DE3750928D1 - Laufzeit-Massenspektrometrie. - Google Patents

Laufzeit-Massenspektrometrie.

Info

Publication number
DE3750928D1
DE3750928D1 DE3750928T DE3750928T DE3750928D1 DE 3750928 D1 DE3750928 D1 DE 3750928D1 DE 3750928 T DE3750928 T DE 3750928T DE 3750928 T DE3750928 T DE 3750928T DE 3750928 D1 DE3750928 D1 DE 3750928D1
Authority
DE
Germany
Prior art keywords
mass spectrometry
runtime
runtime mass
spectrometry
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3750928T
Other languages
English (en)
Other versions
DE3750928T2 (de
Inventor
Allen Robert Waugh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fisons Ltd
Original Assignee
Fisons Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fisons Ltd filed Critical Fisons Ltd
Publication of DE3750928D1 publication Critical patent/DE3750928D1/de
Application granted granted Critical
Publication of DE3750928T2 publication Critical patent/DE3750928T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/061Ion deflecting means, e.g. ion gates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/0027Methods for using particle spectrometers
    • H01J49/0031Step by step routines describing the use of the apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
DE3750928T 1986-10-31 1987-08-28 Laufzeit-Massenspektrometrie. Expired - Fee Related DE3750928T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB868626075A GB8626075D0 (en) 1986-10-31 1986-10-31 Time-of-flight mass spectrometer

Publications (2)

Publication Number Publication Date
DE3750928D1 true DE3750928D1 (de) 1995-02-09
DE3750928T2 DE3750928T2 (de) 1995-05-11

Family

ID=10606618

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3750928T Expired - Fee Related DE3750928T2 (de) 1986-10-31 1987-08-28 Laufzeit-Massenspektrometrie.

Country Status (4)

Country Link
US (1) US4778993A (de)
EP (1) EP0266039B1 (de)
DE (1) DE3750928T2 (de)
GB (1) GB8626075D0 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2624610B1 (fr) * 1987-12-11 1990-03-30 Cameca Procede d'analyse en temps de vol, a balayage continu, et dispositif d'analyse pour la mise en oeuvre de ce procede
US5068535A (en) * 1988-03-07 1991-11-26 University Of Houston - University Park Time-of-flight ion-scattering spectrometer for scattering and recoiling for electron density and structure
JP2523781B2 (ja) * 1988-04-28 1996-08-14 日本電子株式会社 飛行時間型/偏向二重収束型切換質量分析装置
US4988628A (en) * 1989-02-28 1991-01-29 New England Deaconess Hospital Corporation Method of drug detection
WO1991003071A1 (en) * 1989-08-25 1991-03-07 Institut Energeticheskikh Problem Khimicheskoi Fiziki Akademii Nauk Sssr Method and device for continuous-wave ion beam time-of-flight mass-spectrometric analysis
US5026988A (en) * 1989-09-19 1991-06-25 Vanderbilt University Method and apparatus for time of flight medium energy particle scattering
US5045694A (en) * 1989-09-27 1991-09-03 The Rockefeller University Instrument and method for the laser desorption of ions in mass spectrometry
US5288644A (en) * 1990-04-04 1994-02-22 The Rockefeller University Instrument and method for the sequencing of genome
US5168158A (en) * 1991-03-29 1992-12-01 The United States Of America As Represented By The United States Department Of Energy Linear electric field mass spectrometry
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method
US6436635B1 (en) 1992-11-06 2002-08-20 Boston University Solid phase sequencing of double-stranded nucleic acids
US5605798A (en) 1993-01-07 1997-02-25 Sequenom, Inc. DNA diagnostic based on mass spectrometry
US6194144B1 (en) 1993-01-07 2001-02-27 Sequenom, Inc. DNA sequencing by mass spectrometry
CA2153387A1 (en) 1993-01-07 1994-07-21 Hubert Koester Dna sequencing by mass spectrometry
US5396065A (en) * 1993-12-21 1995-03-07 Hewlett-Packard Company Sequencing ion packets for ion time-of-flight mass spectrometry
US7803529B1 (en) 1995-04-11 2010-09-28 Sequenom, Inc. Solid phase sequencing of biopolymers
US6146854A (en) * 1995-08-31 2000-11-14 Sequenom, Inc. Filtration processes, kits and devices for isolating plasmids
US5654543A (en) * 1995-11-02 1997-08-05 Hewlett-Packard Company Mass spectrometer and related method
US5619034A (en) * 1995-11-15 1997-04-08 Reed; David A. Differentiating mass spectrometer
US5777324A (en) 1996-09-19 1998-07-07 Sequenom, Inc. Method and apparatus for maldi analysis
US6140053A (en) * 1996-11-06 2000-10-31 Sequenom, Inc. DNA sequencing by mass spectrometry via exonuclease degradation
EP1164203B1 (de) 1996-11-06 2007-10-10 Sequenom, Inc. DNA-Diagnostik mittels Massenspektrometrie
DE69727489T2 (de) 1996-11-06 2004-11-25 Sequenom, Inc., San Diego Verfahren zur massenspektrometrie
AUPO481097A0 (en) * 1997-01-28 1997-02-20 Gbc Scientific Equipment Pty Ltd Gate for eliminating charged particles in time of flight spectrometers
US6207370B1 (en) 1997-09-02 2001-03-27 Sequenom, Inc. Diagnostics based on mass spectrometric detection of translated target polypeptides
US6723564B2 (en) 1998-05-07 2004-04-20 Sequenom, Inc. IR MALDI mass spectrometry of nucleic acids using liquid matrices
US7095015B2 (en) 2001-10-22 2006-08-22 Micromass Uk Limited Mass spectrometer
WO2008086618A1 (en) * 2007-01-19 2008-07-24 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Apparatus and method for cooling ions

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3619606A (en) * 1969-10-06 1971-11-09 Bendix Corp Ion source for time-of-flight mass spectrometer
US4296323A (en) * 1980-03-10 1981-10-20 The Perkin-Elmer Corporation Secondary emission mass spectrometer mechanism to be used with other instrumentation
US4458149A (en) * 1981-07-14 1984-07-03 Patrick Luis Muga Time-of-flight mass spectrometer
US4472631A (en) * 1982-06-04 1984-09-18 Research Corporation Combination of time resolution and mass dispersive techniques in mass spectrometry
US4633083A (en) * 1985-04-08 1986-12-30 Washington State University Research Foundation, Inc. Chemical analysis by time dispersive ion spectrometry

Also Published As

Publication number Publication date
EP0266039B1 (de) 1994-12-28
GB8626075D0 (en) 1986-12-03
US4778993A (en) 1988-10-18
EP0266039A3 (en) 1989-12-13
DE3750928T2 (de) 1995-05-11
EP0266039A2 (de) 1988-05-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee