CN1465072A - 非易失性存储器中的导引门和位线分隔 - Google Patents
非易失性存储器中的导引门和位线分隔 Download PDFInfo
- Publication number
- CN1465072A CN1465072A CN02802264A CN02802264A CN1465072A CN 1465072 A CN1465072 A CN 1465072A CN 02802264 A CN02802264 A CN 02802264A CN 02802264 A CN02802264 A CN 02802264A CN 1465072 A CN1465072 A CN 1465072A
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- storage unit
- steering gate
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Links
- 230000015654 memory Effects 0.000 title claims abstract description 55
- 230000011218 segmentation Effects 0.000 title description 12
- 238000000034 method Methods 0.000 claims description 12
- 238000009792 diffusion process Methods 0.000 claims description 8
- 230000008878 coupling Effects 0.000 claims 4
- 238000010168 coupling process Methods 0.000 claims 4
- 238000005859 coupling reaction Methods 0.000 claims 4
- 239000000758 substrate Substances 0.000 claims 4
- 230000005540 biological transmission Effects 0.000 description 8
- 230000008901 benefit Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 239000004615 ingredient Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 206010048669 Terminal state Diseases 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000024241 parasitism Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/18—Bit line organisation; Bit line lay-out
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0491—Virtual ground arrays
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0433—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0441—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates
- G11C16/0458—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates comprising two or more independent floating gates which store independent data
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
- Storage Device Security (AREA)
Abstract
Description
Claims (15)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/871,333 | 2001-05-31 | ||
US09/871,333 US6532172B2 (en) | 2001-05-31 | 2001-05-31 | Steering gate and bit line segmentation in non-volatile memories |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1465072A true CN1465072A (zh) | 2003-12-31 |
CN1329915C CN1329915C (zh) | 2007-08-01 |
Family
ID=25357217
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB028022645A Expired - Lifetime CN1329915C (zh) | 2001-05-31 | 2002-03-29 | 非易失性存储器中的导引门和位线分隔 |
Country Status (9)
Country | Link |
---|---|
US (1) | US6532172B2 (zh) |
EP (3) | EP1397808B3 (zh) |
JP (2) | JP4173800B2 (zh) |
KR (1) | KR100896221B1 (zh) |
CN (1) | CN1329915C (zh) |
AT (2) | ATE409348T1 (zh) |
DE (2) | DE60206624T3 (zh) |
TW (1) | TW556227B (zh) |
WO (1) | WO2002099808A1 (zh) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7071060B1 (en) | 1996-02-28 | 2006-07-04 | Sandisk Corporation | EEPROM with split gate source side infection with sidewall spacers |
US6894343B2 (en) * | 2001-05-18 | 2005-05-17 | Sandisk Corporation | Floating gate memory cells utilizing substrate trenches to scale down their size |
US6936887B2 (en) * | 2001-05-18 | 2005-08-30 | Sandisk Corporation | Non-volatile memory cells utilizing substrate trenches |
KR100432884B1 (ko) * | 2001-08-28 | 2004-05-22 | 삼성전자주식회사 | 공유된 행 선택 구조를 갖는 불 휘발성 반도체 메모리 장치 |
US6552932B1 (en) * | 2001-09-21 | 2003-04-22 | Sandisk Corporation | Segmented metal bitlines |
US6654283B1 (en) * | 2001-12-11 | 2003-11-25 | Advanced Micro Devices Inc. | Flash memory array architecture and method of programming, erasing and reading thereof |
US6795349B2 (en) * | 2002-02-28 | 2004-09-21 | Sandisk Corporation | Method and system for efficiently reading and programming of dual cell memory elements |
US6950348B2 (en) | 2003-06-20 | 2005-09-27 | Sandisk Corporation | Source controlled operation of non-volatile memories |
US6888758B1 (en) | 2004-01-21 | 2005-05-03 | Sandisk Corporation | Programming non-volatile memory |
US7068539B2 (en) * | 2004-01-27 | 2006-06-27 | Sandisk Corporation | Charge packet metering for coarse/fine programming of non-volatile memory |
US7002843B2 (en) * | 2004-01-27 | 2006-02-21 | Sandisk Corporation | Variable current sinking for coarse/fine programming of non-volatile memory |
US7139198B2 (en) * | 2004-01-27 | 2006-11-21 | Sandisk Corporation | Efficient verification for coarse/fine programming of non-volatile memory |
US7020026B2 (en) * | 2004-05-05 | 2006-03-28 | Sandisk Corporation | Bitline governed approach for program control of non-volatile memory |
US7023733B2 (en) * | 2004-05-05 | 2006-04-04 | Sandisk Corporation | Boosting to control programming of non-volatile memory |
US7307884B2 (en) * | 2004-06-15 | 2007-12-11 | Sandisk Corporation | Concurrent programming of non-volatile memory |
US7173859B2 (en) * | 2004-11-16 | 2007-02-06 | Sandisk Corporation | Faster programming of higher level states in multi-level cell flash memory |
US7092290B2 (en) * | 2004-11-16 | 2006-08-15 | Sandisk Corporation | High speed programming system with reduced over programming |
US7313023B2 (en) * | 2005-03-11 | 2007-12-25 | Sandisk Corporation | Partition of non-volatile memory array to reduce bit line capacitance |
US7206235B1 (en) | 2005-10-14 | 2007-04-17 | Sandisk Corporation | Apparatus for controlled programming of non-volatile memory exhibiting bit line coupling |
US7286406B2 (en) * | 2005-10-14 | 2007-10-23 | Sandisk Corporation | Method for controlled programming of non-volatile memory exhibiting bit line coupling |
US7486561B2 (en) * | 2006-06-22 | 2009-02-03 | Sandisk Corporation | Method for non-real time reprogramming of non-volatile memory to achieve tighter distribution of threshold voltages |
US7489549B2 (en) * | 2006-06-22 | 2009-02-10 | Sandisk Corporation | System for non-real time reprogramming of non-volatile memory to achieve tighter distribution of threshold voltages |
US8750041B2 (en) * | 2006-09-05 | 2014-06-10 | Semiconductor Components Industries, Llc | Scalable electrically erasable and programmable memory |
US7450426B2 (en) * | 2006-10-10 | 2008-11-11 | Sandisk Corporation | Systems utilizing variable program voltage increment values in non-volatile memory program operations |
US7474561B2 (en) * | 2006-10-10 | 2009-01-06 | Sandisk Corporation | Variable program voltage increment values in non-volatile memory program operations |
US7508715B2 (en) * | 2007-07-03 | 2009-03-24 | Sandisk Corporation | Coarse/fine program verification in non-volatile memory using different reference levels for improved sensing |
US7599224B2 (en) * | 2007-07-03 | 2009-10-06 | Sandisk Corporation | Systems for coarse/fine program verification in non-volatile memory using different reference levels for improved sensing |
US7940572B2 (en) * | 2008-01-07 | 2011-05-10 | Mosaid Technologies Incorporated | NAND flash memory having multiple cell substrates |
WO2009105282A1 (en) * | 2008-02-20 | 2009-08-27 | Rambus, Inc. | Multiple interface memory with segmented i/o columns reconfigurable with respect to the interfaces |
US8130528B2 (en) * | 2008-08-25 | 2012-03-06 | Sandisk 3D Llc | Memory system with sectional data lines |
US8027209B2 (en) | 2008-10-06 | 2011-09-27 | Sandisk 3D, Llc | Continuous programming of non-volatile memory |
US8279650B2 (en) * | 2009-04-20 | 2012-10-02 | Sandisk 3D Llc | Memory system with data line switching scheme |
US8760957B2 (en) | 2012-03-27 | 2014-06-24 | SanDisk Technologies, Inc. | Non-volatile memory and method having a memory array with a high-speed, short bit-line portion |
KR20180001074U (ko) | 2016-10-11 | 2018-04-19 | 박상규 | 이중구조의 보온용기 |
WO2019044960A1 (ja) | 2017-08-31 | 2019-03-07 | 雪印メグミルク株式会社 | 腸内環境改善用組成物及びその製造法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5095344A (en) | 1988-06-08 | 1992-03-10 | Eliyahou Harari | Highly compact eprom and flash eeprom devices |
US5343063A (en) | 1990-12-18 | 1994-08-30 | Sundisk Corporation | Dense vertical programmable read only memory cell structure and processes for making them |
US6222762B1 (en) | 1992-01-14 | 2001-04-24 | Sandisk Corporation | Multi-state memory |
US5712180A (en) * | 1992-01-14 | 1998-01-27 | Sundisk Corporation | EEPROM with split gate source side injection |
US5313421A (en) | 1992-01-14 | 1994-05-17 | Sundisk Corporation | EEPROM with split gate source side injection |
US5315541A (en) | 1992-07-24 | 1994-05-24 | Sundisk Corporation | Segmented column memory array |
US5661053A (en) | 1994-05-25 | 1997-08-26 | Sandisk Corporation | Method of making dense flash EEPROM cell array and peripheral supporting circuits formed in deposited field oxide with the use of spacers |
US5579259A (en) | 1995-05-31 | 1996-11-26 | Sandisk Corporation | Low voltage erase of a flash EEPROM system having a common erase electrode for two individually erasable sectors |
US5963465A (en) | 1997-12-12 | 1999-10-05 | Saifun Semiconductors, Ltd. | Symmetric segmented memory array architecture |
US6103573A (en) | 1999-06-30 | 2000-08-15 | Sandisk Corporation | Processing techniques for making a dual floating gate EEPROM cell array |
US6151248A (en) | 1999-06-30 | 2000-11-21 | Sandisk Corporation | Dual floating gate EEPROM cell array with steering gates shared by adjacent cells |
US6091633A (en) | 1999-08-09 | 2000-07-18 | Sandisk Corporation | Memory array architecture utilizing global bit lines shared by multiple cells |
US6512263B1 (en) | 2000-09-22 | 2003-01-28 | Sandisk Corporation | Non-volatile memory cell array having discontinuous source and drain diffusions contacted by continuous bit line conductors and methods of forming |
JP3640175B2 (ja) * | 2001-04-13 | 2005-04-20 | セイコーエプソン株式会社 | 不揮発性半導体記憶装置 |
JP2002334588A (ja) * | 2001-05-11 | 2002-11-22 | Seiko Epson Corp | 不揮発性半導体記憶装置のプログラム方法 |
-
2001
- 2001-05-31 US US09/871,333 patent/US6532172B2/en not_active Expired - Lifetime
-
2002
- 2002-03-29 CN CNB028022645A patent/CN1329915C/zh not_active Expired - Lifetime
- 2002-03-29 EP EP02715220A patent/EP1397808B3/en not_active Expired - Lifetime
- 2002-03-29 KR KR1020037001363A patent/KR100896221B1/ko not_active IP Right Cessation
- 2002-03-29 EP EP08014274A patent/EP2009643A1/en not_active Withdrawn
- 2002-03-29 AT AT05076921T patent/ATE409348T1/de not_active IP Right Cessation
- 2002-03-29 DE DE60206624T patent/DE60206624T3/de not_active Expired - Lifetime
- 2002-03-29 JP JP2003502834A patent/JP4173800B2/ja not_active Expired - Lifetime
- 2002-03-29 EP EP05076921A patent/EP1610338B1/en not_active Expired - Lifetime
- 2002-03-29 AT AT02715220T patent/ATE306711T1/de not_active IP Right Cessation
- 2002-03-29 WO PCT/US2002/009535 patent/WO2002099808A1/en active IP Right Grant
- 2002-03-29 DE DE60229076T patent/DE60229076D1/de not_active Expired - Lifetime
- 2002-04-03 TW TW091106736A patent/TW556227B/zh not_active IP Right Cessation
-
2008
- 2008-02-13 JP JP2008031258A patent/JP4750809B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20030020949A (ko) | 2003-03-10 |
DE60206624T3 (de) | 2009-07-16 |
DE60229076D1 (de) | 2008-11-06 |
US6532172B2 (en) | 2003-03-11 |
KR100896221B1 (ko) | 2009-05-07 |
EP1397808A1 (en) | 2004-03-17 |
US20020181266A1 (en) | 2002-12-05 |
ATE306711T1 (de) | 2005-10-15 |
ATE409348T1 (de) | 2008-10-15 |
EP1610338A1 (en) | 2005-12-28 |
DE60206624T2 (de) | 2006-07-13 |
EP1397808B1 (en) | 2005-10-12 |
WO2002099808A1 (en) | 2002-12-12 |
EP1610338B1 (en) | 2008-09-24 |
JP4750809B2 (ja) | 2011-08-17 |
JP2008165980A (ja) | 2008-07-17 |
JP2004522249A (ja) | 2004-07-22 |
EP2009643A1 (en) | 2008-12-31 |
DE60206624D1 (de) | 2006-02-23 |
CN1329915C (zh) | 2007-08-01 |
TW556227B (en) | 2003-10-01 |
JP4173800B2 (ja) | 2008-10-29 |
EP1397808B3 (en) | 2008-11-26 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SANDISK TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: SANDISK CORP. Effective date: 20120326 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20120326 Address after: American Texas Patentee after: Sandisk Corp. Address before: American California Patentee before: Sandisk Corp. |
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C56 | Change in the name or address of the patentee | ||
CP03 | Change of name, title or address |
Address after: texas Patentee after: DELPHI INT OPERATIONS LUX SRL Address before: American Texas Patentee before: Sandisk Corp. |
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CX01 | Expiry of patent term |
Granted publication date: 20070801 |
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CX01 | Expiry of patent term |