DE3686803T2 - Verfahren und vorrichtung zur ablesung eines bandmusters. - Google Patents

Verfahren und vorrichtung zur ablesung eines bandmusters.

Info

Publication number
DE3686803T2
DE3686803T2 DE8686115046T DE3686803T DE3686803T2 DE 3686803 T2 DE3686803 T2 DE 3686803T2 DE 8686115046 T DE8686115046 T DE 8686115046T DE 3686803 T DE3686803 T DE 3686803T DE 3686803 T2 DE3686803 T2 DE 3686803T2
Authority
DE
Germany
Prior art keywords
reading
tape pattern
tape
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686115046T
Other languages
English (en)
Other versions
DE3686803D1 (de
Inventor
Shigeru Kakumoto
Tatsuo Hitachi Sk Kounan- Sumi
Tetsuo Kurisu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Software Engineering Co Ltd
Hitachi Ltd
Original Assignee
Hitachi Software Engineering Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP60241549A external-priority patent/JPH0785056B2/ja
Priority claimed from JP60241548A external-priority patent/JPH0785055B2/ja
Application filed by Hitachi Software Engineering Co Ltd, Hitachi Ltd filed Critical Hitachi Software Engineering Co Ltd
Publication of DE3686803D1 publication Critical patent/DE3686803D1/de
Application granted granted Critical
Publication of DE3686803T2 publication Critical patent/DE3686803T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2942—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using autoradiographic methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/447—Systems using electrophoresis
    • G01N27/44704—Details; Accessories
    • G01N27/44717—Arrangements for investigating the separated zones, e.g. localising zones
    • G01N27/44721—Arrangements for investigating the separated zones, e.g. localising zones by optical means
DE8686115046T 1985-10-30 1986-10-29 Verfahren und vorrichtung zur ablesung eines bandmusters. Expired - Fee Related DE3686803T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP60241549A JPH0785056B2 (ja) 1985-10-30 1985-10-30 バンド配列パタ−ンのバンド位置補正方法
JP60241548A JPH0785055B2 (ja) 1985-10-30 1985-10-30 バンド配列パタ−ン自動読取り方法および装置

Publications (2)

Publication Number Publication Date
DE3686803D1 DE3686803D1 (de) 1992-10-29
DE3686803T2 true DE3686803T2 (de) 1993-05-06

Family

ID=26535320

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686115046T Expired - Fee Related DE3686803T2 (de) 1985-10-30 1986-10-29 Verfahren und vorrichtung zur ablesung eines bandmusters.

Country Status (3)

Country Link
US (1) US4841443A (de)
EP (1) EP0220732B1 (de)
DE (1) DE3686803T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6285862A (ja) * 1985-10-11 1987-04-20 Fuji Photo Film Co Ltd 核酸の塩基配列決定のための信号処理方法
JP2508404B2 (ja) * 1990-10-30 1996-06-19 株式会社島津製作所 塩基配列決定装置
US5502773A (en) * 1991-09-20 1996-03-26 Vanderbilt University Method and apparatus for automated processing of DNA sequence data
AU6114194A (en) * 1993-03-09 1994-09-26 Inopsia Bron & Co. Method for automatically correcting and matching digitized electrophoresis and western blots tests
JPH07318534A (ja) * 1994-05-27 1995-12-08 Fuji Photo Film Co Ltd 生体高分子物質の分離展開データのサンプリング方法
US5800993A (en) * 1994-07-29 1998-09-01 The Regents Of The University Of California DNA sequencing apparatus and method for a small format gel with a magnified readout
US5666435A (en) * 1994-12-09 1997-09-09 Genomyx Corporation System for analysis of x-ray films of nucleotide sequences
US5717602A (en) * 1996-02-05 1998-02-10 Kenning; Gregory G. Automated electrophoresis and analysis system
GB2311198B (en) * 1996-03-14 1998-05-06 Simage Oy Autoradiography imaging
AU2001247275A1 (en) * 2000-03-06 2001-09-17 Gene Logic, Inc. Virtual gel profiling system
US11686703B2 (en) 2017-12-22 2023-06-27 Quest Diagnostics Investments Llc Automated analysis of analytical gels and blots

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3932839A (en) * 1974-04-24 1976-01-13 Stephens Richard G Pattern analysis apparatus and method
JPS5944648A (ja) * 1982-09-07 1984-03-13 Sansou Seisakusho:Kk デオキシリボ核酸の塩基配列決定方法
EP0151974A3 (de) * 1984-01-27 1987-05-06 E.I. Du Pont De Nemours And Company Bildelementquantisierung
DE3573667D1 (en) * 1984-04-27 1989-11-16 Hitachi Software Eng Input apparatus for entering base sequence information of the gene

Also Published As

Publication number Publication date
EP0220732B1 (de) 1992-09-23
US4841443A (en) 1989-06-20
DE3686803D1 (de) 1992-10-29
EP0220732A3 (en) 1989-07-19
EP0220732A2 (de) 1987-05-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee