CN1825127B - 量化由信号路径的阻抗变化引起的定时误差的方法和装置 - Google Patents
量化由信号路径的阻抗变化引起的定时误差的方法和装置 Download PDFInfo
- Publication number
- CN1825127B CN1825127B CN2006100084002A CN200610008400A CN1825127B CN 1825127 B CN1825127 B CN 1825127B CN 2006100084002 A CN2006100084002 A CN 2006100084002A CN 200610008400 A CN200610008400 A CN 200610008400A CN 1825127 B CN1825127 B CN 1825127B
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- signal
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- sensor
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- 238000000034 method Methods 0.000 title claims description 56
- 238000005070 sampling Methods 0.000 claims description 12
- 230000000630 rising effect Effects 0.000 claims description 8
- 230000007423 decrease Effects 0.000 claims description 6
- 230000005856 abnormality Effects 0.000 claims description 5
- 108010076504 Protein Sorting Signals Proteins 0.000 claims description 3
- 230000004044 response Effects 0.000 claims description 3
- 238000011002 quantification Methods 0.000 claims description 2
- 238000012512 characterization method Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 230000003247 decreasing effect Effects 0.000 description 2
- 230000011514 reflex Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B3/00—Line transmission systems
- H04B3/02—Details
- H04B3/46—Monitoring; Testing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L25/00—Baseband systems
- H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
- H04L25/12—Compensating for variations in line impedance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31901—Analysis of tester Performance; Tester characterization
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L25/00—Baseband systems
- H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
- H04L25/0264—Arrangements for coupling to transmission lines
- H04L25/0278—Arrangements for impedance matching
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B2203/00—Indexing scheme relating to line transmission systems
- H04B2203/54—Aspects of powerline communications not already covered by H04B3/54 and its subgroups
- H04B2203/5462—Systems for power line communications
- H04B2203/5495—Systems for power line communications having measurements and testing channel
Abstract
Description
Claims (18)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/066,832 | 2005-02-25 | ||
US11/066,832 US7536663B2 (en) | 2005-02-25 | 2005-02-25 | Method and apparatus for quantifying the timing error induced by an impedance variation of a signal path |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1825127A CN1825127A (zh) | 2006-08-30 |
CN1825127B true CN1825127B (zh) | 2010-05-26 |
Family
ID=36848263
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2006100084002A Active CN1825127B (zh) | 2005-02-25 | 2006-02-21 | 量化由信号路径的阻抗变化引起的定时误差的方法和装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7536663B2 (zh) |
KR (1) | KR101226330B1 (zh) |
CN (1) | CN1825127B (zh) |
DE (1) | DE102005055829B4 (zh) |
TW (1) | TWI429919B (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7251798B2 (en) * | 2005-02-25 | 2007-07-31 | Verigy (Singapore) Pte. Ltd. | Method and apparatus for quantifying the timing error induced by crosstalk between signal paths |
US20090033389A1 (en) * | 2007-08-03 | 2009-02-05 | Abadeer Wagdi W | Micro-phase adjusting and micro-phase adjusting mixer circuits designed with standard field effect transistor structures |
US9535119B2 (en) * | 2014-06-30 | 2017-01-03 | Intel Corporation | Duty cycle based timing margining for I/O AC timing |
CN112946551B (zh) * | 2021-05-13 | 2021-07-20 | 杭州长川科技股份有限公司 | 路径延迟的测量方法、装置、电子装置和存储介质 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN85108640A (zh) * | 1984-10-03 | 1986-07-30 | 西屋电气公司 | 数字式棒位探测系统 |
US5528166A (en) * | 1995-03-14 | 1996-06-18 | Intel Corporation | Pulse controlled impedance compensated output buffer |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5448591A (en) * | 1990-06-24 | 1995-09-05 | Next, Inc. | Method and apparatus for clock and data delivery on a bus |
ATE401597T1 (de) * | 2000-01-24 | 2008-08-15 | Broadcom Corp | System und verfahren zur kompensation von durch versorgungsspannung induzierten signalverzögerungsfehlanpassungen |
US6509811B2 (en) * | 2000-02-29 | 2003-01-21 | International Business Machines Corporation | Method for reducing the effects of signal reflections in a data communications network |
US6530062B1 (en) * | 2000-03-10 | 2003-03-04 | Rambus Inc. | Active impedance compensation |
US6609077B1 (en) * | 2000-05-31 | 2003-08-19 | Teradyne, Inc. | ATE timing measurement unit and method |
US6571376B1 (en) * | 2002-01-03 | 2003-05-27 | Intel Corporation | Method and apparatus for analog compensation of driver output signal slew rate against device impedance variation |
US7003043B2 (en) * | 2002-01-09 | 2006-02-21 | Intel Corporation | Replica driver mismatch correction using a variable offset comparator |
US6842011B1 (en) * | 2002-06-27 | 2005-01-11 | Nortel Networks Limited | Method and apparatus for locating impedance mismatches in a radio frequency communication system |
US7036098B2 (en) * | 2003-06-30 | 2006-04-25 | Sun Microsystems, Inc. | On-chip signal state duration measurement and adjustment |
JP2006154951A (ja) * | 2004-11-25 | 2006-06-15 | Fujitsu Ltd | 検証方法及び検証装置 |
-
2005
- 2005-02-25 US US11/066,832 patent/US7536663B2/en active Active
- 2005-08-24 TW TW094128911A patent/TWI429919B/zh active
- 2005-11-23 DE DE102005055829A patent/DE102005055829B4/de not_active Expired - Fee Related
-
2006
- 2006-02-21 CN CN2006100084002A patent/CN1825127B/zh active Active
- 2006-02-24 KR KR1020060018309A patent/KR101226330B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN85108640A (zh) * | 1984-10-03 | 1986-07-30 | 西屋电气公司 | 数字式棒位探测系统 |
US5528166A (en) * | 1995-03-14 | 1996-06-18 | Intel Corporation | Pulse controlled impedance compensated output buffer |
Also Published As
Publication number | Publication date |
---|---|
US7536663B2 (en) | 2009-05-19 |
DE102005055829B4 (de) | 2009-06-04 |
KR20060094920A (ko) | 2006-08-30 |
TW200630620A (en) | 2006-09-01 |
KR101226330B1 (ko) | 2013-01-24 |
DE102005055829A1 (de) | 2006-09-07 |
CN1825127A (zh) | 2006-08-30 |
US20060195806A1 (en) | 2006-08-31 |
TWI429919B (zh) | 2014-03-11 |
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Effective date of registration: 20080314 Address after: Singapore Singapore Applicant after: Verigy Pte Ltd Singapore Address before: American California Applicant before: Anjelen Sci. & Tech. Inc. |
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Owner name: ADVANTEST (SINGAPORE) PTE. LTD. Free format text: FORMER OWNER: VERIGY (SINGAPORE) PTE. LTD. Effective date: 20120425 |
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Owner name: ADVANTEST CORP. Free format text: FORMER OWNER: ADVANTEST (CHINA) CO., LTD. Effective date: 20150430 |
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