DE60040212D1 - Effiziente parallele prüfung von integrierten schaltungsvorrichtungen, unter verwendung einer bekannten guten schaltung, um erwartete antworten zu erzeugen - Google Patents

Effiziente parallele prüfung von integrierten schaltungsvorrichtungen, unter verwendung einer bekannten guten schaltung, um erwartete antworten zu erzeugen

Info

Publication number
DE60040212D1
DE60040212D1 DE60040212T DE60040212T DE60040212D1 DE 60040212 D1 DE60040212 D1 DE 60040212D1 DE 60040212 T DE60040212 T DE 60040212T DE 60040212 T DE60040212 T DE 60040212T DE 60040212 D1 DE60040212 D1 DE 60040212D1
Authority
DE
Germany
Prior art keywords
integrated circuits
known good
parallel testing
good circuit
produce expected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60040212T
Other languages
English (en)
Inventor
Richard S Roy
Charles A Miller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FormFactor Inc
Original Assignee
FormFactor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FormFactor Inc filed Critical FormFactor Inc
Application granted granted Critical
Publication of DE60040212D1 publication Critical patent/DE60040212D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/3193Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31903Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
DE60040212T 1999-03-01 2000-02-24 Effiziente parallele prüfung von integrierten schaltungsvorrichtungen, unter verwendung einer bekannten guten schaltung, um erwartete antworten zu erzeugen Expired - Lifetime DE60040212D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/260,460 US6452411B1 (en) 1999-03-01 1999-03-01 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses
PCT/US2000/004864 WO2000052487A1 (en) 1999-03-01 2000-02-24 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses

Publications (1)

Publication Number Publication Date
DE60040212D1 true DE60040212D1 (de) 2008-10-23

Family

ID=22989261

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60040212T Expired - Lifetime DE60040212D1 (de) 1999-03-01 2000-02-24 Effiziente parallele prüfung von integrierten schaltungsvorrichtungen, unter verwendung einer bekannten guten schaltung, um erwartete antworten zu erzeugen

Country Status (8)

Country Link
US (2) US6452411B1 (de)
EP (1) EP1159629B1 (de)
JP (1) JP4571749B2 (de)
KR (1) KR100681363B1 (de)
AU (1) AU3245800A (de)
DE (1) DE60040212D1 (de)
TW (1) TW451379B (de)
WO (1) WO2000052487A1 (de)

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Also Published As

Publication number Publication date
AU3245800A (en) 2000-09-21
EP1159629A1 (de) 2001-12-05
KR20010104363A (ko) 2001-11-24
TW451379B (en) 2001-08-21
US6559671B2 (en) 2003-05-06
EP1159629B1 (de) 2008-09-10
KR100681363B1 (ko) 2007-02-12
WO2000052487A1 (en) 2000-09-08
US6452411B1 (en) 2002-09-17
JP4571749B2 (ja) 2010-10-27
JP2002538464A (ja) 2002-11-12
US20020175697A1 (en) 2002-11-28

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