DE3483184D1 - Bearbeitungsvorrichtung mittels plasma. - Google Patents

Bearbeitungsvorrichtung mittels plasma.

Info

Publication number
DE3483184D1
DE3483184D1 DE8484304597T DE3483184T DE3483184D1 DE 3483184 D1 DE3483184 D1 DE 3483184D1 DE 8484304597 T DE8484304597 T DE 8484304597T DE 3483184 T DE3483184 T DE 3483184T DE 3483184 D1 DE3483184 D1 DE 3483184D1
Authority
DE
Germany
Prior art keywords
plasma
machining device
machining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8484304597T
Other languages
English (en)
Inventor
Shuzo C O Fujitsu Lim Fujimura
Hiroshi C O Fujitsu Limit Yano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3483184D1 publication Critical patent/DE3483184D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/04Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres
    • G02B6/06Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065Plasma etching; Reactive-ion etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32357Generation remote from the workpiece, e.g. down-stream
DE8484304597T 1983-07-08 1984-07-05 Bearbeitungsvorrichtung mittels plasma. Expired - Fee Related DE3483184D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58124511A JPS6016424A (ja) 1983-07-08 1983-07-08 マイクロ波プラズマ処理方法及びその装置

Publications (1)

Publication Number Publication Date
DE3483184D1 true DE3483184D1 (de) 1990-10-18

Family

ID=14887295

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484304597T Expired - Fee Related DE3483184D1 (de) 1983-07-08 1984-07-05 Bearbeitungsvorrichtung mittels plasma.

Country Status (5)

Country Link
US (1) US4512868A (de)
EP (1) EP0131433B1 (de)
JP (1) JPS6016424A (de)
KR (1) KR890002732B1 (de)
DE (1) DE3483184D1 (de)

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JPH0775226B2 (ja) * 1990-04-10 1995-08-09 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン プラズマ処理方法及び装置
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DE4119362A1 (de) * 1991-06-12 1992-12-17 Leybold Ag Teilchenquelle, insbesondere fuer reaktive ionenaetz- und plasmaunterstuetzte cvd-verfahren
JP3158715B2 (ja) * 1992-03-30 2001-04-23 株式会社ダイヘン プラズマ処理装置
DE4308990A1 (de) * 1993-03-20 1994-09-22 Bosch Gmbh Robert Ätzverfahren und Vorrichtung zur Reinigung von Halbleiterelementen, insbesondere Leistungsdioden
US5567241A (en) * 1993-04-30 1996-10-22 Energy Conversion Devices, Inc. Method and apparatus for the improved microwave deposition of thin films
JP3288490B2 (ja) * 1993-07-09 2002-06-04 富士通株式会社 半導体装置の製造方法及び半導体装置の製造装置
US5498308A (en) * 1994-02-25 1996-03-12 Fusion Systems Corp. Plasma asher with microwave trap
US5783100A (en) * 1994-03-16 1998-07-21 Micron Display Technology, Inc. Method of high density plasma etching for semiconductor manufacture
US5811022A (en) * 1994-11-15 1998-09-22 Mattson Technology, Inc. Inductive plasma reactor
US5560781A (en) * 1995-05-08 1996-10-01 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Process for non-contact removal of organic coatings from the surface of paintings
KR100238216B1 (ko) * 1996-11-27 2000-01-15 윤종용 랑뮤일 프로브
US6026762A (en) * 1997-04-23 2000-02-22 Applied Materials, Inc. Apparatus for improved remote microwave plasma source for use with substrate processing systems
US6579805B1 (en) * 1999-01-05 2003-06-17 Ronal Systems Corp. In situ chemical generator and method
US6263830B1 (en) 1999-04-12 2001-07-24 Matrix Integrated Systems, Inc. Microwave choke for remote plasma generator
US6461971B1 (en) * 2000-01-21 2002-10-08 Chartered Semiconductor Manufacturing Ltd. Method of residual resist removal after etching of aluminum alloy filmsin chlorine containing plasma
US6873113B2 (en) * 2000-04-13 2005-03-29 Tokyo Electron Limited Stand alone plasma vacuum pump
US6729850B2 (en) 2001-10-31 2004-05-04 Tokyo Electron Limited Applied plasma duct system
US7375035B2 (en) 2003-04-29 2008-05-20 Ronal Systems Corporation Host and ancillary tool interface methodology for distributed processing
US7429714B2 (en) * 2003-06-20 2008-09-30 Ronal Systems Corporation Modular ICP torch assembly
US7910166B2 (en) * 2005-04-26 2011-03-22 First Solar, Inc. System and method for depositing a material on a substrate
US7931937B2 (en) * 2005-04-26 2011-04-26 First Solar, Inc. System and method for depositing a material on a substrate
US7968145B2 (en) * 2005-04-26 2011-06-28 First Solar, Inc. System and method for depositing a material on a substrate
US7927659B2 (en) * 2005-04-26 2011-04-19 First Solar, Inc. System and method for depositing a material on a substrate
KR100666881B1 (ko) * 2005-06-10 2007-01-10 삼성전자주식회사 포토레지스트 제거 방법 및 이를 이용한 반도체 소자의제조 방법.
KR100814409B1 (ko) * 2006-08-14 2008-03-18 삼성전자주식회사 애싱 방법 및 이를 수행하기 위한 장치
WO2010129901A2 (en) 2009-05-08 2010-11-11 Vandermeulen Peter F Methods and systems for plasma deposition and treatment
JP5656504B2 (ja) * 2010-08-06 2015-01-21 三菱重工業株式会社 真空処理装置およびプラズマ処理方法
US9129778B2 (en) 2011-03-18 2015-09-08 Lam Research Corporation Fluid distribution members and/or assemblies
US9548227B2 (en) 2013-10-30 2017-01-17 Nisene Technology Group Microwave induced plasma decapsulation using a dielectric plasma discharge tube
CN111033689B (zh) 2017-06-27 2023-07-28 彼得·F·范德莫伊伦 用于等离子体沉积和处理的方法及系统
US10861667B2 (en) 2017-06-27 2020-12-08 Peter F. Vandermeulen Methods and systems for plasma deposition and treatment
KR20210094694A (ko) * 2020-01-21 2021-07-30 삼성전자주식회사 기판 처리 장치, 물질막 증착 장치, 및 상압 화학 기상 증착 장치

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JPS5613480A (en) * 1979-07-13 1981-02-09 Hitachi Ltd Dry etching apparatus
JPS5696840A (en) * 1979-12-28 1981-08-05 Fujitsu Ltd Microwave plasma treating method
JPS5751265A (en) * 1980-09-10 1982-03-26 Hitachi Ltd Microwave plasma etching device
JPS5776844A (en) * 1980-10-31 1982-05-14 Fujitsu Ltd Method and apparatus for processing microwave plasma
JPS57159016A (en) * 1981-03-26 1982-10-01 Sumitomo Electric Ind Ltd Manufacture of amorphous silicon film
JPS58100431A (ja) * 1981-12-10 1983-06-15 Fujitsu Ltd プラズマ・エツチング方法及びその装置
JPS58170536A (ja) * 1982-03-31 1983-10-07 Fujitsu Ltd プラズマ処理方法及びその装置
DE3376921D1 (en) * 1982-09-10 1988-07-07 Nippon Telegraph & Telephone Ion shower apparatus
JPH0770509B2 (ja) * 1982-10-08 1995-07-31 株式会社日立製作所 ドライプロセス装置

Also Published As

Publication number Publication date
US4512868A (en) 1985-04-23
KR890002732B1 (ko) 1989-07-25
KR850000901A (ko) 1985-03-09
JPS6016424A (ja) 1985-01-28
JPH055167B2 (de) 1993-01-21
EP0131433A3 (en) 1986-05-14
EP0131433B1 (de) 1990-09-12
EP0131433A2 (de) 1985-01-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee