CN101221144A - 监视电化学半电池的方法 - Google Patents
监视电化学半电池的方法 Download PDFInfo
- Publication number
- CN101221144A CN101221144A CNA2007101600737A CN200710160073A CN101221144A CN 101221144 A CN101221144 A CN 101221144A CN A2007101600737 A CNA2007101600737 A CN A2007101600737A CN 200710160073 A CN200710160073 A CN 200710160073A CN 101221144 A CN101221144 A CN 101221144A
- Authority
- CN
- China
- Prior art keywords
- conductor element
- half cell
- electrolyte
- measuring probe
- controlling value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/4163—Systems checking the operation of, or calibrating, the measuring apparatus
- G01N27/4165—Systems checking the operation of, or calibrating, the measuring apparatus for pH meters
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Molecular Biology (AREA)
- General Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Secondary Cells (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Hybrid Cells (AREA)
- Tests Of Electric Status Of Batteries (AREA)
Abstract
Description
Claims (14)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06127182.1 | 2006-12-22 | ||
EP06127182A EP1936366B1 (de) | 2006-12-22 | 2006-12-22 | Verfahren und Vorrichtung zur Überwachung einer elektrochemischen Halbzelle |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101221144A true CN101221144A (zh) | 2008-07-16 |
CN101221144B CN101221144B (zh) | 2013-06-05 |
Family
ID=38001738
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101600737A Active CN101221144B (zh) | 2006-12-22 | 2007-12-21 | 监视电化学半电池的方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8117003B2 (zh) |
EP (1) | EP1936366B1 (zh) |
JP (1) | JP5184877B2 (zh) |
CN (1) | CN101221144B (zh) |
AT (1) | ATE498127T1 (zh) |
DE (1) | DE502006008890D1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102224471B (zh) * | 2008-11-24 | 2013-07-10 | 梅特勒-托利多公开股份有限公司 | 监控电位测量探针的方法 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8554505B2 (en) | 2008-05-13 | 2013-10-08 | Mettler-Toledo Ag | System and method for calibrating and monitoring the condition of a sensor device |
EP2154523B1 (de) * | 2008-08-05 | 2013-03-27 | Hamilton Bonaduz AG | Potentiometrische pH-Einstabmesskette und Verfahren zur kontinuierlichen Füllstandsüberwachung |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59154351A (ja) * | 1983-02-23 | 1984-09-03 | Ngk Insulators Ltd | 水素イオン濃度測定装置 |
DE3510868A1 (de) | 1984-03-30 | 1985-10-10 | Conducta Gesellschaft für Meß- und Regeltechnik mbH & Co, 7016 Gerlingen | Verfahren zum schutz und/oder zur ueberwachung eines referenzsystems fuer die analysen-messtechnik auf veraenderung und referenzsystem mit bezugselektrode |
JPS6235254A (ja) * | 1985-08-08 | 1987-02-16 | Yamazato Erekutoronaito Kk | 溶融金属の温度及び含有酸素量の読み取り方法 |
US4822456A (en) * | 1987-06-05 | 1989-04-18 | Bryan Avron I | Ion measuring apparatus and monitoring system |
CN1053956A (zh) * | 1990-02-09 | 1991-08-21 | 国际自动控制装置金融公司 | 检测酸碱度[pH]探测器是否破损的方法和设备 |
JP3097924B2 (ja) * | 1991-04-25 | 2000-10-10 | 株式会社小松製作所 | 化学量センサの温度補正方法 |
DE19539763C2 (de) * | 1995-10-26 | 1998-04-16 | Knick Elektronische Mesgeraete | Verfahren und Vorrichtung zur überwachung der Bezugselektrode einer pH-Meßkette |
US6133709A (en) * | 1997-01-21 | 2000-10-17 | Metrixx Limited | Signalling system |
JP2001242134A (ja) * | 2000-03-02 | 2001-09-07 | Matsushita Electric Ind Co Ltd | pHセンサ |
DE10036039B4 (de) * | 2000-07-25 | 2016-02-25 | Mettler-Toledo Ag | Messsonde für potentiometrische Messungen, Verfahren zur Überwachung des Altrungszustandes der Messonde und ihre Verwendung |
EP1219958A1 (de) * | 2000-12-27 | 2002-07-03 | Hamilton Bonaduz AG | Elektrochemisches Messsystem mit zwei Referenzelektroden unterschiedlicher Potentialstabilität |
DE10100239A1 (de) | 2001-01-05 | 2002-07-11 | Mettler Toledo Gmbh | Verfahren zur Bestimmung einer Restbetriebsdauer einer potentiometrischen Messsonde, Vorrichtung zur Durchführung des Verfahrens und ihre Verwendung |
US20050040038A1 (en) * | 2003-04-02 | 2005-02-24 | Larry Berger | Diagnostic electro-chemical reference half cell |
EP2472277A3 (en) * | 2003-06-27 | 2012-10-17 | The Furukawa Electric Co., Ltd. | Method and device for measuring secondary cell internal impedance and judging deterioration |
ATE443860T1 (de) * | 2004-06-22 | 2009-10-15 | Mettler Toledo Ag | Potentiometrische messsonde mit aussenseitiger beschichtung als zusatzelektrode |
ATE363067T1 (de) | 2004-10-04 | 2007-06-15 | Mettler Toledo Ag | Bezugselektrode für potentiometrische messungen und verfahren zu deren überwachung |
JP4646129B2 (ja) * | 2004-12-28 | 2011-03-09 | 日本特殊陶業株式会社 | ガス濃度測定装置の異常診断方法及びガス濃度測定装置の異常診断装置 |
CN100412542C (zh) * | 2005-10-01 | 2008-08-20 | 中国科学院等离子体物理研究所 | 多路光伏电池性能实时测试方法 |
CN100363738C (zh) * | 2005-12-09 | 2008-01-23 | 清华大学 | 燃料电池质子交换膜缺水诊断方法及监测装置 |
-
2006
- 2006-12-22 DE DE502006008890T patent/DE502006008890D1/de active Active
- 2006-12-22 AT AT06127182T patent/ATE498127T1/de active
- 2006-12-22 EP EP06127182A patent/EP1936366B1/de not_active Not-in-force
-
2007
- 2007-12-05 US US11/950,975 patent/US8117003B2/en not_active Expired - Fee Related
- 2007-12-21 CN CN2007101600737A patent/CN101221144B/zh active Active
- 2007-12-21 JP JP2007329995A patent/JP5184877B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102224471B (zh) * | 2008-11-24 | 2013-07-10 | 梅特勒-托利多公开股份有限公司 | 监控电位测量探针的方法 |
Also Published As
Publication number | Publication date |
---|---|
ATE498127T1 (de) | 2011-02-15 |
EP1936366B1 (de) | 2011-02-09 |
EP1936366A1 (de) | 2008-06-25 |
JP5184877B2 (ja) | 2013-04-17 |
DE502006008890D1 (de) | 2011-03-24 |
US20080149497A1 (en) | 2008-06-26 |
CN101221144B (zh) | 2013-06-05 |
US8117003B2 (en) | 2012-02-14 |
JP2008170433A (ja) | 2008-07-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20080716 Assignee: Mettler-Toledo Instrument (Shanghai) Co., Ltd. Assignor: Mettler Toledo AG Contract record no.: 2010990000172 Denomination of invention: Method of monitoring an electrochemical half-cell License type: Exclusive License Record date: 20100406 |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: MEITELE-TUOLIDUO INSTRUMENT (SHANGHAI) CO., LTD. Free format text: FORMER OWNER: METTLER TOLEDO GMBH Effective date: 20150731 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20150731 Address after: 200233 No. 589, Guiping Road, Shanghai Patentee after: Mettler-Toledo Instrument (Shanghai) Co., Ltd. Address before: Swiss G Lai Finn Jose Patentee before: Mettler Toledo AG |