DE58908477D1 - Messfassung für Mikrowellenbauelemente. - Google Patents

Messfassung für Mikrowellenbauelemente.

Info

Publication number
DE58908477D1
DE58908477D1 DE58908477T DE58908477T DE58908477D1 DE 58908477 D1 DE58908477 D1 DE 58908477D1 DE 58908477 T DE58908477 T DE 58908477T DE 58908477 T DE58908477 T DE 58908477T DE 58908477 D1 DE58908477 D1 DE 58908477D1
Authority
DE
Germany
Prior art keywords
microwave components
measurement socket
socket
measurement
microwave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE58908477T
Other languages
English (en)
Inventor
Walter Zimmermann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Application granted granted Critical
Publication of DE58908477D1 publication Critical patent/DE58908477D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
DE58908477T 1989-03-20 1989-03-20 Messfassung für Mikrowellenbauelemente. Expired - Fee Related DE58908477D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP89104951A EP0388485B1 (de) 1989-03-20 1989-03-20 Messfassung für Mikrowellenbauelemente

Publications (1)

Publication Number Publication Date
DE58908477D1 true DE58908477D1 (de) 1994-11-10

Family

ID=8201115

Family Applications (1)

Application Number Title Priority Date Filing Date
DE58908477T Expired - Fee Related DE58908477D1 (de) 1989-03-20 1989-03-20 Messfassung für Mikrowellenbauelemente.

Country Status (6)

Country Link
US (1) US5086268A (de)
EP (1) EP0388485B1 (de)
JP (1) JPH02285270A (de)
CA (1) CA2012407A1 (de)
DE (1) DE58908477D1 (de)
ES (1) ES2061755T3 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69215787T2 (de) * 1991-08-13 1997-05-28 Polygram Int Holding Verfahren zum Herstellen eines vorbespielten Magnetbandes sowie Magnetbandgerät zum Durchführen dieses Verfahrens
US5541225A (en) * 1994-10-11 1996-07-30 The General Hospital Corporation α-Linolenic acid and eicosatetraynoic acid in the prevention and treatment of ventricular tachyarrhythmia
DE102008011240B4 (de) * 2008-02-26 2016-11-17 Airbus Ds Electronics And Border Security Gmbh Vorrichtung zur Kontaktierung eines T/R-Moduls mit einer Testeinrichtung
DE102008023130B3 (de) * 2008-05-09 2009-12-31 Eads Deutschland Gmbh Vorrichtung zur Kontaktierung eines T/R-Moduls mit einer Testeinrichtung
CN112180244B (zh) * 2020-12-01 2021-02-12 四川斯艾普电子科技有限公司 一种载板式裸芯片功放模块测试装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4365195A (en) * 1979-12-27 1982-12-21 Communications Satellite Corporation Coplanar waveguide mounting structure and test fixture for microwave integrated circuits
US4340860A (en) * 1980-05-19 1982-07-20 Trigon Integrated circuit carrier package test probe
US4367584A (en) * 1980-09-15 1983-01-11 Universal Instruments Corporation Method and apparatus for straightening leads and verifying the orientation and functionality of components
US4478352A (en) * 1982-05-19 1984-10-23 Micro Component Technology, Inc. Integrated circuit component handler singulation apparatus
US4535307A (en) * 1982-06-30 1985-08-13 Raytheon Company Microwave circuit device package
US4689556A (en) * 1984-10-12 1987-08-25 Daymarc Corporation Broad band contactor assembly for testing integrated circuit devices
US4747784A (en) * 1986-05-16 1988-05-31 Daymarc Corporation Contactor for integrated circuits
US4707656A (en) * 1985-03-18 1987-11-17 Marzan Jose M Circuit test fixture
US4836797A (en) * 1986-12-16 1989-06-06 Sym-Tek Systems, Inc. Electrical device contactor
US4835464A (en) * 1987-04-23 1989-05-30 Micro Component Technology, Inc. Decoupling apparatus for use with integrated circuit tester
DE8810268U1 (de) * 1988-04-08 1988-11-17 Itronic Fuchs Gmbh, 7809 Denzlingen, De

Also Published As

Publication number Publication date
US5086268A (en) 1992-02-04
CA2012407A1 (en) 1990-09-20
EP0388485A1 (de) 1990-09-26
ES2061755T3 (es) 1994-12-16
EP0388485B1 (de) 1994-10-05
JPH02285270A (ja) 1990-11-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee