CN101517377A - 带有校验的磁流量计 - Google Patents

带有校验的磁流量计 Download PDF

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CN101517377A
CN101517377A CNA2007800354911A CN200780035491A CN101517377A CN 101517377 A CN101517377 A CN 101517377A CN A2007800354911 A CNA2007800354911 A CN A2007800354911A CN 200780035491 A CN200780035491 A CN 200780035491A CN 101517377 A CN101517377 A CN 101517377A
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flowmeter
parameter
circuit
measurement
stream pipe
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CN101517377B (zh
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威廉·F·格拉伯尔
斯科特·R·弗斯
罗伯特·K·舒尔兹
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Micro Motion Inc
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Rosemount Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
    • G01F1/56—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using electric or magnetic effects
    • G01F1/58—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using electric or magnetic effects by electromagnetic flowmeters
    • G01F1/60—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F25/00—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume
    • G01F25/10—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume of flowmeters

Abstract

本发明提供了一种磁流量计(20)，所述磁流量计(20)包括被设置用以接收过程流体流动的磁流管(22)。所述磁流管(22)包括激励线圈(26)和至少一个感测电极(30、32)。测量电路(154)耦合至磁流管(22)且被配置以提供激励信号至激励线圈(26)和基于感测电极(30、32)的输出测量穿过流管(22)的过程流体的流动。存储器(204)包括相关于流管的额定参数的存储值(222)。校验电路(200)被设置以测量磁流管(22)的参数，和基于测量参数和存储值之间的比较响应地提供相关于磁流量计(22)的运行的校验输出(222)。

Description

带有校验的磁流量计
技术领域
本发明涉及过程测量和控制工业。更具体地，本发明涉及用于测量过程流体流动的类型的磁流量计。
背景技术
磁流量计用于测量穿过流管的传导过程流体的流动。所述传导流体流过电磁体和电极。根据电磁感应的法拉第定律，由于施加了磁场在流体中感应产生电动势(EMF)。EMF与流体的流动流速成正比。电极设置在流管中以与流动的流体进行电接触。电极感测在流体中磁感应产生的EMF，所述EMF之后被用于确定流率。通过使用跨过电极被连接的微分前端放大器的流量计测量所述EMF。过程流体的电势作为微分放大器的参考。
在一些工业安装中，流量计的校准必需被校验以处于特定的限度内，例如所需精度的百分比。使用各种技术校验流量计的运行。这些包括关闭所述过程、从所述过程移除流管和把流管发送至非现场位置(offsite location)以校验校准。所述非现场位置可以是例如工厂、鉴定试验室或使用例如“校准装置”或参考计的另外的设备进行测试的房屋位置。在一些配置中，可使用连接至流管和变送器的外部装置。之后这种外部装置校验流管和变送器的原始特性没有显著地变化。这些程序非常昂贵、麻烦而且需要经专门训练的技术人员执行所述测试。
发明内容
提供了一种磁流量计，所述磁流量计包括被设置用以接收过程流体流动的磁流管。所述磁流管包括激励线圈和至少一个感测电极。测量电路被耦合至流管且被配置以提供激励信号至激励线圈和基于感测电极的输出测量穿过流管的过程流体的流动。存储器包括相关于流管的额定参数的存储值。校验电路被设置以测量磁流管或流量计的参数，和基于测量的参数和存储值的比较响应地提供相关于磁流量计的运行的校验输出。
附图说明
图1是显示了显示根据本发明的流量计的部分切掉视图的透视切掉视图。
图2是图1的流量计的电学方框图。
图3是根据本发明的显示校验电路的方框图。
图4是显示图3中所显示的校验电路使用的测试电路的简化方框图。
具体实施方式
本发明提供了一种用被提供至所述测量计内部的电路校验流管或磁流量计的运行的方法和设备。这种配置不需要关闭所述过程和从使用中移除流管，且也不需要分离的或另外的设备或经专门训练的人员执行所述测试。
在磁流量计中，提供测量与流量计相关的磁流管和/或变送器电路的参数的校验电路。校验电路可被配置以测量包括相关电子电路的流管的参数。所述电路基于测量参数和与参数的额定值相关的储存值的比较响应地提供校验输出。所述比较可以例如基于阈值限制、随时间的变化等。可测量和校验多于一个参数，校验输出可以是多个比较或其它的运算法则的函数。例如，一个测量可显示一个特定的部件已经退化但仍然在可接受的限度内运行，而另外的测量可显示第二部件也已退化且在可接受的限度内运行。然而，两个已退化部件的结合可用于提供磁流量计的整个运行在可接受的精度范围之外的校验。可被监测的参数的例子包括流管的激励线圈的电阻、激励线圈的电感、流管的感测电极的阻抗和磁流量计的模拟输出、流量计的前端电子装置的运行、施加至流管线圈的激励电流的波形和水平、脉冲输出、数字输入和输出、或其它的，但不限于此。
图1是磁流量计的一个实施例的部分切掉视图，其中，本发明的各实施例可用于所述磁流量计。磁流量计20包括具有电绝缘的衬垫23的、由低导磁率材料形成的流管22、由线圈形成的电磁体26、铁磁芯或屏蔽物28、以及感测电极30、32。电磁体26和电极30、32被导线连接至变送器电路34，接地电极35也被连接至变送器电路34。在运行中，变送器电路34用电流激励电磁体26，电磁体26产生由流管22内部的箭头显示的磁场36。过程流体21流过流管22的磁场，所述流动在液体21中感应产生电动势(EMF、电压)。绝缘衬垫23防止EMF从液体21泄露至金属流管22。电极30、32接触液体21且获得或感测根据法拉第定律与流管22中的液体21的流量(流率)成正比的EMF。
图2是磁流量计20的电路的图解视图。磁流量计20包括具有适合承载流动液体21的绝缘衬垫23的流管22，所述流动液体21被电耦合至流管22且通常被连接至接地地面130。设置电磁体26以响应于激励电路152的激励信号施加磁场至过程流体。电极30和32分别穿过放大器150和148耦合至测量电路154。测量电路154根据公知的技术提供相关于流动的输出。
图2也显示根据本发明的流量计的校验电路200。下文中将更加详细地说明校验电路200的运行。校验电路200提供输出210。可就地提供这种输出用于在流量计20中使用或把这种输出发送至很远的位置。可通过任何适合的方式传输至很远的位置。例如，可由根据HART
Figure A20078003549100061
通信协议、Fieldbus协议或其它的有线通信技术运行的二线式过程控制回路传输输出210。在另一个实施例中，使用无线通信技术发送校验电路200的输出210。例如，通过无线电频率通信线路可提供信息至很远的位置。所述很远的位置可以是例如耦合至流量计20的测试设备、远程控制室或其它的装置。测量电路154和校验电路200的输出被提供至通信电路160。在图2显示的实施例中，通信电路160显示耦合至二线式过程控制回路162。
图3是校验电路200的简化方框图。校验电路200包括测试电路202、存储器204和输出电路206。输出电路206被配置以提供输出210。输出电路206被配置以提供输出210。包括校验电路200的各种元件可被包含在流量计20的其它的元件中。例如，存储器204可是与流量计20的其它部件共有的。类似地，测试电路202可由分离的部件形成或可以是与其它的部件共有的，例如微处理器、放大器、模数转换器、传感器等。输出电路206可以是独立于流量计20中的其它电路的输出电路，或可以是与例如微处理器或与其类似的流量计中的其它电路共有的。
显示测试电路202与流量计电路220连接。流量计电路220可以是在流量计20中使用的任何电路。
在运行中，测试电路202对流量计电路200执行测试。测试的结果与储存在存储器204中的额定参数值222对较。额定参数值可以是特定值、百分比范围的值、值的范围或从在流量计电路220上执行的测试中识别可接受的结果的其它的方式。基于这种比较，从校验电路220通过输出电路206提供输出。这可以是装置应该尽快被维修或装置在可接受的运行限制之外的指示。在更复杂的配置中，存储器204储存多个额定参数值222，测试电路202对多个流量计电路220或流量计的其它方面执行测试。之后测试电路202可提供基于多个测试的输出。例如，虽然总的来说多个单独的测试可在可接受的限制中，但测试可显示整个流量计不能适当地运行或不处于可接受的限制中。注意到，这些测试是被原位地执行的，不需要从使用中移除流量计。
图4是更加详细地显示已示出的测试电路202的简化方框图。如所显示的测试电路202包括测试功能(function)230和感测器232。测试功能230和感测器232耦合至流量计电路202。感测器232的输出被提供至模数转换器236，所述模数转换器236提供数字输出信号至微处理器238。所述微处理器238被如所示出地控制测试功能230。微处理器238可以是孤立的微处理器或例如可以是图2中示出的测量电路154的一部分。所述微处理器可根据例如储存在存储器204中的指令运行。
测试功能230可被用于施加测试功能或信号至流量计电路220的部件或电路。感测器232可被用于测量流量计电路220的部件或电路的参数。转向特定的实施例，测试功能230可包括电流源，感测器232可包括电压感测器。在这样的配置中，通过监测响应于施加的电流水平的经过部件的电压降，微处理器238可测量阻抗值。类似地，通过使用具有时间变化信号的测试功能，可测量例如电感或电容的其它参数。
在一种配置中，在流量计的正常运行中或通过流量计的已有部件可提供测试功能230。例如，图2中显示的线圈激励电路152可提供用于测试线圈26的测试功能。测试功能信号可包括在正常运行中所使用的线圈激励信号。在这种配置中，感测器232被用于测量线圈的参数，例如在运行中的穿过线圈26的时间变化电压。
在一个示例的配置中，设置测试电路202测量线圈26的阻抗。这可以是例如通过施加测试功能和测量穿过线圈26所产生的电压降或电流。如上面所讨论的，在另一配置中，通过线圈激励电路152施加测试功能。在另一示例的配置中，测量线圈的电感。测试电路202也可被配置以测量电极202的阻抗。在这样的配置中，测试功能230可被配置以施加通过电极30和32的电流。在这种配置中，把感测器232包含在被设置用于测量电极30和32的电压的放大器148和150中。除了校验在执行测量中所使用的电路的运行，校验电路200可被设置以测量与变送器通信相关的部件。例如，测试电路202可被配置以测量在过程控制回路162上传送的模拟电流水平。类似地，使用感测器232可测量通过线圈激励电路152施加至线圈26的电流水平。可测试变送器其它的“前端”电子装置。例如，测试功能230可被配置以模拟由于穿过流管的流动导致的、从电极30和32上所产生的电极电压。基于模拟的感测电压，可测试输入电路以测定放大器或其它部件的适当运行。
额定参数值222可储存在非易失存储器中。在运送至工厂之前和在运送至现场位置以前，把所述值设置在存储器中。多个值可被存储在存储器中，多个值全面地提供了流量计20的各个部件的表征。之后，这些值可与测量的值进行比较，以校验流管的校准在运行中没有变化。可用很多方式获得所述数据，包括例如工厂的测量、外部设备的测量，且所述数据被设置在存储器中，当流量计20被初次使用时通过校验电路200本身测量所述数据。
可根据需要选择由测试电路202执行的特定测试。例如，基于测量的值与额定参数值222的存储值的偏离，可采用通过测试/未通过测试。例如，如果过程控制回路162上的模拟输出应该是20mA，测量输出是在20mA的X百分比内，特定电路可被显示为适当运行。
如上面所讨论的，可使用合适的测量技术用测试电路202测量任何电路。例如，可通过线圈电压除以线圈电流测量线圈阻抗。在这样的配置中，可能需要两个感测器232，一个用于测量电压，一个用于测量线圈电流的变化率。通过求解下述方程可测量电感L。
I ( t ) = I ( ∞ ) - ( I ( ∞ ) - I ( 0 ) ) * e - t / L R 方程1
可测量电极电阻，例如把共同模式信号施加至电极30和32和所述信号的衰减被用于确定阻抗。模数转换器可被用于测量过程控制回路162上的电流输出。通过把感测电阻器包含在与线圈26串联设置的感测器232中和测量所产生的电压降，可测量线圈电流。可在其它部件上执行其它的测试，本发明并不限于在此处所述的这些。
对于本发明，在过程流体的流动的正常测量中可执行磁流量计的校验，且没有打断流动信息的输出。在一种配置中，在流量计的正常运行情况(background)下执行校验。通过变送器本身执行所述校验，且不需要外部工具。所述变送器被配置以校验变送器本身以及流管的运行。额定参数提供正常运行的“标记”指示。在制造流量计的过程中、在流量计的初始安装过程中或在随后的时间中，可存储所述参数。例如，在流量计在现场位置开始运行后，可把额定参数存储在存储器中。
虽然已经参照优选的实施例对本发明进行了描述，但本领域技术人员将会意识到，在没有背离本发明的实质和范围的情况下可对本发明进行形式和细节上的改变。

Claims (21)

1.一种磁流量计，包括：
磁流管，所述磁流管被设置以接收过程流体的流动，所述磁流管包括激励线圈和至少一个感测电极；
测量电路，所述测量电路耦合至流管，被配置以提供激励信号至激励线圈和基于至少一个感测电极的输出测量通过流管的过程流体流；
存储器，所述存储器被配置以包含与流管的额定参数相关的存储值；和
校验电路，所述校验电路被设置以测量磁流管的参数和基于测量参数和存储值之间的比较响应地提供与磁流量计的运行相关的校验输出。
2.根据权利要求1所述的设备，其中，在校验电路的运行过程中，所述测量电路被配置以测量流体。
3.根据权利要求1所述的设备，其中，所述校验电路被配置以测量流管的线圈的阻抗。
4.根据权利要求1所述的设备，其中，所述校验电路被配置以测量流管的线圈电感。
5.根据权利要求1所述的设备，其中，所述校验电路被配置以测量流管电极至过程接地的阻抗。
6.根据权利要求1所述的设备，其中，所述校验电路被另外地配置以测量设置在二线式过程控制回路上的输出。
7.根据权利要求1所述的设备，其中，所述校验电路被配置以测量通过测量电路施加至激励线圈的激励信号的电流的电流水平。
8.根据权利要求1所述的设备，其中，在制造流量计的过程中或在流量计的初始安装过程中，所述额定参数值被存储在存储器中。
9.根据权利要求1所述的设备，其中，由校验电路把所述额定参数值存储在存储器中。
10.根据权利要求1所述的设备，其中，所述存储器被配置以存储多个额定参数，所述校验电路基于多个测量参数和多个存储的额定参数之间的比较提供校验输出。
11.根据权利要求1所述的设备，其中，所述额定参数是从由脉冲输出、数字输入和数字输出的值组成的组中选取的。
12.根据权利要求1所述的设备，其中，在现场位置运行磁流量计的过程中，把所述额定参数值存储在存储器中。
13.一种用于校验磁流量计的运行的方法，包括：
电耦合被设置以接收过程流体流动的磁流管，所述流管被耦合至过程流体流，所述磁流管包括激励线圈和至少一个感测电极；
测量所述磁流管的参数；
检索与流管的额定参数相关的存储值；和
基于磁流管的测量参数和与流管的额定值相关的存储值的比较，提供校验输出。
14.根据权利要求13所述的方法，其中，测量参数的步骤包括测量流管的线圈的阻抗。
15.根据权利要求13所述的方法，其中，测量参数的步骤包括测量流管的线圈的电感。
16.根据权利要求13所述的方法，其中，测量参数的步骤包括测量流管的电极的阻抗。
17.根据权利要求13所述的方法，其中，测量参数的步骤包括进一步测量设置在二线式过程控制回路上的输出。
18.根据权利要求13所述的方法，其中，所述校验电路被配置以测量由测量电路施加至激励线圈的激励信号的电流的电流水平。
19.根据权利要求13所述的方法，其中，在制造所述流量计过程中或在所述流量计的初始安装过程中，把所述额定参数值存储在存储器中。
20.根据权利要求13所述的方法，其中，由所述校验电路把所述额定参数值存储在存储器中。
21.根据权利要求13所述的方法，包括：存储多个额定参数，且所述校验输出是基于多个测量参数和多个存储的额定参数的比较。
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US7750642B2 (en) 2010-07-06
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WO2008042290A3 (en) 2008-07-24
EP2074385B1 (en) 2011-07-13
JP2010505121A (ja) 2010-02-18
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CN101517377B (zh) 2012-05-09
EP2074385B2 (en) 2022-07-06

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