DE60237168D1 - Röntgenquelle mit verbesserter strahlstabilität unssigkeiten - Google Patents
Röntgenquelle mit verbesserter strahlstabilität unssigkeitenInfo
- Publication number
- DE60237168D1 DE60237168D1 DE60237168T DE60237168T DE60237168D1 DE 60237168 D1 DE60237168 D1 DE 60237168D1 DE 60237168 T DE60237168 T DE 60237168T DE 60237168 T DE60237168 T DE 60237168T DE 60237168 D1 DE60237168 D1 DE 60237168D1
- Authority
- DE
- Germany
- Prior art keywords
- ray
- ray source
- ray tube
- uncertainties
- tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/12—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/12—Cooling
- H01J2235/1225—Cooling characterised by method
- H01J2235/1291—Thermal conductivity
- H01J2235/1295—Contact between conducting bodies
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US33658401P | 2001-12-04 | 2001-12-04 | |
| US38399002P | 2002-05-29 | 2002-05-29 | |
| US39896802P | 2002-07-26 | 2002-07-26 | |
| US39896602P | 2002-07-26 | 2002-07-26 | |
| US39896502P | 2002-07-26 | 2002-07-26 | |
| US10/206,531 US6781060B2 (en) | 2002-07-26 | 2002-07-26 | Electrical connector, a cable sleeve, and a method for fabricating an electrical connection |
| PCT/US2002/038493 WO2003049510A2 (en) | 2001-12-04 | 2002-12-04 | X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE60237168D1 true DE60237168D1 (de) | 2010-09-09 |
Family
ID=27558986
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60237168T Expired - Lifetime DE60237168D1 (de) | 2001-12-04 | 2002-12-04 | Röntgenquelle mit verbesserter strahlstabilität unssigkeiten |
Country Status (8)
| Country | Link |
|---|---|
| US (3) | US7072439B2 (de) |
| EP (1) | EP1454513B1 (de) |
| JP (2) | JP4999256B2 (de) |
| CN (2) | CN101183083B (de) |
| AT (1) | ATE476088T1 (de) |
| AU (3) | AU2002364525A1 (de) |
| DE (1) | DE60237168D1 (de) |
| WO (3) | WO2003049138A2 (de) |
Families Citing this family (117)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| CN1864447B (zh) | 2003-08-04 | 2011-03-23 | X射线光学系统公司 | X射线源组件及其操作方法 |
| FI20031753A (fi) | 2003-12-01 | 2005-06-02 | Metorex Internat Oy | Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten |
| US7286644B2 (en) * | 2004-04-28 | 2007-10-23 | Varian Medical Systems Technologies, Inc. | Systems, methods and devices for x-ray device focal spot control |
| DE102004025119B4 (de) * | 2004-05-21 | 2012-08-02 | Siemens Ag | Röntgenstrahler |
| FR2882886B1 (fr) * | 2005-03-02 | 2007-11-23 | Commissariat Energie Atomique | Source monochromatique de rayons x et microscope a rayons x mettant en oeuvre une telle source |
| US20060228238A1 (en) * | 2005-04-06 | 2006-10-12 | Andrews Gregory C | Coolant pump for x-ray device |
| JP4994375B2 (ja) | 2005-08-01 | 2012-08-08 | ザ リサーチ ファウンデーション オブ ステート ユニバーシティ オブ ニューヨーク | 点焦点湾曲モノクロメータ光学体を使用するｘ線結像系 |
| EP1758132B1 (de) | 2005-08-22 | 2009-02-18 | Unisantis FZE | Vorrichtung und Verfahren zum Positionieren einer Röntgenlinse und Röntgengerät mit einer solchen Vorrichtung |
| JP4954525B2 (ja) * | 2005-10-07 | 2012-06-20 | 浜松ホトニクス株式会社 | Ｘ線管 |
| US20100189223A1 (en) * | 2006-02-16 | 2010-07-29 | Steller Micro Devices | Digitally addressed flat panel x-ray sources |
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| US9324535B2 (en) * | 2006-02-16 | 2016-04-26 | Stellarray, Incorporaated | Self contained irradiation system using flat panel X-ray sources |
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| JP4559377B2 (ja) * | 2006-03-23 | 2010-10-06 | 株式会社ジョブ | Ｘ線発生装置 |
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| US7409037B2 (en) * | 2006-05-05 | 2008-08-05 | Oxford Instruments Analytical Oy | X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure |
| JP5102549B2 (ja) * | 2006-07-14 | 2012-12-19 | 独立行政法人科学技術振興機構 | Ｘ線分析装置及びｘ線分析方法 |
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| SE532723C2 (sv) * | 2007-05-03 | 2010-03-23 | Lars Lantto | Anordning för alstring av röntgenstrålning med stort reellt fokus och behovsanpassat virtuellt fokus |
| JP5196872B2 (ja) * | 2007-05-28 | 2013-05-15 | 株式会社東芝 | Ｘ線管用高電圧コネクタ |
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| US9305735B2 (en) | 2007-09-28 | 2016-04-05 | Brigham Young University | Reinforced polymer x-ray window |
| JP5414167B2 (ja) * | 2007-11-02 | 2014-02-12 | 株式会社東芝 | Ｘ線管装置 |
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| FR2926924B1 (fr) * | 2008-01-25 | 2012-10-12 | Thales Sa | Source radiogene comprenant au moins une source d'electrons associee a un dispositif photoelectrique de commande |
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| JP5539906B2 (ja) * | 2008-03-05 | 2014-07-02 | エックス−レイ オプティカル システムズ インコーポレーテッド | 高度に位置合わせされた筐体内に複数の励起エネルギー帯域を有するｘｒｆシステム |
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| FR2939896B1 (fr) * | 2008-12-12 | 2011-05-06 | Geoservices Equipements | Dispositif d'emission d'un premier faisceau de photons gamma de haute energie et d'un deuxieme faisceau de photons gamma de plus basse energie, ensemble de mesure et procede associe |
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- 2002-12-04 AU AU2002364525A patent/AU2002364525A1/en not_active Abandoned
- 2002-12-04 WO PCT/US2002/038803 patent/WO2003049138A2/en not_active Application Discontinuation
- 2002-12-04 WO PCT/US2002/038493 patent/WO2003049510A2/en active Application Filing
- 2002-12-04 AU AU2002363962A patent/AU2002363962A1/en not_active Abandoned
- 2002-12-04 AT AT02798480T patent/ATE476088T1/de not_active IP Right Cessation
- 2002-12-04 JP JP2003550565A patent/JP4999256B2/ja not_active Expired - Fee Related
- 2002-12-04 CN CN2007101367041A patent/CN101183083B/zh not_active Expired - Fee Related
- 2002-12-04 WO PCT/US2002/038792 patent/WO2003048745A2/en not_active Application Discontinuation
- 2002-12-04 DE DE60237168T patent/DE60237168D1/de not_active Expired - Lifetime
- 2002-12-04 AU AU2002357069A patent/AU2002357069A1/en not_active Abandoned
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2004
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- 2004-06-01 US US10/858,549 patent/US7515684B2/en not_active Expired - Fee Related
- 2004-06-03 US US10/859,901 patent/US7209545B2/en not_active Expired - Lifetime
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2010
- 2010-10-12 JP JP2010230027A patent/JP2011071120A/ja active Pending
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| AU2002357069A8 (en) | 2003-06-17 |
| CN100336422C (zh) | 2007-09-05 |
| WO2003049138A3 (en) | 2004-04-15 |
| AU2002357069A1 (en) | 2003-06-17 |
| WO2003049138A2 (en) | 2003-06-12 |
| JP2005512288A (ja) | 2005-04-28 |
| US7209545B2 (en) | 2007-04-24 |
| WO2003049510A3 (en) | 2004-01-22 |
| CN1618258A (zh) | 2005-05-18 |
| US20050031073A1 (en) | 2005-02-10 |
| WO2003048745A2 (en) | 2003-06-12 |
| WO2003048745A3 (en) | 2004-02-12 |
| JP4999256B2 (ja) | 2012-08-15 |
| AU2002363962A8 (en) | 2003-06-17 |
| CN101183083B (zh) | 2013-03-20 |
| US20050053197A1 (en) | 2005-03-10 |
| JP2011071120A (ja) | 2011-04-07 |
| US7515684B2 (en) | 2009-04-07 |
| EP1454513B1 (de) | 2010-07-28 |
| WO2003049510A2 (en) | 2003-06-12 |
| AU2002364525A1 (en) | 2003-06-17 |
| US20050041773A1 (en) | 2005-02-24 |
| ATE476088T1 (de) | 2010-08-15 |
| US7072439B2 (en) | 2006-07-04 |
| AU2002364525A8 (en) | 2003-06-17 |
| CN101183083A (zh) | 2008-05-21 |
| AU2002363962A1 (en) | 2003-06-17 |
| EP1454513A2 (de) | 2004-09-08 |
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