DE3175782D1 - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
DE3175782D1
DE3175782D1 DE8181303162T DE3175782T DE3175782D1 DE 3175782 D1 DE3175782 D1 DE 3175782D1 DE 8181303162 T DE8181303162 T DE 8181303162T DE 3175782 T DE3175782 T DE 3175782T DE 3175782 D1 DE3175782 D1 DE 3175782D1
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
semiconductor
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8181303162T
Other languages
English (en)
Inventor
Masao Taguchi
Takashi Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3175782D1 publication Critical patent/DE3175782D1/de
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/31DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/403Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
    • G11C11/404Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with one charge-transfer gate, e.g. MOS transistor, per cell
DE8181303162T 1980-07-18 1981-07-10 Semiconductor memory device Expired DE3175782D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55098426A JPS5832789B2 (ja) 1980-07-18 1980-07-18 半導体メモリ

Publications (1)

Publication Number Publication Date
DE3175782D1 true DE3175782D1 (en) 1987-02-05

Family

ID=14219476

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8181303162T Expired DE3175782D1 (en) 1980-07-18 1981-07-10 Semiconductor memory device

Country Status (5)

Country Link
US (1) US4419743A (de)
EP (1) EP0046011B1 (de)
JP (1) JPS5832789B2 (de)
DE (1) DE3175782D1 (de)
IE (1) IE52689B1 (de)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4641165A (en) * 1982-04-28 1987-02-03 Tokyo Shibaura Denki Kabushiki Kaisha Dynamic memory device with an RC circuit for inhibiting the effects of alpha particle radiation
JPS592365A (ja) * 1982-06-28 1984-01-07 Fujitsu Ltd ダイナミツク型半導体記憶装置
JPS602782B2 (ja) * 1982-06-30 1985-01-23 富士通株式会社 半導体記憶装置
US5244825A (en) * 1983-02-23 1993-09-14 Texas Instruments Incorporated DRAM process with improved poly-to-poly capacitor
US5359216A (en) * 1983-02-23 1994-10-25 Texas Instruments Incorporated DRAM process with improved polysilicon-to-polysilicon capacitor and the capacitor
JPH0666436B2 (ja) * 1983-04-15 1994-08-24 株式会社日立製作所 半導体集積回路装置
JPS6014462A (ja) * 1983-07-05 1985-01-25 Oki Electric Ind Co Ltd 半導体メモリ素子
US4652898A (en) * 1984-07-19 1987-03-24 International Business Machines Corporation High speed merged charge memory
US4658377A (en) * 1984-07-26 1987-04-14 Texas Instruments Incorporated Dynamic memory array with segmented bit lines
USRE33694E (en) * 1984-07-26 1991-09-17 Texas Instruments Incorporated Dynamic memory array with segmented bit lines
JPS6130493U (ja) * 1984-07-27 1986-02-24 孝子 浜野 洗濯ばさみ部分の改良法
JPH0793365B2 (ja) * 1984-09-11 1995-10-09 株式会社東芝 半導体記憶装置およびその製造方法
JPS61150366A (ja) * 1984-12-25 1986-07-09 Nec Corp Mis型メモリ−セル
JPS61178795A (ja) * 1985-02-01 1986-08-11 Toshiba Corp ダイナミツク型半導体記憶装置
JPS61256761A (ja) * 1985-05-10 1986-11-14 Mitsubishi Electric Corp 半導体記憶装置
KR900006155B1 (ko) * 1985-09-04 1990-08-24 후지쓰 가부시끼가이샤 프로그래머블 반도체 리드 온리 메모리 장치
JPS62104786U (de) * 1985-12-19 1987-07-03
US5098192A (en) * 1986-04-30 1992-03-24 Texas Instruments Incorporated DRAM with improved poly-to-poly capacitor
JPS63146461A (ja) * 1986-12-10 1988-06-18 Mitsubishi Electric Corp 半導体記憶装置
JP2621181B2 (ja) * 1987-06-12 1997-06-18 日本電気株式会社 Mis型半導体記憶装置
US20010008288A1 (en) 1988-01-08 2001-07-19 Hitachi, Ltd. Semiconductor integrated circuit device having memory cells
US5374576A (en) * 1988-12-21 1994-12-20 Hitachi, Ltd. Method of fabricating stacked capacitor cell memory devices
US5049958A (en) * 1989-01-27 1991-09-17 Texas Instruments Incorporated Stacked capacitors for VLSI semiconductor devices
JPH02222571A (ja) * 1989-02-23 1990-09-05 Sharp Corp 半導体記憶装置
US5006481A (en) * 1989-11-30 1991-04-09 Sgs-Thomson Microelectronics, Inc. Method of making a stacked capacitor DRAM cell
JPH04218959A (ja) * 1990-10-18 1992-08-10 Mitsubishi Electric Corp 半導体装置およびその制御方法
US5592411A (en) * 1995-11-02 1997-01-07 Motorola, Inc. Non-volatile register and method for accessing data therein
US5724283A (en) * 1996-06-14 1998-03-03 Motorola, Inc. Data storage element and method for restoring data
US7034353B2 (en) 1998-02-27 2006-04-25 Micron Technology, Inc. Methods for enhancing capacitors having roughened features to increase charge-storage capacity
US6150706A (en) * 1998-02-27 2000-11-21 Micron Technology, Inc. Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer
US6682970B1 (en) 1998-02-27 2004-01-27 Micron Technology, Inc. Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer
US6201730B1 (en) * 1999-06-01 2001-03-13 Infineon Technologies North America Corp. Sensing of memory cell via a plateline
JP2002094027A (ja) 2000-09-11 2002-03-29 Toshiba Corp 半導体記憶装置とその製造方法
FR2829280B1 (fr) * 2001-09-05 2004-09-24 St Microelectronics Sa Dispositif de memoire claquable et procede de claquage d'une telle memoire
JP2008282459A (ja) * 2007-05-08 2008-11-20 Elpida Memory Inc 半導体記憶装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3986180A (en) * 1975-09-22 1976-10-12 International Business Machines Corporation Depletion mode field effect transistor memory system
JPS5810864B2 (ja) * 1976-07-05 1983-02-28 株式会社日立製作所 半導体記憶装置
NL176415C (nl) * 1976-07-05 1985-04-01 Hitachi Ltd Halfgeleidergeheugeninrichting omvattende een matrix van halfgeleidergeheugencellen, die bestaan uit een veldeffekttransistor en een opslagcapaciteit.
JPS536579A (en) * 1976-07-07 1978-01-21 Agency Of Ind Science & Technol Semiconductor device
US4188671A (en) * 1977-01-24 1980-02-12 Bell Telephone Laboratories, Incorporated Switched-capacitor memory
DE2815605C3 (de) * 1978-04-11 1981-04-16 Siemens AG, 1000 Berlin und 8000 München Halbleiterspeicher mit Ansteuerleitungen hoher Leitfähigkeit

Also Published As

Publication number Publication date
EP0046011A3 (en) 1983-08-24
EP0046011B1 (de) 1986-12-30
US4419743A (en) 1983-12-06
JPS5832789B2 (ja) 1983-07-15
IE811527L (en) 1982-01-18
EP0046011A2 (de) 1982-02-17
IE52689B1 (en) 1988-01-20
JPS5723261A (en) 1982-02-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee