CN102171783B - 驱动质谱仪离子阱或滤质器 - Google Patents

驱动质谱仪离子阱或滤质器 Download PDF

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CN102171783B
CN102171783B CN200980129341.6A CN200980129341A CN102171783B CN 102171783 B CN102171783 B CN 102171783B CN 200980129341 A CN200980129341 A CN 200980129341A CN 102171783 B CN102171783 B CN 102171783B
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ion trap
frequency
circuit
signal
gain level
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CN102171783A (zh
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戴维·拉弗蒂
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1st Detect Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/424Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Abstract

用于驱动质谱仪的离子阱或滤质器的射频(RF)驱动系统及方法,具有耦接到RF增益级的可编程RF频率源。RF增益级是变压器,其耦接到由离子阱或滤质器形成的储能电路。使用感测电路和电源电路测量驱动离子阱或滤质器的RF增益级的功率。通过用于调整RF频率源的电源电路生成反馈值。RF频率源的频率被调整直到RF增益级的功率处于最低水平。

Description

驱动质谱仪离子阱或滤质器
相关申请的交叉引用
本申请要求2008年5月27日提交的、序号为61/056,362的美国临时申请的优先权,通过引用的方式将其结合于此。本申请是2008年12月8日提交的、序号为的美国专利申请的部分继续。
技术领域
本发明涉及离子阱(ion trap)、离子阱质谱仪(ion trap massspectrometers),并且更加具体来说,涉及用于驱动诸如线型四极(linearquadrupole)的质谱仪离子阱或滤质器(mass filter)的射频系统。
发明内容
用于驱动质谱仪离子阱的射频(RF)系统具有产生RF信号的频率可编程RF发生器。RF增益级接收RF信号并生成经放大的RF信号。感测电路生成与传递给RF增益级的供电电流成比例的感测信号。变压器具有耦接到RF增益级的输出的初级绕组(primary)和被耦接以与质谱仪离子阱的电容一起形成储能电路(tank circuit)的次级绕组(secondary)。电源电路(powercircuitry)使用感测信号以确定RF增益级的功耗,以便调整RF发生器的频率,以使得提供给RF增益级的功率(power)被降低。
一旦设置了RF发生器的频率,当可变条件使得变压器次级绕组和离子阱的谐振频率漂移(drift)时,可以利用功率监视来连续地调整频率,该频率作为。因为需要低得多的功率来驱动质谱仪离子阱或滤质器(诸如线型四极),所以质谱仪可以在大小和成本上降低,由此增加潜在应用的数目。
在附图以及下面的说明中阐述了本发明的一个或多个实施例的细节。本发明的其他特征、目标和优点将从描述和附图以及从权利要求中变得清楚。
附图说明
图1示出质谱仪系统的系统方框图;
图2示出用于质谱仪系统的RF捕获和喷射电路(trapping and ejectingcircuitry);
图3示出离子阱;
图4示出用于改变离子阱的性能的电路;
图5A示出用于生成反馈信号以控制RF信号源的电路;
图5B示出配置频率控制的RF信号源的电路;
图6示出用于图2的RF系统的频率跟踪的流程图;
图7示出用于确定图2的RF系统的谐振频率的流程图;
图8示出根据本发明的实施例的流程图;和
图9示出提供给离子阱的频率对功率的示范曲线图(plot)。
具体实施方式
在本发明的实施例中,离子阱执行质谱化学分析。离子阱使用由一个驱动信号或多个驱动信号生成的动态电场从测量样本中动态地捕获离子。通过改变捕获离子的射频(RF)电场的特征(例如,振幅、频率等等),相应于离子的质量-电荷比(质量(m)/电荷(z))选择性地喷射出它们。
在本发明的实施例中,离子阱动态地捕获离子阱内的四极场(quadrupolefield)中的离子。这个场是通过相对于端盖电压(end cap voltage)(或信号)的、从RF源施加到中心电极的电信号创建的(created)。在最简单的形式中,具有恒定RF频率的信号被施加到中心电极,而两个端盖电极被维持在静态零伏特。中心电极信号的振幅线性地倾斜向上,以便选择性地使离子阱内保留的不同质量的离子不稳定(destabilize)。这种振幅喷射(amplitude ejection)结构可能不会得到最佳性能或解决方案,并且在实际中可能导致输出能谱中的双峰。这种振幅喷射方法可以通过在端盖之间区别地施加第二信号得以改进。该第二信号导致偶极轴向激发(dipole axial excitation),其导致当阱内离子的振荡的长期频率与端盖激发频率匹配时,离子从离子阱中谐振喷射。
离子阱或滤质器具有看起来像几乎是纯电容的等效电路。驱动离子阱所需的电压的振幅可以很高(例如,1500伏特),并且通常要求使用耦合以产生高电压的变压器。变压器次级绕组的电感和离子阱的电容形成并联储能电路(parallel tank circuit)。在谐振之外的频率驱动该电路可能产生不必要的损失,并且可能增加电路的成本和大小。特别是,这将妨碍使质谱仪小型化以提高其使用和市场性的努力。
此外,在谐振处驱动电路具有其它好处:诸如产生可能的最清洁、最低失真以及最低噪声的信号。储能电路(tank circuit)使除了谐振频率之外的所有频率的信号衰减;以这种方法,储能电路作为它自己的窄带通滤波器,其中仅仅使特定频率谐振。频偏噪声(off frequency noise)和谐频(harmonics)被滤出。而且,在谐振处,来自信号驱动放大器的功率量非常低。需要的功率仅仅是在变压器无效率(inefficiency)中损失的功率或电阻的损失的功率。电路功率在较小物理面积的储能电路中、在电感元件和电容元件之间来回传递。因为几乎没有功率是从外部放大器驱动的,所以作为电磁干扰(EMI)被放射出(radiated)功率会更少。
因此,对于RF系统来说,保证离子阱是通过最小化组件大小、降低成本和功率、提供超高质量的信号并且导致减少的放射EMI的电路来驱动可能是有利的。这在便携式质谱仪应用中会是非常重要的。
图1示出在质谱仪系统100中的元件的框图。样本101可以通过渗透膜管道102被引入具有低压105(例如真空)的腔112。结果,浓缩的样本气体103被容许通过薄膜管道102并且使其前进到离子阱104。电子113以公知方式由源111生成,并且由加速电势110导向离子阱104。电子113在离子阱104中将样本气体103离子化。RF捕获和喷射电路109被耦接到离子阱104,以便在离子阱104内建立交流电场,以便首先捕获、然后以与离子质量成比例的方式喷射离子。附加的修改电路108可以用于增强离子阱104的操作。离子探测器106寄存以相应于特定离子质量的不同时间间隔发射的离子的数目。这些离子数目被数字化以供分析并在显示器107上显示为光谱。
渗透膜102可以包括嵌入式加热装置(未示出),用以保证气体样本处于均匀温度。另外,提供电子113的装置111可以包括静电透镜,其可操作用于聚焦进入离子阱104的电子113。静电透镜的焦点可以在端盖的孔(aperture)的前面(例如,参见图3)。静电透镜操作用于提供离子阱104中更好的电子分布而且用于提高进入阱104的电子的百分比。电子113的源111可以被配置为以碳纳米管作为使电子能够以比传统方法更低的功率生成的电子发射器。还应当注意,本领域技术人员将认识到,存在包括离子阱(ion trap)的质谱仪100的许多配置,所述配置可以具有改变的(1)将样本101引入到质谱仪100的方法,(2)离子化方法111,以及(3)探测器106,它们均在本发明的实施例的范围之内。
在本发明的实施例中,离子阱104被配置为具有这样的设计:其生成对电路109的最低电容负载。离子阱104可以将其内表面粗糙度最小化以改善其特性。
图2示出驱动离子阱104的RF捕获和喷射电路109的电路和框图。示范性离子阱104包括中心电极219以及端盖218和220。离子阱104可以像在这里描述的那样,或者任何其他可以以像在这里描述的方式操作的等效离子阱设计。寄生电容213和214以虚线示出。端盖218和220可以耦接到地电势并且电容213和214代表对电路109的电容负载。
RF源201生成正弦曲线的RF信号并且被示为具有耦接到(多条)控制线221的输入。控制线221的值可操作为向上或者向下调整RF信号的频率。在实施例中,可以响应于最优化参数,人工地调整RF源201的频率。差动放大器204(例如,运算放大器)具有正输入和负输入以及输出。使用电阻器205和206的负反馈可以用于将放大级的闭环增益设置为电阻器值之比。RF信号用滤波器203进行滤波(例如,低通或带通)并且被施加到放大器204的正输入。放大器204使用电容器209以阻挡放大器输出偏移电压,并且使用电阻器210来改善放大器稳定性。经滤波的放大器204的输出被施加到变压器211的输入。因为可能需要高电压(例如,1500伏特)来驱动离子阱104,所以变压器211可以是升压(step up)变压器。这允许放大级的初级侧组件具有相对较低的电压。
放大器204可以由双极电源(bipolar power supply,PS)电压216和217供电。电流感测电路208可以用于监视来自PS电压216的电流。功率控制电路207可以配置为监视驱动离子阱104所耗散的功率,以便经由控制线221控制RF源201。根据RF源201的特性,控制电路207可以是模拟的或者数字的。在任一情况下,电路109操作为在将由PS电压216和217提供的功率最小化的频率处驱动离子阱104。
可以调整RF源201的频率以最小化驱动离子阱104所需的功率。最小化驱动功率的RF源201的最终频率是使包括变压器211的次级绕组处的电感以及离子阱104的电容的电路谐振的频率。RF源201的频率可以设置在期望值处,并且可变组件(例如,可变电容器212)用于改变次级绕组电路(secondarycircuitry)以使其与所设置的RF源201的期望频率谐振。可以设置RF源201的中心频率,并且次级绕组电路额被调整以调谐(tune)变压器211的次级绕组。然后具有控制221的反馈可以用于调整谐振频率,以动态地最小化驱动离子阱104所需的功率。
电路207可以采用这样的可编程处理器:其首先设置RF源201的频率以最小化到离子阱104的功率。然后,在离子被捕获的时间段之后,来自变压器211的次级绕组的振幅反馈可以用于调整RF源201的振幅或放大级的增益,从而使得驱动离子阱104的次级信号的振幅为以操作来喷射离子的方式而调幅的振幅。
电路207可以采用这样的可编程处理器:其首先设置RF源201的频率以最小化到离子阱104的功率。然后,在离子被捕获的时间段之后,RF源201的频率的被改变,使得驱动离子阱104的次级信号的频率为以操作来喷射离子的方式而调频的频率。
在一个实施例中,电路109可以采用电容分压器用于将变压器211的输出电压的样本反馈到放大器204的负输入。该负反馈可以用于在驱动离子阱104时稳定电压输出变压器211。
图3示出根据本发明的实施例的离子阱104的电极的横截面和细节。第一端盖218具有入口孔(inlet aperture)304,中心电极219具有孔306并且第二端盖220具有出口孔305。端盖218和219以及电极219可以具有环形配置或者根据本发明的实施例足以捕获和喷射离子的其他等效形状。典型地,第一离子阱端盖218可以耦接到地或零伏特,然而,其他实施例可以使用零伏特之外的电压。例如,第一端盖218可以连接到可变DC电压或者其他信号。离子阱中心电极219由电路109驱动(参见图1和2)。第二离子阱端盖220可以直接连接到零伏特或通过电路元件108连接到零伏特(参见图1),或者连接到另外的信号源。薄型绝缘体(Thin insulators)(未示出)可以位于间隔(spaces)309中以隔离第一端盖218、第二端盖220和中心电极219,从而形成电容213和214(以虚线示出)。在美国专利No.3,065,640中描述了典型离子阱的操作和配置,并且典型离子阱的操作和配置后来为本领域的许多作者所涉及,包括March(March,R.E.和Todd,J.F.J,“Practical Aspects ofIon Trap Mass Spectrometry”,1995,CRC Press)提供的说明,以上二者均通过引用的方式结合于此。
图4示出由电路109(参见图1和图2)有源驱动的离子阱104的示意框图400。端盖218具有用于收集样本气体的入口孔304,中心电极219具有用于保留所生成的离子的孔306,并且第二端盖220具有出口孔305。端盖218可以耦接到地或零伏特,然而,其他实施例可以使用除了零伏特或者另外的信号源之外的配置。中心电极219由电路109驱动。端盖220可以通过修改电路108(在本实施例中,包括电容器402和电阻器403的并联组合)连接到零伏特。薄型绝缘体(未示出)可以位于间隔309中以隔离第一端盖218、第二端盖220和中心电极219。
图4中示出的实施例400具有自然存在于中心电极219和端盖220之间的本征电容214(以虚线标出)。电容214与电容器402的电容串联,从而形成电容分压器,由此在端盖220处施加(impress)从来自电路109的信号得出的电势。当电路109在中心电极219上施加变化的电压时,具有较小振幅的、变化的电压通过电容分压器的动作被施加在端盖220上。自然地,在中心电极219和端盖218之间存在相应的本征电容213(以虚线标出)。分立的电阻器403可以添加在端盖220和零伏特之间。电阻器403提供电通路(path),其用于防止端盖220发展出能够引起电压漂移或者过充电堆积(excess chargebuild-up)的浮动DC电势。电阻器403的值在1到10兆欧姆(MΩ)的范围内调整大小,以保证在电路109的工作频率处电阻器403的阻抗比添加的电容器402的阻抗大得多。如果电阻器403的电阻值没有比CA 402的阻抗大得多,那么在中心电极219处的信号与通过电容分压器施加在第二端盖220上的信号之间将存在相移。而且,如果电阻器403的值太低,那么施加在端盖220上的信号的振幅将根据感兴趣的频率范围中频率的函数而变化。没有电阻器403,电容分压器(CS214和CA402)基本上与频率无关。添加的电容器402的值可以是可变的,因此针对给定系统特性,其可以被调整以具有最优化的值。
图5A示出用于在控制线221(参见图2)上产生适合于控制可编程RF信号源201的反馈信号的示范性电路。请注意,控制线221上的信号可以是模拟电压或多个模拟电压,或者是由一条或多条线形成的数字通信方法。放大器204由电源电压216和217供电。在本实施例中,电流感测电阻器501与电压216串联耦接,并且其电压降耦接到差动放大器502。通过在放大器的双极电源(bipolar supplies)中的仅仅一个上监视流向(draw to)放大器204的电流,能够监视功率而无需高速整流或者类似的手段,如果取而代之是监视放大器204的输出电流,则需要这样的高速整流或者类似的手段。差分放大器502生成与电源电流成比例的输出电压到离子阱104,该电源电流为电路109供电。模数(A/D)转换器503将该电压转换为数字值。数字控制器504接收数字值并且响应于用于电路109的总功率在控制线221上输出数字控制信号到离子阱104。数字控制器504可以是从输入505接收编程的存储的程序控制器。然后,可以存储程序步骤,其响应于接收到的相应于电路109的功率的数字值,指导(direct)针对数字控制信号而输出的值。以这样的方式,程序可以被写入并存储,其指导用于离子阱104的电路109怎样被初始化以及自动地调整以便以最低可能功率电平(power level)驱动离子阱104。
图5B示出用于配置可编程RF源201(参见图2)的示范性电路的框图。使用相位/频率电路510将参考频率514与可编程分频器513的输出相比较。通过可编程因子N,分频器513对从源201产生输出515的压控振荡器(VCO)512的输出进行分频。在该结构中,RF源频率将是参考频率514的N倍。因为数字N是可编程的,所以在控制线221上的数字值可以用于控制输出515的频率。存在可以用于电路109的实施例中的、能够用于针对RF源201示出的示范性电路的许多变形。也可以在单个集成电路中获得RF源201的功能。
图6示出在功率控制电路207中执行以及用于图2的电路109的可选的频率跟踪步骤804的步骤的流程图。在步骤601中,从功率控制电路207输出值,以便根据图7中的步骤将RF源201设置到确定的谐振频率Fn。在步骤602中,加号用来指示振荡器201频率的增大,减号用来指示振荡器201频率的降低。初始的符号值是任意选择的或者基于谐振频率漂移的预期方向。在步骤603中,振荡器201的频率在当前符号所指示的方向增加预定量,同时功率控制电路207监视到离子阱104的功率Ps。在步骤604中,进行测试以确定功率Ps是否是增加的。如果测试的结果是“是”,则表示频率变化方向的符号切换到交替的(alternate)符号。然后,由分支返回到步骤603。如果在步骤604中测试的结果是“否”,则当前符号保持现状并且由分支返回到步骤603。以这样的方式,振荡器201的频率来回振动(dither back and forth),以便将到离子阱104的功率保持在最小值。
图7示出在搜索谐振工作频率时在功率控制电路207中执行以及在步骤802中使用的步骤的流程图。在步骤701中,RF源201被设置为可编程频率范围内的低可编程频率。频率范围基于离子阱或者滤质器的成功的工作频率范围确定,并且被最小化以减少搜索时间。该信号的振幅保持恒定并且被设置得足够低以免引起在显著远离谐振频率的频率处的过度的功率抽取(powerdraw)或者发热。在步骤702中,粗略(coarse)值被输出以便以增量渐增地扫描振荡器的频率。该值被赋予可变指示符Fi。在步骤703中,监视到电路109的电流以确定驱动离子阱104的功率Ps。在步骤704中,执行测试以便确定到离子阱104的功率是否被提高了大于预定量。如果在步骤704中测试的结果是“否”,则由分支返回到步骤702。如果在步骤704中测试的结果是“是”,则由分支到步骤705,其中当前Fi被保存,并且频率在频率范围Fi到Fi-2内以精细(fine)增量降低。在步骤705中,调整振荡器的频率的精细值被输出,以便在范围Fi(最后的粗略频率步骤)到Fi-2内降低振荡器的频率,该范围包含了(encompass)最后三个输出的粗略频率步骤。在步骤706中,谐振频率Fn被选为与在频率范围Fi到Fi-2内扫描时发现的最小功率相应的谐振频率。然后由分支返回步骤803(参见图8)。
放大器204具有提供功率到放大器204的两个电源输入,一个用于正电压216,一个用于负电压217。小电阻器(分流电阻器(current shunt resistor))可以沿着(in line with)正电源管脚216(见图2中的电路208)放置。流入该电源输入的任何电流都将流经该电阻器。因为以欧姆为单位的该电阻器的电阻是已知的,所以通过测量该电阻器两端的电压降可以知道流经该电阻器的电流(V=I*R)。当该电阻器两端的电压降最低时,流经电源管脚的电流也处于最低,因此放大器204使用的功率处于最低。在电路的谐振频率处,输入到放大器204的电流显著下降。系统在操作之前扫过(sweep through)系统的整个频率范围,以便找出该谐振频率(通过随着频率被扫描来监视分流电阻器两端的电压)。分流电阻器两端的电压可以通过分流放大器组件放大并且馈送到模数转换器。模数转换器的数字输出可以馈送到微处理元件,诸如在功率控制电路207之内。系统监视流入双极电源中的一个的电流,而非直接测量输出电压。这提供了真正谐振频率的更准确的值,并且消除了整流信号、使用峰值检波器的需要,或者执行RMS变换以确定振幅的需要。
图8示出在操作图2的电路109时在功率控制电路207中执行的一般步骤的流程图。在步骤801中,质谱仪100通过重启(reset)被通电。在步骤802中,开始搜索模式,其中RF源201的频率被调整以确定具有用于驱动示范性离子阱104的最小功率的谐振频率(例如,见图7)。在步骤803中,质谱仪系统100用所确定的谐振频率操作。在步骤804中,在系统操作期间开始可选的频率跟踪,以便响应于离子阱的谐振点以及关联电路中的变化,将工作频率保持在用于驱动离子阱104的最小功率(例如,见图6)。
图9示出根据本发明的实施例的用于驱动离子阱104的频率对功率的示范曲线图。与谐振频率Fn一起示出起始扫描频率Fi。Fn与放大器204的最小功耗点一致。当频率持续升高到超过Fn后、连续的功率下降是由于放大器204的带宽限制造成的。
这里所描述的实施例操作为降低质谱仪的功率和大小,以使得质谱仪系统可以变为其他系统中的组件,这些系统先前因为传统单元的成本和大小而无法使用这样的单元。例如,小质谱仪(mini-mass spectrometer)100可以放置在危险地点用于分析气体,并远程地向人员发回呈现危险的状况报告。使用这里的实施例的小质谱仪100可以放置在航空运输中的战略位置处,用于测试环境中的危险气体,这可能表示故障或者甚至是恐怖威胁。本发明已经预期了缩减实现功能性质谱仪的大小以及所需的功率的价值,以使得其操作可以用于通常不会考虑使用此种设备的地方和应用中。
已经描述了本发明许多实施例。然而,应当理解,可以进行各种修改而不脱离本发明的精神和范围。

Claims (15)

1.一种用于驱动质谱仪离子阱或滤质器的系统,包括∶
频率和振幅可编程射频发生器,其生成射频信号;
射频增益级,接收射频信号及生成经放大的射频信号;
感测电路,其生成与传递给射频增益级的电源电流成正比的感测信号;
变压器,其具有耦接到射频增益级的输出的初级绕组以及被耦接以与质谱仪离子阱或滤质器的电容一起形成谐振电路的次级绕组;以及
功率控制电路,其接收所述感测信号以及生成反馈控制信号到所述射频发生器,该反馈控制信号调整所述射频发生器的频率以降低所述射频增益级所需的电源电流。
2.如权利要求1所述的系统,其中,所述感测电路包括∶
电流感测电阻器,其将电源输入串联到所述射频增益级;以及
差分放大器,其具有耦接到所述电阻器的一个端子的正输入以及耦接到所述电阻器的第二端子的负输入,其中,所述差分放大器生成与提供给所述射频增益级的功率成正比的输出信号。
3.如权利要求2所述的系统,其中,所述可编程射频发生器包括具有可编程分频器电路的锁相环PLL电路。
4.如权利要求3所述的系统,其中,所述可编程分频器电路是数字可编程的。
5.如权利要求4所述的系统,所述功率控制电路还包括模数转换器,用于将所述差分放大器的输出电压转换为数字反馈信号。
6.如权利要求1所述的系统,其中,变压器是具有次级电感的升压变压器,该次级电感与所述质谱仪离子阱或滤质器的电容一起形成谐振电路。
7.如权利要求1所述的系统,其中,所述射频发生器耦接到具有滤波电路的射频增益级。
8.如权利要求1所述的系统,其中,所述射频增益级的输出包括滤波电路。
9.如权利要求8所述的系统,其中,所述滤波电路包括串联电容。
10.如权利要求8所述的系统,其中所述滤波电路包括串联电阻器。
11.如权利要求1所述的系统,其中所述射频增益级的增益通过阻抗之比进行设置。
12.如权利要求1所述的系统,还包括与所述质谱仪离子阱或滤质器并联的可变电容器,被配置为调节所述质谱仪离子阱或滤质器到特定工作频率范围。
13.如权利要求1所述的系统,其中所述射频增益级还包括运算放大器,其具有双极电源输入并且被配置为生成放大的射频信号。
14.一种操作质谱仪离子阱或滤质器的方法,该方法包括∶
通过信号驱动所述质谱仪离子阱或滤质器,其中驱动电路包括经由变压器耦接到所述质谱仪离子阱或滤质器的射频增益级,并且其中,射频发生器被耦接到所述射频增益级的输入;
监视在驱动所述质谱仪离子阱或滤质器的同时提供给所述射频增益级的功率电平,并且生成与所述功率电平成正比的反馈信号;以及
耦接所述反馈信号以调整输出的所述射频发生器的频率,以便当驱动所述质谱仪离子阱或滤质器时降低所述射频增益级所需的功率电平。
15.如权利要求14所述的方法,其中所述射频增益级还包括运算放大器,其具有耦接到电流旁路电阻器的双极电源输入,并且其中监视提供给所述射频增益级的功率电平包括监视所述电流旁路电阻器两端的电压。
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Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1400850B1 (it) * 2009-07-08 2013-07-02 Varian Spa Apparecchiatura di analisi gc-ms.
US8648293B2 (en) 2009-07-08 2014-02-11 Agilent Technologies, Inc. Calibration of mass spectrometry systems
DE102010004649B4 (de) * 2010-01-13 2013-11-07 Inprocess Instruments Gmbh Hochfrequenz (HF)-Spannungs-Versorgungssystem und Verfahren zur Versorgung eines Mulipolmassenspektrometers mit der zur Erzeugung eines Multipolfeldes verwendeten HF-Wechselspannung
US8455814B2 (en) * 2010-05-11 2013-06-04 Agilent Technologies, Inc. Ion guides and collision cells
WO2012124020A1 (ja) * 2011-03-11 2012-09-20 株式会社島津製作所 質量分析装置
CN102324374B (zh) * 2011-09-28 2013-09-11 上海大学 一种用于质谱仪的射频电源
KR101383264B1 (ko) * 2012-12-11 2014-04-08 한국기초과학지원연구원 이온 트랩 질량분석기
US8525111B1 (en) 2012-12-31 2013-09-03 908 Devices Inc. High pressure mass spectrometry systems and methods
US9093253B2 (en) 2012-12-31 2015-07-28 908 Devices Inc. High pressure mass spectrometry systems and methods
US9099286B2 (en) * 2012-12-31 2015-08-04 908 Devices Inc. Compact mass spectrometer
DE102013201499A1 (de) * 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
US8975573B2 (en) 2013-03-11 2015-03-10 1St Detect Corporation Systems and methods for calibrating mass spectrometers
US8610055B1 (en) * 2013-03-11 2013-12-17 1St Detect Corporation Mass spectrometer ion trap having asymmetric end cap apertures
WO2014149847A2 (en) * 2013-03-15 2014-09-25 Riaz Abrar Ionization within ion trap using photoionization and electron ionization
US8878127B2 (en) 2013-03-15 2014-11-04 The University Of North Carolina Of Chapel Hill Miniature charged particle trap with elongated trapping region for mass spectrometry
WO2015040382A1 (en) 2013-09-20 2015-03-26 Micromass Uk Limited High frequency voltage supply control method for multipole or monopole analysers
EP3094958B1 (en) 2014-01-14 2023-07-12 908 Devices Inc. Sample collection in compact mass spectrometry systems
US8921774B1 (en) 2014-05-02 2014-12-30 908 Devices Inc. High pressure mass spectrometry systems and methods
US8816272B1 (en) 2014-05-02 2014-08-26 908 Devices Inc. High pressure mass spectrometry systems and methods
US10262780B2 (en) 2014-05-12 2019-04-16 Flir Detection, Inc. Analytical instrument inductors and methods for manufacturing same
US9711341B2 (en) 2014-06-10 2017-07-18 The University Of North Carolina At Chapel Hill Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods
KR20160031134A (ko) 2014-09-11 2016-03-22 한국기초과학지원연구원 다중 주파수 알에프 증폭기, 그것을 포함한 질량 분석기, 및 질량 분석기의 질량 분석 방법
US9991105B2 (en) * 2015-12-23 2018-06-05 University Of Maryland, College Park Active stabilization of ion trap radiofrequency potentials
US11004660B2 (en) * 2018-11-30 2021-05-11 Eagle Harbor Technologies, Inc. Variable output impedance RF generator
US10242857B2 (en) 2017-08-31 2019-03-26 The University Of North Carolina At Chapel Hill Ion traps with Y-directional ion manipulation for mass spectrometry and related mass spectrometry systems and methods
AU2019220546A1 (en) 2018-02-13 2020-08-27 Biomerieux, Inc. Methods for confirming charged-particle generation in an instrument, and related instruments
CN108987241B (zh) * 2018-08-09 2024-01-30 金华职业技术学院 一种分子光反应测试装置
CN109300766B (zh) * 2018-08-09 2024-03-29 金华职业技术学院 一种分子光反应测试方法
GB201902884D0 (en) * 2019-03-04 2019-04-17 Micromass Ltd Transformer for applying an ac voltage to electrodes
US11336290B2 (en) 2020-03-30 2022-05-17 Thermo Finnigan Llc Amplifier amplitude digital control for a mass spectrometer
US11270874B2 (en) 2020-03-30 2022-03-08 Thermo Finnigan Llc Amplifier amplitude digital control for a mass spectrometer
CN113725062B (zh) * 2021-09-07 2023-07-07 国开启科量子技术(北京)有限公司 离子阱射频装置
CN113837389B (zh) * 2021-09-27 2023-07-11 国开启科量子技术(北京)有限公司 离子阱驱动装置
CN114005723B (zh) * 2021-11-05 2023-07-21 国开启科量子技术(北京)有限公司 噪声稳定的离子阱驱动装置及系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB676238A (en) * 1948-10-29 1952-07-23 British Thomson Houston Co Ltd Improvements relating to phase-control circuits
US4703190A (en) * 1985-06-25 1987-10-27 Anelva Corporation Power supply system for a quadrupole mass spectrometer
CN2589978Y (zh) * 2002-12-27 2003-12-03 华南理工大学 高分辩率四极质谱计

Family Cites Families (375)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2373737A (en) 1943-02-22 1945-04-17 Rca Corp Amplitude modulation
US2531050A (en) 1946-11-30 1950-11-21 Sylvania Electric Prod Ion trap
US2555850A (en) 1948-01-28 1951-06-05 Nicholas D Glyptis Ion trap
US2575067A (en) 1948-05-13 1951-11-13 Clarostat Mfg Co Inc Ion trap
US2507721A (en) 1948-12-21 1950-05-16 Rca Corp Amplitude modulation
US2539156A (en) * 1949-01-19 1951-01-23 Tele Tone Radio Corp Ion trap magnet
US2604533A (en) 1949-03-08 1952-07-22 Rca Corp Amplitude modulation
US2553792A (en) 1949-10-01 1951-05-22 Indiana Steel Products Co Ion trap and centering magnet assembly
US2549602A (en) 1949-10-01 1951-04-17 Indiana Steel Products Co Applicator for ion traps
US2580355A (en) 1949-10-08 1951-12-25 Du Mont Allen B Lab Inc Ion trap magnet
BE502947A (zh) 1950-05-02
US2663815A (en) 1950-09-26 1953-12-22 Clarostat Mfg Co Inc Ion trap
US2582402A (en) * 1950-09-29 1952-01-15 Rauland Corp Ion trap type electron gun
US2642546A (en) 1950-10-10 1953-06-16 Louis J Patla Ion trap
US2661436A (en) 1951-11-07 1953-12-01 Rca Corp Ion trap gun
US2756392A (en) 1952-01-11 1956-07-24 Rca Corp Amplitude modulation
DE1074163B (de) * 1953-05-30 1960-01-28 Standard Elektrik Lorenz Aktiengesellschaft, Stuttgart-Zuffenhausen Kathodenstrahlröhre mit einem Strahlerzeugungssystem mit Ionenfalle
US2974253A (en) * 1953-10-05 1961-03-07 Varian Associates Electron discharge apparatus
IT528250A (zh) 1953-12-24
US2810091A (en) 1954-03-31 1957-10-15 Rca Corp Ion trap
US2903612A (en) 1954-09-16 1959-09-08 Rca Corp Positive ion trap gun
US3114877A (en) 1956-10-30 1963-12-17 Gen Electric Particle detector having improved unipolar charging structure
US3065640A (en) 1959-08-27 1962-11-27 Thompson Ramo Wooldridge Inc Containment device
US3188472A (en) 1961-07-12 1965-06-08 Jr Elden C Whipple Method and apparatus for determining satellite orientation utilizing spatial energy sources
US3307332A (en) * 1964-12-11 1967-03-07 Du Pont Electrostatic gas filter
US3526583A (en) 1967-03-24 1970-09-01 Eastman Kodak Co Treatment for increasing the hydrophilicity of materials
US3631280A (en) 1969-10-06 1971-12-28 Varian Associates Ionic vacuum pump incorporating an ion trap
US4075533A (en) * 1976-09-07 1978-02-21 Tektronix, Inc. Electron beam forming structure utilizing an ion trap
DE3120196C2 (de) 1981-05-21 1985-02-14 Leybold-Heraeus GmbH, 5000 Köln Hochfrequenzgenerator für die Versorgung eines Massenspektrometers
JPS58190754A (ja) * 1982-04-30 1983-11-07 Shimadzu Corp 質量分析装置の質量数表示装置
US4499339A (en) * 1982-11-24 1985-02-12 Baptist Medical Center Of Oklahoma, Inc. Amplitude modulation apparatus and method
US4540884A (en) 1982-12-29 1985-09-10 Finnigan Corporation Method of mass analyzing a sample by use of a quadrupole ion trap
US4621213A (en) 1984-07-02 1986-11-04 Imatron, Inc. Electron gun
US4650999A (en) * 1984-10-22 1987-03-17 Finnigan Corporation Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap
NL8403537A (nl) 1984-11-21 1986-06-16 Philips Nv Kathodestraalbuis met ionenval.
JPS61177006A (ja) * 1985-01-31 1986-08-08 Sony Corp Am変調器
DE3650304T2 (de) 1985-05-24 1995-10-12 Finnigan Corp Betriebsverfahren für eine Ionenfalle.
US4686367A (en) 1985-09-06 1987-08-11 Finnigan Corporation Method of operating quadrupole ion trap chemical ionization mass spectrometry
DE3538407A1 (de) 1985-10-29 1987-04-30 Spectrospin Ag Ionen-zyklotron-resonanz-spektrometer
NL8600098A (nl) 1986-01-20 1987-08-17 Philips Nv Kathodestraalbuis met ionenval.
US5107109A (en) 1986-03-07 1992-04-21 Finnigan Corporation Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer
US4761545A (en) 1986-05-23 1988-08-02 The Ohio State University Research Foundation Tailored excitation for trapped ion mass spectrometry
US4749860A (en) 1986-06-05 1988-06-07 Finnigan Corporation Method of isolating a single mass in a quadrupole ion trap
US4755670A (en) 1986-10-01 1988-07-05 Finnigan Corporation Fourtier transform quadrupole mass spectrometer and method
US4867939A (en) 1987-04-03 1989-09-19 Deutch Bernhard I Process for preparing antihydrogen
DE3716874A1 (de) * 1987-05-20 1988-12-15 Philips Patentverwaltung Schaltungsanordnung mit einem verstaerker mit bipolaren transistoren
US4771172A (en) 1987-05-22 1988-09-13 Finnigan Corporation Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode
US4818869A (en) 1987-05-22 1989-04-04 Finnigan Corporation Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer
DE3733853A1 (de) 1987-10-07 1989-04-27 Spectrospin Ag Verfahren zum einbringen von ionen in die ionenfalle eines ionen-zyklotron-resonanz-spektrometers und zur durchfuehrung des verfahrens ausgebildetes ionen-zyklotron-resonanz-spektrometers
EP0321819B2 (de) 1987-12-23 2002-06-19 Bruker Daltonik GmbH Verfahren zur massenspektroskopischen Untersuchung eines Gasgemisches und Massenspektrometer zur Durchführung dieses Verfahrens
DE3821998A1 (de) * 1988-06-30 1990-01-04 Spectrospin Ag Icr-ionenfalle
US4931639A (en) 1988-09-01 1990-06-05 Cornell Research Foundation, Inc. Multiplication measurement of ion mass spectra
US4945234A (en) 1989-05-19 1990-07-31 Extrel Ftms, Inc. Method and apparatus for producing an arbitrary excitation spectrum for Fourier transform mass spectrometry
JP2873239B2 (ja) * 1989-08-10 1999-03-24 日本原子力研究所 四重極質量分析計
US5051582A (en) 1989-09-06 1991-09-24 The United States Of America As Represented By The Secretary Of The Air Force Method for the production of size, structure and composition of specific-cluster ions
US5118950A (en) 1989-12-29 1992-06-02 The United States Of America As Represented By The Secretary Of The Air Force Cluster ion synthesis and confinement in hybrid ion trap arrays
US4982088A (en) * 1990-02-02 1991-01-01 California Institute Of Technology Method and apparatus for highly sensitive spectroscopy of trapped ions
US5029277A (en) * 1990-02-28 1991-07-02 Motorola, Inc. Optically compensated bipolar transistor
US5055678A (en) 1990-03-02 1991-10-08 Finnigan Corporation Metal surfaces for sample analyzing and ionizing apparatus
JP2888258B2 (ja) * 1990-11-30 1999-05-10 東京エレクトロン株式会社 基板処理装置および基板処理方法
US5162650A (en) 1991-01-25 1992-11-10 Finnigan Corporation Method and apparatus for multi-stage particle separation with gas addition for a mass spectrometer
US5171991A (en) 1991-01-25 1992-12-15 Finnigan Corporation Quadrupole ion trap mass spectrometer having two axial modulation excitation input frequencies and method of parent and neutral loss scanning
US5075547A (en) 1991-01-25 1991-12-24 Finnigan Corporation Quadrupole ion trap mass spectrometer having two pulsed axial excitation input frequencies and method of parent and neutral loss scanning and selected reaction monitoring
US5436445A (en) 1991-02-28 1995-07-25 Teledyne Electronic Technologies Mass spectrometry method with two applied trapping fields having same spatial form
US5381007A (en) * 1991-02-28 1995-01-10 Teledyne Mec A Division Of Teledyne Industries, Inc. Mass spectrometry method with two applied trapping fields having same spatial form
US5196699A (en) * 1991-02-28 1993-03-23 Teledyne Mec Chemical ionization mass spectrometry method using notch filter
US5451782A (en) 1991-02-28 1995-09-19 Teledyne Et Mass spectometry method with applied signal having off-resonance frequency
US5105081A (en) 1991-02-28 1992-04-14 Teledyne Cme Mass spectrometry method and apparatus employing in-trap ion detection
US5274233A (en) 1991-02-28 1993-12-28 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5200613A (en) 1991-02-28 1993-04-06 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5187365A (en) * 1991-02-28 1993-02-16 Teledyne Mec Mass spectrometry method using time-varying filtered noise
US5256875A (en) 1992-05-14 1993-10-26 Teledyne Mec Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry
US5134286A (en) 1991-02-28 1992-07-28 Teledyne Cme Mass spectrometry method using notch filter
US5449905A (en) 1992-05-14 1995-09-12 Teledyne Et Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry
US5182451A (en) * 1991-04-30 1993-01-26 Finnigan Corporation Method of operating an ion trap mass spectrometer in a high resolution mode
US5248883A (en) * 1991-05-30 1993-09-28 International Business Machines Corporation Ion traps of mono- or multi-planar geometry and planar ion trap devices
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
DE4139037C2 (de) 1991-11-27 1995-07-27 Bruker Franzen Analytik Gmbh Verfahren zum Isolieren von Ionen einer auswählbaren Masse
US5206509A (en) 1991-12-11 1993-04-27 Martin Marietta Energy Systems, Inc. Universal collisional activation ion trap mass spectrometry
DE4142871C1 (zh) 1991-12-23 1993-05-19 Bruker - Franzen Analytik Gmbh, 2800 Bremen, De
DE4142870C2 (de) * 1991-12-23 1995-03-16 Bruker Franzen Analytik Gmbh Verfahren für phasenrichtiges Messen der Ionen aus Ionenfallen-Massenspektrometern
DE4142869C1 (zh) * 1991-12-23 1993-05-19 Bruker - Franzen Analytik Gmbh, 2800 Bremen, De
DE4202123C2 (de) 1992-01-27 1995-04-06 Bruker Franzen Analytik Gmbh Vorrichtung für die massenspektrometrische Untersuchung schneller organischer Ionen
US5272337A (en) 1992-04-08 1993-12-21 Martin Marietta Energy Systems, Inc. Sample introducing apparatus and sample modules for mass spectrometer
US5306910A (en) 1992-04-10 1994-04-26 Millipore Corporation Time modulated electrified spray apparatus and process
US5340983A (en) 1992-05-18 1994-08-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Method and apparatus for mass analysis using slow monochromatic electrons
US5248882A (en) 1992-05-28 1993-09-28 Extrel Ftms, Inc. Method and apparatus for providing tailored excitation as in Fourier transform mass spectrometry
US5302826A (en) 1992-05-29 1994-04-12 Varian Associates, Inc. Quadrupole trap improved technique for collisional induced disassociation for MS/MS processes
GB2267385B (en) * 1992-05-29 1995-12-13 Finnigan Corp Method of detecting the ions in an ion trap mass spectrometer
US5457315A (en) 1994-01-11 1995-10-10 Varian Associates, Inc. Method of selective ion trapping for quadrupole ion trap mass spectrometers
US5198665A (en) * 1992-05-29 1993-03-30 Varian Associates, Inc. Quadrupole trap improved technique for ion isolation
US5479012A (en) 1992-05-29 1995-12-26 Varian Associates, Inc. Method of space charge control in an ion trap mass spectrometer
US5352892A (en) 1992-05-29 1994-10-04 Cornell Research Foundation, Inc. Atmospheric pressure ion interface for a mass analyzer
US5521380A (en) 1992-05-29 1996-05-28 Wells; Gregory J. Frequency modulated selected ion species isolation in a quadrupole ion trap
US5448061A (en) 1992-05-29 1995-09-05 Varian Associates, Inc. Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling
US5527731A (en) 1992-11-13 1996-06-18 Hitachi, Ltd. Surface treating method and apparatus therefor
US5475227A (en) 1992-12-17 1995-12-12 Intevac, Inc. Hybrid photomultiplier tube with ion deflector
US5291017A (en) * 1993-01-27 1994-03-01 Varian Associates, Inc. Ion trap mass spectrometer method and apparatus for improved sensitivity
DE4316737C1 (de) 1993-05-19 1994-09-01 Bruker Franzen Analytik Gmbh Verfahren zur digitalen Erzeugung einer zusätzlichen Wechselspannung für die resonante Anregung von Ionen in Ionenfallen
DE4316738C2 (de) 1993-05-19 1996-10-17 Bruker Franzen Analytik Gmbh Auswurf von Ionen aus Ionenfallen durch kombinierte elektrische Dipol- und Quadrupolfelder
US5324939A (en) 1993-05-28 1994-06-28 Finnigan Corporation Method and apparatus for ejecting unwanted ions in an ion trap mass spectrometer
US5399857A (en) * 1993-05-28 1995-03-21 The Johns Hopkins University Method and apparatus for trapping ions by increasing trapping voltage during ion introduction
DE4324224C1 (de) 1993-07-20 1994-10-06 Bruker Franzen Analytik Gmbh Quadrupol-Ionenfallen mit schaltbaren Multipol-Anteilen
DE4324233C1 (de) 1993-07-20 1995-01-19 Bruker Franzen Analytik Gmbh Verfahren zur Auswahl der Reaktionspfade in Ionenfallen
DE4326549C1 (de) 1993-08-07 1994-08-25 Bruker Franzen Analytik Gmbh Verfahren für eine Regelung der Raumladung in Ionenfallen
US5448062A (en) 1993-08-30 1995-09-05 Mims Technology Development Co. Analyte separation process and apparatus
US6005245A (en) 1993-09-20 1999-12-21 Hitachi, Ltd. Method and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis region
US5663560A (en) 1993-09-20 1997-09-02 Hitachi, Ltd. Method and apparatus for mass analysis of solution sample
JP3367719B2 (ja) * 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
US5396064A (en) * 1994-01-11 1995-03-07 Varian Associates, Inc. Quadrupole trap ion isolation method
US6897439B1 (en) 1994-02-28 2005-05-24 Analytica Of Branford, Inc. Multipole ion guide for mass spectrometry
JP3279045B2 (ja) * 1994-02-24 2002-04-30 株式会社島津製作所 四重極質量分析装置
US5479815A (en) * 1994-02-24 1996-01-02 Kraft Foods, Inc. Method and apparatus for measuring volatiles released from food products
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
DK0748249T3 (da) 1994-02-28 2009-11-09 Analytica Of Branford Inc Multipolionguide for massespektrometri
US6011259A (en) * 1995-08-10 2000-01-04 Analytica Of Branford, Inc. Multipole ion guide ion trap mass spectrometry with MS/MSN analysis
US5608217A (en) * 1994-03-10 1997-03-04 Bruker-Franzen Analytik Gmbh Electrospraying method for mass spectrometric analysis
US5420549A (en) 1994-05-13 1995-05-30 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Extended linear ion trap frequency standard apparatus
US5420425A (en) 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
GB2291200A (en) * 1994-07-15 1996-01-17 Ion Track Instr Ion mobility spectrometer and method of operation for enhanced detection of narotics
DE4425384C1 (de) 1994-07-19 1995-11-02 Bruker Franzen Analytik Gmbh Verfahren zur stoßinduzierten Fragmentierung von Ionen in Ionenfallen
US5451781A (en) 1994-10-28 1995-09-19 Regents Of The University Of California Mini ion trap mass spectrometer
DE19501835C2 (de) 1995-01-21 1998-07-02 Bruker Franzen Analytik Gmbh Verfahren zur Anregung der Schwingungen von Ionen in Ionenfallen mit Frequenzgemischen
DE19501823A1 (de) * 1995-01-21 1996-07-25 Bruker Franzen Analytik Gmbh Verfahren zur Regelung der Erzeugungsraten für massenselektives Einspeichern von Ionen in Ionenfallen
US5623144A (en) 1995-02-14 1997-04-22 Hitachi, Ltd. Mass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method thereby
US5572022A (en) 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
DE19523859C2 (de) 1995-06-30 2000-04-27 Bruker Daltonik Gmbh Vorrichtung für die Reflektion geladener Teilchen
DE19511333C1 (de) 1995-03-28 1996-08-08 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für orthogonalen Einschuß von Ionen in ein Flugzeit-Massenspektrometer
GB9506695D0 (en) * 1995-03-31 1995-05-24 Hd Technologies Limited Improvements in or relating to a mass spectrometer
JP3509267B2 (ja) 1995-04-03 2004-03-22 株式会社日立製作所 イオントラップ質量分析方法および装置
DE19517507C1 (de) * 1995-05-12 1996-08-08 Bruker Franzen Analytik Gmbh Hochfrequenz-Ionenleitsystem
US5569917A (en) 1995-05-19 1996-10-29 Varian Associates, Inc. Apparatus for and method of forming a parallel ion beam
US5572025A (en) 1995-05-25 1996-11-05 The Johns Hopkins University, School Of Medicine Method and apparatus for scanning an ion trap mass spectrometer in the resonance ejection mode
DE19520319A1 (de) 1995-06-02 1996-12-12 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für die Einführung von Ionen in Quadrupol-Ionenfallen
JPH095298A (ja) 1995-06-06 1997-01-10 Varian Assoc Inc 四重極イオントラップ内の選択イオン種を検出する方法
DE19523860A1 (de) * 1995-06-30 1997-01-02 Bruker Franzen Analytik Gmbh Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung
DE69536105D1 (de) 1995-07-03 2010-10-28 Hitachi Ltd Massenspektrometer
WO1997007530A1 (en) 1995-08-11 1997-02-27 Mds Health Group Limited Spectrometer with axial field
US5811800A (en) 1995-09-14 1998-09-22 Bruker-Franzen Analytik Gmbh Temporary storage of ions for mass spectrometric analyses
US5633497A (en) 1995-11-03 1997-05-27 Varian Associates, Inc. Surface coating to improve performance of ion trap mass spectrometers
JP3189652B2 (ja) 1995-12-01 2001-07-16 株式会社日立製作所 質量分析装置
US6259091B1 (en) 1996-01-05 2001-07-10 Battelle Memorial Institute Apparatus for reduction of selected ion intensities in confined ion beams
US5767512A (en) 1996-01-05 1998-06-16 Battelle Memorial Institute Method for reduction of selected ion intensities in confined ion beams
US5629519A (en) 1996-01-16 1997-05-13 Hitachi Instruments Three dimensional quadrupole ion trap
JPH09192586A (ja) 1996-01-17 1997-07-29 Nippon Parkerizing Co Ltd 静電粉体塗装方法
US5714755A (en) * 1996-03-01 1998-02-03 Varian Associates, Inc. Mass scanning method using an ion trap mass spectrometer
JP3651106B2 (ja) 1996-04-03 2005-05-25 株式会社日立製作所 質量分析計
US5625186A (en) 1996-03-21 1997-04-29 Purdue Research Foundation Non-destructive ion trap mass spectrometer and method
JP3424431B2 (ja) 1996-03-29 2003-07-07 株式会社日立製作所 質量分析装置
US5734162A (en) * 1996-04-30 1998-03-31 Hewlett Packard Company Method and apparatus for selectively trapping ions into a quadrupole trap
WO1997043036A1 (en) 1996-05-14 1997-11-20 Analytica Of Branford, Inc. Ion transfer from multipole ion guides into multipole ion guides and ion traps
US5696376A (en) 1996-05-20 1997-12-09 The Johns Hopkins University Method and apparatus for isolating ions in an ion trap with increased resolving power
JP3294106B2 (ja) 1996-05-21 2002-06-24 株式会社日立製作所 三次元四重極質量分析法および装置
US5644131A (en) 1996-05-22 1997-07-01 Hewlett-Packard Co. Hyperbolic ion trap and associated methods of manufacture
US6177668B1 (en) * 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
GB9612070D0 (en) 1996-06-10 1996-08-14 Micromass Ltd Plasma mass spectrometer
US5852294A (en) 1996-07-03 1998-12-22 Analytica Of Branford, Inc. Multiple rod construction for ion guides and mass spectrometers
US5756996A (en) 1996-07-05 1998-05-26 Finnigan Corporation Ion source assembly for an ion trap mass spectrometer and method
DE19628179C2 (de) 1996-07-12 1998-04-23 Bruker Franzen Analytik Gmbh Vorrichtung und Verfahren zum Einschuß von Ionen in eine Ionenfalle
DE19629134C1 (de) 1996-07-19 1997-12-11 Bruker Franzen Analytik Gmbh Vorrichtung zur Überführung von Ionen und mit dieser durchgeführtes Meßverfahren
US5650617A (en) 1996-07-30 1997-07-22 Varian Associates, Inc. Method for trapping ions into ion traps and ion trap mass spectrometer system thereof
US5726448A (en) * 1996-08-09 1998-03-10 California Institute Of Technology Rotating field mass and velocity analyzer
US5693941A (en) 1996-08-23 1997-12-02 Battelle Memorial Institute Asymmetric ion trap
US5777214A (en) 1996-09-12 1998-07-07 Lockheed Martin Energy Research Corporation In-situ continuous water analyzing module
WO1998011428A1 (en) 1996-09-13 1998-03-19 Hitachi, Ltd. Mass spectrometer
US5900481A (en) 1996-11-06 1999-05-04 Sequenom, Inc. Bead linkers for immobilizing nucleic acids to solid supports
US5793038A (en) 1996-12-10 1998-08-11 Varian Associates, Inc. Method of operating an ion trap mass spectrometer
US5793091A (en) 1996-12-13 1998-08-11 International Business Machines Corporation Parallel architecture for quantum computers using ion trap arrays
CN1118580C (zh) 1997-01-23 2003-08-20 布拉克斯集团有限公司 对多肽的特性分析
US5747801A (en) 1997-01-24 1998-05-05 University Of Florida Method and device for improved trapping efficiency of injected ions for quadrupole ion traps
JP3648906B2 (ja) 1997-02-14 2005-05-18 株式会社日立製作所 イオントラップ質量分析計を用いた分析装置
JP3617662B2 (ja) 1997-02-28 2005-02-09 株式会社島津製作所 質量分析装置
DE19709086B4 (de) 1997-03-06 2007-03-15 Bruker Daltonik Gmbh Verfahren der Raumladungsregelung von Tochterionen in Ionenfallen
DE19709172B4 (de) 1997-03-06 2007-03-22 Bruker Daltonik Gmbh Verfahren der vergleichenden Analyse mit Ionenfallenmassenspektrometern
US6147348A (en) 1997-04-11 2000-11-14 University Of Florida Method for performing a scan function on quadrupole ion trap mass spectrometers
JP3570151B2 (ja) 1997-04-17 2004-09-29 株式会社日立製作所 イオントラップ質量分析装置
JPH10314624A (ja) 1997-05-14 1998-12-02 Nippon Parkerizing Co Ltd 静電粉体塗装ガン
US6107625A (en) 1997-05-30 2000-08-22 Bruker Daltonics, Inc. Coaxial multiple reflection time-of-flight mass spectrometer
US6498342B1 (en) 1997-06-02 2002-12-24 Advanced Research & Technology Institute Ion separation instrument
US6323482B1 (en) 1997-06-02 2001-11-27 Advanced Research And Technology Institute, Inc. Ion mobility and mass spectrometer
US5880466A (en) * 1997-06-02 1999-03-09 The Regents Of The University Of California Gated charged-particle trap
US5905258A (en) 1997-06-02 1999-05-18 Advanced Research & Techology Institute Hybrid ion mobility and mass spectrometer
JP3496458B2 (ja) 1997-06-10 2004-02-09 株式会社日立製作所 イオントラップ質量分析装置及びイオントラップ質量分析方法
GB9717926D0 (en) 1997-08-22 1997-10-29 Micromass Ltd Methods and apparatus for tandem mass spectrometry
JPH1183803A (ja) * 1997-09-01 1999-03-26 Hitachi Ltd マスマーカーの補正方法
US6157030A (en) 1997-09-01 2000-12-05 Hitachi, Ltd. Ion trap mass spectrometer
US6157031A (en) 1997-09-17 2000-12-05 California Institute Of Technology Quadropole mass analyzer with linear ion trap
JP3413079B2 (ja) 1997-10-09 2003-06-03 株式会社日立製作所 イオントラップ型質量分析装置
DE19751401B4 (de) 1997-11-20 2007-03-01 Bruker Daltonik Gmbh Quadrupol-Hochfrequenz-Ionenfallen für Massenspektrometer
US6015972A (en) * 1998-01-12 2000-01-18 Mds Inc. Boundary activated dissociation in rod-type mass spectrometer
US6331702B1 (en) 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
EP1050065A4 (en) * 1998-01-23 2004-03-31 Analytica Of Branford Inc SURFACES MASS
US6753523B1 (en) 1998-01-23 2004-06-22 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
GB9802111D0 (en) 1998-01-30 1998-04-01 Shimadzu Res Lab Europe Ltd Time-of-flight mass spectrometer
US6428956B1 (en) 1998-03-02 2002-08-06 Isis Pharmaceuticals, Inc. Mass spectrometric methods for biomolecular screening
US6124592A (en) 1998-03-18 2000-09-26 Technispan Llc Ion mobility storage trap and method
US6414331B1 (en) 1998-03-23 2002-07-02 Gerald A. Smith Container for transporting antiprotons and reaction trap
JP3372862B2 (ja) * 1998-03-25 2003-02-04 株式会社日立製作所 生体液の質量分析装置
JP3904322B2 (ja) 1998-04-20 2007-04-11 株式会社日立製作所 分析装置
US6069355A (en) 1998-05-14 2000-05-30 Varian, Inc. Ion trap mass pectrometer with electrospray ionization
JP4231123B2 (ja) * 1998-06-15 2009-02-25 浜松ホトニクス株式会社 電子管及び光電子増倍管
JP2000028579A (ja) 1998-07-08 2000-01-28 Hitachi Ltd 試料ガス採取装置及び危険物探知装置
US6504149B2 (en) 1998-08-05 2003-01-07 National Research Council Canada Apparatus and method for desolvating and focussing ions for introduction into a mass spectrometer
US6621077B1 (en) 1998-08-05 2003-09-16 National Research Council Canada Apparatus and method for atmospheric pressure-3-dimensional ion trapping
JP2000067805A (ja) 1998-08-24 2000-03-03 Hitachi Ltd 質量分析装置
DE69912444T3 (de) 1998-08-25 2010-05-06 University Of Washington, Seattle Schnelle quantitative analyse von proteinen oder proteinfunktionen in komplexen gemischen
CA2341157A1 (en) 1998-08-31 2000-03-09 University Of Washington Stable isotope metabolic labeling for analysis of biopolymers
US6392225B1 (en) 1998-09-24 2002-05-21 Thermo Finnigan Llc Method and apparatus for transferring ions from an atmospheric pressure ion source into an ion trap mass spectrometer
US6624408B1 (en) 1998-10-05 2003-09-23 Bruker Daltonik Gmbh Method for library searches and extraction of structural information from daughter ion spectra in ion trap mass spectrometry
US6124591A (en) 1998-10-16 2000-09-26 Finnigan Corporation Method of ion fragmentation in a quadrupole ion trap
CA2255188C (en) 1998-12-02 2008-11-18 University Of British Columbia Method and apparatus for multiple stages of mass spectrometry
US6196889B1 (en) * 1998-12-11 2001-03-06 United Technologies Corporation Method and apparatus for use an electron gun employing a thermionic source of electrons
AU1771699A (en) 1998-12-21 2000-07-12 Shimadzu Research Laboratory (Europe) Ltd Method of fast start and/or fast termination of a radio frequency resonator
US6291820B1 (en) 1999-01-08 2001-09-18 The Regents Of The University Of California Highly charged ion secondary ion mass spectroscopy
US6342393B1 (en) * 1999-01-22 2002-01-29 Isis Pharmaceuticals, Inc. Methods and apparatus for external accumulation and photodissociation of ions prior to mass spectrometric analysis
US6211516B1 (en) 1999-02-09 2001-04-03 Syagen Technology Photoionization mass spectrometer
DE19911801C1 (de) * 1999-03-17 2001-01-11 Bruker Daltonik Gmbh Verfahren und Vorrichtung zur matrixunterstützten Laserdesorptions-Ionisierung von Substanzen
US6629040B1 (en) 1999-03-19 2003-09-30 University Of Washington Isotope distribution encoded tags for protein identification
GB2349270B (en) 1999-04-15 2002-02-13 Hitachi Ltd Mass analysis apparatus and method for mass analysis
US6379970B1 (en) 1999-04-30 2002-04-30 The Arizona Board Of Regents On Behalf Of The University Of Arizona Analysis of differential protein expression
US6391649B1 (en) 1999-05-04 2002-05-21 The Rockefeller University Method for the comparative quantitative analysis of proteins and other biological material by isotopic labeling and mass spectroscopy
US6507019B2 (en) * 1999-05-21 2003-01-14 Mds Inc. MS/MS scan methods for a quadrupole/time of flight tandem mass spectrometer
US6489609B1 (en) 1999-05-21 2002-12-03 Hitachi, Ltd. Ion trap mass spectrometry and apparatus
US6504148B1 (en) * 1999-05-27 2003-01-07 Mds Inc. Quadrupole mass spectrometer with ION traps to enhance sensitivity
WO2000077823A2 (en) * 1999-06-11 2000-12-21 Perseptive Biosystems, Inc. Tandem time-of-flight mass spectometer with damping in collision cell and method for use
DE19930894B4 (de) 1999-07-05 2007-02-08 Bruker Daltonik Gmbh Verfahren zur Regelung der Ionenzahl in Ionenzyklotronresonanz-Massenspektrometern
US6690004B2 (en) * 1999-07-21 2004-02-10 The Charles Stark Draper Laboratory, Inc. Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry
DE19937439C1 (de) * 1999-08-07 2001-05-17 Bruker Daltonik Gmbh Vorrichtung zum abwechselnden Betrieb mehrerer Ionenquellen
DE19937438C2 (de) 1999-08-07 2001-09-13 Bruker Daltonik Gmbh Kopplung Dünnschicht-Chromatographie und Massenspektrometrie (TLC/MS)
JP2003507874A (ja) 1999-08-26 2003-02-25 ユニバーシティ オブ ニュー ハンプシャー 多段型の質量分析計
US6326615B1 (en) 1999-08-30 2001-12-04 Syagen Technology Rapid response mass spectrometer system
JP3650551B2 (ja) 1999-09-14 2005-05-18 株式会社日立製作所 質量分析計
US6469298B1 (en) 1999-09-20 2002-10-22 Ut-Battelle, Llc Microscale ion trap mass spectrometer
DE19949978A1 (de) 1999-10-08 2001-05-10 Univ Dresden Tech Elektronenstoßionenquelle
JP3756365B2 (ja) 1999-12-02 2006-03-15 株式会社日立製作所 イオントラップ質量分析方法
JP3625265B2 (ja) 1999-12-07 2005-03-02 株式会社日立製作所 イオントラップ型質量分析装置
JP3470671B2 (ja) 2000-01-31 2003-11-25 株式会社島津製作所 イオントラップ型質量分析装置における広帯域信号生成方法
US6822224B2 (en) 2000-03-14 2004-11-23 National Research Council Canada Tandem high field asymmetric waveform ion mobility spectrometry (FAIMS)tandem mass spectrometry
JP4416259B2 (ja) 2000-03-24 2010-02-17 キヤノンアネルバ株式会社 質量分析装置
US6545268B1 (en) 2000-04-10 2003-04-08 Perseptive Biosystems Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
US6403955B1 (en) 2000-04-26 2002-06-11 Thermo Finnigan Llc Linear quadrupole mass spectrometer
US6762406B2 (en) 2000-05-25 2004-07-13 Purdue Research Foundation Ion trap array mass spectrometer
JP2001351571A (ja) 2000-06-07 2001-12-21 Hitachi Ltd イオントラップ型質量分析方法及び質量分析装置
DE10028914C1 (de) 2000-06-10 2002-01-17 Bruker Daltonik Gmbh Interne Detektion von Ionen in Quadrupol-Ionenfallen
US6720554B2 (en) 2000-07-21 2004-04-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
US6690005B2 (en) * 2000-08-02 2004-02-10 General Electric Company Ion mobility spectrometer
JP3894118B2 (ja) 2000-09-20 2007-03-14 株式会社日立製作所 イオントラップ質量分析計を用いた探知方法及び探知装置
JP2002150992A (ja) 2000-11-09 2002-05-24 Anelva Corp 質量分析のためのイオン化装置およびイオン化方法
DE10058706C1 (de) 2000-11-25 2002-02-28 Bruker Daltonik Gmbh Ionenfragmentierung durch Elektroneneinfang in Hochfrequenz-Ionenfallen
US6781119B2 (en) 2000-12-14 2004-08-24 Mks Instruments, Inc. Ion storage system
GB0031342D0 (en) 2000-12-21 2001-02-07 Shimadzu Res Lab Europe Ltd Method and apparatus for ejecting ions from a quadrupole ion trap
US6573495B2 (en) 2000-12-26 2003-06-03 Thermo Finnigan Llc High capacity ion cyclotron resonance cell
US6683301B2 (en) * 2001-01-29 2004-01-27 Analytica Of Branford, Inc. Charged particle trapping in near-surface potential wells
JP2002252207A (ja) * 2001-02-22 2002-09-06 Matsushita Electric Ind Co Ltd 高周波電源、プラズマ処理装置、プラズマ処理装置の検査方法及びプラズマ処理方法
JP2002257869A (ja) * 2001-02-28 2002-09-11 Sanyo Electric Co Ltd 電流検出回路
US6627883B2 (en) 2001-03-02 2003-09-30 Bruker Daltonics Inc. Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
US6649907B2 (en) 2001-03-08 2003-11-18 Wisconsin Alumni Research Foundation Charge reduction electrospray ionization ion source
EP1245952B1 (en) 2001-03-20 2012-09-19 Morpho Detection, Inc. Ion mobility spectrometer and its usage
GB2404784B (en) * 2001-03-23 2005-06-22 Thermo Finnigan Llc Mass spectrometry method and apparatus
US6777671B2 (en) 2001-04-10 2004-08-17 Science & Engineering Services, Inc. Time-of-flight/ion trap mass spectrometer, a method, and a computer program product to use the same
US6617577B2 (en) 2001-04-16 2003-09-09 The Rockefeller University Method and system for mass spectroscopy
US6627875B2 (en) 2001-04-23 2003-09-30 Beyond Genomics, Inc. Tailored waveform/charge reduction mass spectrometry
AU2002305449A1 (en) 2001-05-08 2002-11-18 Thermo Finnigan Llc Ion trap
US6608303B2 (en) 2001-06-06 2003-08-19 Thermo Finnigan Llc Quadrupole ion trap with electronic shims
JP3757820B2 (ja) * 2001-06-13 2006-03-22 株式会社日立製作所 イオン源およびそれを用いた質量分析計
US6784421B2 (en) 2001-06-14 2004-08-31 Bruker Daltonics, Inc. Method and apparatus for fourier transform mass spectrometry (FTMS) in a linear multipole ion trap
US6744042B2 (en) 2001-06-18 2004-06-01 Yeda Research And Development Co., Ltd. Ion trapping
CA2391140C (en) 2001-06-25 2008-10-07 Micromass Limited Mass spectrometer
JP4631219B2 (ja) * 2001-06-26 2011-02-16 株式会社島津製作所 イオントラップ型質量分析装置
JP3620479B2 (ja) 2001-07-31 2005-02-16 株式会社島津製作所 イオン蓄積装置におけるイオン選別の方法
US6610976B2 (en) 2001-08-28 2003-08-26 The Rockefeller University Method and apparatus for improved signal-to-noise ratio in mass spectrometry
EP1421600B1 (en) 2001-08-30 2005-06-22 MDS Inc., doing business as MDS Sciex A method of reducing space charge in a linear ion trap mass spectrometer
JP3990889B2 (ja) 2001-10-10 2007-10-17 株式会社日立ハイテクノロジーズ 質量分析装置およびこれを用いる計測システム
US6787760B2 (en) 2001-10-12 2004-09-07 Battelle Memorial Institute Method for increasing the dynamic range of mass spectrometers
JP3690330B2 (ja) 2001-10-16 2005-08-31 株式会社島津製作所 イオントラップ装置
WO2003041116A1 (fr) 2001-11-07 2003-05-15 Hitachi High-Technologies Corporation Spectrometrie de masse et spectrometre de masse a piege a ions
DE60219576T2 (de) 2001-11-22 2007-12-27 Micromass Uk Ltd. Massenspektrometer und Verfahren
GB2389452B (en) * 2001-12-06 2006-05-10 Bruker Daltonik Gmbh Ion-guide
WO2003056604A1 (en) 2001-12-21 2003-07-10 Mds Inc., Doing Business As Mds Sciex Use of notched broadband waveforms in a linear ion trap
US6777673B2 (en) 2001-12-28 2004-08-17 Academia Sinica Ion trap mass spectrometer
US6710336B2 (en) * 2002-01-30 2004-03-23 Varian, Inc. Ion trap mass spectrometer using pre-calculated waveforms for ion isolation and collision induced dissociation
US6888133B2 (en) 2002-01-30 2005-05-03 Varian, Inc. Integrated ion focusing and gating optics for ion trap mass spectrometer
JP4167593B2 (ja) 2002-01-31 2008-10-15 株式会社日立ハイテクノロジーズ エレクトロスプレイイオン化質量分析装置及びその方法
US6844547B2 (en) * 2002-02-04 2005-01-18 Thermo Finnigan Llc Circuit for applying supplementary voltages to RF multipole devices
JP3653504B2 (ja) 2002-02-12 2005-05-25 株式会社日立ハイテクノロジーズ イオントラップ型質量分析装置
FR2835964B1 (fr) * 2002-02-14 2004-07-09 Centre Nat Rech Scient Piege a ions a aimant permanent et spectrometre de masse utilisant un tel aimant
JP3752458B2 (ja) 2002-02-18 2006-03-08 株式会社日立ハイテクノロジーズ 質量分析装置
JP3840417B2 (ja) 2002-02-20 2006-11-01 株式会社日立ハイテクノロジーズ 質量分析装置
US6674067B2 (en) * 2002-02-21 2004-01-06 Hitachi High Technologies America, Inc. Methods and apparatus to control charge neutralization reactions in ion traps
US6570151B1 (en) 2002-02-21 2003-05-27 Hitachi Instruments, Inc. Methods and apparatus to control charge neutralization reactions in ion traps
JP3951741B2 (ja) * 2002-02-27 2007-08-01 株式会社日立製作所 電荷調整方法とその装置、および質量分析装置
DE10213652B4 (de) 2002-03-27 2008-02-21 Bruker Daltonik Gmbh Verfahren zur Bestrahlung von Ionen in einer Ionenzyklotronresonanz-Falle mit Elektronen und/oder Photonen
US7049580B2 (en) 2002-04-05 2006-05-23 Mds Inc. Fragmentation of ions by resonant excitation in a high order multipole field, low pressure ion trap
US6872939B2 (en) 2002-05-17 2005-03-29 Micromass Uk Limited Mass spectrometer
US6906319B2 (en) 2002-05-17 2005-06-14 Micromass Uk Limited Mass spectrometer
JP3791455B2 (ja) * 2002-05-20 2006-06-28 株式会社島津製作所 イオントラップ型質量分析装置
JP3971958B2 (ja) * 2002-05-28 2007-09-05 株式会社日立ハイテクノロジーズ 質量分析装置
US6703607B2 (en) * 2002-05-30 2004-03-09 Mds Inc. Axial ejection resolution in multipole mass spectrometers
US7095013B2 (en) 2002-05-30 2006-08-22 Micromass Uk Limited Mass spectrometer
US6794641B2 (en) 2002-05-30 2004-09-21 Micromass Uk Limited Mass spectrometer
US6770871B1 (en) 2002-05-31 2004-08-03 Michrom Bioresources, Inc. Two-dimensional tandem mass spectrometry
JP3743717B2 (ja) 2002-06-25 2006-02-08 株式会社日立製作所 質量分析データの解析方法および質量分析データの解析装置および質量分析データの解析プログラムならびにソリューション提供システム
US6791078B2 (en) 2002-06-27 2004-09-14 Micromass Uk Limited Mass spectrometer
US7071467B2 (en) 2002-08-05 2006-07-04 Micromass Uk Limited Mass spectrometer
US6897438B2 (en) 2002-08-05 2005-05-24 University Of British Columbia Geometry for generating a two-dimensional substantially quadrupole field
US7045797B2 (en) 2002-08-05 2006-05-16 The University Of British Columbia Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field
DE10236346A1 (de) 2002-08-08 2004-02-19 Bruker Daltonik Gmbh Nichtlinearer Resonanzauswurf aus linearen Ionenfallen
US6875980B2 (en) 2002-08-08 2005-04-05 Micromass Uk Limited Mass spectrometer
US6794642B2 (en) 2002-08-08 2004-09-21 Micromass Uk Limited Mass spectrometer
US7102126B2 (en) 2002-08-08 2006-09-05 Micromass Uk Limited Mass spectrometer
US6867414B2 (en) * 2002-09-24 2005-03-15 Ciphergen Biosystems, Inc. Electric sector time-of-flight mass spectrometer with adjustable ion optical elements
JP3787549B2 (ja) 2002-10-25 2006-06-21 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
JP3741097B2 (ja) * 2002-10-31 2006-02-01 株式会社島津製作所 イオントラップ装置及び該装置の調整方法
EP1568063A4 (en) 2002-12-02 2007-03-14 Griffin Analytical Tech PROCESS FOR DESIGNING MASS SEPARATORS AND ION TRAPS, METHODS FOR PRODUCING MASS SEPARATORS AND ION TRAPS, MASS SPECTROMETERS, ION TRAPS AND METHODS FOR ANALYZING SAMPLES
US6914242B2 (en) 2002-12-06 2005-07-05 Agilent Technologies, Inc. Time of flight ion trap tandem mass spectrometer system
US20040119014A1 (en) 2002-12-18 2004-06-24 Alex Mordehai Ion trap mass spectrometer and method for analyzing ions
JP3936908B2 (ja) 2002-12-24 2007-06-27 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
US6838666B2 (en) * 2003-01-10 2005-01-04 Purdue Research Foundation Rectilinear ion trap and mass analyzer system and method
US6710334B1 (en) * 2003-01-20 2004-03-23 Genspec Sa Quadrupol ion trap mass spectrometer with cryogenic particle detector
CN100550275C (zh) * 2003-01-24 2009-10-14 萨莫芬尼根有限责任公司 控制质量分析器中的离子数目
US6982415B2 (en) * 2003-01-24 2006-01-03 Thermo Finnigan Llc Controlling ion populations in a mass analyzer having a pulsed ion source
US7019289B2 (en) * 2003-01-31 2006-03-28 Yang Wang Ion trap mass spectrometry
US7157698B2 (en) * 2003-03-19 2007-01-02 Thermo Finnigan, Llc Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
US7064319B2 (en) 2003-03-31 2006-06-20 Hitachi High-Technologies Corporation Mass spectrometer
US6878932B1 (en) 2003-05-09 2005-04-12 John D. Kroska Mass spectrometer ionization source and related methods
US6858840B2 (en) * 2003-05-20 2005-02-22 Science & Engineering Services, Inc. Method of ion fragmentation in a multipole ion guide of a tandem mass spectrometer
US7019290B2 (en) 2003-05-30 2006-03-28 Applera Corporation System and method for modifying the fringing fields of a radio frequency multipole
DE10325579B4 (de) * 2003-06-05 2007-10-11 Bruker Daltonik Gmbh Ionenfragmentierung durch Elektroneneinfang in linearen Ionenfallen
WO2005001430A2 (en) 2003-06-27 2005-01-06 Brigham Young University Virtual ion trap
JP4305832B2 (ja) * 2003-07-29 2009-07-29 キヤノンアネルバ株式会社 多重極型質量分析計
US7119331B2 (en) 2003-08-07 2006-10-10 Academia Sinica Nanoparticle ion detection
US6800851B1 (en) 2003-08-20 2004-10-05 Bruker Daltonik Gmbh Electron-ion fragmentation reactions in multipolar radiofrequency fields
JP3912345B2 (ja) 2003-08-26 2007-05-09 株式会社島津製作所 質量分析装置
US6982413B2 (en) * 2003-09-05 2006-01-03 Griffin Analytical Technologies, Inc. Method of automatically calibrating electronic controls in a mass spectrometer
US7161142B1 (en) * 2003-09-05 2007-01-09 Griffin Analytical Technologies Portable mass spectrometers
EP1668665A4 (en) 2003-09-25 2008-03-19 Mds Inc Dba Mds Sciex METHOD AND DEVICE FOR PROVIDING TWO-DIMENSIONAL FIELDS ESSENTIALLY OF THE QUADRUPOL TYPE WITH SELECTED HEXAPOL COMPONENTS
JP2005108578A (ja) 2003-09-30 2005-04-21 Hitachi Ltd 質量分析装置
US7217919B2 (en) 2004-11-02 2007-05-15 Analytica Of Branford, Inc. Method and apparatus for multiplexing plural ion beams to a mass spectrometer
DE10351604A1 (de) * 2003-11-05 2005-06-02 Rohde & Schwarz Gmbh & Co. Kg Frequenzsynthesizer nach dem direkten digitalen Synthese-Verfahren
JP3960306B2 (ja) 2003-12-22 2007-08-15 株式会社島津製作所 イオントラップ装置
JP4200092B2 (ja) 2003-12-24 2008-12-24 株式会社日立ハイテクノロジーズ 質量分析装置及びそのキャリブレーション方法
JP4033133B2 (ja) 2004-01-13 2008-01-16 株式会社島津製作所 質量分析装置
US7026613B2 (en) 2004-01-23 2006-04-11 Thermo Finnigan Llc Confining positive and negative ions with fast oscillating electric potentials
GB0404285D0 (en) 2004-02-26 2004-03-31 Shimadzu Res Lab Europe Ltd A tandem ion-trap time-of flight mass spectrometer
US6933498B1 (en) 2004-03-16 2005-08-23 Ut-Battelle, Llc Ion trap array-based systems and methods for chemical analysis
US6958473B2 (en) 2004-03-25 2005-10-25 Predicant Biosciences, Inc. A-priori biomarker knowledge based mass filtering for enhanced biomarker detection
JP4300154B2 (ja) * 2004-05-14 2009-07-22 株式会社日立ハイテクノロジーズ イオントラップ/飛行時間質量分析計およびイオンの精密質量測定方法
US7170051B2 (en) * 2004-05-20 2007-01-30 Science & Engineering Services, Inc. Method and apparatus for ion fragmentation in mass spectrometry
JP4384542B2 (ja) 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ 質量分析装置
JP4506285B2 (ja) * 2004-05-28 2010-07-21 株式会社島津製作所 イオントラップ装置及び該装置の調整方法
JP4653972B2 (ja) 2004-06-11 2011-03-16 株式会社日立ハイテクノロジーズ イオントラップ/飛行時間型質量分析装置および質量分析方法
US7270020B2 (en) 2004-06-14 2007-09-18 Griffin Analytical Technologies, Llc Instrument assemblies and analysis methods
US7361890B2 (en) 2004-07-02 2008-04-22 Griffin Analytical Technologies, Inc. Analytical instruments, assemblies, and methods
US7208726B2 (en) 2004-08-27 2007-04-24 Agilent Technologies, Inc. Ion trap mass spectrometer with scanning delay ion extraction
US7102129B2 (en) 2004-09-14 2006-09-05 Thermo Finnigan Llc High-Q pulsed fragmentation in ion traps
US6949743B1 (en) 2004-09-14 2005-09-27 Thermo Finnigan Llc High-Q pulsed fragmentation in ion traps
US7154088B1 (en) 2004-09-16 2006-12-26 Sandia Corporation Microfabricated ion trap array
JP2008514163A (ja) * 2004-09-22 2008-05-01 ジーシーティー セミコンダクター インコーポレイテッド 広帯域周波数を発振する装置および方法
US6972408B1 (en) 2004-09-30 2005-12-06 Ut-Battelle, Llc Ultra high mass range mass spectrometer systems
US20060163472A1 (en) 2005-01-25 2006-07-27 Varian, Inc. Correcting phases for ion polarity in ion trap mass spectrometry
US20090261247A1 (en) * 2005-02-07 2009-10-22 Robert Graham Cooks Linear Ion Trap with Four Planar Electrodes
US7217922B2 (en) 2005-03-14 2007-05-15 Lucent Technologies Inc. Planar micro-miniature ion trap devices
US7164319B2 (en) * 2005-04-29 2007-01-16 Triquint Semiconductor, Inc. Power amplifier with multi mode gain circuit
US7838820B2 (en) 2005-06-06 2010-11-23 UT-Battlelle, LLC Controlled kinetic energy ion source for miniature ion trap and related spectroscopy system and method
US7279681B2 (en) 2005-06-22 2007-10-09 Agilent Technologies, Inc. Ion trap with built-in field-modifying electrodes and method of operation
US7323683B2 (en) * 2005-08-31 2008-01-29 The Rockefeller University Linear ion trap for mass spectrometry
US7423262B2 (en) 2005-11-14 2008-09-09 Agilent Technologies, Inc. Precision segmented ion trap
US7582864B2 (en) 2005-12-22 2009-09-01 Leco Corporation Linear ion trap with an imbalanced radio frequency field
GB0602229D0 (en) * 2006-02-03 2006-03-15 Univ Sussex Electrical potential sensor for use in the detection of nuclear magnetic resonance signals
US7456389B2 (en) 2006-07-11 2008-11-25 Thermo Finnigan Llc High throughput quadrupolar ion trap
US7446310B2 (en) 2006-07-11 2008-11-04 Thermo Finnigan Llc High throughput quadrupolar ion trap
US7579778B2 (en) 2006-07-11 2009-08-25 L-3 Communications Electron Technologies, Inc. Traveling-wave tube with integrated ion trap power supply
US20080017794A1 (en) 2006-07-18 2008-01-24 Zyvex Corporation Coaxial ring ion trap
US8334506B2 (en) * 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
JP5323384B2 (ja) * 2008-04-14 2013-10-23 株式会社日立製作所 質量分析計および質量分析方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB676238A (en) * 1948-10-29 1952-07-23 British Thomson Houston Co Ltd Improvements relating to phase-control circuits
US4703190A (en) * 1985-06-25 1987-10-27 Anelva Corporation Power supply system for a quadrupole mass spectrometer
CN2589978Y (zh) * 2002-12-27 2003-12-03 华南理工大学 高分辩率四极质谱计

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