CN1175315A - 利用干扰排除装置和方法的基于电容的邻近传感器 - Google Patents
利用干扰排除装置和方法的基于电容的邻近传感器 Download PDFInfo
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Abstract
一种具有干扰排除功能的基于电容的邻近检测的装置与方法,一对电极阵列(90)在触摸检测垫(12)上建立电容,该电容随在垫(12)附近的导电物体的运动而变化,并且和一个参考频率信号同步地测量电容的变化,从而提供物体位置的测量。通过产生其频率和干扰的频率不相干的参考频率信号排除电干扰。
Description
本发明一般涉及一种用作触模敏感输入器件的装置与方法,特别涉及其中有效地排除来自检测系统的电干扰的基于电容的用于触摸检测的装置与方法。
现有技术中存在许多利用触觉向数据处理器输入数据的装置和系统。这种装置用于代替普通的指点装置(例如鼠标器或指示笔),通过位于在一个垫(pad)上或显示装置上的手指提供数据输入。这些装置通过电容触摸垫检测手指位置,其中在垫上加上扫描信号,并检测通过手指触摸或靠近所述的垫而引起的电容的变化。通过在连续的时刻检测手指位置,便可以检测手指的运动。这种检测装置可用于控制计算机屏幕光标。更通常地,它可以向各种电气设备提供相应于手指运动、姿势、位置、书写、签名和画图运动的信息。
在Meadows等人的No.4,698,461美国专利中,披露了一种用不变电阻率的层覆盖的触摸表面。施加屏扫描信号,以便激励选择的触摸表面边沿,使得在屏的表面上建立一个交流电压梯度。当表面被触摸时,从每个激励的边沿通过电阻表面流过一个触摸电流,该电流然后到达用户手指(通过电容或传导),通过人体,最后通过人体电容和地电位接通。在边沿上施加不同的扫描顺序和电压形式,并测量每种情况下的电流。通过测量这些电流便可以确定触摸的位置。特别是代表触摸位置的物理参数是从边沿到表面上的触摸点之间的电阻。当触摸点接近或远离每个边沿时,这电阻将发生变化。对于这种系统,术语“电容性触摸垫”可能属于用词不当,因为其中涉及的电容是用于从表面触摸点通过人的手指产生耦合电流,而不是代表手指位置的参数。这一发明的缺点在于,精确的触摸位置测量取决于表面的均匀的电阻率。制造这种具有均匀电阻的表面是困难而昂贵的,并且需要专门的制造方法和设备。
Meadows的461号专利的屏还包括一种用于使当屏不被触摸时存在的触摸电流“回零”的或偏置为零的电路。在对屏操作时可以实现回零,并因而使得对于产生相当弱的信号的触摸,例如用戴着手套的手指触摸,也能更准确地确定。Meadows的461专利的屏还包括一种电路,用于自动地移动屏扫描信号频率,使其离开杂散信号,例如在环境中可能存在的由阴极射线管变压器产生的杂散信号的频谱。这种屏力图避免杂散信号的干扰,如果扫描频率几乎等于杂散信号的频率时则可能发生这种干扰。微控制器通过监视需要进行如上所述的触摸电流的回零调整的数量,确定是否该移动扫描频率。所述的用于产生频率控制信号的唯一方法基于这种回零调节。
Meadows等人的美国专利No.4,922,061和Meadows的461号的相似之处在于,触摸屏根据电阻的变化确定触摸位置,而不是根据电容的变化。这尤其是从图2可以明显地看出,其中从边沿到触摸点的电阻被表示为Kx乘以Rx,其中Kx相应于由76A表示的距离,该装置使用基本上以随机方式改变的频率作为测量信号,从而减少对于来自杂散的电磁频谱的敏感性。
Salvador的美国专利No.4,700,022描述了一种用于检测的导电带阵列,每个导电带位于电阻发射带之间。实际上手指从发射带到检测带进行电接触。触摸的位置由在手指接触的带中的电阻变化(和上述的Meadows′461以及′061专利一样)确定。对某个数量的同步采样取平均值。有一个设计公式用来选择采样频率使其不是最不希望的预定干扰信号的倍数。没有提示进行采样频率的调整或使采样频率自动地适应。
在Gerpheide的美国专利No.5,305,017中,触摸位置由真正的电容变化确定,而不是由电阻的变化确定。其中使用许多电极带形成有效(Virtual)电极。这种方法不需在显示屏上覆盖均匀的电阻。不过,这种基于电容的检测装置可能受到其周围的背景电噪声的干扰,这种噪声被耦合到检测电极上而干扰位置检测。这些杂散信号产生可能引起故障的干扰,干扰手指定位的检测。装置操作者甚至可以作为电干扰的天线,对检测电极产生假的电荷注入或消除。
因而,需要一种触摸检测系统,该系统具有如下特征:
(1)不需要电阻变化便可以确定触摸位置,从而不需要在制造期间为制造均匀电阻而需要高的费用;
(2)触摸位置以和电极电阻或其连线无关的方式测量,因而扩大了可用于制造的材料以及方法的范围;以及
(3)不管电干扰信号的频率,也不需昂贵的回零装置便能从检测系统中消除电干扰信号。
本发明采用一种触摸定位装置,该装置通过使用绝缘的电极阵列形成有效电极,从而具有真正的电容变化。借助于不依赖于电极电阻的方法进行电容变化的测量,从而在制造过程中不需考虑电极电阻参数。不管什么样的电干扰的频率都能被消除,从而提供可靠的检测信号。
本发明的一个说明性的实施例包括一个电极阵列,用以产生电容,所述电容随在阵列附近的物体(例如手指、人体的其它部分、导电的指示笔等)的运动而变化,用于测量电容的变化的同步电容测量部分,所述的测量是和参考频率信号同步的,以及用来产生参考频率信号的参考频率信号发生器,所述参考信号不会带来干扰电容测量的电气干扰,因而不干扰位置定位。
通过产生一个其频率和干扰频率不同的参考频率信号来进行排除干扰。此外,参考信号利用随机频率产生,从而使得不会和干扰频率相干,这样便有效地排除了干扰。
图1是按照本发明的原理实现的电容变化位置测量装置的方块图;
图2A是图1所示的电极阵列的一个说明性的实施例的平面图;
图2B是图2A的电极阵列的一个说明性实施例的侧面截面图;
图3A是图1的电极阵列的另一个实施例的侧面截面图;
图3B是图3A的电极阵列的平面图;
图4是图1的同步电极电容测量装置的一个实施例的原理图;
图5是图1的同步电极电容测量装置的另一个实施例的原理图;
图6A-6D是图4和图5所示的电容测量部分的另一个实施例的电路图;
图7是图1所示的参考频率发生器的一个实施例的方块图;以及
图8是图1所示的参考频率发生器的另一个实施例的方块图。
图1所示为按照本发明实现的电容变化手指(或其它导电的身体部分或导电的非身体部分)位置检测系统10。电极阵列12包括多层的导电电极带。电极和把电极连到该装置上去的连线可以具有相当大的电阻,从而可以允许使用各种材料和工艺制造。电极之间彼此电气绝缘。在每两个电极之间存在相互电容,在每个电极和地之间存在杂散电容。位于阵列附近的手指改变这些相互电容和杂散电容的值。这些电容值改变的程度取决于手指相对于电极的位置。一般地说,当手指和有关电极越接近时,改变的程度也越大。
同步电极电容测量单元14和电极阵列12相连,并确定选择的相互电容值与/或和电极有关的杂散电容值。为了减少干扰,由单元14在与由参考信号发生器16提供的参考频率信号同步的定时进行大量的测量。所需的电容值通过对由单元14进行的各个测量进行积分、平均,或更一般地说,进行滤波而确定。用这种方式,除去在参考频率附近具有强的频率频谱的杂散信号之外,在测量中的干扰基本上被排除了。
参考频率发生器16试图自动地选择并产生一个参考频率,其中不包括最不希望的杂散信号的频率。这种方法基本上消除了干扰,尽管其频率起初可能是未知的并甚至在操作期间可以改变。
位置定位器18处理来自同步电极电容测量单元14的电容测量信号,并提供位置信号例如供给主计算机使用,并把位置信号供给参考频率发生器16。位置定位器单元18根据电容测量确定手指位置信号。在本领域中有几种不同的公知的系统,用来根据和阵列中的电极相关的电容的测量确定手指位置。位置定位器可以提供一维的检测(例如可变电阻器的滑动触头控制),具有接触确定的二维检测(例如计算机光标控制),或完整的三维检测(例如用于游戏和三维的计算机绘图)。现有技术中的位置定位器的例子如上述的Gerpheide的′017专利中图1的标号40和50所示。
电极阵列:
图2A是在优选的电极阵列12中的电极和规定X、Y方向的坐标轴。这个实施例包括16个X电极和12个Y电极,但为清楚起见,只示出了6个X电极20和4个Y电极22。显然,本领域的技术人员知道如何增加电极的数量。阵列最好被制成多层印刷电路板24的形式。这些电极是刻蚀而成的导电带,它们和通道(Vias)26相连,通道26又把它们和阵列中的其它层相连。例如,阵列12在X方向大约65毫米,在Y方向大约49毫米。X电极的宽度大约0.7毫米,中心间距大约3.3毫米。Y电极大约3毫米宽,中心间距为3.3毫米。
图2b是电极阵列12的侧面截面图。绝缘表层21是一种大约0.2毫米厚的一层透明的聚碳酸酯,在上表面具有摸着舒服的结构,通过在上表面上添加有纹理的透明硬涂层可以增加其耐磨性。表层的底面可以用油墨进行丝网印刷,从而提供图案和彩色。
X电极20、Y电极22,接地平面25和元件线27是在多层印刷电路板内蚀刻而成的铜线。接地平面25覆盖整个阵列面积并屏蔽电极使其不受可能由电路部分产生的电干扰。元件线27连接通道26,因而也连接电极20、22到图1的其它电路元件。绝缘层31、32和33是在印刷电路板内的玻璃纤维环氧树脂层。它们的厚度分别大约为1.0毫米、0.2毫米和0.1毫米。这些尺寸可以改变,只要保持其一致性即可。但是所有X电极20和所有Y电极22各自必须尺寸相同。
本领域的技术人员应该理解,可以使用不同技术和材料形成电极阵列。例如,图3A所示为另一实施例,其中电极阵列包括如上所述的绝缘表层40。通过丝网印刷工艺在绝缘表层40的反面交替地提供导电油墨层42和绝缘墨层43。X电极45位于绝缘表层40和X电极导电油墨层42之间。Y电极46位于绝缘油墨层43和导电油墨层44之间。另一个绝缘油墨层47被加于导电油墨层44的下面,并且接地平面48被加在Y电极导电油墨47上。每一层的厚度大约0.01毫米。
所得到的阵列是薄的并有柔性的,因而可以形成弯曲表面。在使用时,应将其置于结实的固体支撑上。在另一个例子中,电极阵列可以利用柔性印刷电路板,例如软性印刷线路板或冲压的金属片与金属箔。
有多种几何形状和布置的电极可被用于手指位置检测。其中的一个例子如图3b所示。这是一个用于一维位置检测的平行电极条阵列50,它可以用作“滑动电位计控制”或“烤面包器的暗度控制”。其它的例子包括菱形的网格(grid of diamonds)控制或磁盘扇区(sec-tors of a disk)的控制。
希望本发明的电极阵列能够使用价廉的且能广泛得到的印刷电路板制造工艺制造。还希望可能够使用多种的表层材料,并根据纹理结构和小的摩擦力进行选择,在其上面应该可以经济地印制艺术字画和色彩。还希望表层可以和阵列的含电极的部分分开印制。这便允许使含电极的部分进行大量的标准化生产,而后再固定专门印制的表层。
同步电极电容测量单元:
图4表示同步电极电容测量单元的更详细的情况。其主要部分包括:(a)用于在电极阵列中和参考信号同步地产生电压变化的部分,(b)用于产生代表位移电荷因而也代表电极阵列的电极之间耦合状态的信号的部分,(c)用于对所述和参考信号同步的信号进行检波的部分,以及(d)用于低通滤波所述检波信号的部分。单元14最好通过多路转换器或开关和电极阵列相连。在本实施例中要被测量的电容是电极之间的相互电容,但也可以是电极对地的杂散电容或所述相互或杂散电容的代数和(即和或差)。
图4表示和电极阵列12相连的同步电极电容测量单元14的一个特定的例子,用来测量电极之间的相互电容的代数和。所有元件被分为4个主要的功能方块。有效电极同步方块70把每个X电极连接到线路CP或CN中的一个,每个Y电极和线RP或RN中的一个相连。这些电极用开关选择地和这些线相连,所述开关最好是在位置定位器装置18(图1)的控制下的CMOS开关,用来选择合适的电极进行电容测量。(见Gerpheide的′017号专利,在其中的图1中由信号S说明了这种电极的选择。)在任何时间和CP线相连的所有电极被认为形成一个“正的有效X电极”。类似地,和CN、RP、以及RN相连的电极分别形成“负的有效X电极”、“正有效Y电极”和“负有效Y电极”。
参考频率信号最好是来自参考频率发生器16(图1)的数字逻辑信号。参考频率信号通过与门72供给单元14,与门72还具有一个“驱动启动”输入端,由参考频率发生器16(图1)提供信号。与门的输出通过反相器74和非反相缓冲器76分别送入线RP和RN,它们是电容测量部分78的一部分。在最佳实施例中,驱动启动信号总是TRUE,以便使参考频率信号通过。在另一个优选的实施例中,当如后所述要进行干扰计算时,由参考频率发生器使其为FALSE。当驱动启动信号为FALSE时,驱动信号停留在一个恒定的电压电平上。当驱动信号是TRUE时,它是参考信号的复制信号。
电容测量部分78包含一个微分电荷转移电路80,如Gerpheide的美国专利5349303的图4所示,在此列为参考。上述专利的图4的电容CS1和CS2相应于正负有效电极对地的杂散电容。图4的CHOP信号在本发明中是一种一般的方波信号,其频率等于参考频率信号的一半,并由图中所示的除以2电路81产生。如Gerpheide的′303专利所述,该电路把CP和CN(其中的线68和72)保持为恒定的虚拟地电位。
电容测量部分78还具有非反相驱动缓冲器76,它驱动RN以及负有效Y电极以便改变电压电平,使得复制驱动启动信号的变化。反相缓冲器74驱动RP和正有效Y电极以便改变电压电平,使得和驱动启动信号的变化相反。因为CP和CN被保持为虚拟接地,所以这些电压的变化是在有效Y电极和有效X电极之间存在的相互电容两端的净电压变化。和这些电压的变化乘以合适的电容值成正比的电荷因而被耦合到节点CP和CN上(“耦合电荷”)。因此,电荷传递电路在其输出端Q01和Q02提供比例微分电荷,它正比于耦合电荷因而也正比于电容。
简明地说,这微分电荷是比例系数K乘以“平衡(balance)”L的积,其中L是由下式给出的这些电容的组合:
L=M(xp,yn)+M(xnyp)-M(xp,yp)-M(xn,yn)其中M表示在有效电极“a”和有效电极“b”之间的相互电容。平衡时的电荷表示如Gerpheide的美国专利5,305,017中所述的相对于有效电极位置的手指位置。比例系统K具有和驱动启动信号变化方向相同的符号。
再参见图4,同步电极电容测量部分78通过带有电荷Q01和Q02的线连接到同步检波器82,它可以是由参考频率信号控制的双极双掷CMOS开关84。同步检波器82的主要作用是对电荷Q01和Q02进行整流,它被连接到低通滤波器86,滤波器86可以是对微分电荷构成积分器的一对电容器C1和C2。(例如积分器可以是一个每倍频程频率衰降6db的低通滤波器。)当参考频率信号刚好变正并且K是正时,电荷Q01和Q02分别在电容器C1和C2上积分。当K为负时,电荷在相反的电容器上积分。用这种方式,在电容C1和C2上便积累和平衡L成正比的微分电荷。
图5是同步电极电容测量单元14的另一个实施例。在这个实施例中,在电极阵列90中的每个电极被连接到专用的电容测量部分92,每个专用的电容测量部分92和同步检波器94相连,然后连接低通滤波器96。这种结构的优点是可以对每个电极连续地提供电容测量,而前一个优选的实施例任何一次只能测量一个电极结构。图5的实施例的缺点是较大的花销,这可能和重复的元件有关。这是一种在提供多个元件以便同时进行测量和多路转换一个元件而按顺序地进行测量之间的普通的交换。显然,可在大量的不同的领域内应用这一交换。
此外,使用模数转换器和数字信号处理,许多单元可以以数字形式实现。虽然优选的实施例目前使用基本的模拟处理,但预计将来用数字处理的花销可能相对的低。
图6对电容测量部分78(图4)或92(图5)提供了若干个优选的替代方案。图6A和6B表示的电路适用于测量电极(可以是实际的电极或有效(virtual)的电极)之间的相互电容,用Cmp,Cmn,和Cm代表。图6C和6D所示的电路适用于测量由Cg表示的电极对地的电容。这些电路的每一个都提供一个代表被测电容的输出电压变化。这些电压变化由下式给出:
对图6A:ΔV输出=ΔV驱动×(Cmp-Cmn)/Cr
对图6B:ΔV输出=ΔV驱动×Cm/Cr
对图6C:ΔV输出=ΔV驱动×Cg/(Cg+Cr)
对图6D:ΔV输出=ΔV驱动×(Cg+Cr)/Cg
这些公式和由Cr表示的已知的参考电容和由ΔV驱动表示的已知的驱动电压变化有关。其它的电容测量部分可以根据电荷平衡技术,如Meyer的美国专利3,857,092所述。同步检波器可以使用模拟或数字放大器实现,或使用National Semiconductor Company的“双平衡混合器”集成电路(例如元件号为LM1496)实现。关于低通滤波器部分,现有技术中有许多不同的实施方案,例如开关电容积分器和开关电容滤波器、高阶模拟滤波器和数字滤波器。
参考频率发生器:
图7是参考频率发生器(图1)的优选实施例。发生器观测位置信号以便估算某个干扰频率的干扰程度。在检测到相当大的干扰的情况下,发生器16则选择一个不同的频率用于进一步的测量。发生器16总是试图选择一个和已被发现引起测量干扰的频率不同的频率进行测量,如下所述。
发生器16包括振荡器100,例如,把其振荡频率设为4MHz,用来驱动微控制器102和除以(M+N)电路104。其中的值N是固定常数大约为50。M的值由微控制器102确定,例如,可以是由微控制器102规定的在61KHz到80KHz范围内的4个值之一。
微控制器102执行干扰估算106和频率选择108的功能。它可以完成和系统有关的其它功能,例如位置定位。优选的干扰估算功能106产生借助于位置定位单元18(图1)产生的位置信号中的干扰的量度。其根据的原理是,干扰产生一个杂散的相当大的位置信号的高频分量,并按照下述的代码描述进行操作。假定位置数据点X、Y和Z大约每10毫秒出现一次。简短地说,它对于32个数据点计算X和Y的二次差分的绝对值以及Z的一次差分的绝对值的和,作为干扰量度IM。计算数据流的差分具有对该数据流进行高通滤波的效果。
详细地说,对于每个数据点,干扰估算功能106执行如下的步骤,其中ABS()表示绝对值函数:
XD=X-XLAST;计算一次差分
YD=Y-YLAST
ZD=Z-ZLAST
XDD=XD-XDLAST;计算二次差分;
YDD=YD-YLAST
IM=IM+ABS(XDD)+ABS(YDD)+ABS(Z);求和
如果每一节32个采样
{执行频率选择功能108(见以下说明)
IM=0}
XLAST=X;移动当前值到最近的值
XLAST=Y
ZLAST=Z
XDLAST=XD
YDLAST=YD
在另一个实施例中,干扰估算功能106不根据位置信号进行估算,而是把上述的驱动启动信号规定成为FALSE状态,并读出所得的同步电容测量值。当电极之间没有被该装置加上电压时,这便测量出和电极耦合的电荷。这些电荷一定是干扰的结果,因而便直接测量出这一干扰(来自杂散信号)。这是产生干扰测量IM的另一种方法。
优选的频率选择功能块108产生一个对于每一可被选择的频率的历史的干扰测量表。在系统初始化时,把每一项置为零。此后,大约每32个数据点便由干扰估算功能106启动频率选择功能。把当前干扰量度IM对于当前选择的频率作为一项输入表中。然后扫描所有的表项。具有最低干扰量度项的频率被选为新的当前频率,并把相应的M值送到除以(M+N)单元104。大约每隔80秒把表中的每一项减小一个相应于大约0.05mm的位置变化的量。用这种方式,如果有一频率由于有一次具有强的干扰而被标记为“差”,它将不会被永久地标记为“差”。
对于不同实施例,上述功能可由微处理器实现,例如由Motorola制造的编号为MC 68HC705P6的微处理器作为微控制器102。
图8表示参考频率发生器16(图1)的另一个优选的实施例。它产生一个随机变化的参考频率信号。信号的每个周期具有不同的并基本上是随机的时间间隔。杂散信号一致地跟随随机变化的同一序列是极不可能的。因而杂散信号基本上被和参考频率同步的电容测量排除了。尽管排除的程度不像前一实施例那样大,但是因为不需要干扰估算和频率选择功能,而使得这种发生器比较简单。
图8的发生器包括振荡器110和除以(N+M)电路112。提供给除法器的值M来自伪随机数发生器(PRNG)114,它产生在0到15范围内的数。参考频率的每个周期控制PRNG 114,使其与之同步产生一个新的数。PRNG在现有技术中是熟知的。
对于图7或图8中的每一实施例,和N的值有关的M值的范围可以增加或减少,从而给出可能频率的较大或较小的范围。N的值或振荡器频率可被调整,从而改变最大的可能频率。代替除以(M+N)电路,也可以优选地使用锁相频率合成器,例如Motorola MC145151-2,或由D/A转换器驱动的电压控制的振荡器。
应当理解,上述的优选实施例的其它变化都落在本发明的范围之内。这些变化包括不同的电极阵列几何结构,例如条形的栅格、菱形的栅格、平行的条以及各种其它形状。还包括制造电极阵列的方法的各种改变。例如用印刷线路板(PCB)、柔性PCB、丝网印刷、冲压的金属片或金属箔。还包括所用电容种类的改变,例如全平衡的(见Gerpheide的′017专利)、杂散的、相互的、半平衡的。
上述说明已按照本发明提供了某些优选的实施例。显然,本领域技术人员可以在所附权利要求的范内作出各种改型,以下的权利要求包括了本发明的构思。
Claims (21)
1.一种用于确定物体的位置,同时排除电干扰的基于电容的邻近检测器,包括:
(a)电极阵列,用于形成随物体的运动而改变的电容;
(b)和所述电极阵列相连的测量装置,用来和参考信号同步地测量所述电容;以及
(c)用于向测量装置提供参考信号的发生器装置,所述参考信号具有和电干扰信号的频率不相干的频率。
2.如权利要求1所述的邻近检测器,其特征在于发生器装置包括用于估算电干扰并用于产生参考信号的装置,所述参考信号的频率和所述电干扰的频率不同。
3.如权利要求2所述的邻近检测器,其特征在于估算装置包括用于存储选择的参考信号的频率和对于每个所述频率的电干扰的测量值IM的表,并用来产生参考信号的装置,所述参考信号的频率具有最低的与其相关的IM。
4.如权利要求1所述的邻近检测器,其特征在于发生器装置包括用于产生参考信号的振荡器装置和用于随机地改变由所述振荡器装置产生的参考信号的频率的装置。
5.如权利要求4所述的邻近传感器,其特征在于所述改变装置包括用于和一个被提供的数成正比地改变参考信号的频率的装置,以及用于向改变装置连续地提供数的伪随机数发生器。
6.如权利要求1所述的邻近检测器,其特征在于还包括物体定位装置,用来响应测量装置而产生代表物体相对于电极阵列的位置的具有高频分量位置信号,并且其中所述发生器装置包括
估算装置;用来响应物体定位装置而确定位置信号的高频分量的大小,以及
当位置信号的高频分量的大小超过预定值时,用来响应估算装置而改变参考信号的频率的装置。
7.如权利要求1所述的邻近检测器,其中所述测量装置包括
驱动器装置,用来在电极阵列上和参考信号同步地产生电压变化,
电荷测量装置,用来和参考信号同步地测量和电极阵列耦合的电荷,并因而测量电容,
用于选择地禁止驱动装置产生电压变化、并在驱动装置禁止期间进行测量代表干扰的量度IM的耦合电荷测量装置,以及
其中所述发生器装置包括当干扰量度IM超过预定值时用于改变参考信号的频率的装置。
8.如权利要求7所述的邻近检测器,其特征在于发生器装置还包括用于存储参考信号的频率和对每一频率的参考信号进行测量的有关干扰量度IM的表,并用于产生参考信号的装置,所述参考信号的频率具有与其相关的最低的干扰量度IM。
9.如权利要求1所述的邻近检测器,其特征在于电极阵列包括在第一阵列中的彼此分开的许多第一电极带,以及和第一电极带接近的彼此分开的许多第二电极带。
10.如权利要求9所述的邻近检测器,其中测量装置包括:
驱动装置,用来在电极阵列上和参考信号同步地产生电压变化,
电荷转移装置,和电极阵列相连,用于和参考信号的频率同步地产生测量信号,所述测量信号代表由于电压变化而耦合到电极阵列上的电荷,
同步检波装置,和电荷转移装置相连,用于整流和参考信号同步产生的测量信号,以及
低通滤波器装置,和同步检测装置相连,用于产生代表整流信号的平均直流电压因而也代表电极阵列的电容的信号。
11.如权利要求10所述的邻近检测器,其中所述测量装置包括多个电容测量部分,每个和各自的电极带相连。
12.如权利要求11所述的邻近检测器,还包括多个同步检波部分,每个和各自的电容测量部分相连。
13.如权利要求1所述的邻近检测器,还包括位置定位装置,和测量装置的输出相连,用于产生代表物体相对于电极阵列的位置的位置信号。
14.一种基于电容的触摸检测系统,用于排除干扰并通过检测物体相对于触摸垫的位置而产生数据,所述系统包括:
(a)和触摸垫邻接的用于产生电容的电极阵列,
(b)用来和参考频率信号同步地进行测量当物体相对于垫运动时而产生的和触摸垫相邻接的电容的变化的装置,以及
(c)用于产生供给测量装置的参考频率信号的装置,所述参考频率信号的频率远离干扰的频率,从而有效地排除所述干扰。
15.如权利要求14所述的检测系统,其中参考频率发生器装置包括用于估算干扰的频率并用于选择其频率远离干扰频率的参考频率信号的装置。
16.如权利要求14所述的检测系统,其中参考频率发生器装置包括振荡器和与振荡器相连的伪随机数发生器,用来产生其频率是随机的参考频率信号。
17.如权利要求14所述的检测系统,其中电极阵列包括相互分开的第一和第二电极组,用来对触摸垫产生电容。
18.如权利要求17所述的检测系统,其中第一和第二电极组基本上互相垂直,以便形成用来提供电容的有效电极(Virtual elec-trode)。
19.如权利要求14所述的检测系统,其中所述测量装置包括和电极阵列相连的电容测量部分,和电容测量部分相连的同步检波器以及和检波器相连的低通滤波器。
20.一种用来检测在电极阵列上的物体位置的方法,包括下列步骤:
(a)在所述阵列上产生随物体的运动而改变的电容,
(b)和参考信号的频率同步地测量所述阵列上的电容,以及
(c)产生一个参考信号,它具有和影响所述电容的电干扰的频率不相干的频率。
21.如权利要求20所述的方法,还包括产生代表物体相对于电极阵列的位置的信号的步骤。
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CN95197542A Expired - Fee Related CN1107929C (zh) | 1994-12-07 | 1995-12-06 | 利用干扰排除装置和方法的基于电容的邻近传感器 |
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EP (1) | EP0796485A4 (zh) |
JP (1) | JP3895373B2 (zh) |
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Also Published As
Publication number | Publication date |
---|---|
CN1107929C (zh) | 2003-05-07 |
US5565658A (en) | 1996-10-15 |
EP0796485A1 (en) | 1997-09-24 |
WO1996018179A1 (en) | 1996-06-13 |
EP0796485A4 (en) | 1998-09-16 |
JP3895373B2 (ja) | 2007-03-22 |
JPH11505641A (ja) | 1999-05-21 |
AU4474196A (en) | 1996-06-26 |
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