculated the distance value of particular image element based on a class value.The described second particular probe cycle is one of one or more such detect cycles, during this time, the value that obtains from the electric charge corresponding to one or more phase places of described one group of phase place is no more than based on the predetermined value of described saturation level, described second particular probe cycle and be a such detect cycle, during the value that obtains from electric charge become the maximal value of one or more detect cycles.In this configuration, there is such possibility, that is, even do not selecting first particular probe also can compute distance values during the cycle.In addition, when the first particular probe cycle was shorter than predetermined length, might utilize the value of the charge available that during the detect cycle of being longer than for the first particular probe cycle, obtains.As a result, might suppress the influence of shot noise to improve measuring accuracy.
In another strengthened embodiment, image construction stage is applied to the light quantity that receives about each photosensitive unit by at least one value that the sensor controlled stage is obtained from one group of electric charge function calculated fiducial value.Image construction stage is relatively selected the particular probe cycle with fiducial value and predetermined threshold then.In this configuration, for example, if fiducial value less than predetermined threshold, just can select long detect cycle as the particular probe cycle from different detect cycles.In addition, if fiducial value greater than predetermined threshold, just can select short detect cycle as the particular probe cycle from different detect cycles.
In alternative, fiducial value is the mean value corresponding to every place electric charge of each light quantity of each photosensitive unit reception during one or more cycles of characteristic frequency.In this configuration, might consider from the intensity-modulated light of object space and surround lighting composition whether saturated to distinguish optical detection device.
In another strengthened embodiment, during the distance value of particular image element, described image construction stage was not that described particular image element is distributed backed-up value in calculating described range image.In this configuration, when can not from different detect cycles, selecting particular probe during the cycle for particular image element, might be by distributing backed-up value to make up the range image that does not have error to particular image element.
In alternative, backed-up value is the distance value in the past of particular image element.In this configuration, if range image sensor is arranged in very circlet border of variable in distance, just can distribute to particular image element to suitable distance.
In another alternative, backed-up value is the mean value of the distance value of each pictorial element around the particular image element.In this configuration, just can distribute to particular image element having successional suitable distance value.
In other strengthened embodiment, it was each pictorial element compute distance values in the range image that image construction stage calculates that a group of each pictorial element place in range image gathers electric charge and gather electric charge based on each group.At each same phase place of described one group of phase place the acquisition that adds up of the every place electric charge of a plurality of particular probe in the cycle is gathered electric charge for this group.In this configuration, owing to might relatively reduce the light quantity that receives in the cycle in each particular probe, can prevent the saturated of optical detection device.
Strengthen among the embodiment at other, optical detection device comprises pixel, and each pixel is made of two or more adjacent photosensitive units in the photosensitive unit.Main two or more phase-locking with each group of each pixel are in two or the generation of more heterogeneous adjacent photosensitive unit place and gather two places or many places electric charge more, described group obtains by one group of phase place being divided into group, and each group comprises two or more phase places respectively.The sensor controlled stage is controlled, gathering the synchronous opportunity in cycle at each of two or more the adjacent photosensitive units in each pixel of each phase change of the corresponding group of all groups, so that each phase place of exchanging corresponding group with adjacent photosensitive unit.The sensor controlled stage is also controlled, and with after the cycle of particular probe at least of described different detect cycles, picks up in each pixel and is in the every place electric charge that mainly produces and gather during gathering the cycle corresponding to each of each phase place of each group.Image construction stage is picked up the sensor controlled stage at each pixel place every place electric charge and one group of combination of charge corresponding to one group of phase place.Image construction stage is each pixel compute distance values in the range image based on this group of electric charge then.In this configuration, might guarantee the reliability of the distance value that obtains from each pixel that constitutes by adjacent photosensitive unit, because might almost completely eliminate the error that the difference by each position of adjacent photosensitive unit causes.
Strengthen among the embodiment at other, a plurality of adjacent photosensitive units are set to arithmetic element.The sensor controlled stage becomes the cycle of gathering of each photosensitive unit of arithmetic element in each particular probe cycle the cycle of gathering of the out of phase of one group of phase place.Image construction stage calculates the value of the pictorial element in the range image from the distance of using the electric charge that adds up obtain photosensitive unit receiving the time durations of light from object space in.In gathering each of cycle, all of phase place receive the light of same number of times.In this configuration, during the out of phase that different photosensitive units is synchronized with the modulation signal of particular probe in the cycle is being gathered the cycle, receive the light time, in the electric charge that adds up, do not comprise the positional information of a plurality of photosensitive units of arithmetic element, so that find distance.Therefore, the reliability of the distance that is obtained has uprised.
Description of drawings
Now the preferred embodiments of the present invention will be described in more detail.The following detailed description of reference and accompanying drawing other features of the present invention and advantage will become better understood, wherein:
Fig. 1 is the block scheme according to the range image sensor of the first embodiment of the present invention;
Fig. 2 shows the operation of the range image sensor of first embodiment;
Fig. 3 A shows in the range image sensor of first embodiment zone corresponding to a photosensitive unit;
Fig. 3 B shows the zone corresponding to photosensitive unit;
Fig. 4 is the synoptic diagram of the pickup unit (pickup unit) in the range image sensor of first embodiment;
Fig. 5 A shows the operation of range image sensor according to a second embodiment of the present invention;
Fig. 5 B shows the another kind operation of the range image sensor of second embodiment;
Fig. 6 shows the operation of the range image sensor of second embodiment;
Fig. 7 shows the operation of the range image sensor of second embodiment;
Fig. 8 A shows the operation of alternative;
Fig. 8 B shows the another kind operation of alternative;
Fig. 9 is the block scheme of the image construction stage (image construction stage) in according to a fifth embodiment of the invention the range image sensor; And
Figure 10 shows the operation of range image sensor according to a sixth embodiment of the invention.
Embodiment
Fig. 1 shows the range image sensor according to the first embodiment of the present invention.This sensor comprises light source 11, optical system 12, optical detection device 13, sensor controlled stage (sensor control stage) 14 and image construction stage 15.
Shown in Fig. 3 A and 3B, each photosensitive unit 131 forms for example photo-sensitive cell of 100 * 100 photosensitive arrays by the impurity doped semiconductor layer 13a in Semiconductor substrate.The luminous sensitivity that unit 131 is controlled with the sensitivity control module 132 of correspondence generates quantity response in the electric charge from the light quantity of object space.For example, semiconductor layer 13a is that n type and the electric charge that produced stem from electronics.
When the optical axis of optical system 12 and receiving surface meet at right angles, two axles of vertical (length) direction of this optical axis and receiving surface and level (width) direction can be regarded as three axles of orthogonal coordinate system.And the center of system 12 is counted as the initial point of orthogonal coordinate system.In this case, each photosensitive unit 131 generates the electric charge of quantity response in the amount of the light that comes the represented direction of free position angle and the elevation angle (angles of azimuth andelevation).When at least one physical objects was arranged in the object space, the light that sends from light source 11 was reflected and is received by each unit 131 then in physical objects.Therefore, unit 131 receive delays as shown in Figure 2 correspond to physical objects and the intensity-modulated light of the phase place Ψ that returns, produce quantity response then in its intensity I
2Electric charge.Intensity-modulated light is expressed as
I
2·sin(ωt-Ψ)+C， (1)
Wherein ω is an angular frequency, and C is intensity I
2Mean value be added to surround lighting and become the value that obtains on the score value.
Gather unit 133 and comprise potential well (depletion layer) 13c, it changes in response to the sensitivity control signal that is applied to corresponding each control electrode 13b.Electronics (e) is captured and gathers in unit 133 near trap 13c.Do not accumulate to electronics in the unit 133 by disappearing with hole-recombination.Therefore, might control the luminous sensitivity of optical detection device 13 by the size of utilizing sensitivity control signal to change trap 13c zone.For example, highly sensitive in the state of Fig. 3 A in the state of Fig. 3 B.
As shown in Figure 4, for example, pickup unit 134 has the structure of frame transfer of being similar to (FT) type ccd image sensor.In the light shield storage area A2 of image pickup zone A1 that makes up by photosensitive unit and neighboring region A1, be used as every place electric charge transfer path vertically at each the vertical continuous all-in-one-piece semiconductor layer of (length) direction 13a.Vertical direction is corresponding to the left and right directions of Fig. 3 A and 3B.
Sensor controlled stage 14 is operation timing control circuit (operation timing control circuit), the operation timing of control light source 11, each sensitivity control module 132 and pickup unit 134.That is, level 14 provides the modulation signal of characteristic frequency (for example 20MHz) to change opportunity with control intensity modulated light intensity for light source 11.Because being used for the transmission time that aforementioned lights comes and goes distance is the extremely short time, that is, nanosecond rank.
Sensor controlled stage 14 also controls so that the particular phases of the cycle of gathering of each photosensitive unit 131 and modulation signal (for example, each in one group of phase place that differs from one another) synchronously.In first embodiment, shown in Fig. 2 and 3A, level 14 is applied to control electrode 13b-2 to 13b-4 and electrode 13b-1 and 13b-5 with voltage+V and voltage 0V respectively, so that make the zero-time of gathering period T i and modulation signal (cf., the I of each unit 131
1) 0,90,180 or 270 the degree phasing degree synchronous.Therefore, the sensitivity of each unit 131 becomes high sensitivity during the cycle of gathering of the one-period that is shorter than characteristic frequency.In addition, the level 14 shown in Fig. 3 B is applied to electrode 13b-3 and electrode 13b-1,13b-2,13b-4 and 13b-5 with voltage+V and voltage 0V respectively synchronously with the memory cycle, and this memory cycle is that described one-period is removed the rest period outside the cycle of gathering.Therefore, the sensitivity of each unit 131 becomes muting sensitivity during the memory cycle.Therefore, in element 13, the Partial charge that is produced by unit 131 gathers with high sensitivity by gathering unit 133 (potential well 13c), is stored with muting sensitivity by unit 133 then.
Sensor controlled stage 14 is further controlled, to pick up the every electric charge that produces and be stored in the optical detection device 13 from element 13 synchronously with detect cycle corresponding to one or more cycles of characteristic frequency.That is, level 14 offers the vertical transitions signal each control electrode 13b during vertical blanking interval, also the horizontal transfer signal is offered horizontal transfer register 13d during horizontal cycle.For example, in pick-up time period (referring to the T among Fig. 7
R1To T
R4) during pick up the every place electric charge that produces and be stored in the element 13 synchronously with the termination time of detect cycle.
Principle to compute distance values is explained.The phase place of Fig. 2 (phase differential) Ψ is corresponding in the receiving surface of optical detection device 13 and the round distance between the physical objects in the object space.Therefore, by calculating phase place Ψ, might calculate the distance that arrives physical objects.Being reflected in of phase place Ψ and physical objects is used to gather and pick up in the time durations of one group of electric charge and seldom changes.In this case, can be from time integral value (for example, the Ti integrated value Q of the represented curve of equation (1)
0, Q
1, Q
2And Q
3) calculate phase place Ψ.Time integral value (amount of received light) Q
0, Q
1, Q
2And Q
3Instantaneous value q
0, q
1, q
2And q
3Provide by following respectively:
q
0＝I
2·sin(-Ψ)+C
＝-I
2·sin(Ψ)+C，
q
1＝I
2·sin(π/2-Ψ)+C
＝-I
2·cos(Ψ)+C，
q
2＝I
2·sin(π-Ψ)+C
=I
2Sin (Ψ)+C, and
q
3＝I
2·sin(3π/2-Ψ)+C
＝-I
2·cos(Ψ)+C。
Therefore, phase place Ψ is provided by following equation (2), and for time integral value, might pass through equation (2) and obtain phase place Ψ.
Ψ＝tan
-1{(q
2-q
0)/(q
1-q
3)} (2)
But, when intensity-modulated light by I
2(ω t-Ψ)+when C represented, phase place Ψ can be by Ψ=tan for cos
-1{ (q
1-q
3)/(q
0-q
2) provide.When the symbol of phase place Ψ when negative, tan
-1... in each order of denominator and molecule can exchange each other or can use absolute value.
Be proportional to the light quantity that receives at photosensitive unit 131 and generate under the situation of electric charge, gather corresponding to Q when gathering unit 133
0Electric charge the time, can gather and be proportional to α Q
0+ β (Q
1+ Q
2+ Q
3)+β Q
xElectric charge.α gathers among the period T i corresponding to Q at each
0To Q
3Sensitivity, β is the sensitivity in the memory cycle, and Q
xIt is the amount of the light that in the memory cycle, receives.When unit 131 also gathers corresponding to Q
2Electric charge the time, just gathered and be proportional to α Q
2+ β (Q
0+ Q
1+ Q
2)+β Q
xElectric charge.Because Q
2-Q
0=(alpha-beta) (Q
2-Q
0) and Q
1-Q
3=(alpha-beta) (Q
1-Q
3), no matter in gathering unit (with reference to equation (2)), whether mixed the electric charge of not expecting, (Q
2-Q
0)/(Q
1-Q
3) in theory all constant.Therefore, do not wish the electric charge that occurs even sneaked in gathering the unit, the phase place Ψ of corresponding pictorial element is still constant.
In first embodiment, detect cycle comprises different detect cycles.For example, different detect cycles are long detect cycle and the short detect cycle that is shorter than long detect cycle.Short detect cycle is set to the time durations corresponding to one or more cycles of characteristic frequency.And each pixel among the A1 of image pickup zone is made of for example four adjacent photosensitive units.And sensor controlled stage 14 is controlled, and picks up one group of electric charge corresponding to one group of phase place synchronously at each pixel place of optical detection device (image pickup zone A1) with different detect cycles with each.But, be not limited thereto, each pixel can comprise a photosensitive unit, and the sensor controlled stage can control, with at least four cycle synchronisation, pick up one group of electric charge respectively corresponding to this group of phase place at each pixel place.
Therefore, image construction stage 15 is made up by holding unit (hold unit) 151 and 152, selected cell 153 and arithmetic element 154. Unit 151 and 152 usefulness storeies make up, and storer is used for storage and changes each numerical value that every place electric charge (simulating signal) obtains by A/D.One group of electric charge (digital value, digital value) that unit 151 interim maintenances are picked up in each pixel synchronously by sensor controlled stage 14 and long detect cycle.One group of electric charge (digital value) that unit 152 interim maintenances are picked up in each pixel synchronously by level 14 and short detect cycle.
As long as selected the particular probe cycle, arithmetic element 154 is just based on the distance value that calculates corresponding to one group of electric charge (digital value) in particular probe cycle corresponding to the pictorial element of the pixel of picking up this group of electric charge.
Explain the operation of first embodiment now.The sensitivity of sensor controlled stage 14 control optical detection devices 13 is gathered in the unit 133 so that the electric charge that produces at each photosensitive unit 131 during each different detect cycle is accumulated to.For example, when corresponding to time integral value (light quantity that is received) Q
0Electric charge when accumulating in the unit 133, level 14 is corresponding to Q
0Gather the sensitivity that improves unit 133 during the period T i.Level 14 also reduces the sensitivity of unit 133 during all (memory cycles) except period T i.Therefore, can be with corresponding to Q
0Electric charge gather and store in the unit 133.Similarly, the electric charge corresponding to each time integral value might be gathered and store in each unit 133.And, may make the signal charge (corresponding to the electric charge of intensity-modulated light) and the ratio of noise charge (corresponding to surround lighting composition and the electric charge that results from the shot noise within the element 13) become big.Therefore, obtain big S/N ratio.
To accumulate to each and gather electric charge in the unit 133 in order to pick up, sensor controlled stage 14 offers the vertical transitions signal each control electrode 13b during vertical blanking interval after long detect cycle or short detect cycle.Level 14 also offers the horizontal transfer signal horizontal transfer register 13d in horizontal cycle.Therefore, remain on the every place electric charge that gathers and store during the long detect cycle by holding unit 151.In addition, remain on the every place electric charge that gathers and store during the short detect cycle by holding unit 152.
The particular probe cycle is selected by selected cell 153 each group electric charge place in each holding unit 151 and 152 from long detect cycle and short detect cycle.In case selected the particular probe cycle, arithmetic element 154 is just calculated the distance value of each pixel based on one group of electric charge corresponding to each pixel in particular probe cycle.Then, make up range image.
Fig. 5 A and 5B show the operation of range image sensor according to a second embodiment of the present invention.In the range image sensor of second embodiment, two adjacent photosensitive units 231 and 231 along vertical direction are used as a pixel.And, spill and leakage (overflow drain) is provided at each pixel place.
If photosensitive unit produces corresponding to Q
0-Q
3Electric charge, the resolution of direction of visual lines just uprises.But the problem of mistiming has taken place because for every place corresponding to Q
0-Q
3Electric charge need at least one particular probe cycle.Otherwise, if four photosensitive units produce corresponding to Q respectively
0-Q
3Electric charge, just might be synchronized with that this particular probe cycle picks up corresponding to Q at least
0-Q
3Electric charge, so the mistiming diminish.But, the resolution step-down of direction of visual lines.
In second embodiment shown in Fig. 5 A and 5B, two photosensitive units 231 and 231 are used for a pixel, so that address this problem.In Fig. 3 of first embodiment A and 3B, when photosensitive unit 131 places produced electric charge, two control electrode 13b-1 and 13b-5 on both sides had the function that forms potential barrier, are used for preventing that Partial charge from flowing into each adjacent photosensitive unit 131.In a second embodiment, because arbitrarily photosensitive unit 231 forms potential barrier between the potential well 23c of adjacent photosensitive unit 231 and 231 and 23c, therefore three control electrodes are provided to each photosensitive unit 231.Therefore, six control electrode 23b-1,23b-2,23b-3,23b-4,23b-5 and 23b-6 are provided to each pixel.
The sensor controlled stage of second embodiment is controlled, and picks up one group of electric charge corresponding to one group of phase place of modulation signal synchronously at each pictorial element place of range image with different detect cycles with each.According to long detect cycle T
L1, short detect cycle T
S1, long detect cycle T
L2With short detect cycle T
S2Order carry out as shown in Figure 7 each different detect cycle synchronously.
Explain the operation of second embodiment now.Shown in Fig. 5 to 7, at long detect cycle T
L1In, corresponding to Q
0Gather during the period T i, respectively voltage+V and voltage 0V are applied to by 23b-1,23b-2,23b-3 and 23b-5 and the control electrode represented by 23b-4 and 23b-6.Then, corresponding to Q
2Gather during the period T i voltage+V and voltage 0V be applied to respectively the electrode that the electrode represented by 23b-2,23b-4,23b-5 and 23b-6 and 23b-1 and 23b-3 are represented.In addition, corresponding to except the above-mentioned cycle all during (memory cycles), voltage+V and voltage 0V are applied to respectively by 23b-2 and 23b-5 and the electrode represented by 23b-1,23b-3,23b-4 and 23b-6.Therefore, with period T
L1Produce and gathered at each pixel place synchronously corresponding to Q
0And Q
2Electric charge.
Pick up (reading) period T
R1In, corresponding to Q
0And Q
2The electric charge of each pixel transferred to storage area A2 from picking region A1.That is, if corresponding to Q
0Electric charge accumulated among the potential well 23c corresponding to electrode 23b-1,23b-2 and 23b-3, then corresponding to Q
2Electric charge accumulated among the potential well 23c corresponding to electrode 23b-4,23b-5 and 23b-6, just pick up corresponding to Q
0And Q
2Electric charge in holding unit, to keep corresponding to long detect cycle.
After this operation, current detect cycle becomes short detect cycle T
S1, and carry out and long detect cycle T then
L1Identical operations.Therefore, with period T
S1Produce and gathered at each pixel place synchronously corresponding to Q
0And Q
2Electric charge.At pick-up time period T
R2(equal T
R1) in, pick up corresponding to Q at each pixel place
0And Q
2Electric charge to keep at holding unit place corresponding to short detect cycle.
After this operation, current detect cycle becomes long detect cycle T
L2(equal T
L1), and be offset 90 degree the opportunity that is used to apply each voltage patterns of Fig. 5 A and 5B, carry out and long detect cycle T then
L1Identical operations.Therefore, with period T
L2Produce and gathered at each pixel place synchronously corresponding to Q
1And Q
3Electric charge.At pick-up time period T
R3(equal T
R1) in, pick up corresponding to Q at each pixel place
1And Q
3Electric charge to keep corresponding to the holding unit place of long detect cycle.
After this operation, current detect cycle becomes short detect cycle T
S2(equal T
S1), and carry out and long detect cycle T then
L2Identical operations.Therefore, with period T
S2Produce and gathered at each pixel place synchronously corresponding to Q
1And Q
3Electric charge.At pick-up time period T
R4(equal T
R1) in, pick up corresponding to Q at each pixel place
1And Q
3Electric charge to keep at holding unit place corresponding to short detect cycle.
In a second embodiment, might be at each operating cycle (operation period) T
P1And T
P2Acquisition is corresponding to one group of electric charge of long detect cycle with corresponding to one group of electric charge of short detect cycle.In this case, if operating cycle T
P1And T
P2Be set to be shorter than 1/60 second time cycle, just obtained range image with 30 frame per seconds.
In alternative, the selected cell of image construction stage at each pictorial element place of range image from obtaining the maximum charge value corresponding to the every electric charge (digital value) in the holding unit of long detect cycle.If the maximum charge value is no more than based on the predetermined max-thresholds of the saturation level of optical detection device, then selected cell selects long detect cycle as the particular probe cycle.If the maximum charge value surpasses max-thresholds, then selected cell obtains the maximum charge value from every electric charge in corresponding to the holding unit of short detect cycle.If the maximum charge value corresponding to short detect cycle is no more than max-thresholds, then selected cell selects short detect cycle as the particular probe cycle.Promptly, this particular probe cycle is one of one or more such detect cycles, during this detect cycle, every group maximum charge value by one group of electric charge that each holding unit kept is no more than max-thresholds, this particular probe cycle still is such detect cycle, during this time, the maximum charge value becomes the maximal value in described one or more detect cycle.Short detect cycle is set to each maximum charge value is no more than max-thresholds betwixt under environment for use time cycle.
In another alternative, the selected cell of image construction stage each pictorial element place in range image is calculated by the mean value corresponding to one group of electric charge that holding unit kept of long detect cycle.If mean value is no more than based on the predetermined average reference value of the saturation level of optical detection device, then selected cell selects long detect cycle as the particular probe cycle.If mean value surpasses the average reference value, then selected cell calculates by the mean value corresponding to one group of electric charge that holding unit kept of lacking detect cycle.If the mean value corresponding to short detect cycle is no more than the average reference value, then selected cell selects short detect cycle as the particular probe cycle.Promptly, this particular probe cycle is one of one or more such detect cycles, during this detect cycle, mean value by one group of electric charge that each holding unit kept is no more than the average reference value, this particular probe cycle still is such detect cycle, during this time, mean value becomes the maximal value in described one or more detect cycle.Each mean value is corresponding in response to from average with in response to every place electric charge of surround lighting composition of every place electric charge of the intensity-modulated light of object space.Whether therefore, might distinguish optical detection device saturated.Each detect cycle preferably is set to ignore the time cycle of surround lighting composition fluctuation.
In a preferred embodiment, replace the voltage patterns of Fig. 5 A, shown in Fig. 8 A, the sensor controlled stage is applied to control electrode 23b-1,23b-2 and 23b-3 with voltage+V, voltage between+V and the 0V is applied to electrode 23b-5, also voltage 0V is applied to electrode 23b-4 and 23b-6.Equally, replace the voltage patterns of Fig. 5 B, shown in Fig. 8 B, the voltage between sensor controlled stage general+V and the 0V is applied to control electrode 23b-2, voltage+V is applied to control electrode 23b-4,23b-5 and 23b-6, also voltage 0V is applied to electrode 23b-1 and 23b-3.So, be deeper than the potential well that is used for main stored charge if be used for mainly gathering the potential well of electric charge, then the electric charge that produces in the zone corresponding to each electrode of voltage 0V just flows in the darker potential well easily.As a result, might reduce to flow into the noise component of the potential well that is used for stored charge.
In other alternatives, repeatedly continuous execution is synchronous with each detect cycle.In this case, the two place's electric charges that pick up synchronously with each detect cycle each in identical continuous probe cycle the place added up or on average.For example, repeatedly continuous executive chairman's detect cycle T
L1With pick-up time period T
R1With long detect cycle T
L1Pick up synchronously corresponding to Q
0And Q
2Electric charge at each continuous detect cycle T
L1The place is added up respectively or on average.According to this embodiment,, can prevent the saturated of optical detection device owing to might relatively reduce the light quantity that in each detect cycle, receives.
In a third embodiment in accordance with the invention, when do not select the particular probe cycle or as first particular probe cycle in particular probe cycle be when being shorter than the short detect cycle of predetermined length, in the non-selected particular probe cycle or selected per two phase place places of one group of phase place of the particular image element of short detect cycle, image construction stage selected for the second particular probe cycle from different detect cycles.
In the example of Fig. 7, when at long detect cycle T
L1(Q
0, Q
2) in the value of every place electric charge less than based on the predetermined value (for example saturation threshold) of the saturation level of optical detection device, and at long detect cycle T
L2(Q
1, Q
3) in the value of every place electric charge during greater than this saturation threshold, do not select the particular probe cycle or select short detect cycle.In this case, if at short detect cycle T
S2(Q
1, Q
3) in the value of every place electric charge less than saturation threshold, image construction stage is selected long detect cycle T
L1With short detect cycle T
S2Promptly, this second particular probe cycle is one of one or more such detect cycles, during this detect cycle, the value that obtains from the electric charge corresponding to two phase places of one group of phase place is no more than for example saturation threshold, this second particular probe cycle still is a such detect cycle, during the value that obtains from electric charge become the maximal value of one or more detect cycles.
Image construction stage is revised two values that obtain with the second particular probe cycle synchronisation based on the length in the corresponding second particular probe cycle than (rate of length) then from one group of electric charge of particular image element, and calculates a class value.Under the situation of previous example, based on corresponding short particular probe period T
S2Length than (T
L1/ T
S2) the short detect cycle T of correction
S2(Q
1, Q
3) in the value of every place electric charge.By testing the relation that obtains in advance between length ratio and the every place charge ratio.
Image construction stage is calculated the distance value of particular image element then based on a class value.Therefore, there is such possibility, that is, even do not selecting first particular probe also can compute distance values during the cycle.And, when short detect cycle is selected as first particular probe during cycle, might utilize in long detect cycle rather than the value of the charge available that obtains in the short detect cycle.As a result, might suppress the influence of shot noise to improve measuring accuracy.
In a fourth embodiment in accordance with the invention, corresponding to each value substitution of the one group of electric charge that is picked up by the sensor controlled stage each variable about the function of the light quantity that received by each photosensitive unit, image construction stage calculates fiducial value (comparison value) thus.Image construction stage is by relatively selecting the particular probe cycle with fiducial value and predetermined threshold then.
For example, fiducial value be corresponding in during one or more cycles of the modulation signal of characteristic frequency by the mean value of every place electric charge of each light quantity that each photosensitive unit received, and by (Q
0+ Q
1+ Q
2+ Q
3Calculate)/4.Also can pass through (Q
0+ Q
2)/2 or (Q
1+ Q
3Calculating mean value is come in)/2.When during the one or more cycles of surround lighting composition shown in Fig. 2 and 6 in characteristic frequency when constant, mean value is equivalent to an intensity I
2Mean value be added to the value C of gained on the surround lighting composition, and be steady state value.Therefore, can select the particular probe cycle based on mean value.For example, if mean value greater than predetermined threshold value, then selects short detect cycle as the particular probe cycle.Otherwise, select long detect cycle as the particular probe cycle.And, if mean value less than the lower limit littler than predetermined threshold, is not just selected the particular probe cycle.Because almost not from the light of object space and do not obtain suitable distance value.
In a preferred embodiment, the sensor controlled stage is controlled, with the one group of electric charge that picks up at each pictorial element place of range image by the particular probe cycle synchronisation of mean value selection corresponding to one group of phase place of modulation signal.
In alternative, when not having surround lighting composition or known environment light component, be I with intensity
2The amplitude A of intensity-modulated light as fiducial value.Can be from each light quantity Q
0, Q
1, Q
2And Q
3With following Equation for Calculating amplitude A.
A＝(1/2)·{(Q
0-Q
2)
2+(Q
1-Q
3)
2}
1/2
This equation is from (Q
0-Q
2)
2+ (Q
1-Q
3)
2=4A
2{ sin
2(Ψ)+cos
2(Ψ) }=4A
2Obtain.If amplitude A greater than predetermined threshold value, then selects short detect cycle as the particular probe cycle.Otherwise, select long detect cycle as the particular probe cycle.And, if amplitude A less than the lower limit littler than predetermined threshold, is not then selected the particular probe cycle, because seldom and do not obtain suitable distance from the light of object space.Whether when the surround lighting composition is unknown, it is saturated to distinguish optical detection device by further use value C.
In another alternative,, for example be used as fiducial value by the value (A/C) of removing the amplitude A gained with value C value from amplitude A and value C acquisition.Value (A/C) is corresponding to the ratio of the intensity-modulated light that receives with the mean value of the 4th embodiment.If the ratio height, the degree of accuracy of distance value just uprises.Otherwise the degree of accuracy of distance value is with regard to step-down.Therefore, if value (A/C) greater than predetermined threshold value, then selects short detect cycle as the particular probe cycle.Otherwise, select long detect cycle as the particular probe cycle.And, if value (A/C) is not then selected the particular probe cycle, because do not obtain the distance value of appropriate accuracy less than the lower limit littler than predetermined threshold.Whether might distinguish optical detection device by further use value C saturated.
Fig. 9 shows the image construction stage 45 in range image sensor according to a fifth embodiment of the invention.Image construction stage 45 with in the same holding unit 451 and 452, selected cell 453 and the arithmetic element 454 of comprising of first embodiment, also comprise exception processing unit 455.When the distance value of particular image element in the computed range image not, unit 455 is that particular image element is distributed backed-up value (alternatevalue).
For example, when by corresponding to one group of numerical value that holding unit kept of short detect cycle and or maximal value greater than based on the predetermined value of the saturation level of optical detection device, perhaps by corresponding to one group of numerical value that holding unit kept of long detect cycle and or minimum value during less than the required lower limit of compute distance values, just be the corresponding pictorial element selection particular probe cycle.Backed-up value is the given numerical value such as the mean distance value that arrives object space etc.Therefore, might not lack distance value and make up range image.
In alternative, backed-up value is the distance value in the past of particular image element.The term of validity is relevant with distance value in the past, as long as do not have the term of validity, the distance value in the past of particular image element just is used as backed-up value.
In another alternative, backed-up value is the mean value of the distance value of each pictorial element around the particular image element.Even without the distance value that calculates particular image element, also there is the distance value situation as calculated of this particular image element each pictorial element on every side.In this case, use mean value, just can distribute to particular image element having successional suitable distance value as backed-up value.And, can be used as backed-up value to the distance value in given numerical value, past or mean value according to priority orders.
Figure 10 shows the operation according to the range image sensor of sixth embodiment of the invention.The range image sensor of the 6th embodiment is characterised in that sensor controlled stage and image construction stage, thereby these two level works guarantee the reliability of the distance value that obtains from each pixel that is made of two adjacent photosensitive units.
Photosensitive unit in the optical detection device of the 6th embodiment comprises pixel, and each pixel all is made of two adjacent photosensitive units, and is identical with second embodiment.Two phase-locking of each pixel and every group (group) mainly produce and gather two place's electric charges at its adjacent photosensitive unit respectively.Each group is divided into two groups by one group of (set) phase place with corrected signal to obtain, and each group all comprises two phase places.In addition, each pixel is equipped with six control electrode 63b-1,63b-2,63b-3,63b-4,63b-5 and 63b-6.
So, when two photosensitive units are used as a pixel, this possibility is arranged, that is, because the difference of each position of photosensitive unit is comprising error the distance value that obtains from pixel.For example, when physical objects to be detected in the object space when the part corresponding to the position between two photosensitive units has step, error becomes the degree of accuracy step-down of big and distance value.
Therefore, the sensor controlled stage of the 6th embodiment is controlled to gather the synchronous opportunity in cycle at each of two adjacent photosensitive units in each pixel of each phase change of corresponding group, so that exchange each phase place of corresponding group at adjacent photosensitive unit.The sensor controlled stage is also controlled with the detect cycle different with each and is picked up the every place electric charge that mainly produces and gather at each pixel place during gathering the cycle corresponding to each of each phase place of each group synchronously.
Long detect cycle T at Figure 10
L11(Q
0, Q
2) and T
L12(Q
2, Q
0) in, the sensor controlled stage is at corresponding to T
L11Q
0Each pixel of phase change in corresponding to the synchronous opportunity of control electrode 63b-1 to the cycle of gathering of the photosensitive unit of 63b-3 so that at photosensitive unit with corresponding to Q
2Phase place exchange.The sensor controlled stage is also at corresponding to T
L11Q
2Each pixel of phase change in corresponding to the synchronous opportunity of electrode 63b-4 to the cycle of gathering of the photosensitive unit of 63b-6 so that at photosensitive unit with corresponding to Q
0Phase place exchange.In brief, gather the synchronous opportunity in cycle at each of two adjacent photosensitive units in each pixel of each phase change of corresponding group, so that exchange each phase place of corresponding group at adjacent photosensitive unit.In addition, sensor controlled stage and long detect cycle T
L11Pick up at each pixel place synchronously mainly corresponding to Q
0And Q
2Each gather the every place electric charge that produces and gather during the cycle.At pick-up time period T
R11Pick up every place electric charge during this time.The sensor controlled stage also with long detect cycle T
L12Pick up at each pixel place synchronously mainly corresponding to Q
2And Q
0Each gather the every place electric charge that produces and gather during the cycle.At pick-up time period T
R12Pick up every place electric charge during this time.
Long detect cycle T at Figure 10
L21(Q
1, Q
3) and T
L22(Q
3, Q
1) in, the sensor controlled stage is at corresponding to T
L21Q
1Each pixel of phase change in corresponding to the synchronous opportunity of control electrode 63b-1 to the cycle of gathering of the photosensitive unit of 63b-3 so that at photosensitive unit with corresponding to Q
3Phase place exchange.The sensor controlled stage is also at corresponding to TL
21Q
3Each pixel of phase change in corresponding to the synchronous opportunity of electrode 63b-4 to the cycle of gathering of the photosensitive unit of 63b-6 so that at photosensitive unit with corresponding to Q
1Phase place exchange.In addition, sensor controlled stage and long detect cycle T
L21Pick up at each pixel place synchronously mainly corresponding to Q
1And Q
3Each gather the every place electric charge that produces and gather during the cycle.At pick-up time period T
R31Pick up every place electric charge during this time.The sensor controlled stage also with long detect cycle T
L22Pick up at each pixel place synchronously mainly corresponding to Q
3And Q
1Each gather the every place electric charge that produces and gather during the cycle.At pick-up time period T
R32Pick up every place electric charge during this time.
Corresponding to long detect cycle T
L11, T
L12, T
L21And T
L22Short detect cycle in, the sensor controlled stage is carried out and process identical in long detect cycle.
The image construction stage of the 6th embodiment is picked up the sensor controlled stage at each pixel place every place electric charge and one group of combination of charge corresponding to one group of phase place of modulation signal.Image construction stage is each pixel compute distance values based on this group of electric charge then.For example, corresponding to Q
0, Q
1, Q
2Or Q
3One group of electric charge of charge value and this in the value combination conduct and or the mean value of corresponding electric charge.In this case, operating cycle T
P1Frame corresponding to range image.
So, because each phase place that each adjacent photosensitive unit has all been exchanged each group, might guarantee the reliability of the distance value that obtains from each pixel that constitutes by two adjacent photosensitive units.
In alternative, it is each pictorial element compute distance values in the range image that image construction stage calculates that a group of each pictorial element place in range image gathers electric charge and gather electric charge based on each group.At each same phase place of one group of phase place the acquisition that adds up of the every place electric charge in a plurality of detect cycles (for example particular probe cycle) is gathered electric charge for this group.In this embodiment, owing to might relatively reduce the light quantity that receives in the cycle in each particular probe, can prevent the saturated of optical detection device.
In another alternative, a plurality of adjacent photosensitive units are set to arithmetic element.The sensor controlled stage becomes the cycle of gathering of each photosensitive unit of arithmetic element in each particular probe cycle the cycle of gathering of the out of phase of one group of phase place.Image construction stage calculates the value of the pictorial element in the range image from the distance of using the electric charge that adds up obtain photosensitive unit receiving the time durations of light from object space in.In gathering each of cycle, all of phase place receive the light of same number of times.In this embodiment, during the out of phase that different photosensitive units is synchronized with the modulation signal of particular probe in the cycle is being gathered the cycle, receive the light time, in the electric charge that adds up, do not comprise the positional information of a plurality of photosensitive units of arithmetic element, so that find distance.Therefore, the reliability of the distance that is obtained has uprised.
Although described the present invention with reference to some preferred embodiment, those skilled in the art can make numerous modifications and variations under the situation that does not deviate from true spirit of the present invention and scope.
For example, except the structure of the ccd image sensor that is similar to the FT type, can also be similarly being configured to interline transfer (IT, interline transfer) or frame interline transfer (FIT, frame interlinetransfer) type.
Claims (15)
1. range image sensor comprises:
Light source, according to the modulation signal of characteristic frequency to object space emissive porwer light modulated;
Optical detection device, have the photosensitive unit that is provided with in the face of described object space, each described photosensitive unit received light and gives birth to electric charge in response to the volume production from the light of described object space from described object space during the cycle of gathering of the one-period that is shorter than described characteristic frequency;
The sensor controlled stage, its control so that each of described photosensitive unit to gather the particular phases of cycle and described modulation signal synchronous, and after detect cycle, pick up the every electric charge that produces and be stored in the described optical detection device from described optical detection device corresponding to one or more cycles of described characteristic frequency; And
Image construction stage, it is each pictorial element compute distance values in the range image based on the every place electric charge that is picked up by described sensor controlled stage, to make up described range image, when in the described object space at least one physical objects being arranged, described distance value representative arrives the distance of described physical objects;
Wherein: described detect cycle comprises different detect cycles; And
Described image construction stage is each pictorial element compute distance values in the described range image based on the every place electric charge that is picked up by described sensor controlled stage after the cycle in the particular probe of described different detect cycles,
The described particular probe cycle is one of described optical detection device one or more detect cycles that can not reach capacity betwixt, and be such detect cycle, during the value relevant with the amount of the light that receives from described object space become maximal value one or more detect cycles.
2. range image sensor as claimed in claim 1, wherein:
Described sensor controlled stage is controlled, so that each of described photosensitive unit gathered each of one group of phase place that differs from one another in cycle and the described modulation signal is synchronous, and one group of electric charge corresponding to described one group of phase place is picked up at each the pictorial element place in described range image after the cycle of described particular probe at least of described different detect cycles; And
Described image construction stage is based at described particular probe one group of electric charge that pick up at each the pictorial element place in described range image after the cycle being each pictorial element compute distance values in the described range image.
3. range image sensor as claimed in claim 2, wherein:
Described sensor controlled stage is controlled with each pictorial element place in described range image after each described different detect cycle and is picked up one group of electric charge corresponding to described one group of phase place; And
Described image construction stage is selected the described particular probe cycle from described different detect cycles, and based at described particular probe one group of electric charge that pick up at each the pictorial element place in described range image after the cycle being each pictorial element compute distance values in the described range image
The described particular probe cycle is one of one or more detect cycles, during this time, the value that the one group of electric charge that picks up from each pictorial element in described range image after each described different detect cycle obtains is no more than based on the predetermined value of the saturation level of described optical detection device, and the described particular probe cycle becomes a peaked detect cycle one or more detect cycles for the value that obtains from one group of electric charge.
4. range image sensor as claimed in claim 3, the wherein said particular probe cycle is one of one or more detect cycles, during this time, the value that the one group of electric charge that picks up from each pictorial element in described range image after each described different detect cycle obtains is no more than the predetermined value corresponding to described saturation level, and the described particular probe cycle becomes a peaked detect cycle one or more detect cycles for the value that obtains from one group of electric charge.
5. range image sensor as claimed in claim 3, the wherein said particular probe cycle is one of one or more detect cycles, during this time, the maximum charge value at every place of the one group of electric charge that picks up from each pictorial element in described range image after each described different detect cycle is no more than based on the predetermined max-thresholds of described saturation level, and the described particular probe cycle is that described maximum charge value becomes the peaked detect cycle in one or more detect cycles.
6. range image sensor as claimed in claim 3, the wherein said particular probe cycle is one of one or more detect cycles, during this time, the mean value of the one group of electric charge that picks up from each pictorial element in described range image after each described different detect cycle is no more than based on the predetermined average reference value of described saturation level, and the described particular probe cycle is that described mean value becomes the peaked detect cycle in one or more detect cycles.
7. range image sensor as claimed in claim 3, wherein, when being shorter than predetermined length when the non-selected described particular probe cycle or as first particular probe cycle in described particular probe cycle, described image construction stage:
(i) from described different detect cycles, selected for the second particular probe cycle at particular image element at each or a plurality of phase places place of described one group of phase place, do not select the described particular probe cycle or selected to be shorter than described first particular probe cycle of described predetermined length for described particular image element;
(ii) revise the one or more values that obtain from the one group of electric charge that picks up at particular image element after the cycle in second particular probe, and calculate a class value based on the length ratio in the corresponding second particular probe cycle; And
Be described particular image element compute distance values (iii) based on a described class value;
The described second particular probe cycle is one of one or more such detect cycles, during this time, the value that obtains from the electric charge corresponding to one or more phase places of described one group of phase place is no more than based on the predetermined value of described saturation level, described second particular probe cycle and be a such detect cycle, during the value that obtains from electric charge become the maximal value of one or more detect cycles.
8. range image sensor as claimed in claim 2, at least one value that wherein said image construction stage obtains by one group of electric charge that will pick up from described sensor controlled stage is applied to calculate fiducial value about the function of the light quantity that each received of described photosensitive unit, and selects the described particular probe cycle by more described fiducial value and predetermined threshold.
9. range image sensor as claimed in claim 8, wherein said fiducial value are the mean value corresponding to the electric charge of the light quantity that is received by described photosensitive unit during one or more cycles of described characteristic frequency.
10. range image sensor as claimed in claim 1, wherein, during the distance value of particular image element, described image construction stage is not that described particular image element is distributed backed-up value in calculating described range image.
11. range image sensor as claimed in claim 10, wherein said backed-up value are the distance values in the past of described particular image element.
12. range image sensor as claimed in claim 10, wherein said backed-up value are the mean value of the distance value of each pictorial element around the described particular image element.
13. range image sensor as claimed in claim 2, wherein said image construction stage is calculated gathering electric charge and calculating the distance value of each pictorial element in the described range image based on the described one group everywhere of gathering electric charge of one group of each pictorial element place in described range image, and described one group is gathered electric charge and by each the same phase place in described one group of phase place the every place electric charge of a plurality of particular probe in the cycle added up and obtain.
14. range image sensor as claimed in claim 13, wherein:
Described optical detection device comprises pixel, each described pixel is made of two or more adjacent photosensitive units in the described photosensitive unit, main two or more phase-locking with each group of each described pixel are in two or the generation of more heterogeneous adjacent photosensitive unit place and gather two places or many places electric charge more, described group obtains by described one group of phase place being divided into group, and each group comprises two or more phase places respectively;
Described sensor controlled stage is controlled, to gather the synchronous opportunity in cycle at each of two or more the adjacent photosensitive units in each described pixel of each phase change of the corresponding group of described all groups, so that exchange adjacent photosensitive unit corresponding group each phase place and pick up every place electric charge, described every place electric charge mainly produces and accumulates in each pixel place during gathering the cycle corresponding to each of each phase place of described each group after the cycle of described particular probe at least of described different detect cycles; And
Described image construction stage is picked up described sensor controlled stage at each pixel place every place electric charge and one group of combination of charge corresponding to described one group of phase place, and be each pictorial element compute distance values in the described range image based on described one group of electric charge.
15. range image sensor as claimed in claim 13, wherein:
A plurality of adjacent photosensitive units are set to arithmetic element;
Described sensor controlled stage becomes the cycle of gathering of each photosensitive unit of arithmetic element in each described particular probe cycle the cycle of gathering of the out of phase of described one group of phase place; And
Described image construction stage calculates the value of the pictorial element in the described range image from the distance of using the electric charge that adds up obtain each photosensitive unit receiving the time durations of light from described object space in, described light is received same number of times in all of described phase place are gathered each of cycle.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004272001A JP3906859B2 (en) | 2004-09-17 | 2004-09-17 | Distance image sensor |
| JP272000/2004 | 2004-09-17 | ||
| JP272001/2004 | 2004-09-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1842723A CN1842723A (en) | 2006-10-04 |
| CN100573187C true CN100573187C (en) | 2009-12-23 |
Family
ID=36163041
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005800010337A Expired - Fee Related CN100573187C (en) | 2004-09-17 | 2005-09-16 | Range image sensor |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP3906859B2 (en) |
| CN (1) | CN100573187C (en) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006030989A1 (en) | 2004-09-17 | 2006-03-23 | Matsushita Electric Works, Ltd. | A range image sensor |
| JP4704153B2 (en) * | 2005-09-02 | 2011-06-15 | 浜松ホトニクス株式会社 | Solid-state imaging device |
| JP4709126B2 (en) * | 2006-12-08 | 2011-06-22 | 富士フイルム株式会社 | Imaging apparatus, method, and program |
| JP5098331B2 (en) * | 2006-12-28 | 2012-12-12 | 株式会社豊田中央研究所 | Measuring device |
| JP2008241434A (en) * | 2007-03-27 | 2008-10-09 | Stanley Electric Co Ltd | Distance image generation device |
| CA2682662A1 (en) | 2007-03-30 | 2008-10-16 | Panasonic Electric Works Co., Ltd. | Image pickup device, spatial information detecting apparatus using the same device and method for taking out received-light output from the same device |
| JP5190866B2 (en) * | 2007-09-04 | 2013-04-24 | 富士フイルム株式会社 | Ranging method and apparatus |
| CN102016636B (en) * | 2009-03-05 | 2014-10-01 | 松下电器（美国）知识产权公司 | Distance measuring method |
| JP5452200B2 (en) * | 2009-12-10 | 2014-03-26 | スタンレー電気株式会社 | Distance image generating apparatus and distance image generating method |
| KR101884952B1 (en) * | 2010-01-06 | 2018-08-02 | 헵타곤 마이크로 옵틱스 피티이. 리미티드 | Demodulation sensor with separate pixel and storage arrays |
| KR101711061B1 (en) * | 2010-02-12 | 2017-02-28 | 삼성전자주식회사 | Method for estimating depth information using depth estimation device |
| JP6315679B2 (en) | 2014-04-18 | 2018-04-25 | 浜松ホトニクス株式会社 | Distance image sensor |
| JP6507529B2 (en) * | 2014-08-29 | 2019-05-08 | 株式会社デンソー | Optical flight type distance measuring device |
| JP6498429B2 (en) * | 2014-12-16 | 2019-04-10 | スタンレー電気株式会社 | Distance image generation device, distance image generation method and program |
| JP6406449B2 (en) * | 2015-06-24 | 2018-10-17 | 株式会社村田製作所 | Distance sensor |
| JP6747822B2 (en) | 2016-02-23 | 2020-08-26 | 株式会社トプコン | Distance measuring device, distance measuring method, and distance measuring program |
| WO2019031510A1 (en) * | 2017-08-08 | 2019-02-14 | 国立大学法人静岡大学 | Distance-image-measuring apparatus and distance-image-measuring method |
| CN111033304A (en) * | 2017-09-27 | 2020-04-17 | 日本电产株式会社 | Distance measuring device and moving body |
| JP7139168B2 (en) * | 2018-07-04 | 2022-09-20 | 株式会社日立エルジーデータストレージ | distance measuring device |
-
2004
- 2004-09-17 JP JP2004272001A patent/JP3906859B2/en not_active Expired - Fee Related
-
2005
- 2005-09-16 CN CNB2005800010337A patent/CN100573187C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP3906859B2 (en) | 2007-04-18 |
| CN1842723A (en) | 2006-10-04 |
| JP2006084430A (en) | 2006-03-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100573187C (en) | Range image sensor | |
| KR100778904B1 (en) | A range image sensor | |
| US11448757B2 (en) | Distance measuring device | |
| US7450220B2 (en) | Method and system to correct motion blur and reduce signal transients in time-of-flight sensor systems | |
| US7283213B2 (en) | Method and system to correct motion blur and reduce signal transients in time-of-flight sensor systems | |
| CN110596721B (en) | Flight time distance measuring system and method of double-shared TDC circuit | |
| CN110596725B (en) | Time-of-flight measurement method and system based on interpolation | |
| CN101449181B (en) | Distance measuring method and distance measuring instrument for detecting the spatial dimension of a target | |
| US10094927B2 (en) | Detector for optically determining a position of at least one object | |
| CN110596723B (en) | Dynamic histogram drawing flight time distance measuring method and measuring system | |
| KR20170122206A (en) | An optical detector for at least one object | |
| CN106896369A (en) | Range unit | |
| CN111045029B (en) | Fused depth measuring device and measuring method | |
| JP2004523769A (en) | Surface shape measurement | |
| CN104236521A (en) | Line-laser ranging method applied to auto-moving robots | |
| WO2021056668A1 (en) | Dynamic distance measurement system and method | |
| Beraldin et al. | Optimized position sensors for flying-spot active triangulation systems | |
| CN102803896B (en) | Displacement sensor | |
| US5107103A (en) | Integrated circuit having at least a sensor and a processor thereon | |
| JP3906858B2 (en) | Distance image sensor | |
| CN109982070A (en) | Imaging sensor and its operating method with calibration phase-detection pixel | |
| JP4259418B2 (en) | Image processing device | |
| CN115552285A (en) | Global shutter image sensor with time-of-flight sensing capability | |
| JP2015207862A (en) | Imaging device and imaging method | |
| Maas | Close range photogrammetry sensors |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20091223 Termination date: 20150916 |
|
| EXPY | Termination of patent right or utility model |