DE3686184D1 - Spektralfotometer. - Google Patents
Spektralfotometer.Info
- Publication number
- DE3686184D1 DE3686184D1 DE8686103160T DE3686184T DE3686184D1 DE 3686184 D1 DE3686184 D1 DE 3686184D1 DE 8686103160 T DE8686103160 T DE 8686103160T DE 3686184 T DE3686184 T DE 3686184T DE 3686184 D1 DE3686184 D1 DE 3686184D1
- Authority
- DE
- Germany
- Prior art keywords
- spectral photometer
- photometer
- spectral
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000003595 spectral effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
- G01J3/0259—Monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0262—Constructional arrangements for removing stray light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
- H01L31/02164—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors for shielding light, e.g. light blocking layers, cold shields for infrared detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
- G01J2003/2806—Array and filter array
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/07—Centrifugal type cuvettes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/064—Stray light conditioning
- G01N2201/0642—Light traps; baffles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0696—Pulsed
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US71431285A | 1985-03-21 | 1985-03-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3686184D1 true DE3686184D1 (de) | 1992-09-03 |
DE3686184T2 DE3686184T2 (de) | 1993-02-25 |
Family
ID=24869531
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686103160T Expired - Fee Related DE3686184T2 (de) | 1985-03-21 | 1986-03-10 | Spektralfotometer. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4687329A (de) |
EP (1) | EP0195339B1 (de) |
JP (1) | JPS61251724A (de) |
CA (1) | CA1272616A (de) |
DE (1) | DE3686184T2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8111396B2 (en) | 2006-04-01 | 2012-02-07 | Carl Zeiss Microimaging Gmbh | Spectrometric measurement system and method for compensating for veiling glare |
Families Citing this family (64)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2604754B2 (ja) * | 1987-09-04 | 1997-04-30 | 倉敷紡績株式会社 | 分光光度計 |
US5014216A (en) * | 1988-07-19 | 1991-05-07 | Beckman Instruments, Inc. | Concentration determination with multiple wavelength flash photometers |
US5043571A (en) * | 1988-08-01 | 1991-08-27 | Minolta Camera Kabushiki Kaisha | CCD photosensor and its application to a spectrophotometer |
US5121239A (en) * | 1989-10-20 | 1992-06-09 | The United States Of America As Represented By The Secretary Of The Air Force | Filter having adjustable spectral transmittance function |
US5128549A (en) * | 1990-03-30 | 1992-07-07 | Beckman Instruments, Inc. | Stray radiation compensation |
US5218473A (en) * | 1990-07-06 | 1993-06-08 | Optical Coating Laboratories, Inc. | Leakage-corrected linear variable filter |
EP0551430A1 (de) * | 1990-10-03 | 1993-07-21 | Abbott Laboratories | Herstellung von multifunktionellen holographischen optischen elementen und anwendung in photometern |
FR2671872B1 (fr) * | 1991-01-17 | 1993-04-02 | Secomam Sa | Spectrophotometre portatif pour l'etude in situ du spectre d'absorption d'une substance. |
JPH04313032A (ja) * | 1991-04-11 | 1992-11-05 | Kubota Corp | 分光分析装置 |
US5235178A (en) * | 1991-10-03 | 1993-08-10 | Hegyi Dennis J | Light sensor with diffuser and eye-like response |
FI95509C (fi) * | 1992-03-20 | 1996-02-12 | Rautaruukki Oy | Spektroskopinen menetelmä ja laite optisen säteilyn mittaamiseksi |
US5478750A (en) * | 1993-03-31 | 1995-12-26 | Abaxis, Inc. | Methods for photometric analysis |
FR2709827B1 (fr) * | 1993-09-07 | 1995-10-06 | Thomson Csf | Dispositif optique d'imagerie permettant l'analyse spectrale d'une scène. |
US6307629B1 (en) | 1997-08-12 | 2001-10-23 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US6373573B1 (en) * | 2000-03-13 | 2002-04-16 | Lj Laboratories L.L.C. | Apparatus for measuring optical characteristics of a substrate and pigments applied thereto |
US5759030A (en) | 1996-01-02 | 1998-06-02 | Lj Laboratories, L.L.C. | Method for determing optical characteristics of teeth |
US5966205A (en) | 1997-07-01 | 1999-10-12 | Lj Laboratories, Llc | Method and apparatus for detecting and preventing counterfeiting |
US5880826A (en) | 1997-07-01 | 1999-03-09 | L J Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of teeth |
US6254385B1 (en) * | 1997-01-02 | 2001-07-03 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of teeth |
US6239868B1 (en) | 1996-01-02 | 2001-05-29 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US6233047B1 (en) | 1997-01-02 | 2001-05-15 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US6301004B1 (en) | 2000-05-31 | 2001-10-09 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US6501542B2 (en) | 1998-06-30 | 2002-12-31 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6271913B1 (en) | 1997-07-01 | 2001-08-07 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6449041B1 (en) | 1997-07-01 | 2002-09-10 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6870616B2 (en) | 1998-06-30 | 2005-03-22 | Jjl Technologies Llc | Spectrometer apparatus for determining an optical characteristic of an object or material having one or more sensors for determining a physical position or non-color property |
FR2765970B1 (fr) * | 1997-07-11 | 1999-10-01 | Commissariat Energie Atomique | Procede de fabrication d'une matrice de filtres optiques, matrice de filtres optiques et dispositif de spectrometrie utilisant une telle matrice |
JPH11194089A (ja) * | 1997-08-20 | 1999-07-21 | Daimler Benz Ag | 車道表面の状態を求める方法 |
US6057586A (en) * | 1997-09-26 | 2000-05-02 | Intel Corporation | Method and apparatus for employing a light shield to modulate pixel color responsivity |
US6246479B1 (en) | 1998-06-08 | 2001-06-12 | Lj Laboratories, L.L.C. | Integrated spectrometer assembly and methods |
US6246471B1 (en) * | 1998-06-08 | 2001-06-12 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6573984B2 (en) | 1998-06-30 | 2003-06-03 | Lj Laboratories Llc | Apparatus and method for measuring optical characteristics of teeth |
US6249348B1 (en) | 1998-11-23 | 2001-06-19 | Lj Laboratories, L.L.C. | Integrated spectrometer assembly and methods |
US6538726B2 (en) | 1998-07-10 | 2003-03-25 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6391264B2 (en) * | 1999-02-11 | 2002-05-21 | Careside, Inc. | Cartridge-based analytical instrument with rotor balance and cartridge lock/eject system |
US6531095B2 (en) * | 1999-02-11 | 2003-03-11 | Careside, Inc. | Cartridge-based analytical instrument with optical detector |
EP1111333A4 (de) * | 1999-06-29 | 2002-08-28 | Omron Tateisi Electronics Co | Lichtquellevorrichtung,Spektroskop mit dieser Vorrichtung und Schichfehickesensor |
US6458326B1 (en) | 1999-11-24 | 2002-10-01 | Home Diagnostics, Inc. | Protective test strip platform |
US6362888B1 (en) | 1999-12-23 | 2002-03-26 | Lj Laboratories, L.L.C. | Spectrometer assembly |
US6519037B2 (en) | 1999-12-23 | 2003-02-11 | Lj Laboratories, Llc | Spectrometer having optical unit including a randomized fiber optic implement |
US6414750B2 (en) * | 2000-01-10 | 2002-07-02 | Lj Laboratories, L.L.C. | Spectrometric apparatus and method for measuring optical characteristics of an object |
WO2001084098A1 (en) * | 2000-05-01 | 2001-11-08 | Nederlandse Organisatie Voor Toegepast-Natuurweten-Schappelijk Onderzoek Tno | Method and means of measuring wavelength change |
US6525330B2 (en) | 2001-02-28 | 2003-02-25 | Home Diagnostics, Inc. | Method of strip insertion detection |
US6541266B2 (en) | 2001-02-28 | 2003-04-01 | Home Diagnostics, Inc. | Method for determining concentration of an analyte in a test strip |
US6562625B2 (en) | 2001-02-28 | 2003-05-13 | Home Diagnostics, Inc. | Distinguishing test types through spectral analysis |
JP2002296116A (ja) * | 2001-03-30 | 2002-10-09 | Yokogawa Electric Corp | マルチチャンネル分光器 |
US7408638B2 (en) * | 2001-11-21 | 2008-08-05 | Roygbiv, Llc | Refractive-diffractive spectrometer |
US6661513B1 (en) * | 2001-11-21 | 2003-12-09 | Roygbiv, Llc | Refractive-diffractive spectrometer |
US6903813B2 (en) | 2002-02-21 | 2005-06-07 | Jjl Technologies Llc | Miniaturized system and method for measuring optical characteristics |
US7450862B2 (en) * | 2002-03-19 | 2008-11-11 | Axsun Technologies, Inc. | Stray light insensitive detector system and amplifier |
US7095026B2 (en) * | 2002-11-08 | 2006-08-22 | L-3 Communications Cincinnati Electronics Corporation | Methods and apparatuses for selectively limiting undesired radiation |
US7351977B2 (en) | 2002-11-08 | 2008-04-01 | L-3 Communications Cincinnati Electronics Corporation | Methods and systems for distinguishing multiple wavelengths of radiation and increasing detected signals in a detection system using micro-optic structures |
JP5134862B2 (ja) * | 2007-05-16 | 2013-01-30 | 株式会社日立ハイテクノロジーズ | 分析装置 |
US7869036B2 (en) * | 2007-08-31 | 2011-01-11 | Canon Kabushiki Kaisha | Analysis apparatus for analyzing a specimen by obtaining electromagnetic spectrum information |
DE102008010010A1 (de) * | 2008-01-22 | 2009-10-22 | Pasan Sa | Spektrometrischer Sensor |
CN101694453B (zh) * | 2009-09-29 | 2011-07-20 | 深圳市蓝韵实业有限公司 | 一种防串扰的生化分析仪探测器装置 |
ES2372191B1 (es) * | 2010-02-25 | 2012-09-06 | Abengoa Solar New Technologies, S.A. | Espectrofotómetro portátil y método de caracterización de tubos de colectores solares. |
CN101858785A (zh) * | 2010-06-12 | 2010-10-13 | 北京农业智能装备技术研究中心 | 用于提高微型光谱仪光谱质量的装置 |
DE102010030549B4 (de) | 2010-06-25 | 2016-04-28 | Siemens Aktiengesellschaft | Nichtdispersiver Gasanalysator |
US8633440B2 (en) * | 2010-07-01 | 2014-01-21 | Newport Corporation | Optical demultiplexing system |
ES2375386B1 (es) | 2010-07-21 | 2012-09-27 | Abengoa Solar New Technologies, S.A. | Reflectómetro portátil y método de caracterización de espejos de centrales termosolares. |
US20140247442A1 (en) * | 2010-07-27 | 2014-09-04 | Microptix Technologies, Llc | Spectroradiometer device and applications of same |
USD812502S1 (en) | 2016-03-15 | 2018-03-13 | Hamamatsu Photonics K.K. | Spectrometer |
WO2020019809A1 (en) * | 2018-07-26 | 2020-01-30 | Boe Technology Group Co., Ltd. | Microfluidic apparatus, method of detecting substance in microfluidic apparatus, and spectrometer |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4003635A (en) * | 1968-03-27 | 1977-01-18 | The United States Of America As Represented By The Secretary Of The Navy | Mosaic interference filter |
US3869212A (en) * | 1973-08-02 | 1975-03-04 | Nasa | Spectrometer integrated with a facsimile camera |
US3973118A (en) * | 1975-03-25 | 1976-08-03 | Lamontagne Joseph Alfred | Electro-optical detector array and spectrum analyzer system |
US4054389A (en) * | 1976-09-23 | 1977-10-18 | International Business Machines Corporation | Spectrophotometer with photodiode array |
GB2013362B (en) * | 1978-01-20 | 1982-07-14 | Hoffmann La Roche | Spectrophotometer |
US4320971A (en) * | 1978-08-28 | 1982-03-23 | Nippon Kogaku K.K. | Spectrophotometer |
JPS55165085A (en) * | 1979-06-12 | 1980-12-23 | Dainippon Printing Co Ltd | Color separation filter for solid-state pickup color camera |
JPS5687007A (en) * | 1979-12-18 | 1981-07-15 | Matsushita Electric Ind Co Ltd | Color filter |
DE3170600D1 (en) * | 1980-09-29 | 1985-06-27 | Ibm | Semiconductor integrated circuit optical image-to-electrical signal transducer |
JPS5772370A (en) * | 1980-10-23 | 1982-05-06 | Canon Inc | Photoelectric converter |
JPS5778003A (en) * | 1980-10-31 | 1982-05-15 | Toppan Printing Co Ltd | Color separation filter |
GB2096352B (en) * | 1981-04-02 | 1985-04-11 | Abbott Lab | Fluorescence spectroscopy |
JPH0239726B2 (ja) * | 1981-12-17 | 1990-09-06 | Tokyo Shibaura Electric Co | Jukososhiarei |
JPS58105025A (ja) * | 1981-12-17 | 1983-06-22 | Toshiba Corp | 受光素子アレイ |
JPS58114684A (ja) * | 1981-12-28 | 1983-07-08 | Matsushita Electric Ind Co Ltd | 固体撮像素子 |
JPS58172536A (ja) * | 1982-04-02 | 1983-10-11 | Toshiba Corp | 分光分析装置 |
JPS59178324A (ja) * | 1983-03-28 | 1984-10-09 | Shimadzu Corp | 多波長光度計 |
JPS59178339A (ja) * | 1983-03-29 | 1984-10-09 | Toshiba Corp | 吸光度測定装置 |
JPS6043985A (ja) * | 1983-08-20 | 1985-03-08 | Matsushita Electric Ind Co Ltd | 色分離フィルタアレイ |
EP0167750A2 (de) * | 1984-06-13 | 1986-01-15 | Abbott Laboratories | Spektralphotometer |
-
1986
- 1986-03-10 EP EP86103160A patent/EP0195339B1/de not_active Expired - Lifetime
- 1986-03-10 DE DE8686103160T patent/DE3686184T2/de not_active Expired - Fee Related
- 1986-03-13 CA CA000503989A patent/CA1272616A/en not_active Expired - Fee Related
- 1986-03-20 JP JP61061078A patent/JPS61251724A/ja active Pending
- 1986-12-12 US US06/941,247 patent/US4687329A/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8111396B2 (en) | 2006-04-01 | 2012-02-07 | Carl Zeiss Microimaging Gmbh | Spectrometric measurement system and method for compensating for veiling glare |
Also Published As
Publication number | Publication date |
---|---|
JPS61251724A (ja) | 1986-11-08 |
CA1272616A (en) | 1990-08-14 |
DE3686184T2 (de) | 1993-02-25 |
EP0195339A2 (de) | 1986-09-24 |
US4687329A (en) | 1987-08-18 |
EP0195339A3 (en) | 1989-05-03 |
EP0195339B1 (de) | 1992-07-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |