DE69320894D1 - Apparat zur Messung elektrischer Felder - Google Patents
Apparat zur Messung elektrischer FelderInfo
- Publication number
- DE69320894D1 DE69320894D1 DE69320894T DE69320894T DE69320894D1 DE 69320894 D1 DE69320894 D1 DE 69320894D1 DE 69320894 T DE69320894 T DE 69320894T DE 69320894 T DE69320894 T DE 69320894T DE 69320894 D1 DE69320894 D1 DE 69320894D1
- Authority
- DE
- Germany
- Prior art keywords
- electric fields
- measuring electric
- measuring
- fields
- electric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19879192 | 1992-07-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69320894D1 true DE69320894D1 (de) | 1998-10-15 |
DE69320894T2 DE69320894T2 (de) | 1999-03-04 |
Family
ID=16396972
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69320894T Expired - Fee Related DE69320894T2 (de) | 1992-07-24 | 1993-07-23 | Apparat zur Messung elektrischer Felder |
Country Status (3)
Country | Link |
---|---|
US (1) | US5592101A (de) |
EP (1) | EP0580446B1 (de) |
DE (1) | DE69320894T2 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3323572B2 (ja) * | 1993-03-15 | 2002-09-09 | 浜松ホトニクス株式会社 | 電圧測定装置のe−oプローブ位置決め方法 |
JP2000214230A (ja) * | 1999-01-20 | 2000-08-04 | Ando Electric Co Ltd | 電気光学サンプリングプロ―バ |
US6906506B1 (en) | 2001-06-08 | 2005-06-14 | The Regents Of The University Of Michigan | Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe |
US7667854B2 (en) * | 2006-12-18 | 2010-02-23 | Battelle Energy Alliance, Llc | Hand-held survey probe |
DE102007049530A1 (de) * | 2007-10-15 | 2009-04-16 | Eltex-Elektrostatik Gmbh | Vorrichtung zur kontaktlosen Bestimmung eines elektrischen Feldes auf oder in einem Medium |
US10641807B2 (en) | 2015-10-16 | 2020-05-05 | Jx Nippon Mining & Metals Corporation | Optical modulator and electric field sensor |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4446425A (en) * | 1982-02-12 | 1984-05-01 | The University Of Rochester | Measurement of electrical signals with picosecond resolution |
US4618819A (en) * | 1984-03-27 | 1986-10-21 | The University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
EP0293497B1 (de) * | 1987-05-26 | 1993-03-10 | Ibm Deutschland Gmbh | Kontaktsonden-Anordnung mit Feinpositionier-Vorrichtung |
DE3877628T2 (de) * | 1987-05-31 | 1993-05-13 | Hamamatsu Photonics Kk | Spannungsdetektor. |
US5272434A (en) * | 1987-06-20 | 1993-12-21 | Schlumberger Technologies, Inc. | Method and apparatus for electro-optically testing circuits |
JP2588965B2 (ja) * | 1989-03-13 | 1997-03-12 | 日本電信電話株式会社 | 電界測定用プローブ |
US4928058A (en) * | 1989-05-23 | 1990-05-22 | The University Of Rochester | Electro-optic signal measurement |
JPH0810776B2 (ja) * | 1990-06-28 | 1996-01-31 | 浜松ホトニクス株式会社 | 狭スペクトル短パルス光源装置及び電圧検出装置 |
US5274325A (en) * | 1991-03-18 | 1993-12-28 | Nippon Telegraph And Telephone Corporation | Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits |
US5406213A (en) * | 1991-09-10 | 1995-04-11 | Photon Dynamics, Inc. | Instrument for testing liquid crystal display base plates |
JP3122190B2 (ja) * | 1991-10-15 | 2001-01-09 | 浜松ホトニクス株式会社 | 電圧検出装置 |
US5412330A (en) * | 1993-06-16 | 1995-05-02 | Tektronix, Inc. | Optical module for an optically based measurement system |
-
1993
- 1993-07-22 US US08/094,974 patent/US5592101A/en not_active Expired - Fee Related
- 1993-07-23 DE DE69320894T patent/DE69320894T2/de not_active Expired - Fee Related
- 1993-07-23 EP EP93305824A patent/EP0580446B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5592101A (en) | 1997-01-07 |
DE69320894T2 (de) | 1999-03-04 |
EP0580446A1 (de) | 1994-01-26 |
EP0580446B1 (de) | 1998-09-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |