DE3570133D1 - Defect detecting method and system - Google Patents

Defect detecting method and system

Info

Publication number
DE3570133D1
DE3570133D1 DE8585100912T DE3570133T DE3570133D1 DE 3570133 D1 DE3570133 D1 DE 3570133D1 DE 8585100912 T DE8585100912 T DE 8585100912T DE 3570133 T DE3570133 T DE 3570133T DE 3570133 D1 DE3570133 D1 DE 3570133D1
Authority
DE
Germany
Prior art keywords
detecting method
defect detecting
defect
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8585100912T
Other languages
English (en)
Inventor
Takashi Miyazawa
Hiroyuki Fukuchi
Sosuke Tateishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kirin Techno System Co Ltd
Original Assignee
Kirin Brewery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kirin Brewery Co Ltd filed Critical Kirin Brewery Co Ltd
Application granted granted Critical
Publication of DE3570133D1 publication Critical patent/DE3570133D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054—Inspection of sealing surface and container finish
DE8585100912T 1984-01-31 1985-01-30 Defect detecting method and system Expired DE3570133D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59015870A JPS60159637A (ja) 1984-01-31 1984-01-31 欠陥検出方法および装置

Publications (1)

Publication Number Publication Date
DE3570133D1 true DE3570133D1 (en) 1989-06-15

Family

ID=11900828

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585100912T Expired DE3570133D1 (en) 1984-01-31 1985-01-30 Defect detecting method and system

Country Status (7)

Country Link
US (1) US4606635A (de)
EP (1) EP0150846B1 (de)
JP (1) JPS60159637A (de)
AU (1) AU565157B2 (de)
CA (1) CA1222801A (de)
DE (1) DE3570133D1 (de)
DK (1) DK161263C (de)

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JP2514944B2 (ja) * 1987-01-26 1996-07-10 サントリー株式会社 瓶類の光学検査方法及びその装置
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JPH0743326B2 (ja) * 1991-01-29 1995-05-15 東洋ガラス株式会社 物体端部の欠陥検査方法及びその装置
US5172005A (en) * 1991-02-20 1992-12-15 Pressco Technology, Inc. Engineered lighting system for tdi inspection comprising means for controlling lighting elements in accordance with specimen displacement
JPH07102978B2 (ja) * 1991-03-13 1995-11-08 石塚硝子株式会社 ガラス壜の検査方法
JPH05126750A (ja) * 1991-11-01 1993-05-21 Fuji Electric Co Ltd 円形容器内面検査装置
US5369713A (en) * 1992-07-09 1994-11-29 Schwartz; Nira Inspection method using area of interest (AOI) analysis
JP3044961B2 (ja) * 1993-02-12 2000-05-22 富士電機株式会社 円形容器内面検査装置
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JP3212389B2 (ja) * 1992-10-26 2001-09-25 株式会社キリンテクノシステム 固体上の異物検査方法
US5353357A (en) * 1992-12-04 1994-10-04 Philip Morris Incorporated Methods and apparatus for inspecting the appearance of substantially circular objects
US5588068A (en) * 1992-12-04 1996-12-24 Philip Morris Incorporated Methods and apparatus for inspecting the appearance of substantially circular objects
IL107603A (en) † 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
IL107602A0 (en) † 1992-12-21 1994-02-27 Johnson & Johnson Vision Prod Method of inspecting ophthalmic lenses
EP0669527A1 (de) * 1994-01-21 1995-08-30 Elpatronic Ag Verfahren zum Ausscheiden von Mehrwegflaschen aus dem Mehrweg-Umlauf
DE4408948C2 (de) * 1994-03-16 1998-02-26 Till Gea Gmbh & Co Verfahren und Vorrichtung zur Überprüfung von Gebinden
US5576827A (en) * 1994-04-15 1996-11-19 Micromeritics Instrument Corporation Apparatus and method for determining the size distribution of particles by light scattering
JPH07286970A (ja) * 1994-04-19 1995-10-31 Kunio Hiuga 瓶口の開口天面欠陥検査方法
JPH07311162A (ja) * 1994-05-20 1995-11-28 Eisai Co Ltd シリンジにおけるフランジ部の欠けや割れを検出する方法
US6122048A (en) * 1994-08-26 2000-09-19 Pressco Technology Inc. Integral field lens illumination for video inspection
US5592286A (en) * 1995-03-08 1997-01-07 Alltrista Corporation Container flange inspection system using an annular lens
US5699152A (en) * 1995-04-03 1997-12-16 Alltrista Corporation Electro-optical inspection system and method
JPH11510256A (ja) 1995-08-04 1999-09-07 イメージ プロセッシング システムズ，インク． びんのねじ山の検査システムおよびその作動方法
US5805279A (en) * 1996-01-11 1998-09-08 Alltrista Corporation Method and apparatus for illuminating and imaging a can end coated with sealing material
US5923419A (en) * 1997-06-16 1999-07-13 Insight Control Systems International System and method for optical inspection of recessed surfaces
US6061125A (en) * 1998-01-27 2000-05-09 Insight Control Systems International Dual illumination apparatus for container inspection
US6621569B2 (en) 2000-05-26 2003-09-16 Applied Vision Company Llc Illuminator for machine vision
JP2001344592A (ja) * 2000-05-31 2001-12-14 Toyo Jidoki Co Ltd キャップ取付け状態検査方法
EP1270433B1 (de) * 2001-06-20 2011-02-23 Japan Crown Cork Co. Ltd. Verfahren zur Prüfung eines auf einer Flasche angebrachtem Verschlusses und Vorrichtung
DE20208943U1 (de) * 2002-06-10 2002-09-12 Hermann Heye I Ins Fa Vorrichtung zum Prüfen einer Behältermündung auf das Vorhandensein einer Neigung
FR2846424B1 (fr) * 2002-10-25 2006-02-03 Bsn Glasspack Procede et dispositif d'eclairage pour detecter des defaut et/ou de manque de matiere sur la bague d'un recipient transparent ou translucide
US20040263620A1 (en) * 2003-06-30 2004-12-30 Diehr Richard D. Container inspection machine
FR2877724B1 (fr) * 2004-11-09 2007-03-16 Tiama Sa Procede et dispositif d'eclairage pour determiner la presence de defauts sur la surface de la bague d'un recipient
DE102005013614A1 (de) * 2005-03-24 2006-10-05 OBE OHNMACHT & BAUMGäRTNER GMBH & CO. KG Vorrichtung zur optischen Formerfassung von Gegenständen und Oberflächen
US7808644B2 (en) * 2005-03-24 2010-10-05 Obe Ohnmacht & Baumgartner Gmbh & Co. Kg Device for optically measuring the shapes of objects and surfaces
US7626158B2 (en) * 2006-10-23 2009-12-01 Emhart Glass S.A. Machine for inspecting glass containers
DE102007043609B4 (de) 2007-09-13 2014-05-28 Ioss Intelligente Optische Sensoren & Systeme Gmbh Integrierte Beleuchtungsvorrichtung für einen optischen Codeleser
JP2009121888A (ja) * 2007-11-13 2009-06-04 Kirin Distillery Co Ltd Ｐｅｔプリフォーム検査装置
CN101990046B (zh) * 2009-07-31 2014-03-26 鸿富锦精密工业（深圳）有限公司 数字图像检测系统及方法
EP2381246A1 (de) * 2010-04-26 2011-10-26 Becton Dickinson France Vorrichtung, Kit und Verfahren zur Prüfung eines Artikels
JP6070940B2 (ja) * 2013-03-07 2017-02-01 東洋製罐株式会社 粘稠物が充填された容器の検査方法とその装置
FR3027391A1 (fr) * 2014-10-17 2016-04-22 Msc & Sgcc Procedes, dispositif et ligne d'inspection pour visualiser la planeite d'une surface de bague de recipient
JP6576661B2 (ja) * 2015-03-26 2019-09-18 株式会社エム・アイ・エル 画像処理装置
DE102018133567A1 (de) * 2018-12-21 2020-06-25 Böllhoff Verbindungstechnik GmbH Verfahren zur computergestützten optischen Zustandsbewertung eines Gegenstands

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2501975A1 (de) * 1975-01-18 1976-07-22 Kronseder Hermann Vorrichtung zum pruefen von behaeltermuendungen auf schadstellen
US4448526A (en) * 1980-06-27 1984-05-15 Kirin Beer Kabushiki Kaisha Defect detecting method and device
US4378494A (en) * 1980-11-07 1983-03-29 Owens-Illinois, Inc. Apparatus and method for detecting defects in glass bottles using event proximity
JPS57132044A (en) * 1981-02-10 1982-08-16 Hitachi Metals Ltd Discriminating method of surface defect
JPS5821146A (ja) * 1981-07-30 1983-02-07 Kirin Brewery Co Ltd 欠陥検査方法および装置
DE3314465A1 (de) * 1983-04-21 1984-10-25 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur optischen oberflaechenpruefung

Also Published As

Publication number Publication date
DK161263C (da) 1991-12-09
DK161263B (da) 1991-06-17
DK41085A (da) 1985-08-01
JPH0345784B2 (de) 1991-07-12
JPS60159637A (ja) 1985-08-21
EP0150846B1 (de) 1989-05-10
AU3812585A (en) 1985-08-08
EP0150846A3 (en) 1986-05-28
EP0150846A2 (de) 1985-08-07
US4606635A (en) 1986-08-19
DK41085D0 (da) 1985-01-30
AU565157B2 (en) 1987-09-03
CA1222801A (en) 1987-06-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: KABUSHIKI KAISHA KIRIN TECHNO-SYSTEM, YOKOHAMA, KA

8328 Change in the person/name/address of the agent

Free format text: PATENTANWAELTE REICHEL UND REICHEL, 60322 FRANKFURT