CN103116617A - Processing method of integrated circuit testing data - Google Patents
Processing method of integrated circuit testing data Download PDFInfo
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- CN103116617A CN103116617A CN2013100324453A CN201310032445A CN103116617A CN 103116617 A CN103116617 A CN 103116617A CN 2013100324453 A CN2013100324453 A CN 2013100324453A CN 201310032445 A CN201310032445 A CN 201310032445A CN 103116617 A CN103116617 A CN 103116617A
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Abstract
The invention discloses a processing method of integrated circuit testing data. Calculation and discretion of corresponding test item variation quantity are carried out on any two files according to appointed test items, vibration quantity limitation and limitation units. Two appointed files are searched automatically according to recorded parameters to generate a corresponding test item variation quantity aggregate report form of all devices, and the corresponding test item variation quantity aggregate report form is judged according to limitation value. If some items are not qualified, a non-qualified report form is automatically generated. According to the processing method of the integrated circuit testing data, working time is greatly shortened, accuracy of variation quantity calculation is improved, working efficiency is improved, and the problem that no corresponding data analyzing tool exists in the field of integrated circuit testing is solved.
Description
Technical field
The present invention relates to a kind of disposal route of integrated circuit test data, belong to the ic test technique field, be applicable to integrated circuit test data and record the mode of production.
Background technology
In high-grade integrated circuit production process, integrated circuit is at the unique sequence number of the complete rear acquisition of encapsulation, when the test link after various fail-tests or other required test link tests of carrying out, all the unique sequence number according to initial acquisition carries out data recording.The performance of integrated circuit is not only carried out the differentiation of performance by test data, simultaneously, the data variation amount also plays an important role for the differentiation of device performance.Solve the computational problem of any two batches of corresponding test event test number of test data variable quantities, can play to the differentiation of performance of integrated circuits further confirmation effect.
Early stage integrated circuit (IC) design small scale, test event is few, every batch of devices quantity is few, need the test event of contrast also only to have one, under this condition, usually manually carry out Data Comparison: according to seeking identical test event in two parts of receipts of device serial number before and after experiment, extract two numerical value, manually calculate variable quantity, then according to the variable quantity limit of product manual, judge that variable quantity is whether in scope.
Along with the development of integrated circuit technique, the integrated circuit scale is increasing, and pin is more and more, test event is also abundant gradually, batch of devices quantity also becomes geometric ways to increase, and in this case, re-uses artificial data extraction, calculating, differentiation workload and also is prone to mistake in the time of large.
It is at present domestic that use more integrated circuit tester in the integrated circuit testing field be mainly the equipment of the companies such as ADVANTEST company, Teradyne.The ultra-large digital-analog mixing test instrument of the J750 of Teradyne company is abundant due to its resource distribution, can realize the requirement of " zero takes up an area ", and enterprise is widely used in integrated circuit (IC) design, research and development, test.J750 can generate the formatted file of being convenient to the lot data statistics, has the function of carrying out the lot data statistics, but there is no corresponding solution instrument for extraction, comparison, the variable quantity calculating of two one data file same test project datas.
Summary of the invention
Technology of the present invention is dealt with problems and is: overcome the deficiencies in the prior art, a kind of disposal route of integrated circuit test data is provided, solve in integrated circuit production process, in the time of need to carrying out the calculating of test event variable quantity, artificial extract data and calculate variable quantity efficient low, easily make mistakes, integrated circuit testing equipment does not possess and carries out the problem that these type of data are processed simultaneously.
Technical solution of the present invention is:
A kind of disposal route of integrated circuit test data comprises the following steps:
(1) integrated circuit (IC) chip of to be measured batch is carried out N test according to the device number of each integrated circuit (IC) chip, generate N test data file, N is that positive integer and N are more than or equal to 2;
(2) needs are carried out the test data file that data extract filename, carry out test event, variable quantity ultimate value and limit unit's disposable recording that variable quantity calculates in the first temporary file;
(3) carry out according to the needs in described the first temporary file two test data files that a plurality of test data files that test data file that data extract generates find correspondence in step (1), in the test data file of these two correspondences, carry out the test event of variable quantity calculating according to the needs in the first temporary file and carry out respectively data search, target data is extracted;
(4) target data in two test data files that extract in step (3) is carried out the conversion of test data unit according to the limit unit in described the first temporary file, generate the test data of uniform units and be kept at respectively in the second temporary file and the 3rd temporary file;
(5) data under the same test project under identity unit in described the second temporary file and the 3rd temporary file number are carried out variable quantity and calculate, variable quantity result of calculation is write the 4th temporary file;
(6) the variable quantity ultimate value in described the first temporary file and the variable quantity result of calculation in the 4th temporary file are compared, if the variable quantity result of calculation in the 4th temporary file less than or equal to the variable quantity ultimate value in described the first temporary file, stores itself the corresponding device number of this variable quantity result of calculation, test data and variable quantity result of calculation in total reporting instrument;
If the variable quantity result of calculation of the 4th temporary file is greater than the variable quantity ultimate value in described the first temporary file, the corresponding device number of this variable quantity result of calculation, test data and variable quantity result of calculation itself are stored simultaneously into total reporting instrument and do not pass through the project reporting instrument, and writing sign F after corresponding variable quantity result of calculation in total reporting instrument.
The file that described needs carry out the test data file of data extraction is called 2.
In described step (1), each integrated circuit (IC) chip comprises at most the test data result one time in same test data file.
Described step (5) is carried out variable quantity with the data under the same test project under identity unit in described the second temporary file and the 3rd temporary file number and is calculated, be specially: first the data under the same test project under identity unit in described the second temporary file and the 3rd temporary file number are asked poor and calculate, then take absolute value.
The present invention's beneficial effect compared with prior art is:
(1) required all parameters in data handling procedure of the present invention, comprise the test data file name, carry out test event that variable quantity calculates, variable quantity ultimate value, variable quantity limit unit, carry out disposable recording when initial, automatically carry out extraction, calculating, the differentiation of all kinds of test datas in transfer process, do not need again to carry out manual intervention, disposable whole tasks of completing variable quantity calculating and differentiating have good operability.
(2) the present invention adopts the mode of automatically carrying out fully for numerical value extraction, variable quantity calculating, the ultimate value judgement of test event, easily produce mistake when having avoided manually-operated, alleviated labor workload, shorten the working time, improved simultaneously stability and accuracy that variable quantity calculates;
(3) the present invention's variable quantity account form of carrying out, not only for twice test data before and after a certain test, can use simultaneously any two parts of test datas in repeatedly test to calculate, so long as the same test event of same device, just can carry out data extraction, variable quantity calculating, have versatility.
(4) the present invention generates the report form automatically for net result, specified test item for every device all has variable quantity accurately, if the test event over the variable quantity ultimate value is arranged simultaneously, also can generate separately in addition portion not by the project reporting instrument, be convenient to the post analysis of data, increase work efficiency.
(5) the invention solves the problem that the integrated circuit testing field does not have data variation amount computational tool, computational data variable quantity quickly and accurately.
Description of drawings
Fig. 1 is the process schematic diagram that this method generates the first temporary file.
Fig. 2 is this method is sought corresponding device number in two one data file process schematic diagram.
Fig. 3 is the process schematic diagram that this method is extracted each device detection project testing numerical value.
Fig. 4 is that this method is carried out the process schematic diagram that variable quantity calculated, differentiates and generated consolidated statement and do not pass through the project reporting instrument.
Embodiment
The invention provides a kind of method that can realize extracting corresponding test event data in different test data files and calculate variable quantity, particularly for the actual demand under the different test of same device link, can carry out the extraction of multiple types test item destination data and variable quantity calculates, and carry out by whether judgement according to the ultimate value that arranges, belong to the ic test technique field, be applicable to integrated circuit test data and record the mode of production.The method is extracted the test item data that require in the data file of appointment according to the integrated circuit device piece number, calculate variable quantity, differentiate the limit.
The step of the inventive method is as follows:
A kind of disposal route of integrated circuit test data is characterized in that comprising the following steps:
(1) integrated circuit (IC) chip of to be measured batch is carried out N test according to the device number of each integrated circuit (IC) chip, generate N test data file, N is that positive integer and N are more than or equal to 2; Each integrated circuit (IC) chip comprises at most the test data result one time in same test data file.
(2) according to shown in Figure 1, be implemented in memory location in computing machine according to this method, obtain current Computer Storage path.All temporary files and net result file will produce under this catalogue.In the first temporary file, all variablees are composed initial value NULL.With needs carry out the test data file that data extract filename, carry out test event, variable quantity ultimate value and limit unit's disposable recording that variable quantity calculates in the first temporary file; The file that described needs carry out the test data file of data extraction is called 2.If this method of withdrawing from is deleted the first temporary file.
(3) according to Fig. 2, carry out according to the needs in described the first temporary file two test data files that a plurality of test data files that test data file name that data extract generates find correspondence in step (1), in the test data file of these two correspondences, carry out the test event of variable quantity calculating according to the needs in the first temporary file and carry out respectively data search, target data is extracted.Be specially at first file 2 by line search device number key word " Device ".Find in file 2 after first device number, carry out the search of identity unit number in file 1.Because in the file 2 after test, number of devices can be less than the number of devices in file 1 usually, so begin search from file 2.According to device number, the numerical value of the test event of appointment in extraction step (1) from file 1,2 respectively.
(4) according to Fig. 3, target data in two test data files that extract in step (3) is carried out the conversion of test data unit according to the limit unit in described the first temporary file, generate the test data of uniform units and be kept at respectively in the second temporary file and the 3rd temporary file;
(5) according to Fig. 4, the data under the same test project under identity unit in described the second temporary file and the 3rd temporary file number are carried out variable quantity calculate, variable quantity result of calculation is write the 4th temporary file; Be specially: first the data under the same test project under identity unit in described the second temporary file and the 3rd temporary file number are asked poor and calculate, then take absolute value, deposit afterwards the 4th temporary file in.
(6) the variable quantity result of calculation with the 4th temporary file in the variable quantity ultimate value in described the first temporary file and step (5) compares, if the variable quantity result of calculation of the 4th temporary file less than or equal to the variable quantity ultimate value in described the first temporary file, stores itself the corresponding device number of this variable quantity result of calculation, test data and variable quantity result of calculation in total reporting instrument;
If the variable quantity result of calculation of the 4th temporary file is greater than the variable quantity ultimate value in described the first temporary file, the corresponding device number of this variable quantity result of calculation, test data and variable quantity result of calculation itself are stored simultaneously into total reporting instrument and do not pass through the project reporting instrument, and writing sign F after corresponding variable quantity result of calculation in total reporting instrument.
After completing the data processing of all devices, delete all temporary files.
Below illustrate.
The variable quantity of device before and after certain test link requires:
| Parameter | Symbol | The variable quantity limit |
| Quiescent power supply current in semiconductor integrated circuit | I CCH | ±150nA |
Step 1: generate two parts of test data file LQ1.dat and LH2.dat.
Test data LQ1.dat before test:
Test data LH2.dat after test
Step 2:
Record following information in the first temporary file.
Data file 1 title: LQ1.dat;
Data file 2 titles: LH2.dat.
Variable quantity is differentiated project: ICCH VDD;
Ultimate value: 150;
Ultimate value unit: nA.
Generate the first all kinds of parameter values of temporary file storage:
Key_Lhq_File_Name=LQ1.dat
Key_Lhh_File_Name=LH2.dat
Key_IDD1_MatchWord=ICCH?VDD
Key_IDD1_PrintWord=ICCH
Key_IDD1_Limit=150
Key_IDD1_Unit=na
Step 3:
Find first device number " 1201 " in LH2.dat, also find afterwards device number 1201 in LQ1.dat.The test data that to extract in two parts of files No. 1201 test events be " ICCH VDD ".Extract successively afterwards all device number test events and be the test data of " ICCH VDD "
Step 4: because test value unit is consistent with variable quantity limit unit, so do not need to change, directly carry out record here.Generate the second temporary file and the 3rd temporary file, store respectively the test event numerical value that extracts from file 1 and file 2.
Content in temporary file 2:
Device：1201
ICCH?VDD275.3859
Device：1203
ICCH?VDD256.4772
Content in temporary file 3:
Device：1201
ICCH?VDD284.3395
Device：1203
ICCH?VDD503.6563
Step 5:
Variable quantity calculates, and is stored in content in temporary file 4:
Device：1201
8.9536
Device：1203
247.1791
Step 6:
Judge according to ultimate value, meet the requirements for No. 1201 as can be known, exceed the variable quantity ultimate value No. 1203, finally generate two files, total reporting instrument comprises all changes amount data:
Device：1201
Can see, the test result before and after the test of No. 1203 devices is all in scope, but variable quantity has surpassed ultimate value, prints sign " F " after 1203 data variation amount.
Generate in addition a Bao Wei and pass through the project reporting instrument:
。
Claims (4)
1. the disposal route of an integrated circuit test data is characterized in that comprising the following steps:
(1) integrated circuit (IC) chip of to be measured batch is carried out N test according to the device number of each integrated circuit (IC) chip, generate N test data file, N is that positive integer and N are more than or equal to 2;
(2) needs are carried out the test data file that data extract filename, carry out test event, variable quantity ultimate value and limit unit's disposable recording that variable quantity calculates in the first temporary file;
(3) carry out according to the needs in described the first temporary file two test data files that a plurality of test data files that test data file that data extract generates find correspondence in step (1), in the test data file of these two correspondences, carry out the test event of variable quantity calculating according to the needs in the first temporary file and carry out respectively data search, target data is extracted;
(4) target data in two test data files that extract in step (3) is carried out the conversion of test data unit according to the limit unit in described the first temporary file, generate the test data of uniform units and be kept at respectively in the second temporary file and the 3rd temporary file;
(5) data under the same test project under identity unit in described the second temporary file and the 3rd temporary file number are carried out variable quantity and calculate, variable quantity result of calculation is write the 4th temporary file;
(6) the variable quantity ultimate value in described the first temporary file and the variable quantity result of calculation in the 4th temporary file are compared, if the variable quantity result of calculation in the 4th temporary file less than or equal to the variable quantity ultimate value in described the first temporary file, stores itself the corresponding device number of this variable quantity result of calculation, test data and variable quantity result of calculation in total reporting instrument;
If the variable quantity result of calculation of the 4th temporary file is greater than the variable quantity ultimate value in described the first temporary file, the corresponding device number of this variable quantity result of calculation, test data and variable quantity result of calculation itself are stored simultaneously into total reporting instrument and do not pass through the project reporting instrument, and writing sign F after corresponding variable quantity result of calculation in total reporting instrument.
2. the disposal route of a kind of integrated circuit test data according to claim 1 is characterized in that: described needs carry out 2 by name of the file of the test data file that data extract.
3. the disposal route of a kind of integrated circuit test data according to claim 1, it is characterized in that: in described step (1), each integrated circuit (IC) chip comprises at most the test data result one time in same test data file.
4. the disposal route of a kind of integrated circuit test data according to claim 1, it is characterized in that: described step (5) is carried out variable quantity with the data under the same test project under identity unit in described the second temporary file and the 3rd temporary file number and is calculated, be specially: first the data under the same test project under identity unit in described the second temporary file and the 3rd temporary file number are asked poor and calculate, then take absolute value.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106653092A (en) * | 2017-01-05 | 2017-05-10 | 上海剑桥科技股份有限公司 | Processing method and processing system of DDR (Double Data Rate) test waveform data file |
| CN110750951A (en) * | 2019-10-15 | 2020-02-04 | 四川豪威尔信息科技有限公司 | Method for processing integrated circuit layout data |
| CN110927587A (en) * | 2019-12-06 | 2020-03-27 | 天津市捷威动力工业有限公司 | Method and device for generating battery pack charge and discharge test report |
| CN111856249A (en) * | 2020-07-24 | 2020-10-30 | 安测半导体技术(江苏)有限公司 | Chip test monitoring method, client and system |
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| US5910895A (en) * | 1997-06-13 | 1999-06-08 | Teradyne, Inc. | Low cost, easy to use automatic test system software |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106653092A (en) * | 2017-01-05 | 2017-05-10 | 上海剑桥科技股份有限公司 | Processing method and processing system of DDR (Double Data Rate) test waveform data file |
| CN110750951A (en) * | 2019-10-15 | 2020-02-04 | 四川豪威尔信息科技有限公司 | Method for processing integrated circuit layout data |
| CN110927587A (en) * | 2019-12-06 | 2020-03-27 | 天津市捷威动力工业有限公司 | Method and device for generating battery pack charge and discharge test report |
| CN110927587B (en) * | 2019-12-06 | 2022-02-25 | 天津市捷威动力工业有限公司 | Method and device for generating battery pack charge and discharge test report |
| CN111856249A (en) * | 2020-07-24 | 2020-10-30 | 安测半导体技术(江苏)有限公司 | Chip test monitoring method, client and system |
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