DE3677137D1 - Kapazitiver streufeldsensor und verfahren. - Google Patents
Kapazitiver streufeldsensor und verfahren.Info
- Publication number
- DE3677137D1 DE3677137D1 DE8686306192T DE3677137T DE3677137D1 DE 3677137 D1 DE3677137 D1 DE 3677137D1 DE 8686306192 T DE8686306192 T DE 8686306192T DE 3677137 T DE3677137 T DE 3677137T DE 3677137 D1 DE3677137 D1 DE 3677137D1
- Authority
- DE
- Germany
- Prior art keywords
- probe
- plate element
- hole
- distance
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/12—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring diameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/764,164 US4814691A (en) | 1985-08-09 | 1985-08-09 | Fringe field capacitive sensor for measuring profile of a surface |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3677137D1 true DE3677137D1 (de) | 1991-02-28 |
Family
ID=25069862
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686306192T Expired - Fee Related DE3677137D1 (de) | 1985-08-09 | 1986-08-11 | Kapazitiver streufeldsensor und verfahren. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4814691A (de) |
EP (1) | EP0221638B1 (de) |
AT (1) | ATE60436T1 (de) |
CA (1) | CA1279988C (de) |
DE (1) | DE3677137D1 (de) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2690908B2 (ja) * | 1987-09-25 | 1997-12-17 | 株式会社日立製作所 | 表面計測装置 |
US4996492A (en) * | 1989-03-07 | 1991-02-26 | The Boeing Company | Probe for inspecting countersunk holes in conductive bodies |
US5021740A (en) * | 1989-03-07 | 1991-06-04 | The Boeing Company | Method and apparatus for measuring the distance between a body and a capacitance probe |
EP0425823A1 (de) * | 1989-09-29 | 1991-05-08 | Antivision Systems Corp. | Elektrostatische Abbildungsvorrichtung |
US5281921A (en) * | 1990-04-24 | 1994-01-25 | Novak James L | Non-contact capacitance based image sensing method and system |
US5189377A (en) * | 1990-09-04 | 1993-02-23 | Extrude Hone Corporation | Method and apparatus for co-ordinate measuring using a capacitance probe |
GB9021448D0 (en) * | 1990-10-03 | 1990-11-14 | Renishaw Plc | Capacitance sensing probe |
GB9021447D0 (en) * | 1990-10-03 | 1990-11-14 | Renishaw Plc | Capacitance probes |
WO1992008947A1 (en) * | 1990-11-16 | 1992-05-29 | Moonstone Designs Limited | Device for determining the presence and/or characteristics of an object or a substance |
US5272443A (en) * | 1992-04-22 | 1993-12-21 | Aluminum Company Of America | Chatter and profile measuring using capacitor sensors |
US5365166A (en) * | 1993-02-08 | 1994-11-15 | Westinghouse Electric Corporation | System and method for testing electrical generators |
DE4304451C2 (de) * | 1993-02-13 | 1995-12-14 | Seichter Gmbh | Meßsystem zur Erfassung von Unebenheiten auf der Oberfläche eines Meßobjektes |
US5517190A (en) * | 1994-02-03 | 1996-05-14 | Gunn; Colin N. | Physical measurement from changes in reactance |
US5646538A (en) * | 1995-06-13 | 1997-07-08 | Measurement Systems, Inc. | Method and apparatus for fastener hole inspection with a capacitive probe |
DE69618559T2 (de) | 1996-02-14 | 2002-08-14 | St Microelectronics Srl | Kapazitiver Abstandssensor, insbesondere zur Erfassung von Fingerabdrücken |
US6320394B1 (en) | 1996-02-14 | 2001-11-20 | Stmicroelectronics S.R.L. | Capacitive distance sensor |
US6114862A (en) | 1996-02-14 | 2000-09-05 | Stmicroelectronics, Inc. | Capacitive distance sensor |
US6483931B2 (en) * | 1997-09-11 | 2002-11-19 | Stmicroelectronics, Inc. | Electrostatic discharge protection of a capacitve type fingerprint sensing array |
US6028773A (en) * | 1997-11-14 | 2000-02-22 | Stmicroelectronics, Inc. | Packaging for silicon sensors |
US6191593B1 (en) | 1997-12-17 | 2001-02-20 | Stmicroelectronics, Inc. | Method for the non-invasive sensing of physical matter on the detection surface of a capacitive sensor |
US6091082A (en) | 1998-02-17 | 2000-07-18 | Stmicroelectronics, Inc. | Electrostatic discharge protection for integrated circuit sensor passivation |
US6181142B1 (en) * | 1998-07-21 | 2001-01-30 | Ade Corporation | Nonlinear current mirror for loop-gain control |
US6397158B1 (en) * | 1999-04-29 | 2002-05-28 | Sun Microsystems, Inc. | Method for determining capacitance values for quieting noisy power conductors |
US7239227B1 (en) | 1999-12-30 | 2007-07-03 | Upek, Inc. | Command interface using fingerprint sensor input system |
US6512381B2 (en) | 1999-12-30 | 2003-01-28 | Stmicroelectronics, Inc. | Enhanced fingerprint detection |
US6618505B2 (en) | 2000-03-09 | 2003-09-09 | The Boeing Company | Method, apparatus and computer program product for determining shim shape |
US6943665B2 (en) * | 2000-03-21 | 2005-09-13 | T. Eric Chornenky | Human machine interface |
US20030098774A1 (en) * | 2000-03-21 | 2003-05-29 | Chornenky Todd E. | Security apparatus |
US7137300B2 (en) * | 2003-03-19 | 2006-11-21 | California Institute Of Technology | Parylene capacitive accelerometer utilizing electrical fringing field sensing and method of making |
US8115497B2 (en) * | 2007-11-13 | 2012-02-14 | Authentec, Inc. | Pixel sensing circuit with common mode cancellation |
RU2504730C1 (ru) * | 2012-07-19 | 2014-01-20 | Федеральное Государственное Унитарное Предприятие "Государственный научно-производственный ракетно-космический центр "ЦСКБ-Прогресс" (ФГУП "ГНПРКЦ "ЦСКБ-Прогресс") | Способ контроля целостности токопроводящего покрытия на диэлектрическом материале |
WO2017072976A1 (ja) * | 2015-10-30 | 2017-05-04 | 三菱電機株式会社 | ワイヤ放電加工機、ワイヤ放電加工機の制御装置の制御方法及び位置決め方法 |
US9817439B2 (en) | 2016-02-29 | 2017-11-14 | JumpStartCSR, Inc. | System, method and device for designing, manufacturing, and monitoring custom human-interfacing devices |
WO2017195001A1 (en) * | 2016-05-13 | 2017-11-16 | Arcelormittal | Method for obtaining a height of a material stacked in a coke oven |
EP3335872A1 (de) | 2016-12-16 | 2018-06-20 | Amcor Flexibles Winterbourne Limited | Polymerffolien und daraus hergestellte verpackungen |
WO2020012440A1 (en) * | 2018-07-12 | 2020-01-16 | Scuola Superiore Di Studi Universitari E Di Perfezionamento Sant'anna | Sensitive system for increased proximity detection |
US11480428B2 (en) * | 2019-01-09 | 2022-10-25 | The Boeing Company | Methods and systems to test a size or characteristic of a hole |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2802178A (en) * | 1954-09-22 | 1957-08-06 | Gen Electric | Motion detecting device |
US3400331A (en) * | 1965-01-18 | 1968-09-03 | Pratt & Whitney Inc | Gaging device including a probe having a plurality of concentric and coextensive electrodes |
US3504279A (en) * | 1967-09-27 | 1970-03-31 | Reliance Electric & Eng Co | Noncontact interrupted surface inspection apparatus providing an electrical analog of the surface profile |
US3805150A (en) * | 1970-08-17 | 1974-04-16 | Ade Corp | Environment immune high precision capacitive gauging system |
US3842194A (en) * | 1971-03-22 | 1974-10-15 | Rca Corp | Information records and recording/playback systems therefor |
GB1436698A (en) * | 1972-02-11 | 1976-05-19 | Bakelite Xylonite Ltd | Apparatus for thickness measurement |
US3771051A (en) * | 1972-06-14 | 1973-11-06 | Ade Corp | Apparatus and method for indicating surface roughness |
FR2202586A5 (de) * | 1972-10-06 | 1974-05-03 | Commissariat Energie Atomique | |
GB1483187A (en) * | 1973-10-22 | 1977-08-17 | Ici Ltd | Method of and apparatus for assessing the flatness of anodes |
US4103226A (en) * | 1976-09-15 | 1978-07-25 | Westinghouse Electric Corp. | Apparatus for gauging the texture of a conducting surface |
US4112355A (en) * | 1976-10-22 | 1978-09-05 | Lockheed Corporation | Quality and fit measuring apparatus for fasteners and their holes |
US4168465A (en) * | 1977-12-15 | 1979-09-18 | The United States Of America As Represented By The Secretary Of The Air Force | Tapered hole capacitive probe |
GB2015165B (en) * | 1978-02-09 | 1983-01-12 | Koa Oil Co Ltd | Detecting capacitively corrosion of pipes |
US4152641A (en) * | 1978-02-27 | 1979-05-01 | Rca Corporation | Method and apparatus for the determination of signal pickup qualities of a stylus of a capacitive disc video player |
DD136897B1 (de) * | 1978-06-20 | 1981-03-25 | Elektromat Veb | Kapazitiver messfuehler |
US4296371A (en) * | 1980-03-17 | 1981-10-20 | Rca Corporation | System for measuring stylus shoe length |
US4352060A (en) * | 1980-07-01 | 1982-09-28 | Viak Ab | Apparatus for measuring the interior dimensions of a cast iron mold |
GB2100441A (en) * | 1981-06-12 | 1982-12-22 | Automatic Systems Lab Ltd | Method for determining dimensions and/or form of surfaces |
US4481616A (en) * | 1981-09-30 | 1984-11-06 | Rca Corporation | Scanning capacitance microscope |
US4422035A (en) * | 1981-12-11 | 1983-12-20 | Extrude Hone Corporation | Capacitance measurement probe |
-
1985
- 1985-08-09 US US06/764,164 patent/US4814691A/en not_active Expired - Lifetime
-
1986
- 1986-08-11 EP EP86306192A patent/EP0221638B1/de not_active Expired - Lifetime
- 1986-08-11 DE DE8686306192T patent/DE3677137D1/de not_active Expired - Fee Related
- 1986-08-11 CA CA000515648A patent/CA1279988C/en not_active Expired - Lifetime
- 1986-08-11 AT AT86306192T patent/ATE60436T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
ATE60436T1 (de) | 1991-02-15 |
CA1279988C (en) | 1991-02-12 |
EP0221638A1 (de) | 1987-05-13 |
US4814691A (en) | 1989-03-21 |
EP0221638B1 (de) | 1991-01-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: STIPPL PATENTANWAELTE, 90482 NUERNBERG |
|
8339 | Ceased/non-payment of the annual fee |