CN105606133A - Resistive sensor array test circuit based on two-wire system voltage feedback - Google Patents
Resistive sensor array test circuit based on two-wire system voltage feedback Download PDFInfo
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- CN105606133A CN105606133A CN201610061119.9A CN201610061119A CN105606133A CN 105606133 A CN105606133 A CN 105606133A CN 201610061119 A CN201610061119 A CN 201610061119A CN 105606133 A CN105606133 A CN 105606133A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/16—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying resistance
Abstract
The invention discloses a resistive sensor array test circuit based on two-wire system voltage feedback, and belongs to the technical field of a sensor. The circuit is applied to an M*N two-dimensional resistive sensor array sharing row wires and column wires. The test circuit comprises a voltage feedback operation amplifier, a row multipath selector, a column multipath selector, a sampling resistor, a reference voltage source, N column wire driving operation amplifiers in one-to-one correspondence with N column wires of the resistive sensor array, and two connecting wires respectively arranged for each row wire and each column wire of the resistive sensor array. The invention also discloses a test method of the test circuit, and a sensing system. Compared to the prior art, a two-wire system voltage feedback method is taken as a key technology, measurement errors caused by connection with a cable lead wire resistor, a cable joint contact resistor and a multipath switch channel conduction resistor can be effectively eliminated, and the measurement precision of the resistive sensor array is substantially improved.
Description
Technical field
The present invention relates to sensor technical field, relate in particular to a kind of resistive Sensor array circuit.
Background technology
Array sensing device is exactly by having multiple sensing elements of identical performance, according to the structure of two-dimensional arrayCombine, it can focus on parameter on array by detection and changes, and changes or generates corresponding formWith feature. This characteristic is widely used in bio-sensing, temperature sense of touch and the heat based on infrared sensor etc. and becomesThe aspect such as look like.
Resistive sensor array is widely used in Simulations of Infrared Image system, power tactilely-perceptible and temperature tactile feelKnow. Taking temperature sense of touch as example, owing to relating to the transmission of heat and the perception of temperature in temperature sensation sensing device, forObtain the hot attribute of object, device has proposed higher requirement to temperature measurement accuracy and resolution ratio, and in order to enterOne step obtains the hot attribute that object diverse location material shows, and has proposed higher to temperature sensation sensing deviceSpatial resolving power requirement.
The quality of resistive sensor array or resolution ratio are to come by the quantity that increases the sensor in arrayIncrease. But, when the scale of sensor array strengthens, the information gathering to all components and parts and signal processingJust become difficulty. Generally, be to the carrying out of all resistive sensors of M × N array one by oneAccess, and each resistive sensor has two ports, needs altogether 2 × M × N root connecting line. This connection sideFormula is line complexity not only, and can only select single testing resistance at every turn, and sweep speed is slow, and the cycle is long, efficiencyLow. For reducing the complexity of device interconnection, there is researcher to propose the two-dimensional array structure of shared line and alignment.Fig. 1 has shown the structure of the resistive sensor array of two dimension of shared line and alignment. As shown in Figure 1, this sensingDevice array comprises respectively as sharing two groups of orthogonal circuits of line and shared alignment and tying according to the two dimension of M × NPhysical quantity sensitive resistance (the being resistive sensor) array that structure distributes, each physical quantity sensitive resistance in arrayOne end connects corresponding line, and the other end connects corresponding alignment, and the each resistance in array has unique rowThe combination of line and alignment, in the resistance R of the capable j row of iijRepresent, wherein, M is line number, and N is rowNumber. Adopt this kind of structure can make the array distributing according to the two-dimensional structure of M × N, only need M+N root to connectLine number can ensure that any one specific resistive element can be by controlling the respective combination of line and alignmentAccessed, therefore required session number significantly reduces.
The resistive sensor array of common row alignment needs conventionally by longer cable connecting test circuit, and longerOn many lead-in wires of connection cable, have lead resistance, its resistance is basic phase between the lead-in wire of the many materials such as isometricWith, and increase with length of cable; The plug of connection cable exists and contacts electricity with the contact between socket simultaneouslyResistance, for every pair of contact, its contact resistance resistance with its contact condition (contact condition of contact in time, machineTool vibrations etc. all can change) different and change within the specific limits (approximately 0～3 Ω). Resistance is essentially identicalThere is obviously impact to the measuring accuracy of resistive sensor array in the contact resistance that lead resistance is different with resistance. JustThe resistive sensor array of common row alignment based on Voltage Feedback method, lead resistance and contact resistance have causedElectrical potential difference between test circuit feedback drive end and resistive sensor array module drive end, has also caused simultaneouslyElectrical potential difference between test circuit sampling end and resistive sensor array module sampling end, thereby destroyed test electricityThe ideal isolation feedback condition on road, makes the resistance measure error of unit under test become large. Therefore essentially identical lead-in wireResistance and different cable connector contact resistance are to the resistive sensor array of common row alignment based on Voltage Feedback methodThe impact of row test result is remarkable, and while conventional method also exists the passage conducting resistance of variable connector to affect and treatsThe measure error of measurement unit, impact how to eliminate these factors is a problem needing to be studied.
Summary of the invention
Technical problem to be solved by this invention is to overcome prior art deficiency, provides a kind of based on two-wire system electricityPress feedback resistive Sensor array circuit and method of testing thereof, can effectively eliminate stube cable lead resistance,The measure error that cable connector contact resistance and Multiplexer Channel conducting resistance produce, significantly improves resistiveThe certainty of measurement of sensor array.
The present invention specifically solves the problems of the technologies described above by the following technical solutions:
Based on the resistive Sensor array circuit of two-wire system Voltage Feedback, described resistive sensor array is classified as altogetherWith the resistive sensor array of M × N two dimension of line and alignment; Described test circuit comprises: Voltage Feedback amplifier,Row MUX, row MUX, sampling resistor, reference voltage source, with the N of resistive sensor arrayBar alignment is N column line drive amplifier one to one, and be each row of described resistive sensor arrayTwo connecting lines that line and alignment arrange respectively; Every alignment of resistive sensor array by connecting line withThe output of its corresponding column line drive amplifier is connected, and this alignment by another root connecting line corresponding thereto simultaneouslyThe inverting input of column line drive amplifier is connected; Inverting input, the output of Voltage Feedback amplifier interconnect,One end of sampling resistor connects zero potential; Described row MUX can make any corresponding alignment of alignmentDrive the in-phase input end of amplifier to be connected with reference voltage source or to be connected with the output of Voltage Feedback amplifier; InstituteStating row MUX can make any line respectively by its two connecting lines and Voltage Feedback amplifierThe other end of in-phase input end, sampling resistor connects simultaneously or disconnects simultaneously.
The as mentioned above method of testing of test circuit, to be measured for any one in described resistive sensor arrayResistive sensor, first this resistive sensor to be measured of gating, specific as follows: to make by described row MUXMust this resistive sensor to be measured place alignment in-phase input end and the reference voltage source of corresponding column line drive amplifierConnect, and other alignment institute in-phase input end of corresponding column line drive amplifier and the output of Voltage Feedback amplifier companyConnect, and make this resistive sensor to be measured place line respectively by its two by described row MUXConnecting line is connected with in-phase input end, the sampling resistor of Voltage Feedback amplifier simultaneously, and other line and voltage are anti-In-phase input end, the sampling resistor of feedback amplifier disconnect simultaneously; Then utilize following formula to calculate this resistive sensing to be measuredThe resistance R of devicexy：
Wherein, VIFor the reference voltage of reference voltage source input, VFFor feedback voltage (the i.e. electricity of Voltage Feedback amplifierPress the output end voltage of feedback amplifier, under the effect of Voltage Feedback amplifier, its value is same with Voltage Feedback amplifierPhase input terminal voltage equates), VsgFor sampling resistor both end voltage, RSFor the resistance value of sampling resistor.
Can also obtain following technical scheme according to identical invention thinking:
A kind of sensor-based system, comprises resistive sensor array and corresponding test circuit, described resistive sensor arrayClassify the resistive sensor array of M × N two dimension that shares line and alignment as, described test circuit is above-mentioned based on twoThe resistive Sensor array circuit of line Voltage Feedback processed.
Compared to existing technology, the present invention has following beneficial effect:
1. the present invention be directed to the detection needs of resistive sensor array, do not improving electric resistance array interconnect complexityBasis on, taking two-wire system Voltage Feedback method as key technology, effectively eliminated the passage conducting of MUXThe error of crosstalking that the contact resistance of resistance, p-wire cable joint, long test cable cause, has improved and has measured essenceSpend, expanded the Standard resistance range of physical quantity sensitive resistance in resistive sensor array simultaneously; And the present invention also canEffectively eliminate the interference of space electromagnetic noise;
2. the MUX make cheaply, passage conducting resistance being larger can be applied to resistive sensorArray, has reduced the cost of test circuit;
3. eliminated cable connector contact that resistance changes with contact contact condition in time to resistive sensorThe impact of array measurement precision, makes plug, socket that application system can plug by convenience change resistive biographySensor array or its test circuit, the while can ensure the certainty of measurement of application system.
4. eliminate the error of crosstalking that long test cable causes, made long test cable can be applied to resistive biographySensor array, being specially adapted to has the resistive sensor array of softness of requirement to measure to test circuit bulk.
Brief description of the drawings
Fig. 1 is the resistive sensor array structural representation of M × N two dimension that shares line and alignment;
Fig. 2 is the Voltage Feedback method test circuit schematic diagram of the resistive sensor array of existing common row alignment;
Fig. 3 is the test philosophy isoboles of Fig. 2 test circuit;
Fig. 4 is the schematic diagram of a specific embodiment of test circuit of the present invention;
Fig. 5 is the test philosophy isoboles of test circuit specific embodiment of the present invention.
Detailed description of the invention
Below in conjunction with accompanying drawing, technical scheme of the present invention is elaborated:
Fig. 2 has shown the Voltage Feedback method test circuit of the resistive sensor array of typical common row alignment, Fig. 3For the test philosophy isoboles of this test circuit. Current unit under test R in figurexyFor M × N common row alignmentR in resistive sensor array11. In this circuit, between every line or alignment and test circuit of arrayAll only has a connecting line, at sampling resistor RsAnd between line, be connected to the electric current M such as and select a variable connector.
This test circuit under desirable duty, the passage conducting resistance of all alignment alternative variable connectorsRsc, drive the lead resistance of connecting line and the cumulative resistance R of joint contact resistanceLcBe left in the basket, like this RxyInstituteAt the voltage V of alignmentcyEqual reference voltage VI, and the voltage of other alignment equals VF; Wait electric current M simultaneouslySelect the passage conducting resistance R of a variable connectorsr, etc. the lead resistance of electric current connecting line and joint contact resistanceCumulative resistance RLrBe left in the basket, sampling resistor RsOn voltage VsgWith VrxEquate; Due to desired voltage feedbackThe effect of amplifier, feedback voltage VFFollow unit under test place line voltage VrxChange therefore VF＝Vrx＝Vsg；And due to voltage and the V of other alignmentrxEquate the therefore electric current on (N-1) of unit under test individual row adjacent cellsBe 0; Because the in-phase input end impedance of Voltage Feedback amplifier is very large, its leakage current is left in the basket, so simultaneouslyRxyOn electric current IxyWith sampling resistor RsOn electric current IsEquate for Is＝Vsg/Rs＝(VI-Vrx)/Rxy＝(VI-Vsg)/Rxy。Due to VIAnd RsKnown, sampling resistor RsOn voltage Vsg＝VFCan measure, and then can calculateRxy。
And this test circuit is in real work situation, logical due to the alignment alternative variable connector of unit under testRoad conducting resistance Rsc, drive the lead resistance of connecting line and the cumulative resistance R of joint contact resistanceLcExistence,Cause VcyWith VIUnequal; Simultaneously because the electric current M that waits in the line direction of unit under test selects a multichannel to openThe passage conducting resistance R closingsr, etc. the lead resistance of electric current connecting line and the cumulative resistance R of joint contact resistanceLrExistence, cause VsgWith VrxUnequal. The passage of row connection cable, row connection cable and variable connector is ledThese two principal elements that energising resistance causes have been destroyed the ideal isolation work bar of Voltage Feedback method test circuitPart, makes RxyIt is large that measure error becomes.
In order to overcome the existing shortcoming of Fig. 2 test circuit, eliminate lead resistance, the cable connector of connection cableContact resistance and the impact of the passage conducting resistance of variable connector, the present invention proposes a kind of based on two-wire system electricityThe resistive Sensor array circuit of pressing feedback, utilizes the Voltage Feedback method of doubly-linked wiring to measure shared ranksThe resistive sensor array of line. Particularly, test circuit of the present invention comprises: Voltage Feedback amplifier, row multichannel are selectedDevice, row MUX, sampling resistor, reference voltage source, with the N bar alignment one of resistive sensor arrayThe N of one correspondence column line drive amplifier, and be each line and the alignment of described resistive sensor arrayTwo connecting lines that arrange respectively; Every alignment of resistive sensor array by a connecting line corresponding theretoThe output of column line drive amplifier is connected, and this alignment is by another root connecting line column line drive corresponding thereto simultaneouslyThe inverting input of amplifier is connected; Inverting input, the output of Voltage Feedback amplifier interconnect, sampling electricityOne end of resistance connects zero potential; Described row MUX can make the corresponding column line drive fortune of any alignment instituteThe in-phase input end of putting is connected with reference voltage source or is connected with the output of Voltage Feedback amplifier; Described row is manyRoad selector can make any line defeated by the homophase of its two connecting lines and Voltage Feedback amplifier respectivelyThe other end that enters end, sampling resistor connects simultaneously or disconnects simultaneously.
The method of testing of above-mentioned test circuit is specially: treat for any one in described resistive sensor arraySurvey resistive sensor, first this resistive sensor to be measured of gating, specific as follows: by described row MUXMake this resistive sensor to be measured place alignment in-phase input end and the reference voltage of corresponding column line drive amplifierSource connect, and other alignment the in-phase input end of corresponding column line drive amplifier and the output of Voltage Feedback amplifierConnect, and by described row MUX make this resistive sensor to be measured place line respectively by its twoRoot connecting line is connected with in-phase input end, the sampling resistor of Voltage Feedback amplifier simultaneously, and other line and voltageIn-phase input end, the sampling resistor of feedback amplifier disconnect simultaneously; Then utilize following formula to calculate this resistive biography to be measuredThe resistance R of sensorxy：
Wherein, VIFor the reference voltage of reference voltage source input, VFFor feedback voltage (the i.e. electricity of Voltage Feedback amplifierPress the output end voltage of feedback amplifier, under the effect of Voltage Feedback amplifier, its value is same with Voltage Feedback amplifierPhase input terminal voltage equates), VsgFor sampling resistor both end voltage, RSFor the resistance value of sampling resistor.
In technique scheme, the concrete structure of row MUX and row MUX can be selected flexibly, onlyWant to realize corresponding function, provide several preferred concrete structures below:
Described row MUX comprises and N alignment two choosings one to one of described N column line drive amplifierOne variable connector; The common port of each alignment alternative variable connector with its homophase of corresponding column line drive amplifierInput connect, two independently hold with its corresponding alignment connect respectively by two connecting lines of this alignment.
Described row MUX comprises that two M select a variable connector: wait electric current M select a variable connector, etc.Electromotive force M selects a variable connector; Equipotential M select M of a variable connector independent end, etc. electric current M select oneThe M of variable connector independent end is corresponding one by one with M bar line, every line pass through one root connecting line and etc.Electromotive force M selects the correspondence of a variable connector independently to hold connection, and by its another root connecting line with wait electric current M selectThe correspondence of one variable connector is independently held connection; Equipotential M selects common port and the Voltage Feedback fortune of a variable connectorThe in-phase input end of putting connects, and waits electric current M to select the common port of a variable connector to be connected with the sampling resistor other end.
Or described row MUX comprises two groups of single-pole single-throw switch (SPST)s, each group comprises and resistive sensorThe M bar line of array M single-pole single-throw switch (SPST) one to one; Every line by one root connecting line withIn first group, one end of corresponding single-pole single-throw switch (SPST) connects, simultaneously by right in its another root connecting line and second groupAnswer one end of single-pole single-throw switch (SPST) to connect; In first group, the other end of each single-pole single-throw switch (SPST) is all with sampling resistorThe other end connects, in second group the other end of each single-pole single-throw switch (SPST) all with the in-phase input end of Voltage Feedback amplifierConnect.
For the ease of public understanding, with a specific embodiment, technical solution of the present invention is carried out further belowExplanation.
Fig. 4 has shown the general principle of a specific embodiment of test circuit of the present invention, and Fig. 5 is this test circuitTest philosophy isoboles. The existing test circuit of comparing Fig. 2, as shown in Figure 4, the present invention is common at M × NAll additionally increase a connecting line with every line and the alignment of the resistive sensor array module of ranks line, eachRoot alignment and line all corresponding two connecting lines (for the ease of difference, are considered from functional perspective, below by sameTwo connecting lines of alignment are called and drive connecting line, drive sampling to follow connecting line, by two of same lineRoot connecting line such as is called at electric current connecting line, the equipotential connecting line); While is at each row of test circuitDrive end all increases an operational amplifier, and this operational amplifier is as column line drive amplifier. Like this in the present inventionIn test circuit, there are a Voltage Feedback amplifier and N column line drive amplifier, in each column line drive amplifierIn-phase input end all correspondence is connected with an alignment alternative variable connector, at sampling resistor RsAnd logical between lineCross each line wait electric current connecting line to be connected to one to wait electric current M to select a variable connector, in Voltage Feedback amplifierBetween in-phase input end and line, being connected to an equipotential M by the equipotential connecting line of each line selects a multichannel to openClose, that is every line selects the corresponding independent end of a variable connector by equipotential connecting line and equipotential MConnect, and by the electric current connecting lines such as another root with wait that electric current M selects a variable connector corresponding independently hold connection,Equipotential M selects the common port of a variable connector to be connected with the in-phase input end of Voltage Feedback amplifier, Voltage FeedbackInverting input, the output of amplifier interconnect; Select common port and the sampling of a variable connector Deng electric current MResistance RsOne end connects, sampling resistor RsOther end ground connection.
As shown in Figure 4, every alignment in the resistive sensor array of common row alignment drives connecting line by oneDrive the output of amplifier to be connected with its respective column lines, this alignment drives sampling to follow connection by another root simultaneouslyLine drives the inverting input of amplifier to be connected with its respective column lines; The in-phase input end of each column line drive amplifier is logicalCross common port and the reference voltage V of an alignment alternative variable connector corresponding theretoIOr feedback voltage VFConnect; In the time of test, the in-phase input end gating reference voltage V of the column line drive amplifier at unit under test placeI，The in-phase input end gating feedback voltage V of other column line drive amplifierF. In the driving force of column line drive amplifierUnder enough prerequisites, due to the short effect of void of column line drive amplifier, its homophase of the voltage follow of its place alignment is defeatedEnter terminal voltage and change, thus the column line voltage V at unit under test placecyEqual VI, other column line voltage is VF。So just realize the accumulation resistance R that drives the lead resistance of connecting line and the contact resistance of joint thereofLcVirtualIsolation, thus R eliminatedLcOn the impact of test result. Simultaneously due to the in-phase input end of column line drive amplifierThe resistance R of the passage conducting resistance of input impedance and alignment alternative variable connectorscCompare very large, due to rowLine drives the disconnected effect of the void of amplifier, the therefore in-phase input end voltage of column line drive amplifier and alignment alternative multichannelInput voltage (the reference voltage V of switchIOr feedback voltage VF) equate, the voltage that can eliminate doubly-linked wiring is anti-R in feedback method circuitscTo RxyThe impact of measurement result.
As shown in Figure 4, every line in the resistive sensor array of common row alignment waits electric current to connect by oneLine selects a corresponding independent end of a variable connector to be connected with waiting electric current M, and these electric currents M selects a multichannel simultaneouslyThe common port of switch connects sampling resistor Rs, the line that only unit under test is expert in the time of test is waited electric current MSelect a variable connector institute gating, and other line is unsettled, thereby the line that only unit under test is expert at connects Rs；Every line also by another root equipotential connecting line and equipotential M select one of a variable connector corresponding independentEnd is connected, and this equipotential M selects the common port of a variable connector to connect the homophase input of Voltage Feedback amplifier simultaneouslyEnd, in the time of test, only unit under test place line is selected a variable connector gating by equipotential M, and other line is outstandingSky, thus only unit under test place line connects the in-phase input end of Voltage Feedback amplifier. From unit under testFirst the measuring current of column line drive amplifier arrives its line through unit under test, and secondly process waits electric current connecting line,Process waits electric current M to select a variable connector again, then passes through RsTo ground. Because Voltage Feedback amplifier homophase is defeatedThe input impedance that enters end is very large, is far longer than equipotential M and selects the passage conducting resistance R of a variable connectorsrWith etc.The lead resistance of electromotive force connecting line and the contact resistance R of joint thereofLrCumulative sum, can think Voltage Feedback fortuneVoltage and the unit under test place line voltage of putting in-phase input end are equal, and its value is Vrx, Voltage Feedback simultaneouslyThe Following effect of amplifier makes feedback voltage VFWith VrxEquate; And due to Voltage Feedback amplifier in-phase input endInput impedance is very large, is far longer than Rs, etc. electric current M select the passage conducting resistance R of a variable connectorsrWith electricity such as gradeThe stream lead resistance of connecting line and the contact resistance R of joint thereofLrAccumulative total resistance Rer, therefore Voltage Feedback amplifierThe leakage current of in-phase input end can be ignored; And other alignment keeps equating with tested line simultaneously, voltage is allVF＝Vrx, therefore the leakage current on (N-1) of unit under test individual row adjacent cells is all zero. Therefore RsAnd RxyOn equate by electric current, this electric current also simultaneously by wait electric current M select a variable connector passage conducting resistance,Deng the lead resistance of electric current connecting line, etc. the accumulation resistance that jointly causes of the contact resistance etc. of electric current connecting-wire connectorRer, and current value is constant. Due to RsAnd RxyOn electric current equate, due to RsKnown, if known soRsThe precise voltage V at two endssgAnd RxyPrecise voltage (the V at two endscy-Vrx)＝(VI-Vrx), just can determine accuratelyIxy, and then can calculate accurately Rxy。
But due to accumulation resistance RerExistence, cause passing through RsThe voltage V at two endssgWith desired voltage VF＝VrxHave any different, if therefore ignore RerImpact the test result that causes unit under test is produced to extra error.Due to Rxy、RsAnd RerOn the electric current that flows through equate, therefore the present invention adopts formula Rxy＝(VI-VF)×Rs/VsgTry to achieve RxyResistance. Can find does not have R in the formulaerThere is RerImpact thoroughly eliminated. Due toRsAnd VIKnown, and VsgAnd VFWe can measure, and finally realize RxyThe mensuration of true value.
In sum, utilize test circuit of the present invention, arbitrary tested in the resistive sensor array of common row alignmentThe true resistive value of unit can be by Measurement accuracy out, and the lead resistance of the alignment of resistive sensor array, lineAnd the impact that the contact resistance of joint and Multiplexer Channel conducting resistance cause is completely eliminated.
Compared with the Voltage Feedback method of traditional monotroded wiring, in test circuit of the present invention, connect every row, columnA calibrating terminal of line becomes two calibrating terminals, and (N × M array test number of terminals becomes from (N+M) is individual2 (N+M) are individual); Connection cable pin count also correspondingly doubles, and (the required connection cable of N × M array goes betweenIndividual to become 2 (N+M) individual from (N+M) for subnumber); Need in addition to increase a M and select a variable connector and NOperational amplifier.
In addition it is emphasized that: above line, classify relative concept as, those skilled in the art completely can be by itExchange, therefore, similar this kind of simple deformation based on thinking of the present invention is still by technical solution of the present invention is contained.
Claims (6)
1. the resistive Sensor array circuit based on two-wire system Voltage Feedback, described resistive sensor array is classified as altogetherWith the resistive sensor array of M × N two dimension of line and alignment; It is characterized in that, described test circuit comprises:Voltage Feedback amplifier, row MUX, row MUX, sampling resistor, reference voltage source, with resistiveThe N bar alignment of sensor array N column line drive amplifier one to one, and be described resistive sensorTwo connecting lines that each of array line and alignment arrange respectively; Every alignment of resistive sensor array is logicalCross a connecting line corresponding thereto the output of column line drive amplifier be connected, this alignment connects by another root simultaneouslyThe wiring corresponding thereto inverting input of column line drive amplifier is connected; The inverting input of Voltage Feedback amplifier,Output interconnects, and one end of sampling resistor connects zero potential; Described row MUX can make any oneBar alignment the in-phase input end of corresponding column line drive amplifier be connected with reference voltage source or transport with Voltage FeedbackThe output of putting connects; Described row MUX can make any line respectively by its two connecting linesBe connected simultaneously or disconnect simultaneously with the in-phase input end of Voltage Feedback amplifier, the other end of sampling resistor.
2. test circuit as claimed in claim 1, is characterized in that, described row MUX comprises and described NIndividual column line drive amplifier is N alignment alternative variable connector one to one; Each alignment alternative multichannel is openedClose common port with its institute corresponding column line drive amplifier in-phase input end connect, two independently hold and its rightTwo connecting lines of answering alignment to pass through this alignment connect respectively.
3. test circuit as claimed in claim 1, is characterized in that, described row MUX comprises two M choosingsOne variable connector: wait electric current M to select a variable connector, equipotential M to select a variable connector; Equipotential M selects oneThe M of variable connector independent end, etc. electric current M select M independent end and the M bar line one of a variable connectorOne correspondence, every line selects the corresponding independent end of a variable connector to connect by one root connecting line with equipotential MConnect, and by its another root connecting line with etc. electric current M select the corresponding independent end of a variable connector to connect; Deng electricityGesture M selects the common port of a variable connector to be connected with the in-phase input end of Voltage Feedback amplifier, waits electric current M to select oneThe common port of variable connector is connected with the sampling resistor other end.
4. test circuit as claimed in claim 1, is characterized in that, described row MUX comprises two groups of hilted broadswordsSingle-throw switch, each group comprises M bar line M the single-pole single-throw(SPST one to one with resistive sensor arraySwitch; Every line connects with one end of corresponding single-pole single-throw switch (SPST) in first group by one root connecting line, withIn time, connects with one end of corresponding single-pole single-throw switch (SPST) in second group by its another root connecting line; Each list in first groupThe other end of monopole single throw switch is all connected with the other end of sampling resistor, and each single-pole single-throw switch (SPST) is another in second groupOne end is all connected with the in-phase input end of Voltage Feedback amplifier.
5. the method for testing of test circuit as described in claim 1～4 any one, is characterized in that, for described resistanceProperty any one resistive sensor to be measured in sensor array, first this resistive sensor to be measured of gating, concreteAs follows: to make this corresponding column line drive fortune of resistive sensor to be measured place alignment institute by described row MUXThe in-phase input end of putting is connected with reference voltage source, and other alignment the homophase input of corresponding column line drive amplifierEnd is connected with the output of Voltage Feedback amplifier, and makes this resistive biography to be measured by described row MUXSensor place line is same by in-phase input end, the sampling resistor of its two connecting lines and Voltage Feedback amplifier respectivelyIn time, connects, and the in-phase input end of other line and Voltage Feedback amplifier, sampling resistor disconnect simultaneously; Then profitCalculate the resistance R of this resistive sensor to be measured with following formulaxy：
Wherein, VIFor the reference voltage that reference voltage source provides, VFFor the feedback voltage of Voltage Feedback amplifier output,VsgFor sampling resistor both end voltage, RSFor the resistance value of sampling resistor.
6. a sensor-based system, comprises resistive sensor array and corresponding test circuit, it is characterized in that, described inResistive sensor array is classified the resistive sensor array of M × N two dimension of common row line and alignment, described test circuit asFor the resistive Sensor array circuit based on two-wire system Voltage Feedback described in claim 1～4 any one.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105978625A (en) * | 2016-06-27 | 2016-09-28 | 佛山市南海区联合广东新光源产业创新中心 | Visible light communication device with resistor array |
| CN106027145A (en) * | 2016-06-27 | 2016-10-12 | 佛山市南海区联合广东新光源产业创新中心 | Visible light communication switching and controlling method |
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| CN106067843A (en) * | 2016-06-24 | 2016-11-02 | 佛山市南海区联合广东新光源产业创新中心 | A kind of visible light communication device based on analog switch switching control |
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| CN114964346B (en) * | 2022-04-11 | 2023-08-01 | 合肥通用机械研究院有限公司 | Sensor testing method |
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