CN105509889A - Light-splitting color photometer - Google Patents
Light-splitting color photometer Download PDFInfo
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- CN105509889A CN105509889A CN201610016723.XA CN201610016723A CN105509889A CN 105509889 A CN105509889 A CN 105509889A CN 201610016723 A CN201610016723 A CN 201610016723A CN 105509889 A CN105509889 A CN 105509889A
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- 238000005259 measurement Methods 0.000 claims abstract description 29
- 238000003384 imaging method Methods 0.000 claims abstract description 5
- 230000003287 optical effect Effects 0.000 claims description 33
- 238000005286 illumination Methods 0.000 claims description 13
- 238000000576 coating method Methods 0.000 claims description 11
- 238000002310 reflectometry Methods 0.000 claims description 11
- 239000011248 coating agent Substances 0.000 claims description 9
- 238000012360 testing method Methods 0.000 abstract description 22
- 239000003086 colorant Substances 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000003071 parasitic effect Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005755 formation reaction Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000001105 regulatory effect Effects 0.000 description 3
- 230000007812 deficiency Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004164 analytical calibration Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
Abstract
The invention discloses a light-splitting color photometer. Test conditions compatible for SCI and SCE are achieved by combination of a dual-light-source system consisting of a first illuminating system and a second illuminating system. The second illuminating system in the dual-light-source system comprises a second illuminating light source, a front lens, a light collecting lens and two adjustable light diaphragms; light emitted by the second illuminating light source is imaged near the light collecting lens by the front lens; the light collecting lens is used for imaging the front lens near a target area; the light emitted by the second illuminating light source is imaged, then the light shape of the light source is more uniform, namely the light source irradiated on a tested sample is more uniform; test data obtained on the basis of the light source is more accurate; the measurement reproducibility is better; the size and the intensity of light spots projected to the tested area can also be adjusted by adjusting the two light diaphragms; the colors of various objects are effectively and accurately measured; in addition, a light eliminating part is also arranged at the periphery of a tested sample taking area; the level of stray light is further reduced; the test accuracy is improved.
Description
[technical field]
The present invention relates to color measurement technique field, be specifically related to a kind of spectrophotometric color measurement instrument.
[background technology]
The d/8 measure geometry that CIE recommends contains SCI (comprising the specular light on sample surface) and SCE (eliminating the specular light on sample surface) two kinds of structures.SCI measurement result and material surface gloss have nothing to do, and data are generally used for color matching; SCE gets rid of specular light, close with the results contrast of eye observation color, is generally used for color acceptance, Quality Control etc.Existing d8 spectrophotometric color measurement instrument, the light that light source sends carries out diffuse illumination to sample after mixed light in integrating sphere, in the position with inclined 8 ° of sample normal, one receiving trap is set, and one is had for eliminating the light trapping hole (as shown in Figure 1) of specular component with the position of inclined-8 ° of sample normal on integrating sphere wall, by the switching of mechanical switch, close or open light trapping hole and measure structure to provide SCI or SCE.But mechanical switch not only affects Measurement sensibility, each switching also needs again to calibrate, and Measuring Time is longer, and efficiency is not high yet.
In order to overcome above-mentioned technological deficiency, a kind of colour photometer based on the compatible SCI/SCE test condition of two light source and implementation method is disclosed in US005859709A, the program is also provided with the second lighting source for realizing SCE observation condition on the basis of conventional art, wherein the second lighting source is arranged on former light trapping position, the incident light of the second lighting source is projected to receiving trap after sample reflection, the switching of SCI/SCE measuring condition is realized by adopting the mode that two light source throws light on respectively successively, and the test result utilizing twice illumination to obtain obtains the test value under SCE condition by data processing.But the light utilization efficiency of the secondary light source in the technical scheme of US005859709A (Fig. 2) is lower, the inadequate and integrating sphere inwall of the illumination of sample surfaces also has the diffuse reflection of secondary, and repeatability is poor.In JP4400538B2 (Fig. 3), improvement is done to the second illuminator, but the second lighting source irradiates sample surfaces by diffusion sheet and focus device, though this structure improves light source utilization rate and signal to noise ratio (S/N ratio), but there is several significant shortcoming: first it is that radiation source is once direct imaging at sample window place, but because the light shape of usual lighting source is uneven, so the light shape projecting the light source on sample is also uneven, this will directly affect the accuracy of SCE measurement result, although available diaphragm regulates spot size, but when hot spot is less, the uneven defect brought of light source will highlight more, owing to only having one for regulating the diaphragm of spot size in next this structure, cannot realize the adjustment to hot spot power, when causing the sample when measurement of reflectivity difference is larger, the strong and weak difference of the signal that detector receives is obvious, dynamic range is little, and test accuracy is not high.
[summary of the invention]
For the deficiencies in the prior art, technical matters to be solved by this invention is how under the prerequisite of compatible SCI and SCE test condition, improves the accuracy of test data further and measures the adaptability of structure.
In order to solve the problems of the technologies described above, basic conception of the present invention is: except arranging the first illuminator on common colour examining integrating sphere, also arranges the second illuminator of illumination sample window.Utilize two light-source system: the first illuminator and the second illuminator, realize compatible SCI and SCE test condition in same colour photometer, and by implementing to improve to the illumination approach of the second illuminator light source, make the light source light shape that is projected near sample window more even, the lighting quality of further improvement second illuminator, improves test accuracy.
As realizing a kind of technical scheme of the present invention, second illuminator direct illumination sample window, concrete arranges multiple perforate on colour examining integrating sphere, comprise light source incidence mouth, measurement window and gather the sample window of sample signal, in measurement window, place arranges optical receiver assembly, and optical receiver assembly optical axis is through sample window center; The centre normal of light source incidence mouth and the optical axis of optical receiver assembly are 8 ° along the centre normal of sample window and are symmetrical arranged, and integrating sphere inwall is coated with white coating; The light that first illuminator sends is mixed light back lighting sample window in colour examining integrating sphere; The supplementary lens that second illuminator comprises the second lighting source, set gradually along light path and condenser, the photoimaging that the second lighting source sends by supplementary lens is near condenser, and supplementary lens is imaged onto near order sample window by condenser again.
As realizing another kind of technical scheme of the present invention, second illuminator is by the first reflector space illumination sample window of integrating sphere inwall, the concrete optical axis of the first reflector space reflected light and the optical axis of optical receiver assembly are 8 ° of specular along the centre normal of sample window, this region is equivalent to the incident light source of mirror-reflection, and its light sent only has could be received device reception measurement after the effect of sample.In order to the light the second illuminator sent is projected to the first reflector space, by introducing a reflection unit outward at integrating sphere, the light that second illuminator sends first is projected to the first reflector space place on integrating sphere inwall after reflection unit reflection by light entrance port, the ray cast that this region sends is received device reception afterwards to sample surface.Also or can reflection unit is placed in integrating sphere, the light that second illuminator sends first is projected to the position of installing reflection unit by light entrance port, reflection unit again by the light reflection that incides on it to the first reflector space place on integrating sphere inwall, by first area, ray cast is surperficial to sample again, and received device receives measurement after sample effect.
In above-mentioned two schemes, no matter the second illuminator is direct illumination sample window, or the second illuminator is by the first reflector space illumination sample window of integrating sphere inwall, the centre normal specular of optical axis along sample window being incident to optic biradial on sample window and optical receiver assembly sent by the second illuminator, to realize the measurement to specular component.
As preferably, can also comprise for regulating the first adjustable diaphragm exposing to spot size on sample in the second illuminator in aforementioned schemes, the first adjustable diaphragm can be arranged in the light path before supplementary lens and the second lighting source and close supplementary lens side; Or adjustable diaphragm is arranged in the light path between supplementary lens and condenser and close supplementary lens side.Explanation in the light path being arranged between supplementary lens and condenser for the first adjustable diaphragm, the light that second lighting source sends through supplementary lens uniform irradiation in the first adjustable diaphragm, regulate the size of the first adjustable diaphragm, the quantity entering the first adjustable diaphragm light can be changed, supplementary lens and the first adjustable diaphragm acting in conjunction by the image formation by rays in the first adjustable diaphragm size limited range near condenser, condenser is again by near these image formations by rays to sample window, due to be by the image formation by rays of uniform irradiation in the first adjustable diaphragm near sample window, therefore the light source light shape be projected near sample window is also comparatively even, the accuracy of test data also will promote to some extent.
As preferably, can also comprise in order to regulate the second adjustable diaphragm being projected to hot spot power on sample in the second illuminator in aforementioned schemes, second adjustable diaphragm is arranged near condenser, and the light that the second lighting source sends is imaged near the second adjustable diaphragm through supplementary lens.Because the difference of incident light source intensity can affect to some extent on test result, therefore the introducing of the second adjustable diaphragm can ensure that receiving trap possesses good dynamic range when reply has different reflectivity sample, successfully manages various testing requirement.
Need first use during test at least two pieces can trace to the source to relevant authentication mechanism and the on-gauge plate with different specular reflectance and diffuse reflectance colour photometer is calibrated.Concrete way is: the on-gauge plate of one piece of known specular reflectance and diffuse reflectance is placed in sample window place, opens the first illuminator, now the first measurement mechanism measured value I
1,1; Close the first illuminator, open the second illuminator, the first measurement mechanism measured value I
1,2:
I
1,1＝k
1I
1,SCE+h
1I
1,SCI(1-1)
I
1,2＝k
2I
1,SCE+h
1I
1,SCI(1-2)
Replace last piece of on-gauge plate, same above-mentioned steps with the on-gauge plate of the known specular reflectance of another block and diffuse reflectance, now the first measurement mechanism twice measured value is respectively I
2,1and I
2,2:
I
2,1＝k
1I
2,SCE+h
2I
2,SCI(2-1)
I
2,2＝k
2I
2,SCE+h
2I
2,SCI(2-2)
Wherein I
1, SCErepresent the SCE reflectivity of first piece of on-gauge plate, I
1, SCIrepresent the SCI reflectivity of first piece of on-gauge plate; Same I
2, SCEand I
2, SCIrepresent SCE and the SCI reflectivity of second piece of on-gauge plate respectively.
The above-mentioned equation of simultaneous, can obtain coefficient k
1, k
2, h
1and h
2.And then testing sample is placed on sample window place, with above-mentioned operation steps, now the first measurement mechanism twice measured value is respectively I
s, 1and I
s, 2:
I
S,1＝k
1I
S,SCE+h
2I
S,SCI(3-1)
I
S,2＝k
2I
S,SCE+h
2I
S,SCI(3-2)
Due to coefficient k
1, k
2, h
1and h
2determined by calibration, therefore simultaneous equations (3-1) and (3-2) can try to achieve the specular reflectance I of sample
s, SCEwith diffuse reflectance I
s, SCI.
As preferably, the integrating sphere in aforementioned colour photometer also comprises delustring part, and delustring part is positioned at the periphery of sample sample area, and delustring part has antiradar reflectivity.Because the light entering optical detector in practical application not only comes from the reflected light on sample surface, also comprise a lot of unexpected light, the impact of this part parasitic light on measurement result is very important, and the ratio regular meeting of this part parasitic light that receives of detector is because different measuring object and different is placed at sample window place.But in traditional instrument calibration and measuring process, generally regard this part parasitic light signal as equal process roughly, this have impact on the accuracy of measurement of optical parametric greatly, can not the optical characteristics on reaction material surface really.Therefore can adopt delustring part that this part parasitic light is less further, to reduce the interference to system.
Concrete, delustring part can be located on the integrating sphere inwall of sample window edge; Or install a sample accessory on integrating sphere, this sample accessory and integrating sphere spheroid match, and detachably, sample window is arranged on sample accessory, and now delustring part is then located on the sample accessory inwall at sample window edge; Also or on sample, arrange delustring part, this delustring part is positioned at the edge of sample sample area, and when testing, sample is arranged near sample window.In first two scheme, delustring part can also by be located at integrating sphere inwall and near sample window fringe region place arrange bracing or strutting arrangement fixed.It is to be noted, here delustring part can for antiradar reflectivity coating or other there is material or the object of low reflection characteristic, be generally black coating, here black coating can be black diffuse coatings, or black half diffuse coatings, or black mirror face reflection coating, or black half mirror face reflection coating; Or delustring part is antiradar reflectivity material.In order to ensure delustring quality, the reflectivity of usual delustring part should not higher than 8%.
It is pointed out that in aforesaid various scheme, the first illuminator both can be placed in outside integrating sphere, also can be placed in integrating sphere.When the first illuminator is placed in outside integrating sphere, on integrating sphere wall, corresponding position needs to offer corresponding light entrance port, so that the light the first illuminator sent is introduced in integrating sphere; First illuminator is placed in the situation in integrating sphere, then without the need to offering corresponding light entrance port on integrating sphere wall, but baffle plate need be set to prevent the first illuminator direct projection sample.
In sum, the present invention is by introducing two light-source illuminating system, realize compatible SCI and SCE test condition, and by the improvement to the second illuminator, supplementary lens, condenser and respectively in order to regulate the adjustable diaphragm of spot size and hot spot power are set in the second illuminator, make the light source near imaging to sample window more even, improve the accuracy of test result; By regulating the size of diaphragm, changing size and the power of the hot spot of illumination sample window, successfully managing various measurement demand.
[accompanying drawing explanation]
Accompanying drawing 1 is that in prior art, a kind of d/8 observes geometric condition structural representation;
Accompanying drawing 2 is structural representations of a kind of pair of light source chromatic measuring system in prior art;
Accompanying drawing 3 is structural representations of another kind of two light source chromatic measuring system in prior art;
Accompanying drawing 4 is the structural representations in embodiment 1;
Accompanying drawing 5 is the structural representations in embodiment 2;
Accompanying drawing 6 is the structural representations in embodiment 3;
Accompanying drawing 7 is the structural representations in embodiment 4;
Accompanying drawing 8 is the plan structure schematic diagram comprising delustring part in embodiment 1 in integrating sphere.
Accompanying drawing 9 is partial schematic diagrams that in embodiment 5, delustring part is fixed by bracing or strutting arrangement;
Accompanying drawing 10 is the partial schematic diagrams sample support parts that coordinate with integrating sphere in embodiment 6 being arranged delustring part.
1-integrating sphere; 11-light source incidence mouth; 12-measurement window; 13-sample window; 14-second measurement window; 2-sample; 3-optical receiver assembly; 4-first illuminator; 5-second illuminator; 51-second lighting source; 52-supplementary lens; 53-condenser; 54-first adjustable diaphragm; 55-second adjustable diaphragm; 6-first reflector space; 7-delustring part; 8-sample accessory; 9-bracing or strutting arrangement.
[embodiment]
Embodiment 1
As shown in Figure 4, present embodiment discloses a kind of spectrophotometric color measurement instrument, be made up of integrating sphere 1, optical receiver assembly 3, first illuminator 4 and the second illuminator 5.Sample window 13 is had bottom integrating sphere 1, integrating sphere 1 inwall is provided with delustring part 7 near sample window 13 edge, here delustring part 7 be reflectivity lower than 8% black coating (as shown in Figure 8), integrating sphere 1 inwall remainder is coated with the white coating of high reflectance.With sample window 13 centre normal partially-8 ° of integrating spheres located 1 on have light that light source incidence mouth 11, second illuminator 5 sends and to throw light on sample window 13 through this light source incidence mouth 11; Have measurement window 12 with integrating sphere 1 place of inclined 8 ° of sample window 14 centre normal, the optical axis of optical receiver assembly 3 is through sample window 13 center, and it receives the light signal through measurement window 12 outgoing; The sidewall of integrating sphere 1 also has light entrance slit, and the light that the first illuminator 4 sends enters in integrating sphere 1 through this perforate.Second illuminator 5 is made up of the second lighting source 51, supplementary lens 52, first adjustable diaphragm 54, second adjustable diaphragm 55 and condenser 53 successively, and supplementary lens 52 images near sample window 13 by condenser 53.
During test, first open the light that the first illuminator 4, first illuminator 4 sends and project the inwall of integrating sphere 1 from light entrance slit, after integrating sphere 1 inwall multiple reflections, penetrate form illumination sample window 13, optical receiver assembly 3 measured value I to diffuse in
s, 1; Close the first illuminator 4, open the second illuminator 5, the light that second lighting source 51 sends images near sample window 13 after supplementary lens 52, first adjustable diaphragm 54 and the second adjustable diaphragm 55 and condenser 53, optical receiver assembly 3 measured value I
s, 2.In addition, according to testing requirement, regulate the first adjustable diaphragm 54, the size exposing to sample window 13 place hot spot can be changed, regulate the second adjustable diaphragm 55, realize changing the power exposing to sample window 13 place hot spot.
The present embodiment passes through the switching of the first illuminator 4 and the second illuminator 5, achieves the compatibility of SCI and SCE test condition; Utilize the improvement to the second illuminator 5 simultaneously, improve the second illuminator 5 lighting quality further, improve measuring accuracy.
Embodiment 2
As shown in Figure 5, as different from Example 1, the first illuminator 4 in the present embodiment is placed in integrating sphere, now without the need to offering corresponding entrance slit at integrating sphere 1 sidewall.The light that first illuminator 4 sends, directly after integrating sphere 1 multiple reflections, irradiates sample surface to diffuse in form of penetrating.With in embodiment 1, first illuminator 4 is placed in compared with the scheme outside integrating sphere, the present embodiment is suitable for the first illuminator 4 of small size, and what is more important open amount comparatively embodiment 1 is less, can realize better light mixing effect.
Embodiment 3
As shown in Figure 6, with embodiment 1 and 2 all unlike, also comprise a reflector apparatus in the present embodiment, reflection unit is positioned at the outside of the smooth entrance port 11 of integrating sphere 1, and arranges along the light path after the second illuminator 5.Light through the second illuminator 5 condenser 53 outgoing is first projected to the first reflector space 6 place of integrating sphere 1 inwall after reflection unit reflection by light entrance port 11, the optical axis of light reflected through the first reflector space 6 and the optical axis of optical receiver assembly 3 are specular relation along sample window 13 centre normal.Through first reflector space 6 reflect ray cast to sample 2 surface and through effect after received by optical receiver assembly 3.
Embodiment 4
As described in Figure 7, as different from Example 3, the reflection unit in the present embodiment is positioned at integrating sphere 1, and the light path after the second illuminator 5 is arranged.The light that now the second illuminator 5 sends first is projected to the position of installing reflection unit by light entrance port 11, reflection unit by the light reflection that incides on it to the first reflector space 6 place on integrating sphere 1 inwall, by the first reflector space 6, ray cast is surperficial to sample 2 again, and received device 3 receives measurement after sample 2 acts on.
Embodiment 5
As shown in Figure 9, eliminate other identical structures, as different from Example 1, a sample accessory 8 is had to match with integrating sphere 1 in the present embodiment, sample window 13 is arranged on sample accessory 8, and this sample accessory 8 is dismountable, now delustring part 7 is located on sample accessory 8 inwall at sample window 13 fringe region place.
Embodiment 6
As shown in Figure 10, eliminate other identical structures, as different from Example 1, the delustring part 7 in the present embodiment is arranged at integrating sphere 1 inwall by one and the bracing or strutting arrangement 9 at close sample window 13 fringe region place is fixed.
Claims (10)
1. a spectrophotometric color measurement instrument, is characterized in that, comprising:
Integrating sphere (1), described integrating sphere (1) is provided with light source incidence mouth (11), measurement window (12) and gathers the sample window (13) of sample (2) signal, and described integrating sphere (1) inwall is coated with white coating;
Optical receiver assembly (3), described optical receiver assembly (3) is arranged on the emitting light path of measurement window (12), and optical receiver assembly (3) optical axis is by sample window (13) center;
First illuminator (4), the light that described first illuminator (4) sends mixed light back lighting sample window (13) in integrating sphere (1);
Second illuminator (5), the light that described second illuminator (5) sends is by light source incidence mouth (11) illumination sample window (13);
The supplementary lens (52) that second illuminator (5) comprises the second lighting source (51), set gradually along light path and condenser (53), the second lighting source (51) images near condenser (53) by described supplementary lens (52); Condenser (53) is by near supplementary lens (52) imaging to sample window (13); The centre normal specular of optical axis along sample window (13) being incident to optic biradial on sample window (13) and optical receiver assembly (3) sent by the second illuminator (5).
2. colour photometer as claimed in claim 1, it is characterized in that, described second illuminator (5) direct illumination sample window (13), the centre normal of described light source incidence mouth (11) and the optical axis of optical receiver assembly (3) are symmetrical arranged along the centre normal of sample window (13).
3. colour photometer as claimed in claim 1, it is characterized in that, described integrating sphere (1) inwall is provided with the first reflector space (6), and the optical axis of the first reflector space (6) reflected light and the optical axis of optical receiver assembly (3) are along the centre normal specular of sample window (13); Described second illuminator (5) is by near the first reflector space (6) imaging to sample window (13).
4. the colour photometer as described in any one of claim 1-3, it is characterized in that, described second illuminator (5) also comprises the first adjustable diaphragm (54), and described first adjustable diaphragm (54) is arranged in the light path between supplementary lens (52) and condenser (53) and arranges near supplementary lens (52) side; Or described first adjustable diaphragm (54) is arranged in the light path between the second lighting source (51) and supplementary lens (52) and arranges near supplementary lens (52) side.
5. colour photometer as claimed in claim 4, it is characterized in that, described second illuminator (4) also comprises the second adjustable diaphragm (55), second adjustable diaphragm (55) is arranged near condenser (53), and the light that described second lighting source (51) sends is imaged near the second adjustable diaphragm (55) through supplementary lens (52).
6. the colour photometer as described in any one of claim 1-3, it is characterized in that, described integrating sphere (1) also comprises delustring part (7), described delustring part (7) is positioned at the periphery of sample (2) sample area, and delustring part (7) has antiradar reflectivity.
7. colour photometer as claimed in claim 6, it is characterized in that, described delustring part (7) is located on integrating sphere (1) inwall at sample window (13) edge.
8. colour photometer as claimed in claim 6, it is characterized in that, also comprise sample accessory (8), described sample accessory (8) is arranged on integrating sphere (1), and coincide with integrating sphere (1) spheroid, be detachable block; And sample accessory (8) is provided with sample window (13), sample accessory (8) inwall at described sample window (13) edge is provided with delustring part (7).
9. colour photometer as claimed in claim 6, it is characterized in that, also comprise bracing or strutting arrangement (9), and described delustring part (7) is fixed by bracing or strutting arrangement (9).
10. colour photometer as claimed in claim 6, it is characterized in that, described delustring part (7) is arranged on sample (2), and delustring part (7) is positioned at the edge in sample (2) region to be measured.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610016723.XA CN105509889B (en) | 2016-01-11 | 2016-01-11 | A kind of spectrophotometric color measurement instrument |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610016723.XA CN105509889B (en) | 2016-01-11 | 2016-01-11 | A kind of spectrophotometric color measurement instrument |
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| CN105509889A true CN105509889A (en) | 2016-04-20 |
| CN105509889B CN105509889B (en) | 2017-09-15 |
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| CN201610016723.XA Active CN105509889B (en) | 2016-01-11 | 2016-01-11 | A kind of spectrophotometric color measurement instrument |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111983831A (en) * | 2020-08-07 | 2020-11-24 | 深圳市华星光电半导体显示技术有限公司 | Liquid crystal panel reflectivity detection device and detection method |
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|---|---|---|---|---|
| US5369481A (en) * | 1992-05-08 | 1994-11-29 | X-Rite, Incorporated | Portable spectrophotometer |
| US5859709A (en) * | 1995-08-24 | 1999-01-12 | Minolta Co., Ltd. | Optical characteristic measuring apparatus |
| CN101183025A (en) * | 2007-12-04 | 2008-05-21 | 中国计量学院 | Color measurement color difference instrument and color measurement method thereof |
| CN102565459A (en) * | 2011-12-29 | 2012-07-11 | 中国科学院长春光学精密机械与物理研究所 | Transparent illumination device applied to process of detecting micro-pore shape by atomic force microscope |
| CN204085696U (en) * | 2014-08-21 | 2015-01-07 | 深圳泓泰创想科技有限公司 | Colorimeter optical system |
| CN205537961U (en) * | 2016-01-11 | 2016-08-31 | 杭州远方光电信息股份有限公司 | Beam split colour photometer |
-
2016
- 2016-01-11 CN CN201610016723.XA patent/CN105509889B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5369481A (en) * | 1992-05-08 | 1994-11-29 | X-Rite, Incorporated | Portable spectrophotometer |
| US5859709A (en) * | 1995-08-24 | 1999-01-12 | Minolta Co., Ltd. | Optical characteristic measuring apparatus |
| CN101183025A (en) * | 2007-12-04 | 2008-05-21 | 中国计量学院 | Color measurement color difference instrument and color measurement method thereof |
| CN102565459A (en) * | 2011-12-29 | 2012-07-11 | 中国科学院长春光学精密机械与物理研究所 | Transparent illumination device applied to process of detecting micro-pore shape by atomic force microscope |
| CN204085696U (en) * | 2014-08-21 | 2015-01-07 | 深圳泓泰创想科技有限公司 | Colorimeter optical system |
| CN205537961U (en) * | 2016-01-11 | 2016-08-31 | 杭州远方光电信息股份有限公司 | Beam split colour photometer |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111983831A (en) * | 2020-08-07 | 2020-11-24 | 深圳市华星光电半导体显示技术有限公司 | Liquid crystal panel reflectivity detection device and detection method |
| WO2022027735A1 (en) * | 2020-08-07 | 2022-02-10 | 深圳市华星光电半导体显示技术有限公司 | Testing device and testing method for reflectivity of liquid crystal panel |
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| Publication number | Publication date |
|---|---|
| CN105509889B (en) | 2017-09-15 |
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