CN102854195B - Method for detecting defect coordinates on color filter - Google Patents
Method for detecting defect coordinates on color filter Download PDFInfo
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- CN102854195B CN102854195B CN201210357215.XA CN201210357215A CN102854195B CN 102854195 B CN102854195 B CN 102854195B CN 201210357215 A CN201210357215 A CN 201210357215A CN 102854195 B CN102854195 B CN 102854195B
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- colored filter
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- mark
- color filter
- coordinate system
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Abstract
The invention discloses a method for detecting defect coordinates on a color filter and relates to the field of industry detection. The method comprises steps of capturing an image of the color filter; processing the image and obtaining a grey scale change critical point on the color filter; capturing a mark of the color filter or an edge of the color filter in accordance with the critical point; and determining a coordinate system of the color filter in accordance with the mark of the color filter or the edge of the color filter and outputting defect coordinates in accordance with the coordinate system. The method has the advantages that a process that a microscope is used for reading a mark is omitted, the coordinate system is established and defect coordinate data are output through image processing, the working period of devices is reduced, the detection efficiency is improved and the detection accuracy of defect coordinates is improved.
Description
Technical field
The present invention relates to industrial detection technical field, particularly the detection method of defect coordinate on a kind of colored filter.
Background technology
In prior art, detecting step for defect coordinate on colored filter is roughly as follows: when colored filter enters AOI(Automatic Optic Inspection, automated optical detection) after in equipment, there is microscope to move and read Mark(mark), identify Mark, establish coordinate system; TDI CCD(time delay integration charge coupled cell) again colored filter is scanned, by image, process and read with microscope the coordinate system that Mark establishes and mate, output defect coordinate.Fig. 1 is AOI equipment schematic diagram, and as shown in Figure 1, described AOI equipment 1 comprises: microscope and TDI CCD, and microscope is arranged on microscope portal frame 11, and TDI CCD is arranged on TDI CCD portal frame 12.
There is following defect in existing detection method: after colored filter enters in AOI equipment, first by microscope, move and read AOI Mark, by TDI CCD, carry out image scanning again, read AOI Mark and TDI CCD scanning and be divided into two steps, cause detecting step many, sense cycle is long, and causes the frequency of device fails to rise, and affects the stability of equipment; Microscope portal frame and TDI CCD portal frame belong to two different portal frames, between them, exist the error on coordinate, and the defect coordinate that TDI CCD exports is that to take the data that microscope calculates be basis, the error of defect coordinate will be very large like this, can not to defect, process exactly, affect the quality of product.
Summary of the invention
(1) technical matters that will solve
The technical problem to be solved in the present invention is: how the detection method of defect coordinate on a kind of colored filter is provided, to simplify detecting step, improves accuracy of detection.
(2) technical scheme
A detection method for defect coordinate on colored filter, it comprises step:
A: the image that catches colored filter;
B: described image is processed, obtained the critical point of gray scale variation on described colored filter;
C: capture mark on described colored filter or the edge of described colored filter according to described critical point;
D: determine the coordinate system of described colored filter according to the edge of the mark on described colored filter or described colored filter, according to described coordinate system output defect coordinate.
Wherein, in described steps A, by time delay integration charge coupled cell, catch the image of colored filter.
Wherein, described step B specifically comprises step:
B1: described image is synthesized;
B2: the image after synthetic is carried out to GTG processing, obtain the GTG value of each pixel on described colored filter;
B3: according to the situation of change of described GTG value, find the critical point of gray scale variation on described colored filter.
Wherein, described in be labeled as a plurality ofly, be cruciform, be separately positioned on the corner of described colored filter.
Wherein, after described step D, also comprise step e: repair apparatus is repaired described colored filter according to described defect coordinate.
(3) beneficial effect
On colored filter of the present invention, the detection method of defect coordinate has following advantage: omitted the step that microscope reads Mark, by image, process and set up coordinate system and export defect coordinate data, both reduced the work period of equipment, improve detection efficiency, improved again the accuracy of detection to defect coordinate; Avoided breaking down due to microscope or microscopical portal frame, and affected the situation of TDI CCD work, improved the stability of checkout equipment; The defect coordinate of being exported by checkout equipment is more accurate, thereby make the repair apparatus in downstream find out more accurately defective locations, repairs, and has promoted product quality.
Accompanying drawing explanation
Fig. 1 is AOI equipment schematic diagram;
Fig. 2 is the process flow diagram of the detection method of defect coordinate on colored filter described in the embodiment of the present invention;
Fig. 3 is the process flow diagram of described step B;
Fig. 4 is marked at the position view on colored filter described in being;
Fig. 5 is the corresponding critical point schematic diagram of described mark;
Fig. 6 is the schematic diagram of the described mark that captures according to critical point;
Fig. 7 is the edge schematic diagram of the described colored filter that captures according to critical point.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples are used for illustrating the present invention, but are not used for limiting the scope of the invention.
Fig. 2 is the process flow diagram of the detection method of defect coordinate on colored filter described in the embodiment of the present invention, and as shown in Figure 2, described method comprises step:
A: the image that catches colored filter.
In this step, catch the image of colored filter by time delay integration charge coupled cell (being TDI CCD), described image has higher resolution.TDI CCD is applicable to the object imaging to some high-speed mobile, its advantage be same scenery to the imaging of multirow linear array pixel signal plus, compare with common line array CCD (especially area array CCD) and reduced the unevenness that responds between pixel.
B: described image is processed, obtained the critical point of gray scale variation on described colored filter.
Fig. 3 is the process flow diagram of described step B, and as shown in Figure 3, described step B specifically comprises step:
B1: described image is synthesized.
Because colored filter is kept in motion, TDI original image that CCD catches can not reflect complete colored filter, therefore, need to first to described image, synthesize, to obtain reflecting the image of complete colored filter, so that subsequent treatment.
B2: the image after synthetic is carried out to GTG processing, obtain the GTG value of each pixel on described colored filter.
B3: according to the situation of change of described GTG value, find the critical point of gray scale variation on described colored filter.
GTG value represented pixel in image by the most secretly to the stratum level of different brightness the brightest, while comprising mark (being Mark) in image, can there is at the intersection of mark and background image the phenomenon of GTG value saltus step.In like manner, in the edge of described colored filter, also there will be the phenomenon of GTG value saltus step.The phenomenon of this GTG value saltus step is corresponding to the critical point of a series of gray scale variation, and can capture mark on described colored filter or the edge of described colored filter according to these critical points.
C: capture mark on described colored filter or the edge of described colored filter according to described critical point.
Fig. 4 is marked at the position view on colored filter described in being, as shown in Figure 4, in the present embodiment, described in be labeled as four, be cruciform, be separately positioned on the Si Ge corner of described colored filter.Described mark can be considered the needs of setting up coordinate system for the follow-up coordinate system of setting up described colored filter, and its quantity can also be 3,5 etc.
Fig. 5 is the corresponding critical point schematic diagram of described mark; Fig. 6 is the schematic diagram of the described mark that captures according to critical point.As shown in Figure 5 and Figure 6, according to the corresponding critical point of described mark, can clearly capture the mark on described colored filter, in obtaining the process of described mark, as classic method, not use microscope, thereby simplified treatment step, improved detection efficiency.
Fig. 7 is the edge schematic diagram of the described colored filter that captures according to critical point, and as shown in Figure 7, the principle based on identical with catching described mark, can catch the edge that obtains described colored filter.
D: determine the coordinate system of described colored filter according to the edge of the mark on described colored filter or described colored filter, according to described coordinate system output defect coordinate.
First with the described example that is labeled as, describe, referring to Fig. 4, according at least three marks in Fig. 4, can set up the rectangular coordinate system of a described colored filter of correspondence, and definite true origin.Such as, the center of lower left corner mark is denoted as to an O, the center of upper left corner mark is denoted as to a Y, the center of lower right corner mark is denoted as to an X, can setting up one, to take O point be initial point, and take O, X place straight line is x axle, take the rectangular coordinate system that O, Y place straight line be y axle, according to this rectangular coordinate system, can give a coordinate for each point on described colored filter, thus can be according to this rectangular coordinate system output defect coordinate.
When determining the coordinate system of described colored filter according to the edge of described colored filter, can select two orthogonal edges set up one with the similar rectangular coordinate system of above-mentioned rectangular coordinate system, such as, the intersection point of left side edge and lower edge of take is initial point, take left side edge place straight line as y axle, the lower edge place straight line of take is set up rectangular coordinate system as x axle, then according to this rectangular coordinate system, exports defect coordinate.
Because the edge of described colored filter might not standard, so the determined rectangular coordinate system in edge of comparing according to described colored filter according to the definite rectangular coordinate system of described mark has higher precision, resulting defect coordinate is also correspondingly more accurate.
After obtaining described defect coordinate, can adopt repair apparatus according to described defect coordinate, described colored filter to be repaired, to guarantee the reliable in quality of described colored filter.
Described in the embodiment of the present invention, on colored filter, the detection method of defect coordinate has following advantage: omitted the step that microscope reads Mark, by image, process and set up coordinate system and export defect coordinate data, both reduced the work period of equipment, improve detection efficiency, improved again the accuracy of detection to defect coordinate; Avoided breaking down due to microscope or microscopical portal frame, and affected the situation of TDI CCD work, improved the stability of checkout equipment; The defect coordinate of being exported by checkout equipment is more accurate, thereby make the repair apparatus in downstream find out more accurately defective locations, repairs, and has promoted product quality.
Above embodiment is only for illustrating the present invention; and be not limitation of the present invention; the those of ordinary skill in relevant technologies field; without departing from the spirit and scope of the present invention; can also make a variety of changes and modification; therefore all technical schemes that are equal to also belong to category of the present invention, and scope of patent protection of the present invention should be defined by the claims.
Claims (4)
1. a detection method for defect coordinate on colored filter, is characterized in that, comprises step:
A: the image that catches colored filter;
B: described image is processed, obtained the critical point of gray scale variation on described colored filter;
C: capture mark on described colored filter or the edge of described colored filter according to described critical point;
D: determine the coordinate system of described colored filter according to the edge of the mark on described colored filter or described colored filter, according to described coordinate system output defect coordinate;
Step B specifically comprises step:
B1: described image is synthesized;
B2: the image after synthetic is carried out to GTG processing, obtain the GTG value of each pixel on described colored filter;
B3: according to the situation of change of described GTG value, find the critical point of gray scale variation on described colored filter.
2. the method for claim 1, is characterized in that, in described steps A, catches the image of colored filter by time delay integration charge coupled cell.
3. the method for claim 1, is characterized in that, described in be labeled as a plurality ofly, be cruciform, be separately positioned on the corner of described colored filter.
4. the method for claim 1, is characterized in that, also comprises step e: repair apparatus is repaired described colored filter according to described defect coordinate after described step D.
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| CN201210357215.XA CN102854195B (en) | 2012-09-21 | 2012-09-21 | Method for detecting defect coordinates on color filter |
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| CN201210357215.XA CN102854195B (en) | 2012-09-21 | 2012-09-21 | Method for detecting defect coordinates on color filter |
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| CN102854195B true CN102854195B (en) | 2014-08-20 |
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Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104460104B (en) * | 2014-12-26 | 2017-07-21 | 深圳市华星光电技术有限公司 | The method for determining the edge of color filter block and the overlapping region of black matrix |
| CN104991391B (en) * | 2015-07-30 | 2018-01-30 | 武汉华星光电技术有限公司 | The restorative procedure of display panel |
| CN107024484B (en) * | 2017-02-28 | 2020-05-22 | 张家港康得新光电材料有限公司 | Display screen defect assessment device, maintenance method thereof and display screen to be detected |
| CN107727654B (en) * | 2017-09-29 | 2019-12-24 | 绵阳京东方光电科技有限公司 | Film detection method, device and system |
| CN109556831A (en) * | 2018-11-27 | 2019-04-02 | 惠科股份有限公司 | The detection method and its device and computer readable storage medium of colored filter |
| CN114965500A (en) * | 2022-05-18 | 2022-08-30 | 江苏道达智能科技有限公司 | AOI image detection device and detection method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4760247A (en) * | 1986-04-04 | 1988-07-26 | Bally Manufacturing Company | Optical card reader utilizing area image processing |
| CN1696746A (en) * | 2004-05-12 | 2005-11-16 | 统宝光电股份有限公司 | Method and device for repairing defect of color filter |
| CN101086537A (en) * | 2006-06-08 | 2007-12-12 | Icf科技有限公司 | Color filter detecting system |
| CN201984043U (en) * | 2011-03-23 | 2011-09-21 | 京东方科技集团股份有限公司 | Automatic optical inspection system |
| CN102520537A (en) * | 2011-12-02 | 2012-06-27 | 深圳市华星光电技术有限公司 | Automatic optical inspection method and automatic optical inspection equipment |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2938126B2 (en) * | 1990-04-06 | 1999-08-23 | 沖電気工業株式会社 | Color filter surface inspection device |
| US5642442A (en) * | 1995-04-10 | 1997-06-24 | United Parcel Services Of America, Inc. | Method for locating the position and orientation of a fiduciary mark |
| JP3675278B2 (en) * | 2000-02-15 | 2005-07-27 | セイコーエプソン株式会社 | Point defect detection apparatus and method |
-
2012
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4760247A (en) * | 1986-04-04 | 1988-07-26 | Bally Manufacturing Company | Optical card reader utilizing area image processing |
| CN1696746A (en) * | 2004-05-12 | 2005-11-16 | 统宝光电股份有限公司 | Method and device for repairing defect of color filter |
| CN101086537A (en) * | 2006-06-08 | 2007-12-12 | Icf科技有限公司 | Color filter detecting system |
| CN201984043U (en) * | 2011-03-23 | 2011-09-21 | 京东方科技集团股份有限公司 | Automatic optical inspection system |
| CN102520537A (en) * | 2011-12-02 | 2012-06-27 | 深圳市华星光电技术有限公司 | Automatic optical inspection method and automatic optical inspection equipment |
Non-Patent Citations (2)
| Title |
|---|
| JP平3-289544A 1991.12.19 |
| JP特開2001-228049A 2001.08.24 |
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