DE602005013755D1 - Verfahren zum Zugriff eines einmal programmierbaren Speicher - Google Patents

Verfahren zum Zugriff eines einmal programmierbaren Speicher

Info

Publication number
DE602005013755D1
DE602005013755D1 DE602005013755T DE602005013755T DE602005013755D1 DE 602005013755 D1 DE602005013755 D1 DE 602005013755D1 DE 602005013755 T DE602005013755 T DE 602005013755T DE 602005013755 T DE602005013755 T DE 602005013755T DE 602005013755 D1 DE602005013755 D1 DE 602005013755D1
Authority
DE
Germany
Prior art keywords
accessing
once
programmable memory
programmable
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005013755T
Other languages
English (en)
Inventor
Ching-Yuan Lin
Hong-Yi Liao
Yen-Tai Lin
Shih-Yun Lin
Chun-Hung Lu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
eMemory Technology Inc
Original Assignee
eMemory Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by eMemory Technology Inc filed Critical eMemory Technology Inc
Publication of DE602005013755D1 publication Critical patent/DE602005013755D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/102External programming circuits, e.g. EPROM programmers; In-circuit programming or reprogramming; EPROM emulators
    • G11C16/105Circuits or methods for updating contents of nonvolatile memory, especially with 'security' features to ensure reliable replacement, i.e. preventing that old data is lost before new data is reliably written
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • G11C16/3495Circuits or methods to detect or delay wearout of nonvolatile EPROM or EEPROM memory devices, e.g. by counting numbers of erase or reprogram cycles, by using multiple memory areas serially or cyclically
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/146Write once memory, i.e. allowing changing of memory content by writing additional bits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18Auxiliary circuits, e.g. for writing into memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2216/00Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/26Floating gate memory which is adapted to be one-time programmable [OTP], e.g. containing multiple OTP blocks permitting limited update ability

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Read Only Memory (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
DE602005013755T 2005-05-19 2005-11-03 Verfahren zum Zugriff eines einmal programmierbaren Speicher Active DE602005013755D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US59492205P 2005-05-19 2005-05-19

Publications (1)

Publication Number Publication Date
DE602005013755D1 true DE602005013755D1 (de) 2009-05-20

Family

ID=36949002

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005013755T Active DE602005013755D1 (de) 2005-05-19 2005-11-03 Verfahren zum Zugriff eines einmal programmierbaren Speicher

Country Status (6)

Country Link
US (1) US7254086B2 (de)
EP (1) EP1724786B1 (de)
JP (1) JP4280739B2 (de)
CN (1) CN100543876C (de)
DE (1) DE602005013755D1 (de)
TW (1) TWI262507B (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8947233B2 (en) * 2005-12-09 2015-02-03 Tego Inc. Methods and systems of a multiple radio frequency network node RFID tag
US9117128B2 (en) 2005-12-09 2015-08-25 Tego, Inc. External access to memory on an RFID tag
US9542577B2 (en) 2005-12-09 2017-01-10 Tego, Inc. Information RFID tagging facilities
WO2007068002A2 (en) * 2005-12-09 2007-06-14 Tego Inc. Multiple radio frequency network node rfid tag
US8269630B2 (en) 2005-12-09 2012-09-18 Tego Inc. Methods and systems of a multiple radio frequency network node RFID tag
US8390456B2 (en) 2008-12-03 2013-03-05 Tego Inc. RFID tag facility with access to external devices
US8242908B2 (en) * 2005-12-09 2012-08-14 Tego Inc. Methods and systems of a multiple radio frequency network node RFID tag
US20080186138A1 (en) * 2005-12-09 2008-08-07 Butler Timothy P Methods and systems of a multiple radio frequency network node rfid tag
US8988223B2 (en) 2005-12-09 2015-03-24 Tego Inc. RFID drive management facility
US8242911B2 (en) * 2006-12-11 2012-08-14 Tego Inc. Composite multiple RFID tag facility
US9418263B2 (en) 2005-12-09 2016-08-16 Tego, Inc. Operating systems for an RFID tag
US8279065B2 (en) * 2005-12-09 2012-10-02 Tego Inc. Methods and systems of a multiple radio frequency network node RFID tag
US9361568B2 (en) 2005-12-09 2016-06-07 Tego, Inc. Radio frequency identification tag with hardened memory system
US9430732B2 (en) 2014-05-08 2016-08-30 Tego, Inc. Three-dimension RFID tag with opening through structure
DE102006059743B4 (de) * 2006-12-18 2010-04-29 Qimonda Ag Verfahren zum Trimmen eines Parameters eines Halbleiter-Bauelements
US8417902B2 (en) * 2008-08-05 2013-04-09 Atmel Corporation One-time-programmable memory emulation
JP5328020B2 (ja) * 2009-01-15 2013-10-30 セイコーインスツル株式会社 メモリ装置及びメモリアクセス方法
JP5347649B2 (ja) * 2009-03-30 2013-11-20 凸版印刷株式会社 不揮発性半導体メモリ装置
US20110226617A1 (en) * 2010-03-22 2011-09-22 Applied Materials, Inc. Dielectric deposition using a remote plasma source
KR102132247B1 (ko) * 2014-04-03 2020-07-13 에스케이하이닉스 주식회사 원-타임 프로그램 메모리
US9953193B2 (en) 2014-09-30 2018-04-24 Tego, Inc. Operating systems for an RFID tag
CN110489351B (zh) * 2018-05-14 2021-03-09 英韧科技(上海)有限公司 芯片指纹管理装置及安全芯片
CN113590209B (zh) * 2021-09-29 2022-03-01 翱捷科技(深圳)有限公司 芯片启动控制方法、芯片及电子设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100274099B1 (ko) 1991-08-02 2001-01-15 비센트 비.인그라시아 점진적으로 프로그램가능한 비휘발성 메모리 및 이를 구비한 집적 회로와 비휘발성 메모리 프로그래밍 방법
US5675547A (en) * 1995-06-01 1997-10-07 Sony Corporation One time programmable read only memory programmed by destruction of insulating layer
US6208549B1 (en) * 2000-02-24 2001-03-27 Xilinx, Inc. One-time programmable poly-fuse circuit for implementing non-volatile functions in a standard sub 0.35 micron CMOS
US6222760B1 (en) * 2000-07-25 2001-04-24 Micon Design Technology Co. Ltd OTP (one time programmable) micro-controller
US6584018B2 (en) * 2001-10-05 2003-06-24 Mosel Vitelic, Inc. Nonvolatile memory structures and access methods
US6857054B2 (en) * 2002-06-28 2005-02-15 Hewlett-Packard Development Company, L.P. Write-once memory storage device
US6728137B1 (en) * 2003-04-29 2004-04-27 Ememory Technology Inc. Method for programming and reading a plurality of one-time programmable memory blocks
KR100618865B1 (ko) * 2004-09-30 2006-08-31 삼성전자주식회사 멀티플 프로그래밍 가능한 otp 메모리 장치 및 그프로그래밍 방법
TWI271620B (en) * 2005-06-16 2007-01-21 Ememory Technology Inc Method and apparatus for performing multi-programmable function with one-time programmable memories

Also Published As

Publication number Publication date
US7254086B2 (en) 2007-08-07
JP4280739B2 (ja) 2009-06-17
CN1866400A (zh) 2006-11-22
JP2006323981A (ja) 2006-11-30
US20060262626A1 (en) 2006-11-23
TW200641896A (en) 2006-12-01
CN100543876C (zh) 2009-09-23
TWI262507B (en) 2006-09-21
EP1724786B1 (de) 2009-04-08
EP1724786A1 (de) 2006-11-22

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