DE19914583A1 - Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light - Google Patents

Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light

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Publication number
DE19914583A1
DE19914583A1 DE1999114583 DE19914583A DE19914583A1 DE 19914583 A1 DE19914583 A1 DE 19914583A1 DE 1999114583 DE1999114583 DE 1999114583 DE 19914583 A DE19914583 A DE 19914583A DE 19914583 A1 DE19914583 A1 DE 19914583A1
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Germany
Prior art keywords
bitmap
production
illuminated
light
semiconductor
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DE1999114583
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German (de)
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Individual
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Individual
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Priority to DE1999114583 priority Critical patent/DE19914583A1/en
Publication of DE19914583A1 publication Critical patent/DE19914583A1/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems

Abstract

System in which an exposure layout is produced virtually and a virtual reticule or transparent mask is made using a software pattern or bitmap of pixels where the gray values are any of 256 values. After production of a pixel map it is portrayed as an LCD panel which is then illuminated using UV light so that a photosensitive surface is exposed. This surface is then etched in a conventional way.

Description

Bei dem vorgestellten Gerät handelt es sich um ein hochflexibles und sehr schnelles Belichtungssystem zum Übertragen eines beliebigen Layouts (s/w oder Graumuster) auf eine fotoempfindliche Schicht.The device presented is a highly flexible and very fast exposure system for transferring any layout (b / w or gray pattern) to a photosensitive layer.

Der Einsatzbereich des Gerätes ist breit, beispielsweise in der Halbleiter- und Mikrosystembranche zum Belichten von Kleinserien oder Prototypen sowie in der Platinenbelichtung.The area of application of the device is wide, for example in the semiconductor and microsystem industries Exposing small series or prototypes as well as in circuit board exposure.

In der Mikrosystem- oder Halbleitertechnik werden Layouts bisher in einem sehr aufwendigen und teueren Verfahren mittels Elektronenstrahlschreibern auf Chrommasken (Transparentmasken) übertragen. Diese Masken werden dann, zum Teil verkleinert, auf Siliziumwafer projiziert und das Layout in eine vorher aufgebrachte fotoempfindliche Schicht übertragen.In microsystem or semiconductor technology, layouts have so far been very complex and expensive Method transferred to chrome masks (transparent masks) using electron beam recorders. This Masks are then projected, partially reduced, onto silicon wafers and the layout into a previous one applied photosensitive layer.

Durch den aufwendigen und teueren Prozeß der Maskenherstellung ist das Verfahren sehr unflexibel. Eventuelle Fehler werden erst spät sichtbar und machen dann Design und Herstellung einer neuen Maske notwendig. Dadurch ist das Verfahren zur Entwicklung von Prototypen oder für kleine Serien ungeeignet.The process is very inflexible due to the complex and expensive process of mask production. Any errors are only visible late and then design and manufacture a new mask necessary. This makes the process unsuitable for developing prototypes or for small series.

Bei dem vorgestellten neuen Verfahren werden die Layoutdaten auf einem PC mit einer beliebigen Layout-Software erzeugt, in ein s/w-Muster (Bitmap) umgesetzt und von einem LCD-Durchlichtpanel dargestellt. Der gesamte Prozeß der Maskenherstellung entfällt. Das "Bild" wird mit einer Optik verkleinert und auf die fotoempfindliche Schicht belichtet.In the new method presented, the layout data on a PC with any Layout software generated, converted into a b / w pattern (bitmap) and from an LCD transmitted light panel shown. The entire process of mask making is eliminated. The "image" is reduced with optics and exposed on the photosensitive layer.

Die aktive Fläche der erwähnten LCD-Panels besteht aus einer Matrix von ca. 800 × 600 quadratischen Punkten, die in 256 Abstufungen von transparent bis lichtundurchlässig wechseln können. Aus den Punkten dieser Matrix wird das gewünschte Bild zusammengesetzt. Das erzeugte Bild wird von einer Lichtquelle durchstrahlt und von einer Optik im gewünschten Verhältnis verkleinert abgebildet. Für Strukturen im µm-Bereich muß die Wellenlänge im nahen UV-Bereich z. B. 436 nm, 405 nm, 380 nm oder darunter liegen. Mit diesen Wellenlängen lassen sich kleinste Strukturen von etwa 2*λ, also 0.8 µm bis 0.9 µm erzeugen. Im UV-Bereich sinkt allerdings die Transparenz der LCD-Panels. Sie liegt bei 430 nm etwa 50% niedriger als bei höheren Wellenlängen ab ca. 530 nm.The active area of the mentioned LCD panels consists of a matrix of approx. 800 × 600 square Dots that can change from transparent to opaque in 256 shades. From the Points of this matrix are put together the desired picture. The generated image is from a The light source shines through and is reduced in size by optics in the desired ratio. For Structures in the µm range, the wavelength in the near UV range z. B. 436 nm, 405 nm, 380 nm or lie below. With these wavelengths, the smallest structures of around 2 * λ, i.e. 0.8 µm to Generate 0.9 µm. In the UV range, however, the transparency of the LCD panels drops. It is at 430 nm about 50% lower than at higher wavelengths from approx. 530 nm.

Durch die Möglichkeit, Graustufen zu belichten, ist das Verfahren geeignet für die integrierte Optik. Hier werden Graustufen in Lackdicken umgesetzt, was bei einem anschließenden Ätzprozess unterschiedliche Ätztiefen ergibt und zur Herstellung von 3-dimensionalen. Strukturen benutzt wird.The possibility of exposing grayscale makes the process suitable for the integrated optics. Here grayscale are implemented in lacquer thicknesses, which is different in a subsequent etching process Etching depths result and for the production of 3-dimensional. Structures is used.

Die angestrebte Reduzierung der Bildgröße durch eine Optik liegt im Bereich 10 : 1 bis 50 : 1. Bei einer Bildgröße, die die gesamte aktive Fläche des LCD-Panels (26.6 mm × 20 mm) ausnutzt, und einer 10 : 1- Reduktionsoptik entsteht damit auf der Fotoschicht ein Bild von 2.66 mm × 2 mm Kantenlänge mit einer Auflösung von 800 × 600 quadratischen, fast nahtlos aneinandergefügten Bildpunkten. Die einzelnen abgebildeten Bildpunkte haben dann eine Kantenlänge von 3.33 µm. Um größere Layouts aus einzelnen Belichtungen zusammensetzen zu können, wird die fotoempfindliche Schicht im Raster von 2.66 mm × 2 mm verschoben. Die Auflösung des dazu verwendeten Verschiebetisches muß ca. 10- bis 20-fach höher als die kleinste erzeugte Struktur sein, damit der Versatz unter der von der Optik vorgegebenen Auflösungsgrenze liegt. Daraus ergibt sich eine reproduzierbare Positioniergenauigkeit des Tisches von etwa 0.1 µm. Diese Genauigkeit wird von handelsüblichen Positioniertischen erreicht.The desired reduction in image size through optics is in the range 10: 1 to 50: 1 Image size that uses the entire active area of the LCD panel (26.6 mm × 20 mm) and a 10: 1 Reduction optics thus create an image with an edge length of 2.66 mm × 2 mm on the photo layer Resolution of 800 × 600 square, almost seamlessly connected pixels. The single ones The pixels shown then have an edge length of 3.33 µm. To make larger layouts out of individual To be able to compose exposures, the photosensitive layer has a grid of 2.66 mm × 2 mm shifted. The resolution of the sliding table used for this must be approx. 10 to 20 times higher than the smallest structure created so that the offset is less than that specified by the optics Resolution limit. This results in a reproducible positioning accuracy of the table from about 0.1 µm. This accuracy is achieved by standard positioning tables.

Es ist auch problemlos möglich, nur das LCD-Display mit Ansteuerung in bestehende Belichtungsanlagen, sog. Stepper, einzusetzen. Solche Anlagen werden in der Halbleiterindustrie verwendet und bilden eingelegte Transparentmasken (Reticle) in einem bestimmten Verhältnis (Reduktion) ab. Anstelle einer solchen (teuer und aufwendig produzierten) Transparentmaske wird ein LCD-Display eingesetzt. Es stellt dann ein "virtuelles Reticle" dar.It is also possible without any problems, only the LCD display with control in existing exposure systems, so-called stepper. Such systems are used in the semiconductor industry and form inserted transparency masks (reticle) in a certain ratio (reduction). Instead of one Such (expensive and elaborately produced) transparent mask, an LCD display is used. It puts then a "virtual reticle".

Für Anlagen zur Platinenbelichtung und andere Anwendungen, die geringere Anforderungen an die Auflösung steilen, genügt es, Verschiebetische mit einfachen, preiswerten Schrittmotoren zu verwenden.For systems for circuit board exposure and other applications that have lower requirements Steep resolution, it is enough to use sliding tables with simple, inexpensive stepper motors.

Claims (3)

1. µ-Writer: hochflexibles und schnelles Belichtungssystem, dadurch gekennzeichnet, daß das Belichtungslayout "virtuell" erzeugt wird.1. µ-Writer: highly flexible and fast exposure system, characterized in that the exposure layout is generated "virtually". 2. µ-Writer "virtuelles Reticle" dadurch gekennzeichnet, daß das virtuelle Reticle (Transparentmaske) in schon vorhandene Anlagen anstelle eines konventionellen Reticles eingebaut werden kann.2. µ-Writer "virtual reticle" characterized in that the virtual reticle (transparent mask) can be installed in existing systems instead of a conventional reticle. 3. µ-Writer geeignet zur Herstellung sog. "Integrierter Optik", da das Verfahren die Belichtung von Graustufen ermöglicht.3. µ-Writer suitable for the production of so-called "integrated optics", since the method exposes the exposure of Grayscale enabled.
DE1999114583 1999-03-31 1999-03-31 Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light Withdrawn DE19914583A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE1999114583 DE19914583A1 (en) 1999-03-31 1999-03-31 Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE1999114583 DE19914583A1 (en) 1999-03-31 1999-03-31 Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light

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DE19914583A1 true DE19914583A1 (en) 2000-10-05

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1628157A1 (en) * 2004-08-17 2006-02-22 ASML Netherlands B.V. Lithographic apparatus, method and a computer program product for generating a mask pattern on an addressable mask and device manufacturing method using same
US7713667B2 (en) 2004-11-30 2010-05-11 Asml Holding N.V. System and method for generating pattern data used to control a pattern generator

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5171490A (en) * 1988-11-29 1992-12-15 Fudim Efrem V Method and apparatus for production of three-dimensional objects by irradiation of photopolymers
US5344748A (en) * 1986-01-13 1994-09-06 Rohm And Haas Company Microplastic structure and method of manufacture
US5558884A (en) * 1989-04-03 1996-09-24 Omnichrome Corporation System for rapidly producing either integrated circuits on a substrate, Interconnections on a printed circuit board or rapidly performing lithography
WO1997045770A1 (en) * 1996-05-29 1997-12-04 Chiu Tzu Yin Reconfigurable mask
US5742362A (en) * 1993-03-21 1998-04-21 Nec Corporation Process for forming a photosensitive material and an exposure apparatus used for the process
DE19522936C2 (en) * 1995-06-23 1999-01-07 Fraunhofer Ges Forschung Device for structuring a photolithographic layer

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5344748A (en) * 1986-01-13 1994-09-06 Rohm And Haas Company Microplastic structure and method of manufacture
US5171490A (en) * 1988-11-29 1992-12-15 Fudim Efrem V Method and apparatus for production of three-dimensional objects by irradiation of photopolymers
US5558884A (en) * 1989-04-03 1996-09-24 Omnichrome Corporation System for rapidly producing either integrated circuits on a substrate, Interconnections on a printed circuit board or rapidly performing lithography
US5742362A (en) * 1993-03-21 1998-04-21 Nec Corporation Process for forming a photosensitive material and an exposure apparatus used for the process
DE19522936C2 (en) * 1995-06-23 1999-01-07 Fraunhofer Ges Forschung Device for structuring a photolithographic layer
WO1997045770A1 (en) * 1996-05-29 1997-12-04 Chiu Tzu Yin Reconfigurable mask

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1628157A1 (en) * 2004-08-17 2006-02-22 ASML Netherlands B.V. Lithographic apparatus, method and a computer program product for generating a mask pattern on an addressable mask and device manufacturing method using same
JP2006058882A (en) * 2004-08-17 2006-03-02 Asml Netherlands Bv Lithography device and method for generating mask and pattern, computer program product and device manufacturing method using the same
US7500218B2 (en) 2004-08-17 2009-03-03 Asml Netherlands B.V. Lithographic apparatus, method, and computer program product for generating a mask pattern and device manufacturing method using same
JP2011095755A (en) * 2004-08-17 2011-05-12 Asml Netherlands Bv Lithographic apparatus, method, and computer program product for generating mask pattern, and method of manufacturing device using the same
US7713667B2 (en) 2004-11-30 2010-05-11 Asml Holding N.V. System and method for generating pattern data used to control a pattern generator

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