DE69029606D1 - Leistungsschnittstellenschaltung und Verfahren zur Prüfung einer solchen Schaltung - Google Patents

Leistungsschnittstellenschaltung und Verfahren zur Prüfung einer solchen Schaltung

Info

Publication number
DE69029606D1
DE69029606D1 DE69029606T DE69029606T DE69029606D1 DE 69029606 D1 DE69029606 D1 DE 69029606D1 DE 69029606 T DE69029606 T DE 69029606T DE 69029606 T DE69029606 T DE 69029606T DE 69029606 D1 DE69029606 D1 DE 69029606D1
Authority
DE
Germany
Prior art keywords
circuit
testing
power interface
interface circuit
power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69029606T
Other languages
English (en)
Other versions
DE69029606T2 (de
Inventor
Richard M Kerslake
Frank R Fattori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE69029606D1 publication Critical patent/DE69029606D1/de
Application granted granted Critical
Publication of DE69029606T2 publication Critical patent/DE69029606T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • H04L1/243—Testing correct operation by comparing a transmitted test signal with a locally generated replica at the transmitter, using a loop-back

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Dc Digital Transmission (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
DE69029606T 1989-06-16 1990-06-06 Leistungsschnittstellenschaltung und Verfahren zur Prüfung einer solchen Schaltung Expired - Fee Related DE69029606T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB898913952A GB8913952D0 (en) 1989-06-16 1989-06-16 Line interface circuit and method of testing such a circuit

Publications (2)

Publication Number Publication Date
DE69029606D1 true DE69029606D1 (de) 1997-02-20
DE69029606T2 DE69029606T2 (de) 1997-04-24

Family

ID=10658604

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69029606T Expired - Fee Related DE69029606T2 (de) 1989-06-16 1990-06-06 Leistungsschnittstellenschaltung und Verfahren zur Prüfung einer solchen Schaltung

Country Status (5)

Country Link
US (1) US5128962A (de)
EP (1) EP0403147B1 (de)
JP (1) JP3332919B2 (de)
DE (1) DE69029606T2 (de)
GB (1) GB8913952D0 (de)

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DE4010798A1 (de) * 1990-04-04 1991-10-10 Bodenseewerk Geraetetech Demodulatorbaustein und damit aufgebaute signalverarbeitungsschaltung
FR2674082B1 (fr) * 1991-03-14 1994-11-25 Bull Sa Procedes de test pour transmissions serie bidirectionnelles et circuits pour leur mise en óoeuvre.
US5337316A (en) * 1992-01-31 1994-08-09 Motorola, Inc. Transceiver self-diagnostic testing apparatus and method
DE580938T1 (de) * 1992-06-26 1994-09-22 Yokogawa Electric Corp Steuerungsgerät für Duplex-Kommunikation.
US5663968A (en) * 1992-06-30 1997-09-02 H. Heuer Instruments Pty Ltd. Margin test method and apparatus for intergrated services digital networks
GB9306735D0 (en) * 1993-03-31 1993-05-26 Texas Instruments Ltd Improvements in or relating to in-circuit testing
US5425054A (en) * 1993-06-23 1995-06-13 Tamarack Microelectronics Inc. Surrounding circuit for the ethernet coaxial local area newtwork transceiver
JP2648796B2 (ja) * 1993-10-12 1997-09-03 富士通株式会社 データ伝送異常検出方式およびデータ伝送機器
AUPM411294A0 (en) * 1994-02-25 1994-03-24 Martin Communications Pty Ltd Evaluation of signal processor performance
US6255852B1 (en) * 1999-02-09 2001-07-03 Micron Technology, Inc. Current mode signal interconnects and CMOS amplifier
US7554829B2 (en) 1999-07-30 2009-06-30 Micron Technology, Inc. Transmission lines for CMOS integrated circuits
US6331785B1 (en) * 2000-01-26 2001-12-18 Cirrus Logic, Inc. Polling to determine optimal impedance
US6348826B1 (en) 2000-06-28 2002-02-19 Intel Corporation Digital variable-delay circuit having voltage-mixing interpolator and methods of testing input/output buffers using same
US6377103B1 (en) 2000-06-28 2002-04-23 Intel Corporation Symmetric, voltage-controlled CMOS delay cell with closed-loop replica bias
US6348811B1 (en) * 2000-06-28 2002-02-19 Intel Corporation Apparatus and methods for testing simultaneous bi-directional I/O circuits
US7222208B1 (en) * 2000-08-23 2007-05-22 Intel Corporation Simultaneous bidirectional port with synchronization circuit to synchronize the port with another port
US6793575B2 (en) * 2000-11-10 2004-09-21 Case Venture Management, Llc Racing game
US6795871B2 (en) 2000-12-22 2004-09-21 General Electric Company Appliance sensor and man machine interface bus
US6720801B2 (en) * 2001-06-18 2004-04-13 The United States Of America As Represented By The Secretary Of The Navy RS-232 bus data tap apparatus
US7180352B2 (en) * 2001-06-28 2007-02-20 Intel Corporation Clock recovery using clock phase interpolator
US6791356B2 (en) * 2001-06-28 2004-09-14 Intel Corporation Bidirectional port with clock channel used for synchronization
US6950968B1 (en) * 2001-07-31 2005-09-27 Alcatel System and method for conducting diagnostics in a telecommunications node
US7101770B2 (en) * 2002-01-30 2006-09-05 Micron Technology, Inc. Capacitive techniques to reduce noise in high speed interconnections
US7235457B2 (en) * 2002-03-13 2007-06-26 Micron Technology, Inc. High permeability layered films to reduce noise in high speed interconnects
US6846738B2 (en) * 2002-03-13 2005-01-25 Micron Technology, Inc. High permeability composite films to reduce noise in high speed interconnects
US6900116B2 (en) 2002-03-13 2005-05-31 Micron Technology Inc. High permeability thin films and patterned thin films to reduce noise in high speed interconnections
US7192892B2 (en) 2003-03-04 2007-03-20 Micron Technology, Inc. Atomic layer deposited dielectric layers
US6970053B2 (en) * 2003-05-22 2005-11-29 Micron Technology, Inc. Atomic layer deposition (ALD) high permeability layered magnetic films to reduce noise in high speed interconnection
US9529762B2 (en) * 2003-06-30 2016-12-27 Becton, Dickinson And Company Self powered serial-to-serial or USB-to-serial cable with loopback and isolation
US7366641B1 (en) 2005-03-28 2008-04-29 Western Digital Technologies, Inc. Serial interface amplitude selection for a disk drive in an unknown interconnect environment
US7927948B2 (en) 2005-07-20 2011-04-19 Micron Technology, Inc. Devices with nanocrystals and methods of formation
US20070104111A1 (en) * 2005-11-04 2007-05-10 Intel Corporation Internal analog loopback for a high-speed interface test
US7280302B1 (en) 2005-11-16 2007-10-09 Western Digital Technologies, Inc. Disk drive using loopback to calibrate transmission amplitude
US20080195920A1 (en) * 2007-02-13 2008-08-14 Freescale Semiconductor, Inc. Self-test structure and method of testing a digital interface
KR101369834B1 (ko) * 2007-07-25 2014-03-05 삼성전자주식회사 시리얼 데이터 수신장치 및 이를 사용한 전자장치
CN102055339B (zh) * 2009-10-30 2014-03-26 深圳富泰宏精密工业有限公司 测试用电源装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2485306A1 (fr) * 1980-06-23 1981-12-24 Trt Telecom Radio Electr Systeme de test local d'un modem utilisant la modulation par deplacement de frequence
JPS6020664A (ja) * 1983-07-15 1985-02-01 Nec Corp インタフエ−ス回路の診断方法
EP0176646B1 (de) * 1984-08-24 1988-07-20 International Business Machines Corporation Leitungsschnittstelle
JPS61231646A (ja) * 1985-04-05 1986-10-15 Nec Corp 入出力制御装置の診断方式
US4993045A (en) * 1988-10-31 1991-02-12 Racal Data Communications Inc. Modem diagnostic loop

Also Published As

Publication number Publication date
EP0403147A3 (de) 1992-08-26
GB8913952D0 (en) 1989-08-02
JP3332919B2 (ja) 2002-10-07
JPH03129949A (ja) 1991-06-03
DE69029606T2 (de) 1997-04-24
EP0403147A2 (de) 1990-12-19
EP0403147B1 (de) 1997-01-08
US5128962A (en) 1992-07-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee