DE69210923D1 - Optische Messeinrichtung für Verschiebung - Google Patents

Optische Messeinrichtung für Verschiebung

Info

Publication number
DE69210923D1
DE69210923D1 DE69210923T DE69210923T DE69210923D1 DE 69210923 D1 DE69210923 D1 DE 69210923D1 DE 69210923 T DE69210923 T DE 69210923T DE 69210923 T DE69210923 T DE 69210923T DE 69210923 D1 DE69210923 D1 DE 69210923D1
Authority
DE
Germany
Prior art keywords
image
fourier
modulating
coherent light
timings
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69210923T
Other languages
English (en)
Other versions
DE69210923T2 (de
Inventor
Tamiki Takemori
Yuji Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE69210923D1 publication Critical patent/DE69210923D1/de
Publication of DE69210923T2 publication Critical patent/DE69210923T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/64—Devices characterised by the determination of the time taken to traverse a fixed distance
    • G01P3/80—Devices characterised by the determination of the time taken to traverse a fixed distance using auto-correlation or cross-correlation detection means
    • G01P3/806—Devices characterised by the determination of the time taken to traverse a fixed distance using auto-correlation or cross-correlation detection means in devices of the type to be classified in G01P3/68
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/36—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light
    • G01P3/366—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light by using diffraction of light
DE69210923T 1991-08-12 1992-08-12 Optische Messeinrichtung für Verschiebung Expired - Fee Related DE69210923T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3226459A JP2538456B2 (ja) 1991-08-12 1991-08-12 光学的変位量測定装置

Publications (2)

Publication Number Publication Date
DE69210923D1 true DE69210923D1 (de) 1996-06-27
DE69210923T2 DE69210923T2 (de) 1996-11-28

Family

ID=16845431

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69210923T Expired - Fee Related DE69210923T2 (de) 1991-08-12 1992-08-12 Optische Messeinrichtung für Verschiebung

Country Status (5)

Country Link
US (1) US5361131A (de)
EP (1) EP0532182B1 (de)
JP (1) JP2538456B2 (de)
AT (1) ATE138479T1 (de)
DE (1) DE69210923T2 (de)

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US6454761B1 (en) 1995-01-30 2002-09-24 Philip D. Freedman Laser surgery device and method
DE19527540C2 (de) * 1995-07-27 1998-09-10 Siemens Ag Optischer Korrelator und Verfahren zur Korrelation optischer Signale
US5684588A (en) * 1996-10-04 1997-11-04 United States Of America As Represented By The Secretary Of The Air Force Homodyne and hetrodyne imaging in a light scattering medium
US6303986B1 (en) 1998-07-29 2001-10-16 Silicon Light Machines Method of and apparatus for sealing an hermetic lid to a semiconductor die
US6728008B1 (en) 1998-09-04 2004-04-27 Kabushiki Kaisha Toshiba Method for diagnosing optical devices installed in image reading apparatus and image forming apparatus
JP3737292B2 (ja) * 1998-10-13 2006-01-18 パイオニア株式会社 光変調装置及び光学的情報処理システム
US6323984B1 (en) * 2000-10-11 2001-11-27 Silicon Light Machines Method and apparatus for reducing laser speckle
US6697501B2 (en) * 2000-11-30 2004-02-24 Vansco Electronics Ltd. Method for detecting velocity or displacement of an object over a surface by analyzing images of the surface
US6707591B2 (en) 2001-04-10 2004-03-16 Silicon Light Machines Angled illumination for a single order light modulator based projection system
US6747781B2 (en) 2001-06-25 2004-06-08 Silicon Light Machines, Inc. Method, apparatus, and diffuser for reducing laser speckle
US6782205B2 (en) 2001-06-25 2004-08-24 Silicon Light Machines Method and apparatus for dynamic equalization in wavelength division multiplexing
US6829092B2 (en) 2001-08-15 2004-12-07 Silicon Light Machines, Inc. Blazed grating light valve
US6800238B1 (en) 2002-01-15 2004-10-05 Silicon Light Machines, Inc. Method for domain patterning in low coercive field ferroelectrics
US6728023B1 (en) 2002-05-28 2004-04-27 Silicon Light Machines Optical device arrays with optimized image resolution
US6767751B2 (en) 2002-05-28 2004-07-27 Silicon Light Machines, Inc. Integrated driver process flow
US6822797B1 (en) 2002-05-31 2004-11-23 Silicon Light Machines, Inc. Light modulator structure for producing high-contrast operation using zero-order light
US6829258B1 (en) 2002-06-26 2004-12-07 Silicon Light Machines, Inc. Rapidly tunable external cavity laser
US6714337B1 (en) 2002-06-28 2004-03-30 Silicon Light Machines Method and device for modulating a light beam and having an improved gamma response
US6813059B2 (en) 2002-06-28 2004-11-02 Silicon Light Machines, Inc. Reduced formation of asperities in contact micro-structures
US6801354B1 (en) 2002-08-20 2004-10-05 Silicon Light Machines, Inc. 2-D diffraction grating for substantially eliminating polarization dependent losses
US6712480B1 (en) 2002-09-27 2004-03-30 Silicon Light Machines Controlled curvature of stressed micro-structures
US6829077B1 (en) 2003-02-28 2004-12-07 Silicon Light Machines, Inc. Diffractive light modulator with dynamically rotatable diffraction plane
JP4014535B2 (ja) * 2003-04-25 2007-11-28 シャープ株式会社 光学式移動量検出装置及び電子機器及び搬送処理システム
CN1902639A (zh) * 2003-11-10 2007-01-24 科技创新有限责任公司 数字成像组合件及其方法
JP2006349534A (ja) * 2005-06-16 2006-12-28 Fujinon Corp 動体測定用干渉計装置および動体測定用光干渉計測方法
TWI402721B (zh) * 2009-12-03 2013-07-21 Chung Shan Inst Of Science 光斑定位方法及光斑定位系統
TWI492622B (zh) * 2011-08-31 2015-07-11 Realtek Semiconductor Corp 網路訊號接收系統與網路訊號接收方法
JP5927837B2 (ja) * 2011-10-20 2016-06-01 株式会社リコー 速度検出装置、移動部材搬送ユニット、及び、画像形成装置
CN104620073B (zh) * 2012-06-13 2016-08-17 皇家飞利浦有限公司 确定表面波的传播速度
KR102067763B1 (ko) * 2013-03-13 2020-01-17 삼성전자주식회사 공간 광변조기, 이를 포함한 홀로그래피 영상 표시 장치 및 공간 광변조 방법
EP3420324B1 (de) * 2016-02-25 2021-03-24 Continuse Biometrics Ltd. Verfahren und system zur überwachung der parameter eines beweglichen objekts
IL278987A (en) * 2019-12-05 2021-06-30 Continuse Biometrics Ltd System and method for passively monitoring a sample
CN114136229B (zh) * 2021-12-01 2023-09-19 上海市计量测试技术研究院 一种一维psd传感器量程拼接的设计方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57187605A (en) * 1981-05-14 1982-11-18 Ricoh Co Ltd Measuring device for optical movement distance
JPS59212773A (ja) * 1983-05-19 1984-12-01 Toshiba Corp 光学的速度検出装置
DE3729648A1 (de) * 1987-09-04 1989-03-16 Deutsche Forsch Luft Raumfahrt Verfahren und vorrichtung zur messung der stroemungsgeschwindigkeit in windkanaelen
US5011278A (en) * 1989-04-25 1991-04-30 Wisconsin Alumni Research Foundation Optical correlator method and apparatus for particle image velocimetry processing
JP2744494B2 (ja) * 1989-12-04 1998-04-28 住友大阪セメント株式会社 スペックル利用測定装置

Also Published As

Publication number Publication date
ATE138479T1 (de) 1996-06-15
JP2538456B2 (ja) 1996-09-25
JPH0642916A (ja) 1994-02-18
DE69210923T2 (de) 1996-11-28
EP0532182B1 (de) 1996-05-22
EP0532182A1 (de) 1993-03-17
US5361131A (en) 1994-11-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee