DE59408020D1 - Vorrichtung zur Prüfung von Modulen - Google Patents

Vorrichtung zur Prüfung von Modulen

Info

Publication number
DE59408020D1
DE59408020D1 DE59408020T DE59408020T DE59408020D1 DE 59408020 D1 DE59408020 D1 DE 59408020D1 DE 59408020 T DE59408020 T DE 59408020T DE 59408020 T DE59408020 T DE 59408020T DE 59408020 D1 DE59408020 D1 DE 59408020D1
Authority
DE
Germany
Prior art keywords
testing modules
modules
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE59408020T
Other languages
English (en)
Inventor
Hansjoerg Rieser
Herbert Staubli
Peter Dr Schmoker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sieba AG
Original Assignee
Sieba AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sieba AG filed Critical Sieba AG
Application granted granted Critical
Publication of DE59408020D1 publication Critical patent/DE59408020D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2862—Chambers or ovens; Tanks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)
DE59408020T 1993-02-10 1994-01-24 Vorrichtung zur Prüfung von Modulen Expired - Fee Related DE59408020D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH40793 1993-02-10

Publications (1)

Publication Number Publication Date
DE59408020D1 true DE59408020D1 (de) 1999-05-06

Family

ID=4186342

Family Applications (1)

Application Number Title Priority Date Filing Date
DE59408020T Expired - Fee Related DE59408020D1 (de) 1993-02-10 1994-01-24 Vorrichtung zur Prüfung von Modulen

Country Status (5)

Country Link
US (1) US5450018A (de)
EP (1) EP0611968B1 (de)
JP (1) JPH06317515A (de)
DE (1) DE59408020D1 (de)
ES (1) ES2129530T3 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5744733A (en) * 1997-04-09 1998-04-28 Bridenbaugh; Paul Michael Method for testing and screening electronic and photonic packages for hydrogen damage susceptibility
US6526841B1 (en) 1999-08-02 2003-03-04 Pemstar, Inc. Environmental test chamber and a carrier for use therein
WO2002087211A2 (en) * 2001-04-25 2002-10-31 Pemstar, Inc. Hard drive test fixture
US6759862B2 (en) * 2001-08-08 2004-07-06 Accu-Assembly Incorporated Method and apparatus for evaluating a set of electronic components
TW512925U (en) * 2001-10-09 2002-12-01 Chung Shan Inst Of Science High-variability temperature testing device
US7202684B2 (en) * 2003-03-13 2007-04-10 Intel Corporation Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments
US6879869B2 (en) 2003-03-28 2005-04-12 Accu-Assembly Incorporated Placement of electronic components
US7232101B2 (en) * 2003-11-26 2007-06-19 Pemstar, Inc. Hard drive test fixture
US7164281B2 (en) * 2004-02-20 2007-01-16 Accu-Assembly Incorporated Circuit board component ambient moisture exposure monitoring
US20050225338A1 (en) * 2004-03-31 2005-10-13 Sands Richard L Hard drive test fixture
US7272896B2 (en) 2005-02-18 2007-09-25 Accu-Assembly Incorporated Data transfer between moisture sensors
US7498831B2 (en) * 2006-04-05 2009-03-03 Raytheon Company Conduction-cooled accelerated test fixture
US20190056288A1 (en) * 2017-08-17 2019-02-21 Crystal Instruments Corporation Integrated control system and method for environmental testing chamber
JP7066659B2 (ja) * 2019-06-28 2022-05-13 エスペック株式会社 環境試験装置及び試験室部材
CN111830396A (zh) * 2020-07-15 2020-10-27 广东利扬芯片测试股份有限公司 具有芯片测试环境温度检测功能的芯片测试系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58218667A (ja) * 1982-06-15 1983-12-19 Anarogu Debaisezu Kk 集積回路の検査方法
IT1201837B (it) * 1986-07-22 1989-02-02 Sgs Microelettronica Spa Sistema per la verifica della funzionalita' e delle caratteristiche di dispositivi a semiconduttore di tipo eprom durante il "burn-in"
US4729246A (en) * 1986-12-22 1988-03-08 Despatch Industries, Inc. Product testing system
FR2631433B1 (fr) * 1988-05-10 1990-08-24 Sagem Perfectionnements apportes aux dispositifs permettant d'ajuster la temperature d'un element par soufflage d'un gaz a la temperature appropriee
US5014000A (en) * 1989-06-23 1991-05-07 Schlagheck Jerry G Vibratory screening fixture

Also Published As

Publication number Publication date
EP0611968A1 (de) 1994-08-24
ES2129530T3 (es) 1999-06-16
JPH06317515A (ja) 1994-11-15
EP0611968B1 (de) 1999-03-31
US5450018A (en) 1995-09-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee