DE60012966D1 - Hochgeschwindigkeitsfehlererfassungsgerät und verfahren für automatische testeinrichtung - Google Patents

Hochgeschwindigkeitsfehlererfassungsgerät und verfahren für automatische testeinrichtung

Info

Publication number
DE60012966D1
DE60012966D1 DE60012966T DE60012966T DE60012966D1 DE 60012966 D1 DE60012966 D1 DE 60012966D1 DE 60012966 T DE60012966 T DE 60012966T DE 60012966 T DE60012966 T DE 60012966T DE 60012966 D1 DE60012966 D1 DE 60012966D1
Authority
DE
Germany
Prior art keywords
automatic test
error detecting
speed error
detecting device
test device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60012966T
Other languages
English (en)
Other versions
DE60012966T2 (de
Inventor
H Augarten
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of DE60012966D1 publication Critical patent/DE60012966D1/de
Application granted granted Critical
Publication of DE60012966T2 publication Critical patent/DE60012966T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/3193Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935Storing data, e.g. failure memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44Indication or identification of errors, e.g. for repair
DE60012966T 1999-10-26 2000-10-18 Hochgeschwindigkeitsfehlererfassungsgerät und verfahren für automatische testeinrichtung Expired - Lifetime DE60012966T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US426486 1982-09-29
US09/426,486 US6536005B1 (en) 1999-10-26 1999-10-26 High-speed failure capture apparatus and method for automatic test equipment
PCT/US2000/028916 WO2001031356A1 (en) 1999-10-26 2000-10-18 High-speed failure capture apparatus and method for automatic test equipment

Publications (2)

Publication Number Publication Date
DE60012966D1 true DE60012966D1 (de) 2004-09-16
DE60012966T2 DE60012966T2 (de) 2005-08-11

Family

ID=23690987

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60012966T Expired - Lifetime DE60012966T2 (de) 1999-10-26 2000-10-18 Hochgeschwindigkeitsfehlererfassungsgerät und verfahren für automatische testeinrichtung

Country Status (8)

Country Link
US (1) US6536005B1 (de)
EP (1) EP1232399B1 (de)
JP (2) JP2003513391A (de)
KR (1) KR20020062635A (de)
DE (1) DE60012966T2 (de)
MY (1) MY125270A (de)
TW (1) TW552428B (de)
WO (1) WO2001031356A1 (de)

Families Citing this family (85)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7024696B1 (en) 2000-06-14 2006-04-04 Reuben Bahar Method and system for prevention of piracy of a given software application via a communications network
US6694462B1 (en) * 2000-08-09 2004-02-17 Teradyne, Inc. Capturing and evaluating high speed data streams
JP2002216495A (ja) * 2001-01-18 2002-08-02 Mitsubishi Electric Corp メモリデバイス冗長救済解析方法、記録媒体および装置
US7401272B1 (en) * 2001-03-09 2008-07-15 Pmc-Sierra, Inc. Apparatus and method for high speed sampling or testing of data signals using automated testing equipment
US20030099139A1 (en) * 2001-08-24 2003-05-29 Abrosimov Igor Anatolievich Memory test apparatus and method of testing
US20030051193A1 (en) * 2001-09-10 2003-03-13 Dell Products L.P. Computer system with improved error detection
US7346125B2 (en) * 2002-04-23 2008-03-18 Raytheon Company Method and device for pulse shaping QPSK signals
DE10252199A1 (de) * 2002-11-09 2004-05-19 Infineon Technologies Ag Verfahren zum Beschreiben eines Fehleradressenspeichers und Testschaltung mit einem Fehleradressenspeicher
US7143323B2 (en) * 2002-12-13 2006-11-28 Teradyne, Inc. High speed capture and averaging of serial data by asynchronous periodic sampling
US7117410B2 (en) 2002-12-20 2006-10-03 Teradyne, Inc. Distributed failure analysis memory for automatic test equipment
JP2005011451A (ja) * 2003-06-19 2005-01-13 Advantest Corp 試験装置、及びプログラム
JP4514028B2 (ja) * 2004-05-20 2010-07-28 ルネサスエレクトロニクス株式会社 故障診断回路及び故障診断方法
JP4599945B2 (ja) * 2004-08-31 2010-12-15 横河電機株式会社 Icテスタ
JP4826116B2 (ja) * 2005-03-25 2011-11-30 富士通株式会社 Ram試験装置及び試験方法
US8087092B2 (en) * 2005-09-02 2011-12-27 Uniloc Usa, Inc. Method and apparatus for detection of tampering attacks
US7987362B2 (en) * 2005-09-12 2011-07-26 Uniloc Usa, Inc. Method and apparatus for using imperfections in computing devices for device authentication
US7395465B2 (en) * 2006-01-13 2008-07-01 International Business Machines Corporation Memory array repair where repair logic cannot operate at same operating condition as array
WO2007091332A1 (ja) * 2006-02-10 2007-08-16 Fujitsu Limited 接続検出回路
WO2007104355A1 (en) * 2006-03-13 2007-09-20 Verigy (Singapore) Pte. Ltd. Format transformation of test data
US8284929B2 (en) 2006-09-14 2012-10-09 Uniloc Luxembourg S.A. System of dependant keys across multiple pieces of related scrambled information
US7908662B2 (en) * 2007-06-21 2011-03-15 Uniloc U.S.A., Inc. System and method for auditing software usage
US7694195B2 (en) * 2007-08-14 2010-04-06 Dell Products L.P. System and method for using a memory mapping function to map memory defects
US7945815B2 (en) 2007-08-14 2011-05-17 Dell Products L.P. System and method for managing memory errors in an information handling system
US9373362B2 (en) * 2007-08-14 2016-06-21 Dell Products L.P. System and method for implementing a memory defect map
US7949913B2 (en) * 2007-08-14 2011-05-24 Dell Products L.P. Method for creating a memory defect map and optimizing performance using the memory defect map
EP2203815B1 (de) * 2007-09-20 2015-08-12 Uniloc Luxembourg S.A. Installieren eines geschützten softwareprodukts unter verwendung eines ungeschützten installationsbildes
US8566960B2 (en) * 2007-11-17 2013-10-22 Uniloc Luxembourg S.A. System and method for adjustable licensing of digital products
WO2009076232A1 (en) * 2007-12-05 2009-06-18 Uniloc Corporation System and method for device bound public key infrastructure
US8374968B2 (en) * 2008-02-22 2013-02-12 Uniloc Luxembourg S.A. License auditing for distributed applications
US8122309B2 (en) * 2008-03-11 2012-02-21 Formfactor, Inc. Method and apparatus for processing failures during semiconductor device testing
EP2311233A1 (de) * 2008-05-21 2011-04-20 Uniloc Usa, Inc. Einrichtung und verfahren für gesicherte kommunikation
EP2313858A4 (de) * 2008-06-25 2012-01-18 Uniloc Usa Inc System und verfahren zum überwachen der wirksamkeit von online-werbung
WO2010013306A1 (ja) * 2008-07-28 2010-02-04 株式会社アドバンテスト 試験装置および試験方法
JP2010134979A (ja) * 2008-12-03 2010-06-17 Fujitsu Ltd 演算処理装置および記憶装置用試験装置の制御方法
US8838976B2 (en) * 2009-02-10 2014-09-16 Uniloc Luxembourg S.A. Web content access using a client device identifier
CA2697309A1 (en) * 2009-03-18 2010-09-18 Luc Bessette Medical records system with dynamic avatar generator and avatar viewer
US20100312702A1 (en) * 2009-06-06 2010-12-09 Bullock Roddy M System and method for making money by facilitating easy online payment
US8103553B2 (en) * 2009-06-06 2012-01-24 Bullock Roddy Mckee Method for making money on internet news sites and blogs
US20100332337A1 (en) * 2009-06-25 2010-12-30 Bullock Roddy Mckee Universal one-click online payment method and system
US20100325424A1 (en) * 2009-06-19 2010-12-23 Etchegoyen Craig S System and Method for Secured Communications
US8423473B2 (en) * 2009-06-19 2013-04-16 Uniloc Luxembourg S. A. Systems and methods for game activation
US9047458B2 (en) * 2009-06-19 2015-06-02 Deviceauthority, Inc. Network access protection
US20100325446A1 (en) * 2009-06-19 2010-12-23 Joseph Martin Mordetsky Securing Executable Code Integrity Using Auto-Derivative Key
US20100323790A1 (en) * 2009-06-19 2010-12-23 Etchegoyen Craig S Devices and Methods for Auditing and Enforcing Computer Game Licenses
US20100325431A1 (en) * 2009-06-19 2010-12-23 Joseph Martin Mordetsky Feature-Specific Keys for Executable Code
US9633183B2 (en) * 2009-06-19 2017-04-25 Uniloc Luxembourg S.A. Modular software protection
US9047450B2 (en) 2009-06-19 2015-06-02 Deviceauthority, Inc. Identification of embedded system devices
US20100324983A1 (en) * 2009-06-22 2010-12-23 Etchegoyen Craig S System and Method for Media Distribution
US20100325735A1 (en) * 2009-06-22 2010-12-23 Etchegoyen Craig S System and Method for Software Activation
US20100325200A1 (en) * 2009-06-22 2010-12-23 Craig Stephen Etchegoyen System and Method for Software Activation Through Digital Media Fingerprinting
US20100325051A1 (en) * 2009-06-22 2010-12-23 Craig Stephen Etchegoyen System and Method for Piracy Reduction in Software Activation
US8495359B2 (en) * 2009-06-22 2013-07-23 NetAuthority System and method for securing an electronic communication
US20100324981A1 (en) * 2009-06-22 2010-12-23 Etchegoyen Craig S System and Method for Media Distribution on Social Networks
US20100325025A1 (en) * 2009-06-22 2010-12-23 Etchegoyen Craig S System and Method for Sharing Media
US20100325149A1 (en) * 2009-06-22 2010-12-23 Craig Stephen Etchegoyen System and Method for Auditing Software Usage
US8736462B2 (en) 2009-06-23 2014-05-27 Uniloc Luxembourg, S.A. System and method for traffic information delivery
US8452960B2 (en) * 2009-06-23 2013-05-28 Netauthority, Inc. System and method for content delivery
US8903653B2 (en) 2009-06-23 2014-12-02 Uniloc Luxembourg S.A. System and method for locating network nodes
US20100325040A1 (en) * 2009-06-23 2010-12-23 Craig Stephen Etchegoyen Device Authority for Authenticating a User of an Online Service
US20100324989A1 (en) * 2009-06-23 2010-12-23 Craig Stephen Etchegoyen System and Method for Monitoring Efficacy of Online Advertising
US20100321208A1 (en) * 2009-06-23 2010-12-23 Craig Stephen Etchegoyen System and Method for Emergency Communications
US9075958B2 (en) * 2009-06-24 2015-07-07 Uniloc Luxembourg S.A. Use of fingerprint with an on-line or networked auction
US20100332319A1 (en) * 2009-06-24 2010-12-30 Craig Stephen Etchegoyen Methods and Systems for Dynamic Serving of Advertisements in a Game or Virtual Reality Environment
US9129097B2 (en) * 2009-06-24 2015-09-08 Uniloc Luxembourg S.A. Systems and methods for auditing software usage using a covert key
US20100332331A1 (en) * 2009-06-24 2010-12-30 Craig Stephen Etchegoyen Systems and Methods for Providing an Interface for Purchasing Ad Slots in an Executable Program
US10068282B2 (en) 2009-06-24 2018-09-04 Uniloc 2017 Llc System and method for preventing multiple online purchases
US8239852B2 (en) * 2009-06-24 2012-08-07 Uniloc Luxembourg S.A. Remote update of computers based on physical device recognition
US8213907B2 (en) * 2009-07-08 2012-07-03 Uniloc Luxembourg S. A. System and method for secured mobile communication
US9141489B2 (en) * 2009-07-09 2015-09-22 Uniloc Luxembourg S.A. Failover procedure for server system
US8726407B2 (en) 2009-10-16 2014-05-13 Deviceauthority, Inc. Authentication of computing and communications hardware
US8316421B2 (en) * 2009-10-19 2012-11-20 Uniloc Luxembourg S.A. System and method for device authentication with built-in tolerance
US8769296B2 (en) * 2009-10-19 2014-07-01 Uniloc Luxembourg, S.A. Software signature tracking
US20110093503A1 (en) * 2009-10-19 2011-04-21 Etchegoyen Craig S Computer Hardware Identity Tracking Using Characteristic Parameter-Derived Data
US9082128B2 (en) * 2009-10-19 2015-07-14 Uniloc Luxembourg S.A. System and method for tracking and scoring user activities
KR20110138626A (ko) * 2010-06-21 2011-12-28 삼성전자주식회사 병렬 테스트 장치를 탑재한 메모리 모듈
GB2484268A (en) 2010-09-16 2012-04-11 Uniloc Usa Inc Psychographic profiling of users of computing devices
KR101212737B1 (ko) * 2010-12-17 2012-12-14 에스케이하이닉스 주식회사 반도체 메모리 장치
AU2011100168B4 (en) 2011-02-09 2011-06-30 Device Authority Ltd Device-bound certificate authentication
AU2011101296B4 (en) 2011-09-15 2012-06-28 Uniloc Usa, Inc. Hardware identification through cookies
US8724408B2 (en) 2011-11-29 2014-05-13 Kingtiger Technology (Canada) Inc. Systems and methods for testing and assembling memory modules
US9117552B2 (en) 2012-08-28 2015-08-25 Kingtiger Technology(Canada), Inc. Systems and methods for testing memory
AU2013100802B4 (en) 2013-04-11 2013-11-14 Uniloc Luxembourg S.A. Device authentication using inter-person message metadata
US8695068B1 (en) 2013-04-25 2014-04-08 Uniloc Luxembourg, S.A. Device authentication using display device irregularity
JP2016134188A (ja) 2015-01-22 2016-07-25 株式会社東芝 半導体集積回路
KR102416994B1 (ko) * 2020-10-23 2022-07-05 연세대학교 산학협력단 리던던시 분석 방법 및 리던던시 분석 장치

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4460997A (en) * 1981-07-15 1984-07-17 Pacific Western Systems Inc. Memory tester having memory repair analysis capability
US4460999A (en) * 1981-07-15 1984-07-17 Pacific Western Systems, Inc. Memory tester having memory repair analysis under pattern generator control
DE3482901D1 (de) * 1983-05-11 1990-09-13 Hitachi Ltd Pruefgeraet fuer redundanzspeicher.
US4876685A (en) 1987-06-08 1989-10-24 Teradyne, Inc. Failure information processing in automatic memory tester
EP0424612A3 (en) 1989-08-30 1992-03-11 International Business Machines Corporation Apparatus and method for real time data error capture and compression for redundancy analysis of a memory
JPH03104097A (ja) * 1989-09-18 1991-05-01 Fujitsu Ltd 半導体記憶装置
JPH04186600A (ja) * 1990-11-21 1992-07-03 Hitachi Ltd Icメモリ試験装置
JP3070305B2 (ja) * 1992-10-30 2000-07-31 安藤電気株式会社 フェイルメモリ
US5588115A (en) * 1993-01-29 1996-12-24 Teradyne, Inc. Redundancy analyzer for automatic memory tester
US5610925A (en) 1995-03-27 1997-03-11 Advantest Corporation Failure analyzer for semiconductor tester
JP3552175B2 (ja) * 1995-05-17 2004-08-11 株式会社アドバンテスト フェイルメモリ装置
JPH095402A (ja) 1995-06-22 1997-01-10 Advantest Corp 半導体メモリ試験装置
JP3547059B2 (ja) * 1995-06-30 2004-07-28 株式会社アドバンテスト 半導体メモリ試験方法およびこの方法を実施する装置
US5795797A (en) 1995-08-18 1998-08-18 Teradyne, Inc. Method of making memory chips using memory tester providing fast repair
JPH0963300A (ja) 1995-08-22 1997-03-07 Advantest Corp 半導体メモリ試験装置のフェイル解析装置
DE19680964T1 (de) 1995-09-22 1997-10-16 Advantest Corp Speichertestgerät
JPH1064297A (ja) * 1996-08-27 1998-03-06 Advantest Corp メモリ試験装置
US5889936A (en) 1995-11-22 1999-03-30 Cypress Semiconductor Corporation High speed asynchronous digital testing module
US5720031A (en) 1995-12-04 1998-02-17 Micron Technology, Inc. Method and apparatus for testing memory devices and displaying results of such tests
JP3098700B2 (ja) * 1995-12-27 2000-10-16 日立電子エンジニアリング株式会社 Ic試験装置
JPH09269358A (ja) * 1996-03-29 1997-10-14 Advantest Corp 半導体メモリ試験装置
US5790559A (en) * 1996-03-29 1998-08-04 Advantest Corporation Semiconductor memory testing apparatus
US5754556A (en) 1996-07-18 1998-05-19 Teradyne, Inc. Semiconductor memory tester with hardware accelerators
JP3700797B2 (ja) * 1996-08-09 2005-09-28 株式会社アドバンテスト メモリ試験装置
JPH1083696A (ja) * 1996-09-09 1998-03-31 Advantest Corp 半導体メモリ試験装置
JP3608694B2 (ja) * 1996-09-18 2005-01-12 株式会社アドバンテスト メモリ試験装置
JP3549174B2 (ja) * 1996-09-30 2004-08-04 株式会社アドバンテスト メモリ試験装置
WO1998016933A1 (fr) * 1996-10-15 1998-04-23 Advantest Corporation Verificateur de memoire et procede de commutation dudit verificateur d'un mode de verification ram a un mode de verification rom
JP3871384B2 (ja) * 1996-11-01 2007-01-24 株式会社アドバンテスト 半導体メモリ試験装置用不良解析メモリ
JPH10142298A (ja) * 1996-11-15 1998-05-29 Advantest Corp 集積回路デバイス試験装置
JP3384272B2 (ja) * 1997-02-27 2003-03-10 安藤電気株式会社 フェイルメモリ
JPH10269799A (ja) * 1997-03-19 1998-10-09 Advantest Corp 半導体メモリ試験装置
JPH10289597A (ja) * 1997-04-14 1998-10-27 Advantest Corp メモリ試験装置
TW382657B (en) * 1997-06-13 2000-02-21 Advantest Corp Memory tester
JP3558252B2 (ja) 1997-11-10 2004-08-25 株式会社アドバンテスト 半導体メモリ試験装置
JPH11328995A (ja) * 1998-05-19 1999-11-30 Advantest Corp メモリ試験装置
JP4161481B2 (ja) * 1999-09-28 2008-10-08 横河電機株式会社 フェイルメモリ回路及びそのインタリーブコピー方法

Also Published As

Publication number Publication date
TW552428B (en) 2003-09-11
JP2011249005A (ja) 2011-12-08
EP1232399A1 (de) 2002-08-21
DE60012966T2 (de) 2005-08-11
MY125270A (en) 2006-07-31
EP1232399B1 (de) 2004-08-11
JP2003513391A (ja) 2003-04-08
KR20020062635A (ko) 2002-07-26
WO2001031356A1 (en) 2001-05-03
US6536005B1 (en) 2003-03-18

Similar Documents

Publication Publication Date Title
DE60012966D1 (de) Hochgeschwindigkeitsfehlererfassungsgerät und verfahren für automatische testeinrichtung
DE60005941D1 (de) Fehlererfassungsgerät und verfahren für automatische test-einrichtung
DE60021564D1 (de) Verfahren und vorrichtung für eine fühlerprüfung
DE60036987D1 (de) Verfahren und Einrichtung für basisstations-kontrolliertes Weiterreichen
DE69804759T2 (de) Verfahren und gerät für zeitbereichsreflektometrie (otdr)
DE69837578D1 (de) Verfahren und Gerät für automatische Sprachmodusselektion
DE60000386D1 (de) Adapter für eine pipette, pipette zur absorptionsmessung, verfahren und vorrichtung zur absorptionsmessung
DE60041299D1 (de) Testsondenkarte und Testverfahren für eine Halbleitervorrichtung
DE69810603T2 (de) Gerät und verfahren für automatischen protein-entwurf
DE69841864D1 (de) Testvorrichtung und Verfahren zum Nachweis von Restanalyten in Proben
DE60003675D1 (de) Zustandsermittlungsgerät und verfahren für flüssigkeitsgefüllte elektrische anlage
DE69607390D1 (de) Automatisches bohrloch testsystem und verfahren zu seinem betrieb
DE60034166D1 (de) Automatische Vermessungsgerät und Verfahren zum dreidimensionalen Messen
DE60028581D1 (de) Verfahren und gerät zur entfernungsmessung
DE69942346D1 (de) Verfahren und vorrichtung zur zerstörungsfreien prüfung
DE69704880T2 (de) Fehlererkennungsgerät und verfahren
DE69933726D1 (de) Verfahren und Apparat für verbesserte Inspektionsmessungen
DE69901939D1 (de) Koaxialsonden-schnittstelle für automatische testeinrichtungen
DE60002455D1 (de) Verfahren und vorrichtung zur automatischen softwareprüfung
DE10085275T1 (de) Verfahren und Gerät für Vergangenheits- und Zukunftsbewegungsklassifikation
ATE244174T1 (de) Geschwindigkeitsmessverfahren für ein schienenfahrzeug und einrichtung dazu
DE59801360D1 (de) Testschaltung und verfahren zum prüfen einer digitalen halbleiter-schaltungsanordnung
DE60001448D1 (de) Verfahren und gerät für waferrotation
DE60020325D1 (de) Quantitative chromatographische messvorrichtung und verfahren für ihre herstellung
DE59905612D1 (de) Integrierte Schaltung und Verfahren zu ihrer Prüfung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition