DE50214068D1 - Interferometrische anordnung zur ermittlung der laufzeit des lichts in einer probe - Google Patents

Interferometrische anordnung zur ermittlung der laufzeit des lichts in einer probe

Info

Publication number
DE50214068D1
DE50214068D1 DE50214068T DE50214068T DE50214068D1 DE 50214068 D1 DE50214068 D1 DE 50214068D1 DE 50214068 T DE50214068 T DE 50214068T DE 50214068 T DE50214068 T DE 50214068T DE 50214068 D1 DE50214068 D1 DE 50214068D1
Authority
DE
Germany
Prior art keywords
light
sample
determining
interferometrical
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE50214068T
Other languages
English (en)
Inventor
Peter Koch
Martin Wosnitza
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MED LASERZENTRUM LUEBECK GmbH
Medizinisches Laserzentrum Luebeck GmbH
Original Assignee
MED LASERZENTRUM LUEBECK GmbH
Medizinisches Laserzentrum Luebeck GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MED LASERZENTRUM LUEBECK GmbH, Medizinisches Laserzentrum Luebeck GmbH filed Critical MED LASERZENTRUM LUEBECK GmbH
Priority to DE50214068T priority Critical patent/DE50214068D1/de
Application granted granted Critical
Publication of DE50214068D1 publication Critical patent/DE50214068D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056—Passive reduction of errors
    • G01B9/02057—Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02097—Self-interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
DE50214068T 2001-04-17 2002-04-16 Interferometrische anordnung zur ermittlung der laufzeit des lichts in einer probe Expired - Lifetime DE50214068D1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE50214068T DE50214068D1 (de) 2001-04-17 2002-04-16 Interferometrische anordnung zur ermittlung der laufzeit des lichts in einer probe

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10118760A DE10118760A1 (de) 2001-04-17 2001-04-17 Verfahren zur Ermittlung der Laufzeitverteilung und Anordnung
PCT/DE2002/001404 WO2002084263A1 (de) 2001-04-17 2002-04-16 Interferometrische anordnung zur ermittlung der laufzeit des lichts in einer probe
DE50214068T DE50214068D1 (de) 2001-04-17 2002-04-16 Interferometrische anordnung zur ermittlung der laufzeit des lichts in einer probe

Publications (1)

Publication Number Publication Date
DE50214068D1 true DE50214068D1 (de) 2010-01-21

Family

ID=7681699

Family Applications (2)

Application Number Title Priority Date Filing Date
DE10118760A Ceased DE10118760A1 (de) 2001-04-17 2001-04-17 Verfahren zur Ermittlung der Laufzeitverteilung und Anordnung
DE50214068T Expired - Lifetime DE50214068D1 (de) 2001-04-17 2002-04-16 Interferometrische anordnung zur ermittlung der laufzeit des lichts in einer probe

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE10118760A Ceased DE10118760A1 (de) 2001-04-17 2001-04-17 Verfahren zur Ermittlung der Laufzeitverteilung und Anordnung

Country Status (5)

Country Link
US (1) US20040150829A1 (de)
EP (1) EP1379857B1 (de)
AT (1) ATE451607T1 (de)
DE (2) DE10118760A1 (de)
WO (1) WO2002084263A1 (de)

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ATE451607T1 (de) 2009-12-15
EP1379857B1 (de) 2009-12-09
US20040150829A1 (en) 2004-08-05

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