DE69206848T2 - Verbindungsanordnung für Prüfeinrichtung - Google Patents

Verbindungsanordnung für Prüfeinrichtung

Info

Publication number: DE69206848T2
Authority: DE; Germany
Prior art keywords: connection arrangement; test facility; facility; test; arrangement
Prior art date: 1991-02-22
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE69206848T

Other languages

English (en)

Other versions

DE69206848D1 (de

Inventor

Robert H Pincus

Calvin S Winroth

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Genrad Inc

Original Assignee

Genrad Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1991-02-22

Filing date

1992-02-18

Publication date

1996-08-29

1992-02-18 Application filed by Genrad Inc filed Critical Genrad Inc

1996-02-01 Publication of DE69206848D1 publication Critical patent/DE69206848D1/de

1996-08-29 Application granted granted Critical

1996-08-29 Publication of DE69206848T2 publication Critical patent/DE69206848T2/de

2012-02-19 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

DE69206848T 1991-02-22 1992-02-18 Verbindungsanordnung für Prüfeinrichtung Expired - Lifetime DE69206848T2 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US07/659,755 US5124636A (en)	1991-02-22	1991-02-22	Tester interconnect system

Publications (2)

Publication Number	Publication Date
DE69206848D1 DE69206848D1 (de)	1996-02-01
DE69206848T2 true DE69206848T2 (de)	1996-08-29

Family

ID=24646697

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69206848T Expired - Lifetime DE69206848T2 (de)	1991-02-22	1992-02-18	Verbindungsanordnung für Prüfeinrichtung

Country Status (4)

Country	Link
US (1)	US5124636A (de)
EP (1)	EP0502624B1 (de)
JP (1)	JP3285212B2 (de)
DE (1)	DE69206848T2 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5534774A (en) *	1992-04-23	1996-07-09	Intel Corporation	Apparatus for a test access architecture for testing of modules within integrated circuits
US5406197A (en) *	1992-07-31	1995-04-11	International Business Machines Corporation	Apparatus for controlling test inputs of circuits on an electronic module
US6101457A (en) *	1992-10-29	2000-08-08	Texas Instruments Incorporated	Test access port
US5752216A (en) *	1994-07-06	1998-05-12	Dimensions International, Inc.	Non-intrusive data interface system for air traffic control
US6175230B1 (en) *	1999-01-14	2001-01-16	Genrad, Inc.	Circuit-board tester with backdrive-based burst timing
US6552528B2 (en) *	2001-03-15	2003-04-22	Advantest Corporation	Modular interface between a device under test and a test head
US20030043757A1 (en) *	2001-08-15	2003-03-06	Jason White	Optimizing switch device route transitions
US8161144B2 (en) *	2001-08-15	2012-04-17	National Instruments Corporation	Defining a switch device route based on required signal characteristics and resource dependencies
US6954904B2 (en)	2001-08-15	2005-10-11	National Instruments Corporation	Creating a graphical program to configure one or more switch devices
US7017138B2 (en) *	2001-08-15	2006-03-21	National Instruments Corporation	Dynamically determining a route through one or more switch devices at program execution time
US7062719B2 (en)	2001-08-15	2006-06-13	National Instruments Corporation	Graphically defining a route through one or more switch devices
US6701270B1 (en) *	2001-09-20	2004-03-02	Lsi Logic Corporation	Method for reliability testing leakage characteristics in an electronic circuit and a testing device for accomplishing the source
US20050232256A1 (en) *	2002-03-29	2005-10-20	Jason White	Applying object oriented concepts to switch system configurations
US7154257B2 (en) *	2002-09-30	2006-12-26	Intel Corporation	Universal automated circuit board tester
US6999888B2 (en) *	2002-09-30	2006-02-14	Intel Corporation	Automated circuit board test actuator system
US6958598B2 (en) *	2003-09-30	2005-10-25	Teradyne, Inc.	Efficient switching architecture with reduced stub lengths
US7279919B2 (en) *	2005-01-14	2007-10-09	Verigy (Singapore) Pte. Ltd.	Systems and methods of allocating device testing resources to sites of a probe card
ES2303415B2 (es) *	2005-10-20	2010-03-04	Universidad De Malaga	Banco de ensayos automatizado para ensayos de rutina segun dc 73/23/cee.
CN102565518A (zh) *	2010-12-16	2012-07-11	鸿富锦精密工业（深圳）有限公司	电流平衡测试系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3854125A (en) *	1971-06-15	1974-12-10	Instrumentation Engineering	Automated diagnostic testing system
DE2909268C2 (de) *	1979-03-09	1980-09-11	Wandel & Goltermann Gmbh & Co, 7412 Eningen	Verfahren und Einrichtung zur Oberwachung der Funktion der in einem MeIistellenumschalter befindlichen Schalter
US4354268A (en) *	1980-04-03	1982-10-12	Santek, Inc.	Intelligent test head for automatic test system
US4746855A (en) *	1984-03-14	1988-05-24	Teradyne, Inc.	Relay multiplexing for circuit testers
US4724379A (en) *	1984-03-14	1988-02-09	Teradyne, Inc.	Relay multiplexing for circuit testers
US4719459A (en) *	1986-03-06	1988-01-12	Grumman Aerospace Corporation	Signal distribution system switching module
US4989202A (en) *	1988-10-14	1991-01-29	Harris Corporation	ISDN testing device and method

1991
- 1991-02-22 US US07/659,755 patent/US5124636A/en not_active Expired - Lifetime
1992
- 1992-02-18 DE DE69206848T patent/DE69206848T2/de not_active Expired - Lifetime
- 1992-02-18 EP EP92301302A patent/EP0502624B1/de not_active Expired - Lifetime
- 1992-02-20 JP JP03326492A patent/JP3285212B2/ja not_active Expired - Lifetime

Also Published As

Publication number	Publication date
DE69206848D1 (de)	1996-02-01
EP0502624A1 (de)	1992-09-09
US5124636A (en)	1992-06-23
JPH04323577A (ja)	1992-11-12
JP3285212B2 (ja)	2002-05-27
EP0502624B1 (de)	1995-12-20

Legal Events

Date	Code	Title	Description
1997-01-23	8364	No opposition during term of opposition
2011-04-07	8328	Change in the person/name/address of the agent	Representative=s name: MOSELPATENT TRIERPATENT, 54290 TRIER
2011-06-16	8328	Change in the person/name/address of the agent	Representative=s name: PATENTANWAELTE SERWE & DR. WAGNER, 54290 TRIER

Publication	Publication Date	Title
DE69229389D1 (de)	1999-07-15	Testsystem für Schaltkreise
DE69427945T2 (de)	2001-12-20	Inspektionseinrichtung für Steckverbinder
DE69328120D1 (de)	2000-04-20	Prüfungsstreifen für immunoassays
DE69125438T2 (de)	1997-10-30	Ablaufsteuerung für automatische Testeinrichtung
DE69118617T2 (de)	1996-10-31	Einschrittest für absolute Zellzahlen
DE69210325T2 (de)	1997-01-02	Modularer Ständer für Proberöhrchen
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DE69124929D1 (de)	1997-04-10	Testelementfördervorrichtung für Analysatoren
DE69229510T2 (de)	2000-02-17	Elektrochrome Prüfvorrichtungen für Batterien
DE69308493D1 (de)	1997-04-10	Träger für proberöhrchen
DE69206848T2 (de)	1996-08-29	Verbindungsanordnung für Prüfeinrichtung
DE69326808D1 (de)	1999-11-25	Prüfvorrichtung für Behälter
DE69130755D1 (de)	1999-02-25	Prüfeinrichtung
DE69409056T2 (de)	1998-10-29	Kombinationsvorrichtung für Bohrlochmessung
DE69123380T2 (de)	1997-03-27	Nachweisvorrichtung für gekoppelte Verbinder
DE59006678D1 (de)	1994-09-08	Prüfungseinrichtung für Endoskopausrüstungen.
DE59209464D1 (de)	1998-09-24	Prüfschaltung für einen sensor
DE69301294D1 (de)	1996-02-22	Verbindungsvorrichtung für Baugruppen
NO932466D0 (no)	1993-07-07	Testsystem for feltmaaling
DE69402434D1 (de)	1997-05-07	Prüfeinrichtung für Banknoten
DE69207853D1 (de)	1996-03-07	Verbindungsanordnungen für getrennte Sektionen
DE69316822D1 (de)	1998-03-12	Prüfungsvorrichtung für Bandbreitefehler
DE69129365D1 (de)	1998-06-10	Testagens für endotoxin
DE59106652D1 (de)	1995-11-16	Kontaktierungsvorrichtung für Prüfzwecke.
DE59406585D1 (de)	1998-09-10	Verbindungseinrichtung für Profilteile