CN101957181A - Device for rapidly detecting thickness of anti-UV layer - Google Patents
Device for rapidly detecting thickness of anti-UV layer Download PDFInfo
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- CN101957181A CN101957181A CN2010102749064A CN201010274906A CN101957181A CN 101957181 A CN101957181 A CN 101957181A CN 2010102749064 A CN2010102749064 A CN 2010102749064A CN 201010274906 A CN201010274906 A CN 201010274906A CN 101957181 A CN101957181 A CN 101957181A
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- layer thickness
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Abstract
The invention relates to a detection device, in particular to a device for rapidly detecting the thickness of an anti-UV layer on a surface of a transparent panel. The device comprises a microscope, an ultraviolet light source and a sample slice, wherein the sample slice is positioned below the objective lens of the microscope, and the ultraviolet light source is utilized to irradiate the sample slice. The thickness of the anti-UV layer of the sample slice can be clearly observed through the microscope under the radiation of the ultraviolet light source on the basis of a principle that transparent panels such as PC or PMMA and the like as well as the anti-UV layer can emit lights of different colors after absorbing the wavelength of ultraviolet lights, thus the thickness of the anti-UV layers on the surfaces of the transparent panels such as PC or PMMA and the like can be rapidly measured. The invention solves the technical problems that the detection time is long and the product quality problem can not be discovered in time when the existing detection method is used for detecting the thickness of the anti-UV layers on the surfaces of the transparent panels; and the device of the invention can measure the thickness of the anti-UV layers on the surfaces of the transparent panels such as PC or PMMA and the like conveniently and rapidly, and can master the product quality condition in time.
Description
Technical field
The present invention relates to a kind of pick-up unit, particularly a kind of anti-UV layer thickness device for fast detecting of thickness of the anti-UV layer that detects the clear sheet surface.
Background technology
Sheet material such as PC or PMMA, when being used to make outdoor architecture materials such as dome skylight, warmhouse booth, its weatherability there is requirement, therefore, need to improve the ability of its ultraviolet light, improve its weatherability at the anti-UV layer of surface recombination one decks such as PC or PMMA, prolong the outdoor application life-span of product, and the thickness of the anti-UV layer of its coextru-lamination and the degree of uniformity of distribution etc. are the important performance index of this composite board.But the detection of anti-UV layer thickness but is a difficult problem, because base material PC or PMMA are transparent, anti-UV layer also is transparent, and the UV layer thickness is at 0.005mm-0.01mm usually, and the routine techniques means can't detect at all.Report is abroad arranged, to this base material also is the detection of the anti-UV layer of transparent sheet material, what they adopted is, make equally section earlier, promptly downcut very thin a slice, it was immersed in the special solution more than half an hour, make the variable color of anti-UV layer material by solvent generation chemical reaction from the sheet material end face, take out the sample section then, observe the thickness of anti-UV layer at microscopically.Adopt this detection method, detection time is long, and is also higher to the requirement of sample section, therefore can not in time find product quality problem, also is not suitable for detecting utilization in the control in daily product quality.
Summary of the invention
The technical problem to be solved in the present invention is: when solving conventional detection the anti-UV layer thickness on transparent base surface being detected, detection time is long, can not in time find the technical matters of product quality problem, the invention provides a kind of anti-UV layer thickness device for fast detecting, the thickness of the anti-UV layer on its energy fast detecting transparent base surface is in time controlled the product quality situation.
The technical solution adopted for the present invention to solve the technical problems is: a kind of anti-UV layer thickness device for fast detecting, comprise microscope, ultraviolet source and sample section, microscope comprises eyepiece and object lens, and sample section to be measured is positioned at microscopical object lens below, and ultraviolet source is to sample section irradiation.The transparent base principles different to the reflection case of ultraviolet light such as utilization PC or PMMA with anti-UV layer, under the irradiation of ultraviolet source, the thickness of the anti-UV layer of sample section can be clearly observed by microscope, thereby the thickness of the anti-UV layer on transparent base surfaces such as PC or PMMA can be measured fast.
Simple in structure for making, described ultraviolet source comprises ultraviolet lamp tube, and the sample section is placed on the ultraviolet lamp tube.
Described ultraviolet source is positioned at sample section side top, and ultraviolet light shines in the sample section from the side top, and the UV layer presents the color different with base material because of after having absorbed ultraviolet light.
For avoiding looking at straight the infringement of ultraviolet light to tester's eyesight, described ultraviolet source is LED ultraviolet lamp lamp source, and LED ultraviolet lamp lamp source has the LED lamp pearl that sends out ultraviolet light.
For making anti-UV layer thickness device for fast detecting small and exquisite, convenient, on the described microscope support is housed, be fixed with battery case on the support, LED lamp pearl is fixed on the battery case end, gauge tap also is housed on the battery case, is placed with battery in the battery case, LED lamp pearl, battery and gauge tap are connected in series.
For further avoiding visual ultraviolet light that eyesight is caused damage, to be convenient to the data that detect are analyzed, described microscopical eyepiece top is provided with CCD video capture device and the video acquisition control card that is connected with computing machine.
The invention has the beneficial effects as follows: anti-UV layer thickness device for fast detecting of the present invention, can measure the thickness of the anti-UV layer of clear sheet surface recombination such as PC or PMMA quickly and easily, in time control the product quality situation.
Description of drawings
The invention will be further described below in conjunction with drawings and Examples.
Fig. 1 is the structural representation of first embodiment of anti-UV layer thickness device for fast detecting of the present invention.
Fig. 2 is the structural representation of second embodiment of anti-UV layer thickness device for fast detecting of the present invention.
Fig. 3 is the anti-UV layer measurement result synoptic diagram that shows under microscopical eyepiece.
Among the figure: 1. microscope, 1-1. object lens, 1-2. eyepiece, 2. ultraviolet lamp tube, 2 ' .LED lamp pearl, 3. sample section, 4. print folder, 5. support, 6. battery case, 7. gauge tap 8. batteries, 9.CCD video capture device, 10. video acquisition control card, 11, anti-UV layer, 12, basic layer
Embodiment
First embodiment of of the present invention anti-UV layer thickness device for fast detecting as shown in Figure 1, it comprises microscope 1 and ultraviolet source, microscope 1 comprises eyepiece 1-2 and has the object lens 1-1 of scale, sample section 3 to be measured is positioned at the below of the object lens 1-1 of microscope 1, ultraviolet source comprises ultraviolet lamp tube 2, sample section 3 is placed on the ultraviolet lamp tube 2, and ultraviolet lamp tube shines sample section 3 from the below of sample section 3.Testing staff's eyes are pressed close to the eyepiece 1-1 of microscope 1, with the thickness of the anti-UV layer of observation sample section 3.Print 3 comprises the anti-UV layer 11 on upper strata and the basic layer 12 of lower floor.
Second embodiment of of the present invention anti-UV layer thickness device for fast detecting as shown in Figure 2, it comprises microscope 1 and ultraviolet source, microscope 1 comprises eyepiece 1-2 and object lens 1-1, and sample section 3 is fixed in the print folder 4, and print folder 4 is positioned at microscopical object lens 1-1 below.Support 5 is housed on the microscope 1, be fixed with battery case 6 on the support 5, ultraviolet source comprises the LED lamp pearl 2 ' that sends out ultraviolet light, LED lamp pearl 2 ' is fixed on battery case 6 ends and is positioned at the side top of sample section 3, LED lamp pearl 2 ' is shone sample section 3 from the side top of sample section 3, gauge tap 7 also is housed on the battery case 6, is placed with battery 8 in the battery case 6, LED lamp pearl 2 ', battery 8 and gauge tap 7 are connected in series.
The eyepiece 1-2 top of microscope 1 is provided with CCD video capture device 9 and the video acquisition control card 10 that is connected with computing machine.
Claims (6)
1. anti-UV layer thickness device for fast detecting, it is characterized in that: comprise microscope (1) and ultraviolet source, microscope (1) comprises eyepiece (1-2) and object lens (1-1), and sample section (3) to be measured is positioned at the below of the object lens (1-1) of microscope (1), and ultraviolet source is to sample section (3) irradiation.
2. anti-UV layer thickness device for fast detecting according to claim 1, it is characterized in that: described ultraviolet source comprises ultraviolet lamp tube (2), sample section (3) is placed on the ultraviolet lamp tube (2).
3. anti-UV layer thickness device for fast detecting according to claim 1 is characterized in that: described ultraviolet source is positioned at the side top of sample section (3).
4. anti-UV layer thickness device for fast detecting according to claim 3 is characterized in that: described ultraviolet source comprises the LED lamp pearl (2 ') that sends out ultraviolet light.
5. anti-UV layer thickness device for fast detecting according to claim 4, it is characterized in that: support (5) is housed on the described microscope (1), be fixed with battery case (6) on the support (5), LED lamp pearl (2 ') is fixed on battery case (6) end, gauge tap (7) also is housed on the battery case (6), be placed with battery (8) in the battery case (6), LED lamp pearl (2 '), battery (8) and gauge tap (7) are connected in series.
6. anti-UV layer thickness device for fast detecting according to claim 1 is characterized in that: eyepiece (1-2) top of described microscope (1) is provided with CCD video capture device (9) and the video acquisition control card (10) that is connected with computing machine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102749064A CN101957181A (en) | 2010-09-08 | 2010-09-08 | Device for rapidly detecting thickness of anti-UV layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102749064A CN101957181A (en) | 2010-09-08 | 2010-09-08 | Device for rapidly detecting thickness of anti-UV layer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101957181A true CN101957181A (en) | 2011-01-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010102749064A Pending CN101957181A (en) | 2010-09-08 | 2010-09-08 | Device for rapidly detecting thickness of anti-UV layer |
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| CN (1) | CN101957181A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104006753A (en) * | 2014-05-04 | 2014-08-27 | 辽宁省产品质量监督检验院 | Core material thickness tester for composite waterproof roll |
| CN109106326A (en) * | 2018-08-20 | 2019-01-01 | 广西奥顺仪器有限公司 | A kind of fluorescent apparatus for surgical operation microscope |
| CN112437867A (en) * | 2018-07-19 | 2021-03-02 | 卡尔蔡司显微镜有限责任公司 | Method for determining the thickness and refractive index of a layer |
Citations (7)
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| CN1071004A (en) * | 1992-09-29 | 1993-04-14 | 清华大学 | Super thin transparent medium membrane thickness measured method |
| EP0899541A2 (en) * | 1997-08-29 | 1999-03-03 | Becton, Dickinson and Company | Apparatus for determining the thickness of an optical sample |
| CN1106935C (en) * | 1996-11-04 | 2003-04-30 | 伊斯曼化学公司 | UV stabilized multi-layer structures with detectable UV protective layers and method of detection |
| US20030193672A1 (en) * | 2002-03-26 | 2003-10-16 | Hiroyuki Okada | Film thickness measuring method and measuring apparatus for organic thin film for use in organic electroluminesce device |
| US6962670B1 (en) * | 2000-08-16 | 2005-11-08 | Eastman Chemical Company | Determination of layer thickness or non-uniformity of layer thickness based on fluorophore additives |
| US7391509B1 (en) * | 2006-02-02 | 2008-06-24 | Thermo Electron Scientific Instruments Llc | Devices and methods for multi-mode analytical microscopy, in particular for UV fluorescence and Raman analysis of samples |
| CN201787925U (en) * | 2010-09-08 | 2011-04-06 | 常州丰盛光电科技股份有限公司 | Rapid detecting device for thickness of anti-ultraviolet layer |
-
2010
- 2010-09-08 CN CN2010102749064A patent/CN101957181A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1071004A (en) * | 1992-09-29 | 1993-04-14 | 清华大学 | Super thin transparent medium membrane thickness measured method |
| CN1106935C (en) * | 1996-11-04 | 2003-04-30 | 伊斯曼化学公司 | UV stabilized multi-layer structures with detectable UV protective layers and method of detection |
| EP0899541A2 (en) * | 1997-08-29 | 1999-03-03 | Becton, Dickinson and Company | Apparatus for determining the thickness of an optical sample |
| US6962670B1 (en) * | 2000-08-16 | 2005-11-08 | Eastman Chemical Company | Determination of layer thickness or non-uniformity of layer thickness based on fluorophore additives |
| US20030193672A1 (en) * | 2002-03-26 | 2003-10-16 | Hiroyuki Okada | Film thickness measuring method and measuring apparatus for organic thin film for use in organic electroluminesce device |
| US7391509B1 (en) * | 2006-02-02 | 2008-06-24 | Thermo Electron Scientific Instruments Llc | Devices and methods for multi-mode analytical microscopy, in particular for UV fluorescence and Raman analysis of samples |
| CN201787925U (en) * | 2010-09-08 | 2011-04-06 | 常州丰盛光电科技股份有限公司 | Rapid detecting device for thickness of anti-ultraviolet layer |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104006753A (en) * | 2014-05-04 | 2014-08-27 | 辽宁省产品质量监督检验院 | Core material thickness tester for composite waterproof roll |
| CN104006753B (en) * | 2014-05-04 | 2016-05-18 | 辽宁省产品质量监督检验院 | A kind of composite of water-proof coiled material core thickness tester |
| CN112437867A (en) * | 2018-07-19 | 2021-03-02 | 卡尔蔡司显微镜有限责任公司 | Method for determining the thickness and refractive index of a layer |
| US11371831B2 (en) | 2018-07-19 | 2022-06-28 | Carl Zeiss Microscopy Gmbh | Method for determining the thickness and refractive index of a layer using a shape feature during analysis |
| CN109106326A (en) * | 2018-08-20 | 2019-01-01 | 广西奥顺仪器有限公司 | A kind of fluorescent apparatus for surgical operation microscope |
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Application publication date: 20110126 |