DE502004009073D1 - Analytisches Verfahren zum Bestimmen von kristallographischen Phasen einer Messprobe - Google Patents
Analytisches Verfahren zum Bestimmen von kristallographischen Phasen einer MessprobeInfo
- Publication number
- DE502004009073D1 DE502004009073D1 DE502004009073T DE502004009073T DE502004009073D1 DE 502004009073 D1 DE502004009073 D1 DE 502004009073D1 DE 502004009073 T DE502004009073 T DE 502004009073T DE 502004009073 T DE502004009073 T DE 502004009073T DE 502004009073 D1 DE502004009073 D1 DE 502004009073D1
- Authority
- DE
- Germany
- Prior art keywords
- measurement sample
- analytical method
- crystallographic phases
- determining crystallographic
- determining
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10346433A DE10346433B4 (de) | 2003-10-07 | 2003-10-07 | Analytisches Verfahren zum Bestimmen von kristallographischen Phasen einer Messprobe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE502004009073D1 true DE502004009073D1 (de) | 2009-04-16 |
Family
ID=34306294
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10346433A Expired - Fee Related DE10346433B4 (de) | 2003-10-07 | 2003-10-07 | Analytisches Verfahren zum Bestimmen von kristallographischen Phasen einer Messprobe |
| DE502004009073T Active DE502004009073D1 (de) | 2003-10-07 | 2004-09-23 | Analytisches Verfahren zum Bestimmen von kristallographischen Phasen einer Messprobe |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10346433A Expired - Fee Related DE10346433B4 (de) | 2003-10-07 | 2003-10-07 | Analytisches Verfahren zum Bestimmen von kristallographischen Phasen einer Messprobe |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7184517B2 (de) |
| EP (1) | EP1522847B1 (de) |
| DE (2) | DE10346433B4 (de) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1571441A1 (de) * | 2004-03-01 | 2005-09-07 | Panalytical B.V. | Überwachung von Epitaxie in situ mittels eines winkeldispersiven Röntgendiffraktometers |
| US20070259052A1 (en) | 2006-05-05 | 2007-11-08 | Shire International Licensing B.V. | Assay for lanthanum hydroxycarbonate |
| US7529340B2 (en) * | 2006-05-15 | 2009-05-05 | General Electric Company | Systems and methods for identifying a substance |
| US7792250B1 (en) | 2009-04-30 | 2010-09-07 | Halliburton Energy Services Inc. | Method of selecting a wellbore cement having desirable characteristics |
| US7999933B2 (en) | 2009-08-14 | 2011-08-16 | Princeton Instruments | Method for calibrating imaging spectrographs |
| US8887806B2 (en) | 2011-05-26 | 2014-11-18 | Halliburton Energy Services, Inc. | Method for quantifying cement blend components |
| WO2012178082A1 (en) * | 2011-06-24 | 2012-12-27 | The Trustees Of Columbia University In The City Of New York | Improved methods, devices and systems to process x-ray diffraction data |
| JP6013950B2 (ja) * | 2013-03-14 | 2016-10-25 | 株式会社リガク | 結晶相同定方法、結晶相同定装置、及び結晶相同定プログラム |
| CN103439352B (zh) * | 2013-08-20 | 2016-09-07 | 中国兵器科学研究院宁波分院 | 一种trip钢的组织定量分析方法 |
| US9939393B2 (en) | 2015-09-28 | 2018-04-10 | United Technologies Corporation | Detection of crystallographic properties in aerospace components |
| KR102453706B1 (ko) * | 2016-02-17 | 2022-10-14 | 가부시키가이샤 리가쿠 | 해석 장치, 해석 방법 및 해석 프로그램 |
| WO2018025618A1 (ja) * | 2016-07-30 | 2018-02-08 | 株式会社リガク | 物質構造の探索方法とそれに用いるｘ線構造解析システム |
| AU2018315828B2 (en) * | 2017-08-09 | 2023-07-20 | Rigaku Corporation | Crystal-phase quantitative analysis device, crystal-phase quantitative analysis method, and crystal-phase quantitative analysis program |
| CN114705708B (zh) * | 2022-06-07 | 2022-08-23 | 四川大学 | 一种样品表面成分智能分析方法及系统 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9223592D0 (en) * | 1992-11-11 | 1992-12-23 | Fisons Plc | X-ray analysis apparatus |
| GB9226552D0 (en) * | 1992-12-21 | 1993-02-17 | Philips Electronics Uk Ltd | A method of determining a given characteristic of a material sample |
| US5414747A (en) * | 1993-02-22 | 1995-05-09 | The Penn State Research Foundation | Method and apparatus for in-process analysis of polycrystalline films and coatings by x-ray diffraction |
| JP3059403B2 (ja) * | 1996-07-18 | 2000-07-04 | 理学電機工業株式会社 | Ｘ線分析方法および装置 |
| JPH08334481A (ja) * | 1996-07-25 | 1996-12-17 | Shimadzu Corp | 蛍光ｘ線分析方法 |
| JP2002131251A (ja) * | 2000-10-20 | 2002-05-09 | Seiko Instruments Inc | Ｘ線分析装置 |
| US6577705B1 (en) * | 2001-04-02 | 2003-06-10 | William Chang | Combinatorial material analysis using X-ray capillary optics |
| JP4777539B2 (ja) * | 2001-05-29 | 2011-09-21 | エスアイアイ・ナノテクノロジー株式会社 | 複合ｘ線分析装置 |
| JP2003050115A (ja) * | 2001-08-07 | 2003-02-21 | Seiko Instruments Inc | Ｘ線膜厚計 |
-
2003
- 2003-10-07 DE DE10346433A patent/DE10346433B4/de not_active Expired - Fee Related
-
2004
- 2004-09-23 EP EP04022630A patent/EP1522847B1/de not_active Expired - Fee Related
- 2004-09-23 DE DE502004009073T patent/DE502004009073D1/de active Active
- 2004-09-30 US US10/952,823 patent/US7184517B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP1522847B1 (de) | 2009-03-04 |
| EP1522847A1 (de) | 2005-04-13 |
| US20050074089A1 (en) | 2005-04-07 |
| DE10346433B4 (de) | 2006-05-11 |
| DE10346433A1 (de) | 2005-05-19 |
| US7184517B2 (en) | 2007-02-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE502004009073D1 (de) | Analytisches Verfahren zum Bestimmen von kristallographischen Phasen einer Messprobe | |
| DE60320101D1 (de) | Verfahren für regressionsanalyse von formationsparametern | |
| DE502005007752D1 (de) | Verfahren zur robotergestützten vermessung von messobjekten | |
| DE60216389D1 (de) | Verfahren zur zerstörungsfreien Prüfung | |
| ATE467837T1 (de) | Verfahren zur analyse einer blutprobe | |
| DE50305912D1 (de) | Verfahren zur zerstörungsfreien prüfung eines bauteils | |
| DE69902024D1 (de) | Verfahren zur probenentnahme einer biologischen probe | |
| DE60232117D1 (de) | Verfahren zur Dickenmessung | |
| DE602005002054D1 (de) | Verfahren zum Nachweis von Testkörpern | |
| DE602004028563D1 (de) | Verfahren zur Verbesserung der Genauigkeit einer Messung des Mittelwertes der Polarisationsmodendispersion | |
| DK1470425T3 (da) | Anordning til automatiseret analyse af en væskepröve | |
| DE502005006894D1 (de) | Verfahren zum messen mindestens einer gaskomponente | |
| DE50214333D1 (de) | Verfahren zur gaschromatographischen analyse einer probe | |
| DE602005015563D1 (de) | Optisches verfahren zur bestimmung der verteilung von lipidpartikeln in einer probe | |
| DE60328055D1 (de) | Verfahren zum nachweis von pathogenen mykobakterien in klinischen proben | |
| DE50111035D1 (de) | Verfahren zur detektion des von einer probe kommenden lichtes | |
| DE60329719D1 (de) | Verfahren zum nachweis einer prädisposition für höhenbedingtes lungenödem | |
| DE602004003984D1 (de) | Vorrichtung zum Sammeln von flüssigen Proben | |
| DE60322829D1 (de) | Verfahren zum Prüfen | |
| DE10292255D2 (de) | Verfahren für biochemische Nachweise von Analyten | |
| DE602004031882D1 (de) | Verfahren zur durchführung einer zusammensetzungsanalyse einer erdgasprobe | |
| DE602004003163D1 (de) | Verfahren zur Bereitstellung von Proben zum Nachweis | |
| DE10253337B4 (de) | Verfahren zum Nachweis einer Nukleinsäure | |
| ATE427480T1 (de) | Verfahren zur analytischen untersuchung einer bierprobe | |
| DE50307757D1 (de) | Verfahren zur Ermittlung einer geeigneten Parklücke |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition |