DE3574924D1 - Vorrichtung zur pruefung von schaltungsplatten. - Google Patents

Vorrichtung zur pruefung von schaltungsplatten.

Info

Publication number
DE3574924D1
DE3574924D1 DE8585307793T DE3574924T DE3574924D1 DE 3574924 D1 DE3574924 D1 DE 3574924D1 DE 8585307793 T DE8585307793 T DE 8585307793T DE 3574924 T DE3574924 T DE 3574924T DE 3574924 D1 DE3574924 D1 DE 3574924D1
Authority
DE
Germany
Prior art keywords
baskets
circuit boards
electrical connectors
test chamber
testing circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8585307793T
Other languages
English (en)
Inventor
Robert A Cutright
Mark W Briggs
George J Bouwman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Venturedyne Ltd
Original Assignee
Venturedyne Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Venturedyne Ltd filed Critical Venturedyne Ltd
Application granted granted Critical
Publication of DE3574924D1 publication Critical patent/DE3574924D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817—Environmental-, stress-, or burn-in tests
DE8585307793T 1984-11-07 1985-10-29 Vorrichtung zur pruefung von schaltungsplatten. Expired - Lifetime DE3574924D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/669,117 US4683424A (en) 1984-11-07 1984-11-07 Apparatus for use in testing circuit boards

Publications (1)

Publication Number Publication Date
DE3574924D1 true DE3574924D1 (de) 1990-01-25

Family

ID=24685097

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585307793T Expired - Lifetime DE3574924D1 (de) 1984-11-07 1985-10-29 Vorrichtung zur pruefung von schaltungsplatten.

Country Status (7)

Country Link
US (1) US4683424A (de)
EP (1) EP0181729B1 (de)
JP (1) JPH0677043B2 (de)
AT (1) ATE48931T1 (de)
CA (1) CA1238113A (de)
DE (1) DE3574924D1 (de)
SG (1) SG21890G (de)

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US4777434A (en) * 1985-10-03 1988-10-11 Amp Incorporated Microelectronic burn-in system
FR2597696B1 (fr) * 1986-04-22 1990-05-04 Secasi Dispositif de deverminage (burn-in).
US4949031A (en) * 1987-03-23 1990-08-14 General Signal Corporation Environmental stress screening apparatus for electronic products
US4748540A (en) * 1987-04-24 1988-05-31 Honeywell Bull Inc. Compact packaging of electronic equipment within a small profile enclosure
US4902969A (en) * 1987-06-01 1990-02-20 Reliability Incorporated Automated burn-in system
US4812750A (en) * 1987-09-28 1989-03-14 Avex Electronics Inc. Environmental stress screening apparatus
US4888549A (en) * 1987-10-30 1989-12-19 Wilson Laboratories, Inc. System for testing individually a plurality of disk drive units
US4967155A (en) * 1988-04-08 1990-10-30 Micropolis Corporation Environmentally controlled media defect detection system for Winchester disk drives
FR2637155A1 (fr) * 1988-09-29 1990-03-30 Merlin Gerin Armoire modulaire pour batteries d'accumulateurs electriques
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US5157829A (en) * 1990-10-02 1992-10-27 Outboard Marine Corporation Method of burn-in testing of circuitry
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US5191282A (en) * 1991-10-23 1993-03-02 Venturedyne, Ltd. Unitized test system with bi-directional transport feature
WO1993012438A1 (en) * 1991-12-16 1993-06-24 Venturedyne Limited Improved carrier for testing circuit boards
US5294199A (en) * 1992-10-29 1994-03-15 Venturedyne, Ltd. System and method for thermally stress screening products
US5528161A (en) * 1994-09-15 1996-06-18 Venturedyne Limited Through-port load carrier and related test apparatus
US5966021A (en) * 1996-04-03 1999-10-12 Pycon, Inc. Apparatus for testing an integrated circuit in an oven during burn-in
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US6720784B2 (en) * 2001-06-20 2004-04-13 Heatron, Inc. Device for testing electronic devices
US6788083B1 (en) 2002-05-09 2004-09-07 Pycon, Inc. Method and apparatus to provide a burn-in board with increased monitoring capacity
US6984974B2 (en) * 2003-11-17 2006-01-10 Venturedyne, Ltd. Independently-adjustable circuit board carrier
US7233159B2 (en) * 2004-06-02 2007-06-19 Emc Corporation Ergonomic, rotatable electronic component testing apparatus
US7896859B2 (en) * 2005-10-20 2011-03-01 Tyco Healthcare Group Lp Enteral feeding set
US7611502B2 (en) * 2005-10-20 2009-11-03 Covidien Ag Connector for enteral fluid delivery set
US9052348B2 (en) * 2007-08-09 2015-06-09 Aviat U.S., Inc. Rack system and a method for processing manufactured products
US8549912B2 (en) * 2007-12-18 2013-10-08 Teradyne, Inc. Disk drive transport, clamping and testing
US7996174B2 (en) 2007-12-18 2011-08-09 Teradyne, Inc. Disk drive testing
US7675307B2 (en) * 2008-03-18 2010-03-09 Star Technologies Inc. Heating apparatus for semiconductor devices
US7916470B2 (en) * 2008-04-11 2011-03-29 Dell Products L.P. Docking Plenum for a Rack
US8041449B2 (en) 2008-04-17 2011-10-18 Teradyne, Inc. Bulk feeding disk drives to disk drive testing systems
US7848106B2 (en) 2008-04-17 2010-12-07 Teradyne, Inc. Temperature control within disk drive testing systems
US7945424B2 (en) 2008-04-17 2011-05-17 Teradyne, Inc. Disk drive emulator and method of use thereof
US8095234B2 (en) 2008-04-17 2012-01-10 Teradyne, Inc. Transferring disk drives within disk drive testing systems
US8117480B2 (en) 2008-04-17 2012-02-14 Teradyne, Inc. Dependent temperature control within disk drive testing systems
US20090262455A1 (en) * 2008-04-17 2009-10-22 Teradyne, Inc. Temperature Control Within Disk Drive Testing Systems
US8102173B2 (en) 2008-04-17 2012-01-24 Teradyne, Inc. Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit
US8160739B2 (en) 2008-04-17 2012-04-17 Teradyne, Inc. Transferring storage devices within storage device testing systems
US8305751B2 (en) 2008-04-17 2012-11-06 Teradyne, Inc. Vibration isolation within disk drive testing systems
US8238099B2 (en) 2008-04-17 2012-08-07 Teradyne, Inc. Enclosed operating area for disk drive testing systems
US8086343B2 (en) 2008-06-03 2011-12-27 Teradyne, Inc. Processing storage devices
US8547123B2 (en) 2009-07-15 2013-10-01 Teradyne, Inc. Storage device testing system with a conductive heating assembly
US8116079B2 (en) 2009-07-15 2012-02-14 Teradyne, Inc. Storage device testing system cooling
US7920380B2 (en) 2009-07-15 2011-04-05 Teradyne, Inc. Test slot cooling system for a storage device testing system
US8687356B2 (en) 2010-02-02 2014-04-01 Teradyne, Inc. Storage device testing system cooling
US8628239B2 (en) 2009-07-15 2014-01-14 Teradyne, Inc. Storage device temperature sensing
US7995349B2 (en) 2009-07-15 2011-08-09 Teradyne, Inc. Storage device temperature sensing
US8466699B2 (en) 2009-07-15 2013-06-18 Teradyne, Inc. Heating storage devices in a testing system
JP2011242338A (ja) * 2010-05-20 2011-12-01 Advantest Corp 試験装置
JP2011242339A (ja) * 2010-05-20 2011-12-01 Advantest Corp テストヘッド、試験ボードおよび試験装置
US9779780B2 (en) 2010-06-17 2017-10-03 Teradyne, Inc. Damping vibrations within storage device testing systems
US8687349B2 (en) 2010-07-21 2014-04-01 Teradyne, Inc. Bulk transfer of storage devices using manual loading
US9001456B2 (en) 2010-08-31 2015-04-07 Teradyne, Inc. Engaging test slots
US9441782B2 (en) 2011-10-14 2016-09-13 Ergotron, Inc. Tablet mounting arm systems and methods
CN103999012B (zh) 2011-10-14 2018-01-26 爱格升有限公司 平板电脑存储设备
US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling
TWM445207U (zh) * 2012-08-06 2013-01-11 Acer Inc 散熱機構
US20140185225A1 (en) * 2012-12-28 2014-07-03 Joel Wineland Advanced Datacenter Designs
US9459312B2 (en) 2013-04-10 2016-10-04 Teradyne, Inc. Electronic assembly test system
CN104812184B (zh) * 2014-01-23 2018-05-04 华为技术有限公司 一种导风系统
US10948534B2 (en) 2017-08-28 2021-03-16 Teradyne, Inc. Automated test system employing robotics
US10725091B2 (en) 2017-08-28 2020-07-28 Teradyne, Inc. Automated test system having multiple stages
US11226390B2 (en) 2017-08-28 2022-01-18 Teradyne, Inc. Calibration process for an automated test system
US10845410B2 (en) 2017-08-28 2020-11-24 Teradyne, Inc. Automated test system having orthogonal robots
US10983145B2 (en) 2018-04-24 2021-04-20 Teradyne, Inc. System for testing devices inside of carriers
CN109061233A (zh) * 2018-07-27 2018-12-21 广州华望汽车电子有限公司 一种多用途抽屉及其台车
US10775408B2 (en) 2018-08-20 2020-09-15 Teradyne, Inc. System for testing devices inside of carriers
US11867749B2 (en) 2020-10-22 2024-01-09 Teradyne, Inc. Vision system for an automated test system
US11754622B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Thermal control system for an automated test system
US11754596B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Test site configuration in an automated test system
US11899042B2 (en) 2020-10-22 2024-02-13 Teradyne, Inc. Automated test system
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RU208609U1 (ru) * 2021-09-27 2021-12-28 Федеральное государственное казённое военное образовательное учреждение высшего образования "Военная академия материально-технического обеспечения имени генерала армии А.В. Хрулева" Министерства обороны Российской Федерации Устройство для хранения и транспортирования автомобильного имущества

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US3602774A (en) * 1970-05-05 1971-08-31 Aerotronic Associates Inc Method and apparatus for supporting a plurality of printed circuit boards for life test and burn-in
US3689128A (en) * 1971-04-21 1972-09-05 Bell Telephone Labor Inc Cabinet unit employing a frame which can be moved out of a stationary frame
US3903404A (en) * 1973-10-17 1975-09-02 Amdahl Corp Computer construction and method
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US4145620A (en) * 1977-10-05 1979-03-20 Serel Corporation Modular dynamic burn-in apparatus
US4352274A (en) * 1978-04-10 1982-10-05 Signetics Corporation Circuit board mounting and cooling assembly
US4374317A (en) * 1979-07-05 1983-02-15 Reliability, Inc. Burn-in chamber
US4337499A (en) * 1980-11-03 1982-06-29 Lockheed Corp Electronic enclosure and articulated back panel for use therein
US4542341A (en) * 1982-01-04 1985-09-17 Artronics Corporation Electronic burn-in system
GB2139006B (en) * 1983-08-30 1985-05-15 Thorn Emi Automation Limited Modules for printed circuit boards

Also Published As

Publication number Publication date
JPS61114175A (ja) 1986-05-31
EP0181729A1 (de) 1986-05-21
SG21890G (en) 1990-07-06
EP0181729B1 (de) 1989-12-20
ATE48931T1 (de) 1990-01-15
CA1238113A (en) 1988-06-14
JPH0677043B2 (ja) 1994-09-28
US4683424A (en) 1987-07-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition