DE3683731D1 - Kontaktdurchgaenge in halbleiteranordnungen. - Google Patents

Kontaktdurchgaenge in halbleiteranordnungen.

Info

Publication number
DE3683731D1
DE3683731D1 DE8686308709T DE3683731T DE3683731D1 DE 3683731 D1 DE3683731 D1 DE 3683731D1 DE 8686308709 T DE8686308709 T DE 8686308709T DE 3683731 T DE3683731 T DE 3683731T DE 3683731 D1 DE3683731 D1 DE 3683731D1
Authority
DE
Germany
Prior art keywords
contact continues
semiconductor arrangements
arrangements
semiconductor
continues
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686308709T
Other languages
English (en)
Inventor
Roland Albert Levy
Kurt Nassau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
American Telephone and Telegraph Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone and Telegraph Co Inc filed Critical American Telephone and Telegraph Co Inc
Application granted granted Critical
Publication of DE3683731D1 publication Critical patent/DE3683731D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H01L23/485Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/5329Insulating materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/133Reflow oxides and glasses

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Local Oxidation Of Silicon (AREA)
  • Drying Of Semiconductors (AREA)
  • Formation Of Insulating Films (AREA)
  • Thin Film Transistor (AREA)
DE8686308709T 1985-11-15 1986-11-07 Kontaktdurchgaenge in halbleiteranordnungen. Expired - Fee Related DE3683731D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/798,422 US4733291A (en) 1985-11-15 1985-11-15 Contact vias in semiconductor devices

Publications (1)

Publication Number Publication Date
DE3683731D1 true DE3683731D1 (de) 1992-03-12

Family

ID=25173361

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686308709T Expired - Fee Related DE3683731D1 (de) 1985-11-15 1986-11-07 Kontaktdurchgaenge in halbleiteranordnungen.

Country Status (5)

Country Link
US (1) US4733291A (de)
EP (1) EP0223527B1 (de)
JP (1) JP2599128B2 (de)
CA (1) CA1243422A (de)
DE (1) DE3683731D1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4948743A (en) * 1988-06-29 1990-08-14 Matsushita Electronics Corporation Method of manufacturing a semiconductor device
JPH07109873B2 (ja) * 1988-07-05 1995-11-22 株式会社東芝 半導体記憶装置
JPH02186636A (ja) * 1989-01-12 1990-07-20 Seiko Epson Corp 集積回路装置の配線法
JP2783259B2 (ja) * 1996-07-18 1998-08-06 日本電気株式会社 半導体パッケージとその製造方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3925572A (en) * 1972-10-12 1975-12-09 Ncr Co Multilevel conductor structure and method
DE2414520A1 (de) * 1973-07-30 1975-02-20 Hitachi Ltd Verfahren zur herstellung dicht benachbarter elektroden auf einem halbleitersubstrat
US4192059A (en) * 1978-06-06 1980-03-11 Rockwell International Corporation Process for and structure of high density VLSI circuits, having inherently self-aligned gates and contacts for FET devices and conducting lines
JPS55138874A (en) * 1979-04-18 1980-10-30 Fujitsu Ltd Semiconductor device and method of fabricating the same
JPS5898934A (ja) * 1981-12-08 1983-06-13 Matsushita Electronics Corp 半導体装置の製造方法
JPS593964A (ja) * 1982-06-29 1984-01-10 Semiconductor Res Found 半導体集積回路
US4535528A (en) * 1983-12-02 1985-08-20 Hewlett-Packard Company Method for improving reflow of phosphosilicate glass by arsenic implantation
JPS60198847A (ja) * 1984-03-23 1985-10-08 Nec Corp 半導体装置およびその製造方法

Also Published As

Publication number Publication date
EP0223527A2 (de) 1987-05-27
EP0223527A3 (en) 1988-05-18
EP0223527B1 (de) 1992-01-29
JPS62136858A (ja) 1987-06-19
CA1243422A (en) 1988-10-18
US4733291A (en) 1988-03-22
JP2599128B2 (ja) 1997-04-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: BLUMBACH, KRAMER & PARTNER, 65193 WIESBADEN

8339 Ceased/non-payment of the annual fee