DE2966433D1 - Method of manufacturing semiconductor laser devices - Google Patents

Method of manufacturing semiconductor laser devices

Info

Publication number
DE2966433D1
DE2966433D1 DE7979901610T DE2966433T DE2966433D1 DE 2966433 D1 DE2966433 D1 DE 2966433D1 DE 7979901610 T DE7979901610 T DE 7979901610T DE 2966433 T DE2966433 T DE 2966433T DE 2966433 D1 DE2966433 D1 DE 2966433D1
Authority
DE
Germany
Prior art keywords
semiconductor laser
manufacturing semiconductor
laser devices
devices
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE7979901610T
Other languages
English (en)
Inventor
Kanji Fujiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE2966433D1 publication Critical patent/DE2966433D1/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/64—Heat extraction or cooling elements
    • H01L33/642—Heat extraction or cooling elements characterized by the shape
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
    • H01L23/3732—Diamonds
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/64—Heat extraction or cooling elements
    • H01L33/641—Heat extraction or cooling elements characterized by the materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/024—Arrangements for thermal management
    • H01S5/02476—Heat spreaders, i.e. improving heat flow between laser chip and heat dissipating elements
    • H01S5/02484—Sapphire or diamond heat spreaders
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144—Gold (Au) as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484—Connecting portions
    • H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
    • H01L2224/48472—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013—Alloys
    • H01L2924/0132—Binary Alloys
    • H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/12—Passive devices, e.g. 2 terminal devices
    • H01L2924/1204—Optical Diode
    • H01L2924/12042—LASER
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/022—Mountings; Housings
    • H01S5/02208—Mountings; Housings characterised by the shape of the housings
DE7979901610T 1978-12-01 1979-11-28 Method of manufacturing semiconductor laser devices Expired DE2966433D1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP53148839A JPS5837713B2 (ja) 1978-12-01 1978-12-01 半導体レ−ザ−装置の製造方法
PCT/JP1979/000302 WO1980001222A1 (en) 1978-12-01 1979-11-28 Method of manufacturing semiconductor laser devices

Publications (1)

Publication Number Publication Date
DE2966433D1 true DE2966433D1 (en) 1983-12-29

Family

ID=15461880

Family Applications (1)

Application Number Title Priority Date Filing Date
DE7979901610T Expired DE2966433D1 (en) 1978-12-01 1979-11-28 Method of manufacturing semiconductor laser devices

Country Status (5)

Country Link
US (1) US4360965A (de)
EP (1) EP0019003B1 (de)
JP (1) JPS5837713B2 (de)
DE (1) DE2966433D1 (de)
WO (1) WO1980001222A1 (de)

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DE3132983A1 (de) * 1981-08-20 1983-03-03 Siemens AG, 1000 Berlin und 8000 München Verfahren zum verbinden eines halbleiterchips mit einem chiptraeger
JPS5842285A (ja) * 1981-09-07 1983-03-11 Mitsubishi Electric Corp 半導体レ−ザ装置の製造方法
FR2516703B1 (fr) * 1981-11-18 1986-02-07 Lucas Ind Plc Procede de fixation et d'isolation d'un dispositif semi-conducteur sur une plaque de refroidissement
JPS58145169A (ja) * 1982-02-23 1983-08-29 Nec Corp 光半導体装置
US4491264A (en) * 1982-06-01 1985-01-01 Rca Corporation Method of soldering a light emitting device to a substrate
GB8328573D0 (en) * 1983-10-26 1983-11-30 Plessey Co Plc Diamond heatsink assemblies
EP0194358B1 (de) * 1985-01-11 1991-10-23 Sumitomo Electric Industries, Ltd. Wärmesenke unter Verwendung eines gesinterten Körpers mit hoher Wärmeleitfähigkeit und Verfahren zu ihrer Herstellung
US5177806A (en) * 1986-12-05 1993-01-05 E. I. Du Pont De Nemours And Company Optical fiber feedthrough
US5373171A (en) * 1987-03-12 1994-12-13 Sumitomo Electric Industries, Ltd. Thin film single crystal substrate
FR2616272B1 (fr) * 1987-06-02 1990-10-26 Thomson Csf Dispositif en materiaux semiconducteurs realise sur un substrat de parametre de maille different, application a un laser et procede de realisation
US4826276A (en) * 1987-07-17 1989-05-02 E. I. Du Pont De Nemours And Company Optical fiber feedthrough assembly having a rigidizing arrangement therein
ATE258686T1 (de) 1988-04-22 2004-02-15 Bayer Ag Nachweis, quantifizierung und klassifizierung von ras-proteinen in körperflüssigkeiten und geweben
JPH0750813B2 (ja) * 1988-05-23 1995-05-31 三菱電機株式会社 半導体レーザ素子用サブマウント
JPH03209896A (ja) * 1990-01-12 1991-09-12 Mitsubishi Electric Corp 半導体レーザ素子用サブマウント
US5202288A (en) * 1990-06-01 1993-04-13 Robert Bosch Gmbh Method of manufacturing an electronic circuit component incorporating a heat sink
US5156999A (en) * 1990-06-08 1992-10-20 Wai-Hon Lee Packaging method for semiconductor laser/detector devices
US5197654A (en) * 1991-11-15 1993-03-30 Avishay Katz Bonding method using solder composed of multiple alternating gold and tin layers
DE4206437A1 (de) * 1992-02-29 1993-09-16 Telefunken Microelectron Halbleiter-baugruppe
US5324387A (en) * 1993-05-07 1994-06-28 Xerox Corporation Method of fabricating asymmetric closely-spaced multiple diode lasers
DE19536434C2 (de) * 1995-09-29 2001-11-15 Siemens Ag Verfahren zum Herstellen eines Halbleiterlaser-Bauelements
US5628196A (en) * 1995-11-22 1997-05-13 Loral Electro-Optical Systems, Inc. Cryogenic cooling apparatus employing heat sink and diffuser plate for cooling small objects
US6027957A (en) * 1996-06-27 2000-02-22 University Of Maryland Controlled solder interdiffusion for high power semiconductor laser diode die bonding
US6281574B1 (en) * 1999-09-27 2001-08-28 Raytheon Company High power microwave transistor amplifier
US7339791B2 (en) 2001-01-22 2008-03-04 Morgan Advanced Ceramics, Inc. CVD diamond enhanced microprocessor cooling system
US7453100B2 (en) * 2001-08-28 2008-11-18 The Furukawa Electric Co., Ltd. DFB laser assembly and laser module
JP2004235534A (ja) * 2003-01-31 2004-08-19 Fuji Photo Film Co Ltd レーザ素子およびそのレーザ素子の製造方法並びにそのレーザ素子を用いたレーザモジュール
EP1575089B1 (de) * 2004-03-09 2007-11-14 Infineon Technologies AG Hochzuverlässige, kostengünstige und thermisch verbesserte Halbleiterchip-Befestigungstechnologie mit AuSn
JP4341693B2 (ja) * 2007-05-16 2009-10-07 ウシオ電機株式会社 Ｌｅｄ素子およびその製造方法
JP2010027645A (ja) * 2008-07-15 2010-02-04 Ushio Inc 発光装置及び発光装置の製造方法
KR101266205B1 (ko) * 2008-07-08 2013-05-21 우시오덴키 가부시키가이샤 발광 장치 및 발광 장치의 제조 방법
KR101266226B1 (ko) * 2008-07-09 2013-05-21 우시오덴키 가부시키가이샤 발광 장치 및 발광 장치의 제조 방법
CN103904172A (zh) * 2014-03-19 2014-07-02 浙江竞达齐泰科技有限公司 一种陶瓷体上常温超声波焊接led芯片的方法
JP6367980B2 (ja) * 2014-06-18 2018-08-01 エレメント シックス テクノロジーズ リミテッド 一体型のダイヤモンドヒートスプレッダを有する電子デバイス構成要素
JP6652856B2 (ja) * 2016-02-25 2020-02-26 株式会社フジクラ 半導体レーザモジュール及びその製造方法
CN112967957B (zh) * 2021-02-07 2022-04-01 深圳市东飞凌科技有限公司 共晶装置及晶体管封装共晶系统

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Also Published As

Publication number Publication date
EP0019003A1 (de) 1980-11-26
JPS5575282A (en) 1980-06-06
JPS5837713B2 (ja) 1983-08-18
EP0019003A4 (de) 1981-04-24
EP0019003B1 (de) 1983-11-23
US4360965A (en) 1982-11-30
WO1980001222A1 (en) 1980-06-12

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee