CN103116617B - A kind of disposal route of integrated circuit test data - Google Patents
A kind of disposal route of integrated circuit test data Download PDFInfo
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- CN103116617B CN103116617B CN201310032445.3A CN201310032445A CN103116617B CN 103116617 B CN103116617 B CN 103116617B CN 201310032445 A CN201310032445 A CN 201310032445A CN 103116617 B CN103116617 B CN 103116617B
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Abstract
A disposal route for integrated circuit test data, carries out corresponding test event variable quantity according to the test event of specifying, the variable quantity limit and limit unit to any two parts of files and calculates, differentiates.According to the parameters value of record, automatically search in two parts of files of specifying, generate the total reporting instrument of all devices corresponding test event variable quantity, and judge according to ultimate value; If have not by project, automatically generate not by project reporting instrument.The present invention highly shortened the working time, improves the accuracy that variable quantity calculates, improves work efficiency, and solve the problem that this area does not have corresponding data analysis tool.
Description
Technical field
The present invention relates to a kind of disposal route of integrated circuit test data, belong to ic test technique field, be applicable to the integrated circuit test data record mode of production.
Background technology
In high-grade integrated circuit production process, integrated circuit obtains unique sequence number after encapsulation, when test link after various fail-test or the test link of carrying out needed for other are tested, all carry out data record according to the initial unique sequence numbers obtained.The performance of integrated circuit does not carry out the differentiation of performance by means of only test data, meanwhile, data variation amount also plays an important role for the differentiation of device performance.Solve the computational problem of any two batches of test data corresponding test event test number variable quantities, further confirmation effect can be played to the differentiation of performance of integrated circuits.
Early stage integrated circuit (IC) design small scale, test event is few, every batch of devices quantity is few, need contrast test event also only have one, under this condition, usually manually carry out Data Comparison: according to device serial number on pretreatment after two parts of receipts in find identical test event, extract two numerical value, manually calculate variable quantity, then according to the variable quantity limit of product manual, judge variable quantity whether in scope.
Along with the development of integrated circuit technique, footprint is increasing, and pin gets more and more, test event is also enriched gradually, batch of devices quantity also becomes geometric ways to increase, and in this case, re-uses artificial data and extracts, calculates, differentiates that workload also easily occurs mistake while large.
The domestic equipment using the more integrated circuit tester mainly company such as ADVANTEST company, Teradyne in integrated circuit testing field at present.The ultra-large digital-analog mixing test instrument of J750 of Teradyne company enriches due to its resource distribution, can realize the requirement of " zero takes up an area ", widely use in integrated circuit (IC) design, research and development, test enterprise.J750 can generate the formatted file being convenient to lot data statistics, has the function of carrying out lot data statistics, but calculates then do not solve instrument accordingly for the extraction of two parts of data file same test project datas, comparison, variable quantity.
Summary of the invention
Technology of the present invention is dealt with problems and is: overcome the deficiencies in the prior art, provide a kind of disposal route of integrated circuit test data, solve in integrated circuit production process, when needing to carry out the calculating of test event variable quantity, artificial extraction data and calculate variable quantity efficiency low, easily make mistakes, simultaneously integrated circuit test device does not possess the problem of carrying out this type of data processing.
Technical solution of the present invention is:
A disposal route for integrated circuit test data, comprises the following steps:
(1) carry out N test to the integrated circuit (IC) chip of to be measured batch according to the device number of each integrated circuit (IC) chip, generate N number of test data file, N is positive integer and N is more than or equal to 2;
(2) will need the filename of the test data file carrying out data extraction, the test event of carrying out variable quantity calculating, variable quantity ultimate value and limit unit disposable recording in the first temporary file;
(3) multiple test data files that the test data file carrying out data extraction according to needing in described first temporary file generates in step (1) find two corresponding test data files, in these two corresponding test data files, the test event of carrying out variable quantity calculating according to needing in the first temporary file carries out data search respectively, target data is extracted;
(4) target data in two test data files extracted in step (3) is carried out the conversion of test data unit according to the limit unit in described first temporary file, generate the test data of uniform units and be kept in the second temporary file and the 3rd temporary file respectively;
(5) data under the same test project under identity unit in described second temporary file and the 3rd temporary file number are carried out variable quantity calculating, by variable quantity result of calculation write the 4th temporary file;
(6) the variable quantity result of calculation in the variable quantity ultimate value in described first temporary file and the 4th temporary file is compared, if the variable quantity result of calculation in the 4th temporary file is less than or equal to the variable quantity ultimate value in described first temporary file, then device number, test data and variable quantity result of calculation corresponding to this variable quantity result of calculation itself are stored in total reporting instrument;
If the variable quantity result of calculation of the 4th temporary file is greater than the variable quantity ultimate value in described first temporary file, then device number, test data and the variable quantity result of calculation corresponding to this variable quantity result of calculation itself is stored into total reporting instrument simultaneously and not by project reporting instrument, and in total reporting instrument write mark F after corresponding variable quantity result of calculation.
Described 2 by name of the file needing the test data file carrying out data extraction.
In described step (1), each integrated circuit (IC) chip comprises at most a test data result in same test data file.
Data under same test project under identity unit in described second temporary file and the 3rd temporary file number are carried out variable quantity calculating by described step (5), be specially: first the data under the same test project under identity unit in described second temporary file and the 3rd temporary file number are carried out asking difference to calculate, then take absolute value.
The present invention's beneficial effect is compared with prior art:
(1) required in data handling procedure of the present invention all parameters, comprise test data file name, the test event of carrying out variable quantity calculating, variable quantity ultimate value, variable quantity limit unit, disposable recording is carried out when initial, automatically the extraction of all kinds of test data, calculating, differentiation is carried out in transfer process, do not need again to carry out manual intervention, the disposable whole tasks completing variable quantity and calculate and differentiate, have good operability.
(2) the present invention extracts for the numerical value of test event, variable quantity calculates, ultimate value judges to adopt the mode of automatically carrying out completely, easily mistake is produced when avoiding manual operation, alleviate labor workload, shorten the working time, improve stability and the accuracy of variable quantity calculating simultaneously;
(3) the present invention's variable quantity account form of carrying out, not only for twice test data before and after a certain test, any two parts of test datas in repeatedly test can be used to calculate simultaneously, as long as the same test event of same device, just can carry out data extraction, variable quantity calculates, there is versatility.
(4) the present invention generates report form automatically for net result, variable quantity accurately is all had for test item specified by every device, if have the test event exceeding variable quantity ultimate value simultaneously, also can generate separately portion in addition not by project reporting instrument, be convenient to the post analysis of data, increase work efficiency.
(5) the invention solves the problem that integrated circuit testing field does not have data variation amount computational tool, data variation amount can be calculated quickly and accurately.
Accompanying drawing explanation
Fig. 1 is the process schematic that this method generates the first temporary file.
Fig. 2 is the process schematic that this method finds corresponding device number in two parts of data files.
Fig. 3 is the process schematic that this method extracts each device detection project testing numerical value.
Fig. 4 is that this method is carried out variable quantity calculating, differentiation and generates consolidated statement and not by the process schematic of project reporting instrument.
Embodiment
The invention provides and a kind ofly can realize extracting corresponding test event data in different test data file and calculate the method for variable quantity, particularly for the actual demand under same device difference test link, multiple types test item destination data can be carried out extract and variable quantity calculating, and carry out by whether judgement according to the ultimate value arranged, belong to ic test technique field, be applicable to the integrated circuit test data record mode of production.The method extracts the test item data required in the data file of specifying according to integrated circuit device piece number, calculate variable quantity, differentiate the limit.
The step of the inventive method is as follows:
A disposal route for integrated circuit test data, is characterized in that comprising the following steps:
(1) carry out N test to the integrated circuit (IC) chip of to be measured batch according to the device number of each integrated circuit (IC) chip, generate N number of test data file, N is positive integer and N is more than or equal to 2; Each integrated circuit (IC) chip comprises at most a test data result in same test data file.
(2) according to shown in Fig. 1, according to the memory location that this method is implemented in computing machine, current Computer Storage path is obtained.All temporary files and net result file will produce under this catalogue.In first temporary file, all variablees compose initial value NULL.To need the filename of the test data file carrying out data extraction, the test event of carrying out variable quantity calculating, variable quantity ultimate value and limit unit disposable recording in the first temporary file; Described 2 by name of the file needing the test data file carrying out data extraction.If this method of exiting, then delete the first temporary file.
(3) according to Fig. 2, multiple test data files that the test data file name of carrying out data extraction according to needing in described first temporary file generates in step (1) find two corresponding test data files, in these two corresponding test data files, the test event of carrying out variable quantity calculating according to needing in the first temporary file carries out data search respectively, target data is extracted.Be specially first to file 2 searcher piece number key word " Device " by row.Find in file 2 after first device number, in file 1, carry out the search of identity unit number.Because number of devices can be less than the number of devices in file 1 usually in the file 2 after test, so search for from file 2.According to device number, the numerical value of the test event of specifying in extraction step (1) from file 1,2 respectively.
(4) according to Fig. 3, target data in two test data files extracted in step (3) is carried out the conversion of test data unit according to the limit unit in described first temporary file, generate the test data of uniform units and be kept in the second temporary file and the 3rd temporary file respectively;
(5) according to Fig. 4, the data under the same test project under identity unit in described second temporary file and the 3rd temporary file number are carried out variable quantity calculating, by variable quantity result of calculation write the 4th temporary file; Be specially: first the data under the same test project under identity unit in described second temporary file and the 3rd temporary file number are carried out asking difference to calculate, then take absolute value, afterwards stored in the 4th temporary file.
(6) the variable quantity result of calculation of the 4th temporary file in the variable quantity ultimate value in described first temporary file and step (5) is compared, if the variable quantity result of calculation of the 4th temporary file is less than or equal to the variable quantity ultimate value in described first temporary file, then device number, test data and variable quantity result of calculation corresponding to this variable quantity result of calculation itself are stored in total reporting instrument;
If the variable quantity result of calculation of the 4th temporary file is greater than the variable quantity ultimate value in described first temporary file, then device number, test data and the variable quantity result of calculation corresponding to this variable quantity result of calculation itself is stored into total reporting instrument simultaneously and not by project reporting instrument, and in total reporting instrument write mark F after corresponding variable quantity result of calculation.
After completing the data processing of all devices, delete all temporary files.
Below illustrate.
The variable quantity of device before and after certain test link requires:
| Parameter | Symbol | The variable quantity limit |
| Quiescent power supply current in semiconductor integrated circuit | I CCH | ±150nA |
Step 1: generate two parts of test data file LQ1.dat and LH2.dat.
Test data LQ1.dat before test:
Test data LH2.dat after test
Step 2:
Record following information in the first temporary file.
Data file 1 title: LQ1.dat;
Data file 2 title: LH2.dat.
Variable quantity differentiates project: ICCHVDD;
Ultimate value: 150;
Ultimate value unit: nA.
Generate the first temporary file and store all kinds of parameter value:
Key_Lhq_File_Name=LQ1.dat
Key_Lhh_File_Name=LH2.dat
Key_IDD1_MatchWord=ICCHVDD
Key_IDD1_PrintWord=ICCH
Key_IDD1_Limit=150
Key_IDD1_Unit=na
Step 3:
In LH2.dat, find first device number " 1201 ", in LQ1.dat, also find device number 1201 afterwards.To extract in two parts of files the test data that No. 1201 test events are " ICCHVDD ".Extract the test data that all device number test events are " ICCHVDD " afterwards successively
Step 4: because test value unit is consistent with variable quantity limit unit, so do not need conversion here, directly carry out record.Generate the second temporary file and the 3rd temporary file, store the test event numerical value extracted from file 1 and file 2 respectively.
Content in temporary file 2:
Device：1201
ICCHVDD275.3859
Device：1203
ICCHVDD256.4772
Content in temporary file 3:
Device：1201
ICCHVDD284.3395
Device：1203
ICCHVDD503.6563
Step 5:
Variable quantity calculates, and is stored in content in temporary file 4:
Device：1201
8.9536
Device：1203
247.1791
Step 6:
Judge according to ultimate value, known No. 1201 meet the requirements, and No. 1203 exceed variable quantity ultimate value, final generation two files, and total reporting instrument comprises all changes amount data:
Device：1201
Can see, the test result before and after No. 1203 device tests is all in scope, but variable quantity has exceeded ultimate value, after the data variation amount of 1203, print mark " F ".
Generate a Bao Wei in addition by project reporting instrument:
。
Claims (2)
1. a disposal route for integrated circuit test data, is characterized in that comprising the following steps:
(1) carry out N test to the integrated circuit (IC) chip of to be measured batch according to the device number of each integrated circuit (IC) chip, generate N number of test data file, N is positive integer and N is more than or equal to 2;
(2) will need the filename of the test data file carrying out data extraction, the test event of carrying out variable quantity calculating, variable quantity ultimate value and limit unit disposable recording in the first temporary file;
(3) multiple test data files that the test data file carrying out data extraction according to needing in described first temporary file generates in step (1) find two corresponding test data files, in these two corresponding test data files, the test event of carrying out variable quantity calculating according to needing in the first temporary file carries out data search respectively, target data is extracted;
(4) target data in two test data files extracted in step (3) is carried out the conversion of test data unit according to the limit unit in described first temporary file, generate the test data of uniform units and be kept in the second temporary file and the 3rd temporary file respectively;
(5) data under the same test project under identity unit in described second temporary file and the 3rd temporary file number are carried out variable quantity calculating, by variable quantity result of calculation write the 4th temporary file;
(6) the variable quantity result of calculation in the variable quantity ultimate value in described first temporary file and the 4th temporary file is compared, if the variable quantity result of calculation in the 4th temporary file is less than or equal to the variable quantity ultimate value in described first temporary file, then device number, test data and variable quantity result of calculation corresponding to this variable quantity result of calculation itself are stored in total reporting instrument;
If the variable quantity result of calculation of the 4th temporary file is greater than the variable quantity ultimate value in described first temporary file, then device number, test data and the variable quantity result of calculation corresponding to this variable quantity result of calculation itself is stored into total reporting instrument simultaneously and not by project reporting instrument, and in total reporting instrument write mark F after corresponding variable quantity result of calculation; Described 2 by name of the file needing the test data file carrying out data extraction;
In described step (1), each integrated circuit (IC) chip comprises at most a test data result in same test data file.
2. the disposal route of a kind of integrated circuit test data according to claim 1, it is characterized in that: the data under the same test project under identity unit in described second temporary file and the 3rd temporary file number are carried out variable quantity calculating by described step (5), be specially: first the data under the same test project under identity unit in described second temporary file and the 3rd temporary file number are carried out asking difference to calculate, then take absolute value.
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| CN106653092A (en) * | 2017-01-05 | 2017-05-10 | 上海剑桥科技股份有限公司 | Processing method and processing system of DDR (Double Data Rate) test waveform data file |
| CN110750951A (en) * | 2019-10-15 | 2020-02-04 | 四川豪威尔信息科技有限公司 | Method for processing integrated circuit layout data |
| CN110927587B (en) * | 2019-12-06 | 2022-02-25 | 天津市捷威动力工业有限公司 | Method and device for generating battery pack charge and discharge test report |
| CN111856249B (en) * | 2020-07-24 | 2022-12-13 | 安测半导体技术(江苏)有限公司 | Chip test monitoring method, client and system |
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| US5910895A (en) * | 1997-06-13 | 1999-06-08 | Teradyne, Inc. | Low cost, easy to use automatic test system software |
| CN101364219A (en) * | 2007-08-06 | 2009-02-11 | 北京华大泰思特半导体检测技术有限公司 | Test data conversion method of integrate circuit-oriented test |
| CN101739408A (en) * | 2008-11-18 | 2010-06-16 | 和舰科技(苏州)有限公司 | Semiconductor test data-based data processing method |
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|---|---|---|---|---|
| US5910895A (en) * | 1997-06-13 | 1999-06-08 | Teradyne, Inc. | Low cost, easy to use automatic test system software |
| CN101364219A (en) * | 2007-08-06 | 2009-02-11 | 北京华大泰思特半导体检测技术有限公司 | Test data conversion method of integrate circuit-oriented test |
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