DE10195052T1 - Optische Systeme zur Messung der Form und der geometrischen Abmessungen von Präzisionsbauteilen - Google Patents

Optische Systeme zur Messung der Form und der geometrischen Abmessungen von Präzisionsbauteilen

Info

Publication number
DE10195052T1
DE10195052T1 DE10195052T DE10195052T DE10195052T1 DE 10195052 T1 DE10195052 T1 DE 10195052T1 DE 10195052 T DE10195052 T DE 10195052T DE 10195052 T DE10195052 T DE 10195052T DE 10195052 T1 DE10195052 T1 DE 10195052T1
Authority
DE
Germany
Prior art keywords
measuring
shape
optical systems
geometric dimensions
precision components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE10195052T
Other languages
English (en)
Other versions
DE10195052B3 (de
Inventor
Groot Peter De
De Lega Xavier Colonna
David Grigg
James Biegen
Leslie L Deck
James W Kramer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zygo Corp
Original Assignee
Zygo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zygo Corp filed Critical Zygo Corp
Publication of DE10195052T1 publication Critical patent/DE10195052T1/de
Application granted granted Critical
Publication of DE10195052B3 publication Critical patent/DE10195052B3/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02021—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different faces of object, e.g. opposite faces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078—Caused by ambiguity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
DE10195052.7T 2000-01-25 2001-01-25 Verfahren und Einrichtungen zur Bestimmung einer geometrischen Eigenschaft eines Versuchsgegenstands sowie optisches Profilmesssystem Expired - Lifetime DE10195052B3 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US17791200P 2000-01-25 2000-01-25
US60/177,912 2000-01-25
US20573600P 2000-05-19 2000-05-19
US60/205,736 2000-05-19
PCT/US2001/002411 WO2001059402A2 (en) 2000-01-25 2001-01-25 Optical systems for measuring form and geometric dimensions of precision engineered parts

Publications (2)

Publication Number Publication Date
DE10195052T1 true DE10195052T1 (de) 2003-05-08
DE10195052B3 DE10195052B3 (de) 2015-06-18

Family

ID=26873770

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10195052.7T Expired - Lifetime DE10195052B3 (de) 2000-01-25 2001-01-25 Verfahren und Einrichtungen zur Bestimmung einer geometrischen Eigenschaft eines Versuchsgegenstands sowie optisches Profilmesssystem

Country Status (5)

Country Link
US (1) US6822745B2 (de)
JP (2) JP5112588B2 (de)
AU (1) AU2001260975A1 (de)
DE (1) DE10195052B3 (de)
WO (1) WO2001059402A2 (de)

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Also Published As

Publication number Publication date
JP5032680B2 (ja) 2012-09-26
AU2001260975A1 (en) 2001-08-20
JP2003522939A (ja) 2003-07-29
WO2001059402A2 (en) 2001-08-16
WO2001059402A3 (en) 2002-01-17
US6822745B2 (en) 2004-11-23
DE10195052B3 (de) 2015-06-18
US20010043333A1 (en) 2001-11-22
JP2011107168A (ja) 2011-06-02
JP5112588B2 (ja) 2013-01-09

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