CN103424682A - 芯片测试装置及检测方法 - Google Patents

芯片测试装置及检测方法 Download PDF

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Publication number
CN103424682A
CN103424682A CN2012101523407A CN201210152340A CN103424682A CN 103424682 A CN103424682 A CN 103424682A CN 2012101523407 A CN2012101523407 A CN 2012101523407A CN 201210152340 A CN201210152340 A CN 201210152340A CN 103424682 A CN103424682 A CN 103424682A
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China
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chip
testing
detection tool
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electric energy
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CN2012101523407A
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Chinese (zh)
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张丞中
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Tekserve Corp
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Tekserve Corp
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Priority to CN2012101523407A priority Critical patent/CN103424682A/zh
Publication of CN103424682A publication Critical patent/CN103424682A/zh
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CN2012101523407A 2012-05-16 2012-05-16 芯片测试装置及检测方法 Pending CN103424682A (zh)

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CN2012101523407A CN103424682A (zh) 2012-05-16 2012-05-16 芯片测试装置及检测方法

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CN2012101523407A CN103424682A (zh) 2012-05-16 2012-05-16 芯片测试装置及检测方法

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105182217A (zh) * 2015-08-25 2015-12-23 东莞中之光电股份有限公司 一种测试编带机的芯片探测装置
TWI586212B (zh) * 2016-01-25 2017-06-01 酷碼科技股份有限公司 燈光控制模組、燈光模組與組裝框架裝置
CN112309488A (zh) * 2019-07-26 2021-02-02 第一检测有限公司 芯片测试方法
CN113835019A (zh) * 2021-11-25 2021-12-24 河北圣昊光电科技有限公司 一种芯片自动对位装置及对位方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05152406A (ja) * 1991-11-29 1993-06-18 Sharp Corp Ｉｃチツプ外観検査装置
JP2001153923A (ja) * 1999-11-30 2001-06-08 Nec Machinery Corp Ｉｃ試験装置
DE69529501D1 (de) * 1994-04-18 2003-03-06 Micron Technology Inc Verfahren und vorrichtung zum automatischen positionieren elektronischer würfel in bauteilverpackungen
JP2003232832A (ja) * 2002-02-12 2003-08-22 Organ Technics Kk Ｉｃ検査装置およびｉｃ検査方法
US6731127B2 (en) * 2001-12-21 2004-05-04 Texas Instruments Incorporated Parallel integrated circuit test apparatus and test method
CN2938125Y (zh) * 2006-01-16 2007-08-22 宏连国际科技股份有限公司 具整合体质测试与功能测试的芯片测试装置
US7501809B2 (en) * 2005-09-22 2009-03-10 King Yuan Electronics Co., Ltd. Electronic component handling and testing apparatus and method for electronic component handling and testing
CN101398457A (zh) * 2007-09-25 2009-04-01 奇景光电股份有限公司 晶片、其测试系统、其测试方法及其测试治具
US20110316577A1 (en) * 2009-03-25 2011-12-29 Aehr Test Systems System for testing an integrated circuit of a device and its method of use

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05152406A (ja) * 1991-11-29 1993-06-18 Sharp Corp Ｉｃチツプ外観検査装置
DE69529501D1 (de) * 1994-04-18 2003-03-06 Micron Technology Inc Verfahren und vorrichtung zum automatischen positionieren elektronischer würfel in bauteilverpackungen
JP2001153923A (ja) * 1999-11-30 2001-06-08 Nec Machinery Corp Ｉｃ試験装置
US6731127B2 (en) * 2001-12-21 2004-05-04 Texas Instruments Incorporated Parallel integrated circuit test apparatus and test method
JP2003232832A (ja) * 2002-02-12 2003-08-22 Organ Technics Kk Ｉｃ検査装置およびｉｃ検査方法
US7501809B2 (en) * 2005-09-22 2009-03-10 King Yuan Electronics Co., Ltd. Electronic component handling and testing apparatus and method for electronic component handling and testing
CN2938125Y (zh) * 2006-01-16 2007-08-22 宏连国际科技股份有限公司 具整合体质测试与功能测试的芯片测试装置
CN101398457A (zh) * 2007-09-25 2009-04-01 奇景光电股份有限公司 晶片、其测试系统、其测试方法及其测试治具
US20110316577A1 (en) * 2009-03-25 2011-12-29 Aehr Test Systems System for testing an integrated circuit of a device and its method of use

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105182217A (zh) * 2015-08-25 2015-12-23 东莞中之光电股份有限公司 一种测试编带机的芯片探测装置
CN105182217B (zh) * 2015-08-25 2017-11-07 东莞中之光电股份有限公司 一种测试编带机的芯片探测装置
TWI586212B (zh) * 2016-01-25 2017-06-01 酷碼科技股份有限公司 燈光控制模組、燈光模組與組裝框架裝置
CN112309488A (zh) * 2019-07-26 2021-02-02 第一检测有限公司 芯片测试方法
CN112309488B (zh) * 2019-07-26 2024-04-12 第一检测有限公司 芯片测试方法
CN113835019A (zh) * 2021-11-25 2021-12-24 河北圣昊光电科技有限公司 一种芯片自动对位装置及对位方法

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Application publication date: 20131204