DE69013236T2 - Messanordnung für Oberflächen-Widerstand. - Google Patents

Messanordnung für Oberflächen-Widerstand.

Info

Publication number: DE69013236T2
Authority: DE; Germany
Prior art keywords: surface resistance; measuring arrangement; measuring; arrangement; resistance
Prior art date: 1989-06-12
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE69013236T

Other languages

English (en)

Other versions

DE69013236D1 (de

Inventor

Vincent Gobin

Gerard Labaune

Francois Issac

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Office National dEtudes et de Recherches Aerospatiales ONERA

Dassault Aviation SA

Original Assignee

Office National dEtudes et de Recherches Aerospatiales ONERA

Dassault Aviation SA

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1989-06-12

Filing date

1990-06-08

Publication date

1995-05-11

1990-06-08 Application filed by Office National dEtudes et de Recherches Aerospatiales ONERA, Dassault Aviation SA filed Critical Office National dEtudes et de Recherches Aerospatiales ONERA

1994-11-17 Application granted granted Critical

1994-11-17 Publication of DE69013236D1 publication Critical patent/DE69013236D1/de

1995-05-11 Publication of DE69013236T2 publication Critical patent/DE69013236T2/de

2010-06-09 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies

DE69013236T 1989-06-12 1990-06-08 Messanordnung für Oberflächen-Widerstand. Expired - Fee Related DE69013236T2 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
FR8907726A FR2648236B1 (fr)	1989-06-12	1989-06-12	Appareil de mesure d'impedance surfacique

Publications (2)

Publication Number	Publication Date
DE69013236D1 DE69013236D1 (de)	1994-11-17
DE69013236T2 true DE69013236T2 (de)	1995-05-11

Family

ID=9382606

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69013236T Expired - Fee Related DE69013236T2 (de)	1989-06-12	1990-06-08	Messanordnung für Oberflächen-Widerstand.

Country Status (7)

Country	Link
US (1)	US5086274A (de)
EP (1)	EP0403344B1 (de)
BR (1)	BR9002779A (de)
CA (1)	CA2018689C (de)
DE (1)	DE69013236T2 (de)
FR (1)	FR2648236B1 (de)
IL (1)	IL94707A0 (de)

Families Citing this family (28)

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CA2043347A1 (en) *	1990-05-30	1991-12-01	Yukio Kohmura	Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibres using method and system
US5453689A (en) *	1991-12-06	1995-09-26	Massachusetts Institute Of Technology	Magnetometer having periodic winding structure and material property estimator
ATE201787T1 (de) *	1992-11-25	2001-06-15	Simmonds Precision Products	Datenverarbeitungsstrukturen und methoden
US5515041A (en) *	1993-06-14	1996-05-07	Simmonds Precision Products Inc.	Composite shaft monitoring system
US5581248A (en) *	1993-06-14	1996-12-03	Simmonds Precision Products, Inc.	Embeddable device for contactless interrogation of sensors for smart structures
US5602540A (en) *	1993-06-14	1997-02-11	Simmonds Precision Products Inc.	Fluid gauging apparatus with inductive interrogation
US5433115A (en) *	1993-06-14	1995-07-18	Simmonds Precision Products, Inc.	Contactless interrogation of sensors for smart structures
JP3011090U (ja) *	1994-11-11	1995-05-16	株式会社キョクトー	スポット溶接のナゲットの検査装置
US5698978A (en) *	1995-05-15	1997-12-16	Northrop Grumman Corporation	System and method for measuring electromagnetic radiation absorption
US5793206A (en) *	1995-08-25	1998-08-11	Jentek Sensors, Inc.	Meandering winding test circuit
US5936401A (en) *	1996-09-19	1999-08-10	The United States Of America As Represented By The Secretary Of The Air Force	Device and process for measuring electrical properties at a plurality of locations on thin film superconductors
US6486673B1 (en)	1997-01-06	2002-11-26	Jentek Sensors, Inc.	Segmented field dielectrometer
JP2001508178A (ja) *	1997-01-06	2001-06-19	ジェンテク・センサーズ・インコーポレーテッド	地表下の対象物のマグネトメータおよびディエレクトロメータによる探知
US6781387B2 (en)	1997-01-06	2004-08-24	Jentek Sensors, Inc.	Inspection method using penetrant and dielectrometer
US6534974B1 (en)	1997-02-21	2003-03-18	Pemstar, Inc,	Magnetic head tester with write coil and read coil
AU1965297A (en) *	1997-02-21	1998-09-09	Pemstar, Inc.	A magnetic recording head tester
DE69814601T2 (de)	1997-03-13	2004-04-01	Jentek Sensors, Inc., Watertown	Magnetometrische detektion von ermüdungsschäden in flugzeugen
ATE256865T1 (de) *	1997-10-29	2004-01-15	Jentek Sensors Inc	Absolutmessung von eigenschaften mit luftkalibrierung
US6377039B1 (en)	1997-11-14	2002-04-23	Jentek Sensors, Incorporated	Method for characterizing coating and substrates
US6380747B1 (en)	1998-05-12	2002-04-30	Jentek Sensors, Inc.	Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation grids
US6346807B1 (en) *	1999-10-22	2002-02-12	Bently Nevada Corporation	Digital eddy current proximity system: apparatus and method
KR100505929B1 (ko) *	2003-03-31	2005-08-04	삼성광주전자 주식회사	압축기 및 압축기의 배관연결방법
WO2007088395A1 (en)	2006-02-03	2007-08-09	Bae Systems Plc	Improvements relating to damage sensors
US8550609B2 (en) *	2007-11-21	2013-10-08	Xerox Corporation	System and method for measuring a supply of solid ink in a solid ink printer
WO2017089591A1 (fr)	2015-11-27	2017-06-01	Airbus Safran Launchers Sas	Pale pour éolienne comprenant une couche de métallisation ayant un grammage optimisé
US10605777B2 (en) *	2016-03-16	2020-03-31	Ihi Corporation	Method for inspecting electroconductive composite material and device for inspecting electroconductive composite material
JP6494551B2 (ja) *	2016-03-28	2019-04-03	アンリツ株式会社	電界強度分布測定装置及び電界強度分布測定方法
CN109188083A (zh) *	2018-08-28	2019-01-11	深圳市信维通信股份有限公司	一种lds天线的rf一致性与线路阻抗检测系统及方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US2629004A (en) *	1947-06-10	1953-02-17	Maurice L Greenough	Electrical micrometer
US3441840A (en) *	1967-03-31	1969-04-29	Martin Marietta Corp	Electronic thickness meter having direct readout of coating thickness
US3764897A (en) *	1971-12-28	1973-10-09	Singer Co	Electromagnetic thickness gauging using a transmitting coil shaped to provide a constant field over a range of measuring distances
US3848183A (en) *	1973-04-20	1974-11-12	Magnaflux Corp	Eddy current testing system having concentric coils, one being movable for balancing
CH568569A5 (de) *	1974-02-06	1975-10-31	Bbc Brown Boveri & Cie
US4095180A (en) *	1975-12-29	1978-06-13	K. J. Law Engineers, Inc.	Method and apparatus for testing conductivity using eddy currents
US4042876A (en) *	1976-04-29	1977-08-16	The United States Of America As Represented By The United States Energy Research And Development Administration	Eddy current gauge for monitoring displacement using printed circuit coil
US4383218A (en) *	1978-12-29	1983-05-10	The Boeing Company	Eddy current flow detection including compensation for system variables such as lift-off
US4351031A (en) *	1980-11-07	1982-09-21	Magnaflux Corporation	Nondestructive testing system having automatic set-up means
US4706020A (en) *	1983-12-12	1987-11-10	General Electric Company	High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material

1989
- 1989-06-12 FR FR8907726A patent/FR2648236B1/fr not_active Expired - Lifetime
1990
- 1990-06-08 EP EP90401578A patent/EP0403344B1/de not_active Expired - Lifetime
- 1990-06-08 DE DE69013236T patent/DE69013236T2/de not_active Expired - Fee Related
- 1990-06-11 US US07/535,498 patent/US5086274A/en not_active Expired - Lifetime
- 1990-06-11 CA CA002018689A patent/CA2018689C/en not_active Expired - Fee Related
- 1990-06-12 BR BR909002779A patent/BR9002779A/pt not_active Application Discontinuation
- 1990-06-12 IL IL94707A patent/IL94707A0/xx not_active IP Right Cessation

Also Published As

Publication number	Publication date
EP0403344B1 (de)	1994-10-12
CA2018689A1 (en)	1990-12-12
FR2648236A1 (fr)	1990-12-14
CA2018689C (en)	1994-09-20
DE69013236D1 (de)	1994-11-17
BR9002779A (pt)	1991-08-20
EP0403344A1 (de)	1990-12-19
FR2648236B1 (fr)	1991-12-20
US5086274A (en)	1992-02-04
IL94707A0 (en)	1991-04-15

Legal Events

Date	Code	Title	Description
1995-11-09	8364	No opposition during term of opposition
2009-04-23	8339	Ceased/non-payment of the annual fee

Publication	Publication Date	Title
DE69013236T2 (de)	1995-05-11	Messanordnung für Oberflächen-Widerstand.
DE69003429D1 (de)	1993-10-28	Tastkopf.
DE69003149T2 (de)	1994-01-05	Tastkopf.
DE3861463D1 (de)	1991-02-07	Messfuehler.
DE68911137T2 (de)	1994-03-31	Verriegelungsvorrichtung für endstück.
NO905460D0 (no)	1990-12-18	Broennsonde.
DE3579358D1 (de)	1990-10-04	Lagemessanordnung.
DE69012837D1 (de)	1994-10-27	Messgerät.
DE69004631T2 (de)	1994-03-10	Positionsmesseinrichtung.
DE69001445D1 (de)	1993-06-03	Maehvorrichtung.
DE68912939D1 (de)	1994-03-17	Elektrochemisches Messgerät.
DE59002854D1 (de)	1993-10-28	Temperaturmessschaltung.
DE59103189D1 (de)	1994-11-10	Messsonde.
DE69024016D1 (de)	1996-01-18	Messvorrichtung.
DE3668496D1 (de)	1990-03-01	Messonde.
DE69021590D1 (de)	1995-09-14	Flüssigkeitsmessanordnung.
DE58906457D1 (de)	1994-01-27	Druckmessanordnung.
DE69006478D1 (de)	1994-03-17	Messsystem für anstrichleitfähigkeit.
DE69020425D1 (de)	1995-08-03	Oberflächenpotentialmesssystem.
DE69011482D1 (de)	1994-09-15	Füllstands-Messeinrichtung.
DE69007729D1 (de)	1994-05-05	Messanordnung.
DE3879889T2 (de)	1993-08-05	Testmeter.
DE3877222D1 (de)	1993-02-18	Messfuehler.
DE69000164T2 (de)	1993-02-11	Festigkeitsmessgeraet.
DE69001828T2 (de)	1993-12-23	Elektrode für Füllstandsbestimmung.