CN102222025A - Method and device for eliminating memory failure - Google Patents
Method and device for eliminating memory failure Download PDFInfo
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- CN102222025A CN102222025A CN2011101639659A CN201110163965A CN102222025A CN 102222025 A CN102222025 A CN 102222025A CN 2011101639659 A CN2011101639659 A CN 2011101639659A CN 201110163965 A CN201110163965 A CN 201110163965A CN 102222025 A CN102222025 A CN 102222025A
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Abstract
The invention discloses a method and a device for eliminating memory failure, belonging to the technical field of computers. The method comprises the following steps of: acquiring the physical address information of a failure memory space in an application program operation space of a memory; and isolating a failure memory space in the application program operation space according to the physical address information of the failure memory space. The device comprises an acquisition module and an isolation module. The method and the device can eliminate the memory failure.
Description
Technical field
The present invention relates to computer realm, particularly a kind of method and device of eliminating memory failure.
Background technology
In computer realm, veneer needed earlier operating system and application program to be left in the internal memory before operation system and application program, and then operation system and move the application program that leaves in the internal memory by operating system.
Wherein, the application program running space of internal memory of single board is used to deposit application program, if the application program running space breaks down, then may cause operating system to be restarted with application program can't move.At present, each internal storage location that veneer can adopt ECC (Error Correcting Code, bug check and correction) detection method application programs running space to comprise detects, and detects the internal storage location that has the inefficacy bit; If have only 1 bit to lose efficacy in the detected internal storage location, the ECC detection method can also be carried out error correction to eliminate fault to this internal storage location.
In realizing process of the present invention, the inventor finds that there is following problem at least in prior art:
If 2 bits are arranged in the internal storage location or lost efficacy more than 2 bits, then present ECC detection method can't be carried out error correction to eliminate memory failure to this internal storage location.
Summary of the invention
For when having the internal storage location of a plurality of bits inefficacies in the application program running space, can eliminate memory failure, the invention provides a kind of method and device of eliminating memory failure.Described technical scheme is as follows:
A kind of method of eliminating memory failure, described method comprises:
Obtain the physical address information in the failure memory space in the application program running space of internal memory;
According to the physical address information in described failure memory space, isolate the failure memory space in the described application program running space.
A kind of device of eliminating memory failure, described device comprises:
Acquisition module is used for obtaining the physical address information in failure memory space of the application program running space of internal memory;
Isolation module is used for the physical address information according to described failure memory space, isolates the failure memory space in the described application program running space.
In the present invention, obtain the physical address information in the failure memory space in the application program running space, failure memory space according to the physical address information isolates application running space in failure memory space, so, when having the internal storage location of many bits inefficacies in the application program running space, also can eliminate the fault of internal memory, ensure that operating system and application program normally move.
Description of drawings
Fig. 1 is a kind of method flow diagram of eliminating memory failure that the embodiment of the invention 1 provides;
Fig. 2 is a kind of method flow diagram of eliminating memory failure that the embodiment of the invention 2 provides;
Fig. 3 is a kind of memory headroom synoptic diagram that the embodiment of the invention 2 provides;
Fig. 4 is a kind of device synoptic diagram of eliminating memory failure that the embodiment of the invention 3 provides.
Embodiment
For making the purpose, technical solutions and advantages of the present invention clearer, embodiment of the present invention is described further in detail below in conjunction with accompanying drawing.
Embodiment 1
As shown in Figure 1, the embodiment of the invention provides a kind of method of eliminating memory failure, comprising:
Step 101: the physical address information that obtains the failure memory space in the application program running space of internal memory;
Step 102: according to the physical address information in failure memory space, the failure memory space in the isolates application running space.
In embodiments of the present invention, obtain the physical address information in the failure memory space in the application program running space, failure memory space according to the physical address information isolates application running space in failure memory space, so, when having the internal storage location of many bits inefficacies in the application program running space, also can eliminate the fault of internal memory, ensure that operating system and application program normally move.
Embodiment 2
As shown in Figure 2, the embodiment of the invention provides a kind of method of eliminating memory failure, comprising:
Step 201: when single board starting, the application program running space that comprises in the internal memory for veneer, first internal storage location from the application program running space begin scanning;
Wherein, the internal memory of veneer comprises operating system space and application program running space; The operating system space is used for the deposit operation system, and the application program running space is used to deposit application program.
Wherein, internal storage location is the smallest particles of internal memory, and each internal storage location takies 64 bits or 32 bits etc., and each internal storage location all has its physical address corresponding in internal memory.
For example, referring to Fig. 3, the smallest particles in the application program running space is an internal storage location, and in physical space, each internal storage location all has physical address corresponding, and the physical address of each internal storage location in the application program running space all is continuous; When single board starting, first internal storage location from the application program running space begins scanning, is that the internal storage location of 0000 correspondence begins scanning from physical address promptly.
Step 202: the internal storage location to scanning detects, and breaks down if detect the internal storage location of scanning, and promptly Sao Miao internal storage location is the failure memory unit, and then execution in step 203;
Wherein, in the present embodiment, exist a bit or a plurality of bit to lose efficacy if detect the internal storage location of scanning, the internal storage location that then can determine scanning breaks down; Perhaps, exist a plurality of bits to lose efficacy if detect the internal storage location of scanning, the internal storage location of then determining scanning breaks down.
Wherein, if internal storage location exists a bit to lose efficacy, can carry out error correction to eliminate the fault that this internal storage location takes place to this internal storage location, therefore the internal storage location that exists a bit to lose efficacy can be carried out this internal storage location not being detected as the internal storage location that breaks down after error correction and the error correction; But the less stable of the internal storage location of error correction therefore also can the internal storage location that has a bit inefficacy not carried out error correction, but the internal storage location that directly will exist a bit to lose efficacy detects as the internal storage location that breaks down.
Wherein, in the present embodiment, can adopt existing detection algorithm to come the internal storage location of scanning is detected, existing detection algorithm comprises ECC detection method and RAM (Random Access Memory, random access memory) trace routine etc.
Wherein, do not break down, then scan the next internal storage location in the application program running space, and return execution in step 202 if detect the internal memory of scanning.
For example, the internal storage location of physical address 0000 correspondence is detected, and the internal storage location that detects physical address 0000 correspondence does not break down; Scan next internal storage location, i.e. the internal storage location of physical address 0001 correspondence, and the internal storage location of physical address 0001 correspondence detected and detect do not break down; Continue the next internal storage location of scanning, it is the internal storage location of physical address 0002 correspondence, internal storage location to physical address 0002 correspondence detects, and there is the bit that lost efficacy in the internal storage location that detects physical address 0002 correspondence, the internal storage location that is physical address 0002 correspondence breaks down, and execution in step 203 then.
Step 203: obtain the physical address information in failure memory space and this failure memory space according to the failure memory unit, and the physical address information in this failure memory space is stored in the memory failure information table;
Particularly, begin to scan backward the memory headroom of default size from the failure memory unit, the failure memory space is formed in the space of failure memory unit and scanning, read the physical address information in this failure memory space, the physical address information in this failure memory space is stored in the memory failure information table.
Wherein, in the present embodiment, the physical address of first internal storage location that the failure memory space can be comprised and the physical address of last internal storage location are formed the physical address information in this failure memory space.
Wherein, because the failure memory unit can exert an influence to its follow-up partial memory unit, therefore can begin to scan backward the memory headroom of default size in the present embodiment from the failure memory unit, and the failure memory space is formed in this failure memory unit and scanning memory headroom.
Wherein, if also there is not the internal storage location of scanning in the application program running space, then first internal storage location behind the failure memory space begins scanning, and returns execution in step 202; Press said process, all internal storage locations in having scanned the application program running space, and obtain the memory failure information table of whole internal memory.
For example, begin scanning from the internal storage location of physical address 0002 correspondence, up to the internal storage location that scans physical address 0100 correspondence, obtain the memory headroom of default size, the internal storage location of this memory headroom and physical address 0002 correspondence is formed the failure memory space, promptly this failure memory space is the memory headroom of being made up of to the internal storage location of physical address 0100 correspondence the internal storage location of 0002 pair of physical address, the physical address information that reads this failure memory space comprises the physical address 0100 of last internal storage location in the physical address 0002 of first internal storage location in this failure memory space and this failure memory space, the physical address information in this failure memory space is stored in the memory failure information table, as shown in table 1; First internal storage location behind this failure memory space begins scanning, promptly the internal storage location from physical address 0101 correspondence begins scanning, and returning execution in step 202, all internal storage locations in having scanned the application program running space obtain the memory failure information table of whole internal memory.
Table 1
Step 204:, from the application program running space, mark all failure memory spaces according to the physical address information in the failure memory space of storing in the memory failure information table;
Particularly, from the memory failure information table, read the physical address information in each failure memory space of storage, physical address information according to each failure memory space marks corresponding failure memory space in the application program running space, the unlabelled memory headroom of other in the application program running space all is non-failure memory space.
For example, from table 1, read the physical address information in a failure memory space, be assumed to be the physical address information in failure memory space shown in second row of table 1, mark the internal storage location that comprises physical address 0002 correspondence according to the physical address information in this failure memory space to failure memory space that the internal storage location of physical address 0100 correspondence is formed.
Step 205: each internal storage location in the non-failure memory space in the application programs running space carries out the logic addressing, obtains the logical address of each internal storage location, thereby realizes the failure memory space is isolated.
Wherein, in physical space, each internal storage location in the non-failure memory space of application programs running space carries out the logical address that the logic addressing obtains each internal storage location, make in logical space, the logical address of each internal storage location in the non-failure memory space all is continuous, so realized having isolated in the application program running space all failure memory spaces, the application program running space after therefore isolating only comprises non-failure memory space.
Wherein, operating system is deposited and is run application to the application program running space, and operating system can be discerned the logical address of internal storage location, therefore can carry out the logic addressing in embodiments of the present invention to each internal storage location in the non-failure memory space, thereby can eliminate memory failure.
For example, in Fig. 3, the memory headroom that memory headroom that the internal storage location of physical address 0000 correspondence to the internal storage location of physical address 0001 correspondence is formed and the internal storage location of physical address 0101 correspondence to the internal storage location of physical address 0105 correspondence are formed all is non-failure memory space, non-failure memory space is addressed, obtain the logical address of each internal storage location in the non-failure memory space, for example, the logical address of the internal storage location of physical address 0000 correspondence is 0000, the logical address of the internal storage location of physical address 0001 correspondence is 0001, and the logical address of the internal storage location of physical address 0101 correspondence is 0002......
Further, the number in the failure memory space that statistics marks, if the number in failure memory space surpasses default number, then determining the serious and veneer of memory failure can't use internal memory to deposit and operation system and application program, stop logic addressing, situation about breaking down to the user report internal memory are simultaneously carried out in non-failure memory space.
Wherein, if the number in failure memory space does not surpass default number, then carry out the operation of non-failure memory space being carried out the logic addressing.
Further, the space size in the failure memory space that statistics marks, calculate the occupation rate in failure memory space according to the space of statistics space size big or small and whole internal memory, if the occupation rate in failure memory space surpasses default occupancy, then determining the serious and veneer of memory failure can't use internal memory to deposit and run application, stop logic addressing, situation about breaking down to the user report internal memory are simultaneously carried out in non-failure memory space.
Wherein, if the occupation rate in failure memory space does not surpass default occupancy, then carry out the operation of non-failure memory space being carried out the logic addressing.
Further, before to elimination application program running space, can also begin scanning from first internal storage location in the operating system space of internal memory, and to scanning internal storage location detect, if there is not the bit of inefficacy in the internal storage location that detects scanning, then continues the next internal storage location of scanning and detect the internal storage location that scans; Exist a bit to lose efficacy if detect the internal storage location of scanning, then the internal storage location to scanning carries out error correction, scans next internal storage location and the internal storage location of scanning is detected; Exist a plurality of bits to lose efficacy if detect the internal storage location of scanning, the internal storage location of then judging scanning is the failure memory unit, and determine the serious and veneer of memory failure and can't use this internal memory to deposit and the operation system, stop to eliminate the operation in the failure memory space in the application program running space, simultaneously situation about breaking down to this internal memory of user report.
Wherein, because the physical address of each internal storage location in the operating system space is CPU (CentralProcessing Unit, central processing unit) address of static mappings, the operating system of storing in the address operation system running space of CPU according to self static mappings; If the non-failure memory unit in the operating system space is carried out the logic addressing, therefore CPU can't use logical address to come the operating system of storing in the operation system running space, can't isolate the failure memory unit in the operating system space and can't eliminate fault; And when having the failure memory unit in the operating system space, operating system can't normally be moved and operating system can repeatedly be restarted, so veneer can't use this internal memory.
Wherein, whether the user can be the single-board replacement internal memory according to the situation decision of report.
Further, when in internal memory, depositing application program or in internal memory, run application, operating system can be according to the logical address of each internal storage location in the non-failure memory space of application program running space, deposits in non-failure memory space and runs application.
Wherein, veneer is when depositing application program, operating system is divided a memory headroom earlier in the non-failure memory space of application program running space, use the memory headroom of dividing to deposit application program, and store the sign of this application program and divide the corresponding relation of the logical address of memory headroom; When veneer runs application, operating system elder generation is according to the sign of this application program, from the corresponding relation of the sign of application program and the logical address of memory headroom, find out the logical address of corresponding memory headroom, logical address according to the memory headroom of searching is mapped to corresponding memory headroom, the application program that operation is deposited in the memory headroom of mapping.
In embodiments of the present invention, first internal storage location from the application program running space begins to scan and the internal storage location that scans is detected, when detecting the failure memory unit, obtain the physical address information in failure memory space and be stored in the memory failure information table according to the failure memory unit, mark failure memory space in the application program running space according to the memory failure information table, the failure memory space of logic addressing from realized the isolates application running space carried out in other unlabelled non-failure memory spaces, so, when having the internal storage location of many bits inefficacies in the application program running space, also can eliminate the fault of internal memory, ensure that operating system and application program normally move.
Embodiment 3
As shown in Figure 3, the embodiment of the invention provides a kind of device of eliminating memory failure, comprising:
Wherein, acquisition module 301 comprises:
Detecting unit, each internal storage location of application programs running space detects to be used for beginning successively from first internal storage location of application program running space;
Scanning element is used for when detecting the failure memory unit, begins to scan backward the memory headroom of default size from the failure memory unit, with the physical address information of failure memory unit and this memory headroom composition failure memory space and read failure memory headroom.
Wherein, isolation module 302 comprises:
Indexing unit is used for the physical address information according to the failure memory space, marks corresponding failure memory space in the application program running space;
Addressed location, each internal storage location that is used in the unlabelled non-failure memory of the application programs running space space carries out the logical address that the logic addressing obtains each internal storage location.
Further, this device also comprises:
Deposit the operation module, be used for logical address, in the non-failure memory space of application program running space, deposit and run application according to the internal storage location in the non-failure memory space of application program running space.
Further, this device also comprises:
First reporting modules, the number that is used to add up the failure memory space if the number of statistics surpasses default number, then stops logic addressing, situation about breaking down to this internal memory of user report are simultaneously carried out in non-failure memory space.
Further, this device also comprises:
Second reporting modules, the space size that is used to add up the failure memory space, space size big or small according to the space of adding up and this internal memory calculates the occupation rate in failure memory space; If the occupation rate in failure memory space surpasses default occupancy, then stop logic addressing, situation about breaking down to this internal memory of user report are simultaneously carried out in non-failure memory space.
Further, this device also comprises:
The 3rd reporting modules is used for beginning successively each internal storage location in described operating system space is detected from first internal storage location in the operating system space of this internal memory; If detect the failure memory unit, then stop to obtain the physical address information in the failure memory space in the application program running space, simultaneously situation about breaking down to this internal memory of user report.
In embodiments of the present invention, first internal storage location from the application program running space begins to detect, when detecting the failure memory unit, obtain the physical address information in failure memory space and be stored in the memory failure information table according to the failure memory unit, mark failure memory space in the application program running space according to the memory failure information table, the failure memory space of logic addressing from realized the isolates application running space carried out in other unlabelled non-failure memory spaces, so, when having the internal storage location of many bits inefficacies in the application program running space, also can eliminate the fault of internal memory, ensure that operating system and application program normally move.
Need to prove: a kind of device of memory failure of eliminating that the foregoing description provides is when eliminating memory failure, only the division with above-mentioned each functional module is illustrated, in the practical application, can as required the above-mentioned functions distribution be finished by different functional modules, the inner structure that is about to device is divided into different functional modules, to finish all or part of function described above.In addition, the foregoing description provides the device of eliminating memory failure and the method embodiment that eliminates memory failure to belong to same design, and its specific implementation process sees method embodiment for details, repeats no more here.
The all or part of step that one of ordinary skill in the art will appreciate that realization the foregoing description can be finished by hardware, also can instruct relevant hardware to finish by program, described program can be stored in a kind of computer-readable recording medium, the above-mentioned storage medium of mentioning can be a ROM (read-only memory), disk or CD etc.
The above only is preferred embodiment of the present invention, and is in order to restriction the present invention, within the spirit and principles in the present invention not all, any modification of being done, is equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (14)
1. a method of eliminating memory failure is characterized in that, described method comprises:
Obtain the physical address information in the failure memory space in the application program running space of internal memory;
According to the physical address information in described failure memory space, isolate the failure memory space in the described application program running space.
2. the method for claim 1 is characterized in that, the physical address information in the failure memory space in the described application program running space that obtains internal memory comprises:
Begin successively each internal storage location the described application program running space to be detected from first internal storage location of described application program running space;
When detecting the failure memory unit, begin to scan backward the memory headroom of default size from described failure memory unit, described failure memory unit and memory headroom are formed the failure memory space and read the physical address information in described failure memory space.
3. the method for claim 1 is characterized in that, according to the physical address information in described failure memory space, isolates the failure memory space in the described application program running space, comprising:
According to the physical address information in described failure memory space, in described application program running space, mark corresponding failure memory space;
Each internal storage location in the unlabelled non-failure memory space in the described application program running space is carried out the logical address that the logic addressing obtains each internal storage location.
4. method as claimed in claim 3 is characterized in that, isolates after the failure memory space in the described application program running space, also comprises:
According to the logical address of the internal storage location in the non-failure memory space of described application program running space, in the non-failure memory space of described application program running space, deposit and run application.
5. method as claimed in claim 3 is characterized in that, marks in described application program running space after the corresponding failure memory space, also comprises:
Add up the number in described failure memory space,, then stop logic addressing, situation about breaking down to the described internal memory of user report are simultaneously carried out in non-failure memory space if described number surpasses default number.
6. method as claimed in claim 3 is characterized in that, marks in described application program running space after the corresponding failure memory space, also comprises:
Add up the space size in described failure memory space, calculate the occupation rate in failure memory space according to the space size of described space size and described internal memory;
If the occupation rate in described failure memory space surpasses default occupancy, then stop logic addressing, situation about breaking down to the described internal memory of user report are simultaneously carried out in described non-failure memory space.
7. as the described method of each claim of claim 1-6, it is characterized in that, before the physical address information in the failure memory space in the described application program running space that obtains internal memory, also comprise:
Begin successively each internal storage location the described operating system space to be detected from first internal storage location in the operating system space of described internal memory;
If detect the failure memory unit, then stop to obtain the physical address information in the failure memory space in the described application program running space, simultaneously situation about breaking down to the described internal memory of user report.
8. a device of eliminating memory failure is characterized in that, described device comprises:
Acquisition module is used for obtaining the physical address information in failure memory space of the application program running space of internal memory;
Isolation module is used for the physical address information according to described failure memory space, isolates the failure memory space in the described application program running space.
9. device as claimed in claim 8 is characterized in that, described acquisition module comprises:
Detecting unit is used for beginning successively each internal storage location of described application program running space is detected from first internal storage location of described application program running space;
Scanning element, be used for when detecting the failure memory unit, begin to scan backward the memory headroom of default size from described failure memory unit, described failure memory unit and memory headroom are formed the failure memory space and read the physical address information in described failure memory space.
10. device as claimed in claim 8 is characterized in that, described isolation module comprises:
Indexing unit is used for the physical address information according to described failure memory space, marks corresponding failure memory space in described application program running space;
Addressed location is used for each internal storage location in the unlabelled non-failure memory of the described application program running space space is carried out the logical address that the logic addressing obtains each internal storage location.
11. device as claimed in claim 10 is characterized in that, described device also comprises:
Deposit the operation module, be used for logical address, in the non-failure memory space of described application program running space, deposit and run application according to the internal storage location in the non-failure memory space of described application program running space.
12. device as claimed in claim 10 is characterized in that, described device also comprises:
First reporting modules, the number that is used to add up described failure memory space if described number surpasses default number, then stops logic addressing, situation about breaking down to the described internal memory of user report are simultaneously carried out in non-failure memory space.
13. device as claimed in claim 10 is characterized in that, described device also comprises:
Second reporting modules, the space size that is used to add up described failure memory space, space size big or small according to described space and described internal memory calculates the occupation rate in failure memory space; If the occupation rate in described failure memory space surpasses default occupancy, then stop logic addressing, situation about breaking down to the described internal memory of user report are simultaneously carried out in described non-failure memory space.
14., it is characterized in that described device also comprises as the described device of each claim of claim 8-13:
The 3rd reporting modules is used for beginning successively each internal storage location in described operating system space is detected from first internal storage location in the operating system space of described internal memory; If detect the failure memory unit, then stop to obtain the physical address information in the failure memory space in the described application program running space, simultaneously situation about breaking down to the described internal memory of user report.
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