DE3585525D1 - Schaltungspruefautomat. - Google Patents

Schaltungspruefautomat.

Info

Publication number
DE3585525D1
DE3585525D1 DE8585904561T DE3585525T DE3585525D1 DE 3585525 D1 DE3585525 D1 DE 3585525D1 DE 8585904561 T DE8585904561 T DE 8585904561T DE 3585525 T DE3585525 T DE 3585525T DE 3585525 D1 DE3585525 D1 DE 3585525D1
Authority
DE
Germany
Prior art keywords
testing machine
switch testing
switch
machine
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8585904561T
Other languages
English (en)
Inventor
Hugh Littlebury
Mavin Swapp
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Application granted granted Critical
Publication of DE3585525D1 publication Critical patent/DE3585525D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
DE8585904561T 1984-10-01 1985-09-09 Schaltungspruefautomat. Expired - Lifetime DE3585525D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/656,812 US4604744A (en) 1984-10-01 1984-10-01 Automated circuit tester
PCT/US1985/001711 WO1986002166A1 (en) 1984-10-01 1985-09-09 Automated circuit tester

Publications (1)

Publication Number Publication Date
DE3585525D1 true DE3585525D1 (de) 1992-04-09

Family

ID=24634673

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585904561T Expired - Lifetime DE3585525D1 (de) 1984-10-01 1985-09-09 Schaltungspruefautomat.

Country Status (9)

Country Link
US (1) US4604744A (de)
EP (1) EP0197051B1 (de)
JP (1) JP2543675B2 (de)
KR (1) KR930000546B1 (de)
DE (1) DE3585525D1 (de)
HK (1) HK85695A (de)
MY (1) MY100894A (de)
SG (1) SG22995G (de)
WO (1) WO1986002166A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4692921A (en) * 1985-08-22 1987-09-08 American Telephone And Telegraph Company, At&T Bell Laboratories Method for generating verification tests
US4707834A (en) * 1985-09-17 1987-11-17 Tektronix, Inc. Computer-based instrument system
US4856001A (en) * 1987-05-29 1989-08-08 Zehntel, Inc. Digital in-circuit tester having channel-memory earse-preventer
US5265101A (en) * 1987-09-14 1993-11-23 Texas Instruments Incorporated Function array sequencing for VLSI test system
US4858208A (en) * 1988-07-11 1989-08-15 Motorola, Inc. Apparatus and method for testing semiconductor devices
US5369593A (en) * 1989-05-31 1994-11-29 Synopsys Inc. System for and method of connecting a hardware modeling element to a hardware modeling system
JP2842004B2 (ja) * 1992-02-03 1998-12-24 日本電気株式会社 回路のテスト方式
US5659555A (en) * 1993-08-19 1997-08-19 Lucent Technologies Inc. Method and apparatus for testing protocols
US5617430A (en) * 1993-12-22 1997-04-01 International Business Machines Corporation Testing system interconnections using dynamic configuration and test generation
US5459738A (en) * 1994-01-26 1995-10-17 Watari; Hiromichi Apparatus and method for digital circuit testing
JPH0887462A (ja) * 1994-09-20 1996-04-02 Fujitsu Ltd ステートマシン及び通信制御方式
JPH08184648A (ja) * 1994-12-28 1996-07-16 Advantest Corp 半導体試験装置用テストパターンの高速転送装置
US5546405A (en) * 1995-07-17 1996-08-13 Advanced Micro Devices, Inc. Debug apparatus for an automated semiconductor testing system
US6317638B1 (en) * 1997-08-22 2001-11-13 Honeywell Inc. Multi-layer state machine for a hybrid real-time control system and method of operation thereof
GB0123614D0 (en) * 2001-10-02 2001-11-21 Ibm On-chip diagnostic system, integrated circuit and method
TWI226557B (en) * 2003-09-09 2005-01-11 Taiwan Semiconductor Mfg System and method of real-time statistical bin control

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3969618A (en) * 1974-11-29 1976-07-13 Xerox Corporation On line PROM handling system
US4293950A (en) * 1978-04-03 1981-10-06 Nippon Telegraph And Telephone Public Corporation Test pattern generating apparatus
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
US4348759A (en) * 1979-12-17 1982-09-07 International Business Machines Corporation Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test
GB2070300B (en) * 1980-02-27 1984-01-25 Racal Automation Ltd Electrical testing apparatus and methods
JPS56140439A (en) * 1980-04-03 1981-11-02 Minatoerekutoronikusu Kk Pattern generator
JPS57111471A (en) * 1980-12-29 1982-07-10 Advantest Corp Test-pattern generator
US4439858A (en) * 1981-05-28 1984-03-27 Zehntel, Inc. Digital in-circuit tester
US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
US4493079A (en) * 1982-08-18 1985-01-08 Fairchild Camera & Instrument Corp. Method and system for selectively loading test data into test data storage means of automatic digital test equipment

Also Published As

Publication number Publication date
EP0197051B1 (de) 1992-03-04
HK85695A (en) 1995-06-09
SG22995G (en) 1995-08-18
JP2543675B2 (ja) 1996-10-16
WO1986002166A1 (en) 1986-04-10
EP0197051A4 (de) 1989-08-16
KR930000546B1 (ko) 1993-01-25
US4604744A (en) 1986-08-05
MY100894A (en) 1991-05-16
JPS62500320A (ja) 1987-02-05
KR880700275A (ko) 1988-02-22
EP0197051A1 (de) 1986-10-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee